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19th IEEE International Conference on Software Maintenance (ICSM'03)
Amsterdam, The Netherlands
September 22-September 26
ISBN: 0-7695-1905-9
Table of Contents
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Keynote
Alexander Rinnooy Kan, Executive Board Member / CIO ING Group, Amsterdam, The Netherlands
pp. 2
Technical Session T1: Versioning
Michael Fischer, Vienna University of Technology
Martin Pinzger, Vienna University of Technology
Harald Gall, Vienna University of Technology
pp. 23
Technical Session T2: Slicing
Bogdan Korel, Illinois Institute of Technology
Inderdeep Singh, Illinois Institute of Technology
Luay Tahat, Lucent Technologies
Boris Vaysburg, Illinois Institute of Technology
pp. 34
Amie L. Souter, Drexel University
David Shepherd, University of Delaware, Newark
Lori L. Pollock, University of Delaware, Newark
pp. 54
Technical Session T3: Evolution
Nazim H. Madhavji, University of Western Ontario, Canada
Jos?e Tass?, University of New Brunswick, Canada
pp. 75
Technical Session T4: Metrics
M.T. Baldassarre, Universit? di Bari - Via Orabona
D. Caivano, Universit? di Bari - Via Orabona
G. Visaggio, Universit? di Bari - Via Orabona
pp. 105
Technical Session T5: Components and Frameworks
Technical Session T6: Reverse Engineering
Kim Mens, Universit? catholique de Louvain
Bernard Poll, Universit? catholique de Louvain
Sebasti? Gonz?lez, Universit? catholique de Louvain
pp. 169
Steven Klusener, Software Improvement Group; Vrije Universiteit
Ralf L?mmel, Vrije Universiteit; CWI
pp. 179
Technical Session T7: Maintenance Organization
Harry M. Sneed, Software Data Service, Vienna, Austria
Peter Br?ssler, Software Data Service, Vienna, Austria
pp. 190
Mira Kajko-Mattsson, Stockholm University/Royal Institute of Technology/IT University
pp. 199
Technical Session T8: Execution Architecture
Technical Session T9: Impact Analysis
PhD Dissertation Section
Leon Moonen, Delft University of Technology; CWI (Centrum voor Wiskunde en Informatica)
pp. 276
Technical Session T10: System Analysis
Zsolt Balanyi, University of Szeged, Hungary
Rudolf Ferenc, University of Szeged, Hungary
pp. 305
Panel Discussion
Panagiotis K. Linos, Butler University, Indianapolis
Chris Bailey-Kellogg, Purdue University, West Lafayette
pp. 336
Technical Session T11: Architecture
Reinder J. Bril, Technical University Eindhoven (TU/e); Philips Research Eindhoven (PRE)
Andr? Postma, Philips Research Eindhoven (PRE)
Ren? L. Krikhaar, Philips Medical Systems (PMS)
pp. 348
Akash Garg, University of California, Irvine
Matt Critchlow, University of California, Irvine
Ping Chen, University of California, Irvine
Christopher Van der Westhuizen, University of California, Irvine
Andr? van der Hoek, University of California, Irvine
pp. 358
Fast Track Paper Session
Mika M?ntyl?, Helsinki University of Technology
Jari Vanhanen, Helsinki University of Technology
Casper Lassenius, Helsinki University of Technology
pp. 381
Arie van Deursen, CWI and Delft University of Technology
Tobias Kuipers, Software Improvement Group
pp. 385
Dan Port, University of Hawaii
LiGuo Huang, University of Southern California
pp. 389
Technical Session T12: Regression Testing
Lee White, Case Western Reserve University
Husain Almezen, Case Western Reserve University
Shivakumar Sastry, The University of Akron
pp. 398
Technical Session T13: Process
Ignac Lovrek, University of Zagreb
Gordan Jezic, University of Zagreb
Mario Kusek, University of Zagreb
Igor Ljubi, University of Zagreb
Antun Caric, Ericsson Nikola Tesla
Darko Huljenic, Ericsson Nikola Tesla
Sasa Desic, Ericsson Nikola Tesla
Ozren Labor, Ericsson Nikola Tesla
pp. 440
Robert C. Seacord, Carnegie Mellon University
Joseph Elm, Carnegie Mellon University
Wolf Goethert, Carnegie Mellon University
Grace A. Lewis, Carnegie Mellon University
Dan Plakosh, Carnegie Mellon University
John Robert, Carnegie Mellon University
Lutz Wrage, Carnegie Mellon University
Mikael Lindvall, University of Maryland
pp. 450
Industry Track
Jeroen J. van Beele, Wehkamp, The Netherlands
pp. 465
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