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2011 IEEE International Symposium on Workload Characterization
Two-level soft error vulnerability prediction on SMT/CMP architectures
Austin, TX, USA
November 06-November 08
ISBN: 978-1-4577-2063-5
ASCII Text
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Lide Duan, Lu Peng, Bin Li, "Two-level soft error vulnerability prediction on SMT/CMP architectures," 2012 IEEE International Symposium on Workload Characterization (IISWC), pp. 78, 2011 IEEE International Symposium on Workload Characterization, 2011.
 
 
BibTex
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@article{ 10.1109/IISWC.2011.6114203,
author = {Lide Duan and Lu Peng and Bin Li},
title = {Two-level soft error vulnerability prediction on SMT/CMP architectures},
journal ={2012 IEEE International Symposium on Workload Characterization (IISWC)},
volume = {0},
year = {2011},
isbn = {978-1-4577-2063-5},
pages = {78},
doi = {http://doi.ieeecomputersociety.org/10.1109/IISWC.2011.6114203},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - 2012 IEEE International Symposium on Workload Characterization (IISWC)
TI - Two-level soft error vulnerability prediction on SMT/CMP architectures
SN - 978-1-4577-2063-5
SP
EP
A1 - Lide Duan,
A1 - Lu Peng,
A1 - Bin Li,
PY - 2011
VL - 0
JA - 2012 IEEE International Symposium on Workload Characterization (IISWC)
ER -
 
Lide Duan, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, 70803, USA
Lu Peng, Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, 70803, USA
Bin Li, Department of Experimental Statistics, Louisiana State University, Baton Rouge, 70803, USA
Architectural Vulnerability Factor (AVF) [3] quantifies the probability that a raw soft error finally produces a visible error in the program output. It is often used by computer designers as an important reliability metric at the architectural level. However, the AVF measurement is extremely expensive in terms of hardware and computation. In this paper, we characterize and predict a program's AVF under resource contention and sharing with other programs running on Simultaneous Multithreading (SMT) and Chip-Multiprocessor (CMP) architectures.
Citation:
Lide Duan, Lu Peng, Bin Li, "Two-level soft error vulnerability prediction on SMT/CMP architectures," iiswc, pp.78, 2011 IEEE International Symposium on Workload Characterization, 2011
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