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IDDQ Testing, IEEE International Workshop on (1998)
San Jose, California
Nov. 12, 1998 to Nov. 13, 1998
ISBN: 0-8186-9191-3
TABLE OF CONTENTS
Session 1: Keynote Address
Session 2: Effective IDDQ Testing
Toshimasa Kuchii , The University of Tokushima
Masaki Hashizume , The University of Tokushima
Takeomi Tamesada , The University of Tokushima
pp. 14
Session 3: New Approaches for Current-Based Testing
Session 4: Separating Good Chips from the Bad
T. Aruna Unni , Xilinx Corp.
D.M.H. Walker , Texas A&M University
pp. 43
Session 5: Core-Based Systems and Testability
Yann Antonioli , SHARP Corporation
Shigeki Nishikawa , SHARP Corporation
Hiroshi Uemura , SHARP Corporation
Kozo Kinoshita , Osaka University
pp. 64
Position Papers
Author Index (PDF)
pp. 82
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