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2009 International Forum on Information Technology and Applications
Static Analysis of Malware to Detect Exception Return
Chengdu, China
May 15-May 17
ISBN: 978-0-7695-3600-2
| ASCII Text | x | ||
| Zhang Yichi, Pang Jianmin, Bai Lili, Fu Wen, "Static Analysis of Malware to Detect Exception Return," Information Technology and Applications, International Forum on, vol. 3, pp. 690-693, 2009 International Forum on Information Technology and Applications, 2009. | |||
| BibTex | x | ||
| @article{ 10.1109/IFITA.2009.137, author = {Zhang Yichi and Pang Jianmin and Bai Lili and Fu Wen}, title = {Static Analysis of Malware to Detect Exception Return}, journal ={Information Technology and Applications, International Forum on}, volume = {3}, year = {2009}, isbn = {978-0-7695-3600-2}, pages = {690-693}, doi = {http://doi.ieeecomputersociety.org/10.1109/IFITA.2009.137}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Information Technology and Applications, International Forum on TI - Static Analysis of Malware to Detect Exception Return SN - 978-0-7695-3600-2 SP690 EP693 A1 - Zhang Yichi, A1 - Pang Jianmin, A1 - Bai Lili, A1 - Fu Wen, PY - 2009 KW - Malware KW - Disassemble KW - Obfuscation VL - 3 JA - Information Technology and Applications, International Forum on ER - | |||
Malware is rapidly becoming a major security issue. In order to avoid being analyzed statically, malwares resort to various obfuscation techniques to hide their malicious behaviors. The technique based on the exception return of subroutine is one of the techniques. Currently disassemblers couldn't deal with malware which uses this technique. This paper presents a static disassembly algorithm base on virtual stack for handling malware with exception return. The result of the test proves that the algorithm is effective.
Index Terms:
Malware, Disassemble, Obfuscation
Citation:
Zhang Yichi, Pang Jianmin, Bai Lili, Fu Wen, "Static Analysis of Malware to Detect Exception Return," ifita, vol. 3, pp.690-693, 2009 International Forum on Information Technology and Applications, 2009
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