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15th International Conference on Pattern Recognition (ICPR'00) - Volume 3
An Approach for Determining Phong Reflectance Parameters from Real Objects
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
Javier Iglesia Aparicio, University of Valladolid
Jaime Gómez García-Bermejo, University of Valladolid
Modeling reflectance properties from real objects is useful for solving many practical problems, ranging from industrial inspection to computer graphics. In particular, building computer graphics models directly from real objects has recently received increased attention, because it is useful in many important fields such as CAD, entertainment (3-D games, movies) and virtual museums. This paper describes an automatic way to recover actual reflectance parameters, from range and intensity (or color) data acquired from objects. The proposed approach is based on Phong reflection model, since this model is usually preferred for computer graphics.
Citation:
Javier Iglesia Aparicio, Jaime Gómez García-Bermejo, "An Approach for Determining Phong Reflectance Parameters from Real Objects," icpr, vol. 3, pp.3572, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000
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