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15th International Conference on Pattern Recognition (ICPR'00) - Volume 3
An Evaluation of Ridge Extraction Methods for Portal Imaging
Barcelona, Spain
September 03-September 08
ISBN: 0-7695-0750-6
| ASCII Text | x | ||
| J. Stoeckel, F.M. Vos, P.H. Vos, A.M. Vossepoel, "An Evaluation of Ridge Extraction Methods for Portal Imaging," Pattern Recognition, International Conference on, vol. 3, pp. 3433, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000. | |||
| BibTex | x | ||
| @article{ 10.1109/ICPR.2000.903576, author = {J. Stoeckel and F.M. Vos and P.H. Vos and A.M. Vossepoel}, title = {An Evaluation of Ridge Extraction Methods for Portal Imaging}, journal ={Pattern Recognition, International Conference on}, volume = {3}, year = {2000}, isbn = {0-7695-0750-6}, pages = {3433}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICPR.2000.903576}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Pattern Recognition, International Conference on TI - An Evaluation of Ridge Extraction Methods for Portal Imaging SN - 0-7695-0750-6 SP EP A1 - J. Stoeckel, A1 - F.M. Vos, A1 - P.H. Vos, A1 - A.M. Vossepoel, PY - 2000 VL - 3 JA - Pattern Recognition, International Conference on ER - | |||
In this paper an existing ridge detector based on the Hessian tensor and a new one based on the structure tensor are evaluated for use in portal/simulator imaging. Tensor smoothing is introduced as a scaling parameter. By changing this scale, (as opposed to the image scale) the detectors can be tuned to suppress spurious ridges without moving them. Desirable ridge detector properties for portal/simulator imaging are described and the ridge definitions are tested accordingly. Experiments show our new ridge detector to outperform the existing one in simulator/portal image matching.
Citation:
J. Stoeckel, F.M. Vos, P.H. Vos, A.M. Vossepoel, "An Evaluation of Ridge Extraction Methods for Portal Imaging," icpr, vol. 3, pp.3433, 15th International Conference on Pattern Recognition (ICPR'00) - Volume 3, 2000
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