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17th International Conference on Pattern Recognition (ICPR'04) - Volume 2
Jet Based Feature Classification
Cambridge UK
August 23-August 26
ISBN: 0-7695-2128-2
| ASCII Text | x | ||
| Martin Lillholm, Kim Steenstrup Pedersen, "Jet Based Feature Classification," Pattern Recognition, International Conference on, vol. 2, pp. 787-790, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004. | |||
| BibTex | x | ||
| @article{ 10.1109/ICPR.2004.1334376, author = {Martin Lillholm and Kim Steenstrup Pedersen}, title = {Jet Based Feature Classification}, journal ={Pattern Recognition, International Conference on}, volume = {2}, year = {2004}, issn = {1051-4651}, pages = {787-790}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2004.1334376}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Pattern Recognition, International Conference on TI - Jet Based Feature Classification SN - 1051-4651 SP787 EP790 A1 - Martin Lillholm, A1 - Kim Steenstrup Pedersen, PY - 2004 KW - null VL - 2 JA - Pattern Recognition, International Conference on ER - | |||
In this paper, we investigate to which extent the "raw" mapping of Taylor series coefficients into jet-space can be used as a "language" for describing local image structure in terms of geometrical image features. Based on empirical data from the van Hateren database, we discuss modelling of probability densities for different feature types, calculate feature posterior maps, and finally perform classification or simultaneous feature detection in a Bayesian framework. We introduce the Brownian image model as a generic background class and extend with empirically estimated densities for edges and blobs. We give examples of simultaneous feature detection across scale.
Citation:
Martin Lillholm, Kim Steenstrup Pedersen, "Jet Based Feature Classification," icpr, vol. 2, pp.787-790, 17th International Conference on Pattern Recognition (ICPR'04) - Volume 2, 2004
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