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17th International Conference on Software Engineering (ICSE'95)
Seattle, Washington, USA
April 23-April 30
ISBN: 0-89791-708-1
Table of Contents
Requirements
Michael Jackson, AT&T Bell Laboratories and MAJ Consulting Ltd, London, England
Pamela Zave, AT&T Bell Laboratories, Murray Hill, NJ
pp. 15
Testing
W. Eric Wong, Bell Communications Research, Morristown, NJ
Joseph R. Horgan, Bell Communications Research, Morristown, NJ
Saul London, Bell Communications Research, Morristown, NJ
Aditya P. Mathur, Purdue University, W. Lafayette, IN
pp. 41
Duncan Clarke, University of Pennsylvania, Philadelphia, PA
Insup Lee, University of Pennsylvania, Philadelphia, PA
pp. 51
Antonia Bertolino, Istituto di Elaborazione della Informazione del CNR via S. Maria, Italy
Lorenzo Strigini, Istituto di Elaborazione della Informazione del CNR via S. Maria, Italy
pp. 61
Process I
Jonathan E. Cook, University of Colorado, Boulder
Alexander L. Wolf, University of Colorado, Boulder
pp. 73
Naser S. Barghouti, AT&T Bell Laboratories, Murray Hill, NJ
Balachander Krishnamurthy, AT&T Bell Laboratories, Murray Hill, NJ
pp. 83
Reuse
Scott Henninger, University of Nebraska-Lincoln, NE
Kris Lappala, University of Nebraska-Lincoln, NE
Anand Raghavendran, University of Nebraska-Lincoln, NE
pp. 95
Susan Rosenbaum, Schlumberger Austin Systems Center, Austin, TX
Bertrand du Castel, Schlumberger Austin Systems Center, Austin, TX
pp. 105
Process II
Fabiano Cattaneo, Politecnico di Milano and CEFRIEL
Alfonso Fuggetta, Politecnico di Milano and CEFRIEL
Luigi Lavazza, Politecnico di Milano and CEFRIEL
pp. 115
Toshifumi Tanaka, OMRON Corporation
Keishi Sakamoto, OMRON Corporation
Shinji Kusumoto, Osaka University
Ken-ichi Matsumoto, Nara Institute of Science and Technology
Tohru Kikuno, Osaka University
pp. 123
Lionel Briand, CRIM, Canada
Walc?lio Melo, University of Maryland, College Park
Carolyn Seaman, University of Maryland, College Park
Victor Basili, University of Maryland, College Park
pp. 133
Concurrency
Matthew B. Dwyer, University of Massachusetts, Amherst
Lori A. Clarke, University of Massachusetts, Amherst
Kari A. Nies, University of California, Irvine
pp. 147
Mark A. Ardis, AT&T Bell Laboratories, Naperville, IL
John A. Chaves, AT&T Bell Laboratories, Naperville, IL
Lalita Jategaonkar Jagadeesan, AT&T Bell Laboratories, Naperville, IL
Peter Mataga, AT&T Bell Laboratories, Naperville, IL
Carlos Puchol, AT&T Bell Laboratories, Naperville, IL
Mark G. Staskauskas, AT&T Bell Laboratories, Naperville, IL
James Von Olnhausen, AT&T Bell Laboratories, Naperville, IL
pp. 159
Kyo C. Kang, Pohang University of Science and Technology, Korea
Kwang-Il Ko, Pohang University of Science and Technology, Korea
pp. 169
Architecture
David Garlan, Carnegie Mellon University, Pittsburgh, PA
Robert Allen, Carnegie Mellon University, Pittsburgh, PA
John Ockerbloom, Carnegie Mellon University, Pittsburgh, PA
pp. 179
David R. Harris, The MITRE Corporation, Bedford, MA
Howard B. Reubenstein, GTE Laboratories, Waltham, MA
Alexander S. Yeh, The MITRE Corporation, Bedford, MA
pp. 186
Dilip Soni, Siemens Corporate Research Inc., Princeton, NJ
Robert L. Nord, Siemens Corporate Research Inc., Princeton, NJ
Christine Hofmeister, Siemens Corporate Research Inc., Princeton, NJ
pp. 196
Development
Craig Chambers, University of Washington, Seattle
Jeffrey Dean, University of Washington, Seattle
David Grove, University of Washington, Seattle
pp. 221
Ryszard Janicki, McMaster University, Ontario, Canada
pp. 231
Process III
Barry Boehm, University of Southern California
Prasanta Bose, University of Southern California
Ellis Horowitz, University of Southern California
Ming June Lee, University of Southern California
pp. 243
Ulf Leonhardt, Imperial College, London, UK
Jeff Kramer, Imperial College, London, UK
Bashar Nuseibeh, Imperial College, London, UK
Anthony Finkelstein, City University, London, UK
pp. 255
G. Cugola, Politecnico di Milano, Italy
E. Di Nitto, Politecnico di Milano, Italy
C. Ghezzi, Politecnico di Milano, Italy
M. Mantione, Politecnico di Milano, Italy
pp. 265
State-of-the-Art (Invited)
Lawrence G. Votta, AT&T Bell Laboratories, Naperville, Illinois
Adam Porter, University of Maryland, College Park
pp. 277
Keynote (Invited)
Michael Jackson, MAJ Consulting Ltd, London, England
pp. 283
Integration
Richard N. Taylor, University of California, Irvine
Nenad Medvidovic, University of California, Irvine
Kenneth M. Anderson, University of California, Irvine
E. James Whitehead Jr., University of California, Irvine
Jason E. Robbins, University of California, Irvine
pp. 295
George T. Heineman, Columbia University, New York, NY
Gail E. Kaiser, Columbia University, New York, NY
pp. 305
Bob Gautier, University of Wales Aberystwyth, UK
Chris Loftus, University of Wales Aberystwyth, UK
Edel Sherratt, University of Wales Aberystwyth, UK
Lynda Thomas, University of Wales Aberystwyth, UK
pp. 315
Panel: Tractability of Reverse Engineering
Bruce W. Weide, The Ohio State University, Columbus
Wayne D. Heym, The Ohio State University, Columbus
Joseph E. Hollingsworth, Indiana University Southeast, New Albany
pp. 327
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