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1997 IEEE International Workshop on IDDQ Testing (IDDQ '97)
Washington, DC
November 05-November 06
ISBN: 0-8186-8123-3
Table of Contents
Keynote Speech
Session 1: Test Generation and Testability: Chair: Adit Singh, Auburn University, USA
Samy R. Makar, Center for Reliable Computing Stanford University
Edward J. McCluskey, Center for Reliable Computing Stanford University
pp. 2
Session 2: Testing of Analog and Mixed Signal Circuits: Chair: Kozo Kinoshita, Osaka University, Japan
Iluminada Baturone, Instituto de Microelectronica de Sevilla (IMSE-CNM)
Santiago Sanchez-Solano, Instituto de Microelectronica de Sevilla (IMSE-CNM)
Jose L. Huertas, Instituto de Microelectronica de Sevilla (IMSE-CNM)
Andrew M. Richardson, Lancaster University
pp. 33
Session 3: Testing of Submicron ICs: Chair: Peter Maxwell, Hewlett Packard, USA
Session 4: Test Strategies: Chair: Monoj Sachdev, Philips Research Labs, The Netherlands
S. Chakravarty, State Univ. of New York, Buffalo, NY, USA
S.T. Zachariah, State Univ. of New York, Buffalo, NY, USA
P.J. Thadikaran, State Univ. of New York, Buffalo, NY, USA
pp. 58
Tzuhao Chen, Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
I.N. Hajj, Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
pp. 63
S.M. Menon, Dept. of Electr. & Comput. Eng., South Dakota Sch. of Mines & Technol., Rapid City, SD, USA
M. Palmgren, Dept. of Electr. & Comput. Eng., South Dakota Sch. of Mines & Technol., Rapid City, SD, USA
pp. 68
A. Walker, Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
P.K. Lala, Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
pp. 73
Session 5: Limit Setting and Current Sensors: Chair: Yashwant K. Malaiya, Colorado State University, USA
Y. Maidon, UniversitT Bordeaux
Y. Deval, UniversitT Bordeaux
J. Tomas, UniversitT Bordeaux
F. Verdier, UniversitT Bordeaux
J.B. Begueret, UniversitT Bordeaux
J.P. Dom, UniversitT Bordeaux
pp. 85
Tsung-Chu Huang, Nat'l Cheng-Kung University, Taiwan
Min-Cheng Huang, Nat'l Cheng-Kung University, Taiwan
Kuen-Jong Lee, Nat'l Cheng-Kung University, Taiwan
pp. 90
Tutorial: Physical Failure Mechanisms, Reliability and IDDQ: Panel Chair: Chuck Hawkins, University of New Mexico, USA
Panel Session
Moderator: Jerry Soden, Sandia National Labs
Position Papers
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