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Software Engineering, International Conference on (1995)
Seattle, Washington, USA
Apr. 23, 1995 to Apr. 30, 1995
ISBN: 0-89791-708-1
TABLE OF CONTENTS
Requirements
Michael Jackson , AT&T Bell Laboratories and MAJ Consulting Ltd, London, England
Pamela Zave , AT&T Bell Laboratories, Murray Hill, NJ
pp. 15
Testing
Joseph R. Horgan , Bell Communications Research, Morristown, NJ
Saul London , Bell Communications Research, Morristown, NJ
W. Eric Wong , Bell Communications Research, Morristown, NJ
pp. 41
Duncan Clarke , University of Pennsylvania, Philadelphia, PA
Insup Lee , University of Pennsylvania, Philadelphia, PA
pp. 51
Antonia Bertolino , Istituto di Elaborazione della Informazione del CNR via S. Maria, Italy
Lorenzo Strigini , Istituto di Elaborazione della Informazione del CNR via S. Maria, Italy
pp. 61
Process I
Jonathan E. Cook , University of Colorado, Boulder
Alexander L. Wolf , University of Colorado, Boulder
pp. 73
Naser S. Barghouti , AT&T Bell Laboratories, Murray Hill, NJ
pp. 83
Reuse
Scott Henninger , University of Nebraska-Lincoln, NE
Kris Lappala , University of Nebraska-Lincoln, NE
Anand Raghavendran , University of Nebraska-Lincoln, NE
pp. 95
Susan Rosenbaum , Schlumberger Austin Systems Center, Austin, TX
pp. 105
Process II
Fabiano Cattaneo , Politecnico di Milano and CEFRIEL
Alfonso Fuggetta , Politecnico di Milano and CEFRIEL
Luigi Lavazza , Politecnico di Milano and CEFRIEL
pp. 115
Keishi Sakamoto , OMRON Corporation
Shinji Kusumoto , Osaka University
Toshifumi Tanaka , OMRON Corporation
Tohru Kikuno , Osaka University
pp. 123
Walc?lio Melo , University of Maryland, College Park
Carolyn Seaman , University of Maryland, College Park
Victor Basili , University of Maryland, College Park
pp. 133
Concurrency
Lori A. Clarke , University of Massachusetts, Amherst
Matthew B. Dwyer , University of Massachusetts, Amherst
pp. 147
John A. Chaves , AT&T Bell Laboratories, Naperville, IL
Lalita Jategaonkar Jagadeesan , AT&T Bell Laboratories, Naperville, IL
Peter Mataga , AT&T Bell Laboratories, Naperville, IL
Carlos Puchol , AT&T Bell Laboratories, Naperville, IL
Mark G. Staskauskas , AT&T Bell Laboratories, Naperville, IL
Mark A. Ardis , AT&T Bell Laboratories, Naperville, IL
pp. 159
Kyo C. Kang , Pohang University of Science and Technology, Korea
Kwang-Il Ko , Pohang University of Science and Technology, Korea
pp. 169
Architecture
David Garlan , Carnegie Mellon University, Pittsburgh, PA
Robert Allen , Carnegie Mellon University, Pittsburgh, PA
John Ockerbloom , Carnegie Mellon University, Pittsburgh, PA
pp. 179
Howard B. Reubenstein , GTE Laboratories, Waltham, MA
David R. Harris , The MITRE Corporation, Bedford, MA
pp. 186
Robert L. Nord , Siemens Corporate Research Inc., Princeton, NJ
Dilip Soni , Siemens Corporate Research Inc., Princeton, NJ
pp. 196
Development
Craig Chambers , University of Washington, Seattle
Jeffrey Dean , University of Washington, Seattle
David Grove , University of Washington, Seattle
pp. 221
Ryszard Janicki , McMaster University, Ontario, Canada
pp. 231
Process III
Barry Boehm , University of Southern California
Prasanta Bose , University of Southern California
Ellis Horowitz , University of Southern California
Ming June Lee , University of Southern California
pp. 243
Ulf Leonhardt , Imperial College, London, UK
Jeff Kramer , Imperial College, London, UK
Bashar Nuseibeh , Imperial College, London, UK
Anthony Finkelstein , City University, London, UK
pp. 255
E. Di Nitto , Politecnico di Milano, Italy
C. Ghezzi , Politecnico di Milano, Italy
G. Cugola , Politecnico di Milano, Italy
pp. 265
State-of-the-Art (Invited)
Lawrence G. Votta , AT&T Bell Laboratories, Naperville, Illinois
Adam Porter , University of Maryland, College Park
pp. 277
Keynote (Invited)
Michael Jackson , MAJ Consulting Ltd, London, England
pp. 283
Integration
Nenad Medvidovic , University of California, Irvine
Richard N. Taylor , University of California, Irvine
E. James Whitehead Jr. , University of California, Irvine
Jason E. Robbins , University of California, Irvine
pp. 295
George T. Heineman , Columbia University, New York, NY
Gail E. Kaiser , Columbia University, New York, NY
pp. 305
Chris Loftus , University of Wales Aberystwyth, UK
Bob Gautier , University of Wales Aberystwyth, UK
Lynda Thomas , University of Wales Aberystwyth, UK
pp. 315
Panel: Tractability of Reverse Engineering
Bruce W. Weide , The Ohio State University, Columbus
Wayne D. Heym , The Ohio State University, Columbus
Joseph E. Hollingsworth , Indiana University Southeast, New Albany
pp. 327
Alex Quilici , University of Hawaii at Manoa
pp. 333
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