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1996 IEEE International Workshop on IDDQ Testing (IDDQ '96)
Washington, DC
October 24-October 25
ISBN: 0-8186-7655-8
Table of Contents
Keynote Speaker
Session 1: Effectiveness of IDDQ Testing: Session Chair: Jerry Soden, Sandia National Labs
Frank Peters, Eindhoven University of Technology
Steven Oostdijk, Philips Electronic Design & Tools
pp. 4
Rinya Kawahara, LSI Division, Kawasaki-steel Inc.
Osamu Nakayama, LSI Division, Kawasaki-steel Inc.
Tatsuru Kurasawa, LSI Division, Kawasaki-steel Inc.
pp. 9
Terry Barrette, LSI Logic Corporation
Vishwas Bhide, LSI Logic Corporation
Kaushik De, LSI Logic Corporation
Mike Stover, LSI Logic Corporation
Emery Sugasawara, LSI Logic Corporation
pp. 14
Session 2: Testing and Testability: Session Chair: Sankaran Menon, South Dakota School of Mines & Technology
Anne E. Gattiker, Carnegie Mellon University
Wojciech Maly, Carnegie Mellon University
Phil Nigh, IBM Microelectronics Division
Dale Grosch, IBM Microelectronics Division
pp. 25
Hiroshi Yamazaki, Tokyo Metropolitan University
Yukiya Miura, Tokyo Metropolitan University
pp. 29
Session 3: Limit Setting and Testing: Session Chair: Joel Ferguson, University of California, Santa Cruz
M.A. Ortega, Universitat Politecnica de Catalunya
J. Rius, Universitat Politecnica de Catalunya
J. Figueras, Universitat Politecnica de Catalunya
pp. 36
Bob Thomas, Cadence Design Systems, Inc.
Rick Andlauer, Cadence Design Systems, Inc.
pp. 50
Session 4: Current Sensors: Session Chair: Kenneth Butler, Texas Instruments
Chih-Wen Lu, National Chiao Tung University
Chung-Len Lee, National Chiao Tung University
Jwu-E Chen, Chung-Hwa Polytechnic
pp. 56
On Chip IDDX Sensor (Abstract)
Yvan Maidon, Universite Bordeaux I
Yann Deval, Universite Bordeaux I
Pascal Fouillat, Universite Bordeaux I
Jean Tomas, Universite Bordeaux I
Jean Paul Dom, Universite Bordeaux I
pp. 64
Session 5: Test Generation and Testing: Session Chair: Rob Roy, NEC
Wen Xiaoqing, Dept. of Inf. Eng., Akita Univ., Japan
K.K. Saluja, Dept. of Inf. Eng., Akita Univ., Japan
K. Kinoshita, Dept. of Inf. Eng., Akita Univ., Japan
H. Tamamoto, Dept. of Inf. Eng., Akita Univ., Japan
pp. 79
Peilin Song, Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
Jien-Chung Lo, Dept. of Electr. & Comput. Eng., Rhode Island Univ., Kingston, RI, USA
pp. 84
H. Manhaeve, Dept. of Microelectron., KHBO, Ostend, Belgium
M. Svajda, Dept. of Microelectron., KHBO, Ostend, Belgium
B. Straka, Dept. of Microelectron., KHBO, Ostend, Belgium
pp. 89
Lluis Ribas-Xirgo, Microelectronics Group Universitat Aut\`onoma de Barcelona
Jordi Carrabina-Bordoll, Microelectronics Group Universitat Aut\`onoma de Barcelona
pp. 94
Panel Session: Where Should IDDQ R&D Be Directed in 1997?
Panel Chair: Peter Maxwell, Hewlett-Packard
Position Papers
S.R. Makar, Center for Reliable Comput., Stanford Univ., CA, USA
E.J. McCluskey, Center for Reliable Comput., Stanford Univ., CA, USA
pp. 102
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