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IDDQ Testing, IEEE International Workshop on (1996)
Washington, DC
Oct. 24, 1996 to Oct. 25, 1996
ISBN: 0-8186-7655-8
TABLE OF CONTENTS
pp. null
Session 1: Effectiveness of IDDQ Testing: Session Chair: Jerry Soden, Sandia National Labs
Frank Peters , Eindhoven University of Technology
Steven Oostdijk , Philips Electronic Design & Tools
pp. 4
Rinya Kawahara , LSI Division, Kawasaki-steel Inc.
Osamu Nakayama , LSI Division, Kawasaki-steel Inc.
Tatsuru Kurasawa , LSI Division, Kawasaki-steel Inc.
pp. 9
Terry Barrette , LSI Logic Corporation
Vishwas Bhide , LSI Logic Corporation
Kaushik De , LSI Logic Corporation
Mike Stover , LSI Logic Corporation
Emery Sugasawara , LSI Logic Corporation
pp. 14
Session 2: Testing and Testability: Session Chair: Sankaran Menon, South Dakota School of Mines & Technology
Anne E. Gattiker , Carnegie Mellon University
Wojciech Maly , Carnegie Mellon University
Phil Nigh , IBM Microelectronics Division
Dale Grosch , IBM Microelectronics Division
pp. 25
Hiroshi Yamazaki , Tokyo Metropolitan University
Yukiya Miura , Tokyo Metropolitan University
pp. 29
Session 3: Limit Setting and Testing: Session Chair: Joel Ferguson, University of California, Santa Cruz
M.A. Ortega , Universitat Politecnica de Catalunya
J. Rius , Universitat Politecnica de Catalunya
J. Figueras , Universitat Politecnica de Catalunya
pp. 36
Jonathan T.-Y. Chang , Stanford University
Edward J. McCluskey , Stanford University
pp. 45
Bob Thomas , Cadence Design Systems, Inc.
Rick Andlauer , Cadence Design Systems, Inc.
pp. 50
Session 4: Current Sensors: Session Chair: Kenneth Butler, Texas Instruments
Chih-Wen Lu , National Chiao Tung University
Chung-Len Lee , National Chiao Tung University
Jwu-E Chen , Chung-Hwa Polytechnic
pp. 56
M. Sidiropulos , Technical University of Brno
V. Stopjakova , Slovak Technical University
pp. 59
On Chip IDDX Sensor (Abstract)
Yvan Maidon , Universite Bordeaux I
Yann Deval , Universite Bordeaux I
Pascal Fouillat , Universite Bordeaux I
Jean Tomas , Universite Bordeaux I
Jean Paul Dom , Universite Bordeaux I
pp. 64
Session 5: Test Generation and Testing: Session Chair: Rob Roy, NEC
Tzuhao Chen , University of Illinois
Ibrahim N. Hajj , University of Illinois
Elizabeth M. Rudnick , University of Illinois
Janak H. Patel , University of Illinois
pp. 74
Wen Xiaoqing , Dept. of Inf. Eng., Akita Univ., Japan
K.K. Saluja , Dept. of Inf. Eng., Akita Univ., Japan
K. Kinoshita , Dept. of Inf. Eng., Akita Univ., Japan
H. Tamamoto , Dept. of Inf. Eng., Akita Univ., Japan
pp. 79
Peilin Song , Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
Jien-Chung Lo , Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
pp. 84
H. Manhaeve , Dept. of Microelectron., KHBO, Ostend, Belgium
M. Svajda , Dept. of Microelectron., KHBO, Ostend, Belgium
B. Straka , Dept. of Microelectron., KHBO, Ostend, Belgium
pp. 89
Lluis Ribas-Xirgo , Microelectronics Group Universitat Aut`onoma de Barcelona
Jordi Carrabina-Bordoll , Microelectronics Group Universitat Aut`onoma de Barcelona
pp. 94
Panel Session: Where Should IDDQ R&D Be Directed in 1997?
Position Papers
S.R. Makar , Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey , Center for Reliable Comput., Stanford Univ., CA, USA
pp. 102
Author Index (PDF)
pp. 105
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