ISBN: 0-7695-1695-X

Long Quan, Hong Kong University of Science and Technology

Maxime Lhuillier, Hong Kong University of Science and Technology

Haris Baltzakis, Foundation for Research and Technology - Hellas and University of Crete

Antonis Argyros, Foundation for Research and Technology - Hellas

Panos Trahanias, Foundation for Research and Technology - Hellas and University of Crete

Alexandre R. J. François, University of Southern California

Gérard G. Medioni, University of Southern California

Roman Waupotitsch, Geometrix Inc.

Wolfgang Sepp, German Aerospace Center

Gerd Hirzinger, German Aerospace Center

Mirko Appel, Framatome ANP

Nassir Navab, Siemens Corporate Research

Mark Fiala, University of Alberta

Anup Basu, University of Alberta

Alceu de S. Britto Jr., Pontif?cia Universidade Cat?lica do Paran? and Universidade Estadual de Ponta Grossa

Robert Sabourin, ?cole de Technologie Sup?rieure and Centre for Pattern Recognition and Machine Intelligence

Flavio Bortolozzi, Pontif?cia Universidade Cat?lica do Paran?

Ching Y. Suen, Centre for Pattern Recognition and Machine Intelligence

Matthias Zimmermann, University of Bern

Horst Bunke, University of Bern

Louisa Lam, Concordia University and Hong Kong Institute of Education

Qizhi Xu, Concordia University

Ching Y. Suen, Concordia University

Cheng-Lin Liu, Hitachi Ltd.

Hiroshi Sako, Hitachi Ltd.

Hiromichi Fujisawa, Hitachi Ltd.

R. Paredes, Universidad Politécnica de Valencia

E. Vidal, Universidad Politécnica de Valencia

D. Keysers, Universidad Politécnica de Valencia

Chunhua Feng, École Polytechnique de Montréal

Anna Woch, École Polytechnique de Montréal

Réjean Plamondon, École Polytechnique de Montréal

Makoto Mizoguchi, Nagoya Institute of Technology

Jun Sato, Nagoya Institute of Technology

Hidetomo Sakaino, NTT Corporation

Chong-Wah Ngo, City University of Hong Kong

Ting-Chuen Pong, Hong Kong University of Science & Technology

Hong-Jiang Zhang, Microsoft Research Aisa

Naoyuki Ichimura, National Institute of Advanced Industrial Science and Technology

Gildas Lefaix, IRISA -INRIA Rennes

Éric Marchand, IRISA -INRIA Rennes

Patrick Bouthemy, IRISA -INRIA Rennes

Tsuyoshi Moriyama, Carnegie Mellon University

Takeo Kanade, Carnegie Mellon University

Jeffrey F. Cohn, Carnegie Mellon University and University of Pittsburgh

Jing Xiao, Carnegie Mellon University

Zara Ambadar, University of Pittsburgh

Jiang Gao, Carnegie Mellon University

Hiroki Imamura, Carnegie Mellon University

Ahmed Al-Ani, Queensland University of Technology

Mohamed Deriche, Queensland University of Technology

Ying Zhu, Princeton University

Stuart Schwartz, Princeton University

Teresa Barata, Instituto Superior Tecnico

Pedro Pina, Instituto Superior Tecnico

B. Caputo, University of Erlangen-Nuremberg

H. Niemann, University of Erlangen-Nuremberg

Susumu Kubota, Toshiba Corporation

Hiroyuki Mizutani, Toshiba Corporation

Yoshiaki Kurosawa, Toshiba Corporation

Charles Mathis, Xerox PARC

Thomas Breuel, Xerox PARC

Sung Chun Lee, University of Southern California

Soon Ki Jung, Kyungpook National University

Ram Nevatia, University of Southern California

Anthony Hoogs, GE Corporate Research and Development

Roderic Collins, GE Corporate Research and Development

Robert Kaucic, GE Corporate Research and Development

Mark R. Stevens, Charles River Analytics

Bruce Culbertson, Hewlett Packard Research Labs

Tom Malzbender, Hewlett Packard Research Labs

Shuntaro Yui, Kyushu University

Kenji Hara, University ofTokyo

Hongbin Zha, Peking University

Tsutomu Hasegawa, Kyushu University

Simon Collings, University of Western Australia

Ryszard Kozera, University of Western Australia

Lyle Noakes, University of Western Australia

N. Jhanwar, Indian Institute of Technology - Powai

S. Chaudhuri, Indian Institute of Technology - Powai

G. Seetharaman, University of Louisiana

B. Zavidovique, University of Paris XI

Douglas R. Heisterkamp, Oklahoma State University

ByoungChul Ko, Yonsei University

Hyeran Byun, Yonsei University

L. Cinque, Università di Roma

F. De Rosa, Università di Roma

F. Lecca, Università di Roma

S. Levialdi, Università di Roma

S. Tanimoto, University of Washington

Navid Serrano, Eastman Kodak Company

Andreas Savakis, Rochester Institute of Technology

Jiebo Luo, Eastman Kodak Company

Christopher M. Christoudias, Rutgers University

Bogdan Georgescu, Rutgers University

Peter Meer, Rutgers University

Hironobu Fujiyoshi, Chubu University

Takeo Kanade, Carnegie Mellon University

Guy Dvir, Tel-Aviv University

Hayit Greenspan, Tel-Aviv University

Yossi Rubner, Tel-Aviv University

V. Javier Traver, Universitat Jaume I

Filiberto Pla, Universitat Jaume I

Tanveer Syeda-Mahmood, IBM Almaden Research Center

Antonio Robles-Kelly, University of York

Edwin. R. Hancock, University of York

Adel Hlaoui, Universit? de Sherbrooke

Shengrui Wang, Universit? de Sherbrooke

Guillermo Peris, Universitat Jaume I

Andrés Marzal, Universitat Jaume I

R. A. Mollineda, Universidad Politécnica de Valencia

E. Vidal, Universidad Politécnica de Valencia

F. Casacuberta, Universidad Politécnica de Valencia

Xiaoyi Jiang, Technical University of Berlin

Horst Bunke, University of Bern

Karin Abegglen, University of Bern

Abraham Kandel, University of South Florida

A. Hadid, University of Oulu

M. Pietikäinen, University of Oulu

B. Martinkauppi, University of Oulu

Sarat C. Dass, Michigan State University

Anil K. Jain, Michigan State University

Xiaoguang Lu, Michigan State University

Vadim Mottl, Tula State University

Alexey Kostin, Tula State University

Josef Kittler, University of Surrey

Dihua Xi, Korea University

Seong-Whan Lee, Korea University

Kohsia S. Huang, University of California at San Diego

Mohan M. Trivedi, University of California at San Diego

Diego A. Socolinsky, Equinox Corporation

Andrea Selinger, Equinox Corporation

Xuewen Wang, Tsinghua University

Xiaoqing Ding, Tsinghua University

Changsong Liu, Tsinghua University

Datong Chen, IDIAP

Jean-Marc Odobez, IDIAP

Hervé Bourlard, IDIAP

Kris Popat, Palo Alto Research Center

Daniel H. Greene, Palo Alto Research Center

Tze-Lei Poo, Stanford University

Vincent Tam, University of Hong Kong

Ardi Santoso, University of Singapore

Rudy Setiono, University of Singapore

Haiping Lu, Nanyang Technological University

Jian Wang, Nanyang Technological University

Alex C. Kot, Nanyang Technological University

Yun Q. Shi, New Jersey Institute of Technology

Prateek Sarkar, Palo Alto Research Center

Miguel V. Correia, Universidade do Porto

Aurélio C. Campilho, Universidade do Porto

John Barron, University of Western Ontario

Reinhard Klette, University of Auckland

Eun-Young Kang, University of Southern California

Isaac Cohen, University of Southern California

Gérard Medioni, University of Southern California

Marco Zucchelli, Royal Institute of Technology

José Santos-Victor, Instituto Superior Técnico

Henrik I. Christensen, Royal Institute of Technology

Richard Mann, University of Waterloo

Michael S. Langer, McGill University

Zoran Duric, George Mason University

Fayin Li, George Mason University

Yan Sun, George Mason University

Harry Wechsler, George Mason University

Shi Shuming, Tsinghua University

Yang Guangwen, Tsinghua University

Wang Dingxing, Tsinghua University

Zheng Weimin, Tsinghua University

Ana L.N. Fred, Instituto Superior Técnico

Anil K. Jain, Michigan State University

Anil. K. Jain, Michigan State University

Xiaowei Xu, Michigan State University

Tin Kam Ho, Bell Laboratories, Lucent Technologies

Fan Xiao, Michigan State University

Oktay lbrahimov, Oakland University

lshwar Sethi, Oakland University

Nevenka Dimitrova, Philips Research

Rong Zhang, Carnegie Mellon University

Alexander I. Rudnicky, Carnegie Mellon University

Todd A. Stephenson, Dalle Molle Institute for Perceptual Artificial Intelligence and Swiss Federal Institute of Technology Lausanne

Mathew Magimai-Doss, Dalle Molle Institute for Perceptual Artificial Intelligence and Swiss Federal Institute of Technology Lausanne

Hervé Bourlard, Dalle Molle Institute for Perceptual Artificial Intelligence and Swiss Federal Institute of Technology Lausanne

Rui Ishiyama, NEC Corporation

Shizuo Sakamoto, NEC Corporation

Sujith Srinivasan, Ohio State University

Kim L. Boyer, Ohio State University

B. Gökberk, Boğaziçi University

L. Akarun, Boğaziçi University

E. Alpaydýn, Boğaziçi University

Qiang Ji, Rensselaer Polytechnic Institute

Xiaojie Yang, University of Nevada at Reno

Carlos H. Morimoto, IME/USP

Arnon Amir, IBM Almaden Research Center

Myron Flickner, IBM Almaden Research Center

Zhiwei Zhu, UNR

Qiang Ji, RPI

Kikuo Fujimura, Honda R & D Americas Inc.

Kuangchih Lee, UIUC

S. Tabbone, University of Nancy II

L. Wendling, University of Nancy II

François Mendels, Swiss Federal Institute of Technology

Pierre Vandergheynst, Swiss Federal Institute of Technology

Jean-Philippe Thiran, Swiss Federal Institute of Technology

David Coeurjolly, Université Lumiére Lyon 2

Reinhard Klette, University of Auckland

Alexander Kolesnikov, University of Joensuu

Pasi Fränti, University of Joensuu

Tomáš Suk, Academy of Sciences of the Czech Republic

Jan Flusser, Academy of Sciences of the Czech Republic

Li Yang, Western Michigan University

Mingxing Hu, Northern Jiaotong University

Baozong Yuan, Northern Jiaotong University

Takashi Noguchi, University of Tsukuba

Yuichi Ohta, University of Tsukuba

Caihua Wang, Softopia Japan & JST

Hideki Tanahashi, Softopia Japan & JST

Yutaka Sato, Softopia Japan & JST

Hidekazu Hirayu, Softopia Japan & JST

Yoshinori Niwa, Softopia Japan & JST

Kazuhiko Yamamoto, Gifu University

Yuji Iwahori, Nagoya Institute of Technology

Yumi Watanabe, Nagoya Institute of Technology

Robert J. Woodham, University of British Columbia

Akira Iwata, Nagoya Institute of Technology

Jiří Matas

Štěpán Obdržálek

Ondřej Chum

Louis-Philippe Morency, Massachusetts Institute of Technology

Trevor Darrell, Massachusetts Institute of Technology

Daniel Toth, University of Luebeck

Alexandru Condurache, University of Luebeck

Til Aach, University of Luebeck

Chiraz BenAbdelkader, University of Maryland at College Park

Ross Cutler, Microsoft Research

Larry Davis, University of Maryland at College Park

Yoshiaki Sugie, Waseda University

Tetsunori Kobayashi, Waseda University

Dit-Yan Yeung, Hong Kong University of Science and Technology

Calvin Chow, Hong Kong University of Science and Technology

Fubito Toyama, Utsunomiya University

Yukihiro Fujiki, Utsunomiya University

Kenji Shoji, Utsunomiya University

Juichi Miyamichi, Utsunomiya University

B. Romaniuk, GREYC-CNRS

M. Desvignes, GREYC-CNRS

M. Revenu, GREYC-CNRS

M. J. Deshayes, GREYC-CNRS