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15th International Conference on Pattern Recognition (ICPR'00) - Volume 3
An Approach for Determining Phong Reflectance Parameters from Real Objects
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
| ASCII Text | x | ||
| Javier Iglesia Aparicio, Jaime Gómez García-Bermejo, "An Approach for Determining Phong Reflectance Parameters from Real Objects," Pattern Recognition, International Conference on, vol. 3, pp. 3572, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000. | |||
| BibTex | x | ||
| @article{ 10.1109/ICPR.2000.903609, author = {Javier Iglesia Aparicio and Jaime Gómez García-Bermejo}, title = {An Approach for Determining Phong Reflectance Parameters from Real Objects}, journal ={Pattern Recognition, International Conference on}, volume = {3}, year = {2000}, isbn = {0-7695-0750-6}, pages = {3572}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.903609}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Pattern Recognition, International Conference on TI - An Approach for Determining Phong Reflectance Parameters from Real Objects SN - 0-7695-0750-6 SP EP A1 - Javier Iglesia Aparicio, A1 - Jaime Gómez García-Bermejo, PY - 2000 VL - 3 JA - Pattern Recognition, International Conference on ER - | |||
Modeling reflectance properties from real objects is useful for solving many practical problems, ranging from industrial inspection to computer graphics. In particular, building computer graphics models directly from real objects has recently received increased attention, because it is useful in many important fields such as CAD, entertainment (3-D games, movies) and virtual museums. This paper describes an automatic way to recover actual reflectance parameters, from range and intensity (or color) data acquired from objects. The proposed approach is based on Phong reflection model, since this model is usually preferred for computer graphics.
Citation:
Javier Iglesia Aparicio, Jaime Gómez García-Bermejo, "An Approach for Determining Phong Reflectance Parameters from Real Objects," icpr, vol. 3, pp.3572, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000
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