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  • IEEE International Workshop on IDDQ Testing
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IEEE International Workshop on IDDQ Testing
San Jose, California
November 12-November 13
ISBN: 0-8186-9191-3
Table of Contents
Session 1: Keynote Address
Session 2: Effective IDDQ Testing
Session 3: New Approaches for Current-Based Testing
Session 4: Separating Good Chips from the Bad
Session 5: Core-Based Systems and Testability
Position Papers
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