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- ICIP
- 1997
- 1997 International Conference on Image Processing (ICIP'97) - Volume 3
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1997 International Conference on Image Processing (ICIP'97) - Volume 3
Washington, DC
October 26-October 29
ISBN: 0-8186-8183-7
Table of Contents
 | WA01: Image Technology for WWW Oral |
S. Low, University of Melbourne
pp. 13
 | WA02: Color Image Processing Oral |
H.J. Trussell, Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
M.J. Vrhel, Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
pp. 710
L. Akarun, Dept. of Comput. Eng., Bogazici Univ., Istanbul, Turkey
D. Ozdemir, Dept. of Comput. Eng., Bogazici Univ., Istanbul, Turkey
E. Alpaydin, Dept. of Comput. Eng., Bogazici Univ., Istanbul, Turkey
pp. 46
 | WA03: Image Segmentation II Oral |
Xinquan Shen, Sch. of Electron. & Electr. Eng., Birmingham Univ., UK
M. Spann, Sch. of Electron. & Electr. Eng., Birmingham Univ., UK
pp. 50
R. Morris, Inst. Nat. de Recherche en Inf. et Autom., Sophia Antipolis, France
X. Descombes, Inst. Nat. de Recherche en Inf. et Autom., Sophia Antipolis, France
J. Zerubia, Inst. Nat. de Recherche en Inf. et Autom., Sophia Antipolis, France
pp. 54
J. Luo, Image Res. & Adv. Dev., Eastman Kodak Co., Rochester, NY, USA
R.T. Gray, Image Res. & Adv. Dev., Eastman Kodak Co., Rochester, NY, USA
Hsien-Che Lee, Image Res. & Adv. Dev., Eastman Kodak Co., Rochester, NY, USA
pp. 58
R.R. Schultz, Dept. of Electr. Eng., North Dakota Univ., Grand Forks, ND, USA
R.L. Stevenson, Dept. of Electr. Eng., North Dakota Univ., Grand Forks, ND, USA
pp. 62
M.G. Ramos, Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
S.S. Hemami, Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
M.A. Tamburro, Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
pp. 66
 | WA04: Image Coding II Oral |
Syed A. Rizvi, College of Staten Island of City University of New York
pp. 102
Hongzhi Li, University of Missouri-Columbia, Columbia, MO 65211
pp. 106
F. Golchin, Sch. of Microelectron. Eng., Griffith Univ., Brisbane, Qld., Australia
K.K. Paliwal, Sch. of Microelectron. Eng., Griffith Univ., Brisbane, Qld., Australia
pp. 110
P. Nunes, Inst. Superior Tecnico, Lisbon, Portugal
F. Pereira, Inst. Superior Tecnico, Lisbon, Portugal
F. Marques, Inst. Superior Tecnico, Lisbon, Portugal
pp. 114
 | WA05: Image Recognition Poster |
K. Wiltschi, Inst. for Comput. Graphics & Vision, Tech. Univ. Graz, Austria
T. Lindeberg, Inst. for Comput. Graphics & Vision, Tech. Univ. Graz, Austria
A. Pinz, Inst. for Comput. Graphics & Vision, Tech. Univ. Graz, Austria
pp. 122
Yuntao Cui, Siemens Corp. Res. Inc., Princeton, NJ, USA
Qian Huang, Siemens Corp. Res. Inc., Princeton, NJ, USA
pp. 126
D. Kundur, Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
D. Hatzinakos, Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
H. Leung, Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
pp. 130
H.B.D. Sorensen, Dept. of Appl. Electron., Tech. Univ. Denmark, Lyngby, Denmark
K.B. Jakobsen, Dept. of Appl. Electron., Tech. Univ. Denmark, Lyngby, Denmark
O. Nymann, Dept. of Appl. Electron., Tech. Univ. Denmark, Lyngby, Denmark
pp. 142
A. Abu-Naser, Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
N.P. Galatsanos, Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
M.N. Wernick, Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
pp. 158
Zhiqian Wang, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
J. Ben-Arie, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
pp. 162
J. Posl, Lehrstuhl fur Mustererkennung, Erlangen-Nurnberg Univ., Germany
H. Niemann, Lehrstuhl fur Mustererkennung, Erlangen-Nurnberg Univ., Germany
pp. 170
 | WA06: Image Texture Analysis Poster |
A. Teuner, Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany
O. Pichler, Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany
J.E. Santos Conde, Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany
B.J. Hosticka, Fraunhofer Inst. of Microelectron. Circuits & Syst., Duisburg, Germany
pp. 174
J.-R. Ohm, Image Process. Dept., Heinrich-Hertz-Inst., Germany
Phuong Ma, Image Process. Dept., Heinrich-Hertz-Inst., Germany
pp. 178
H. Igehy, Dept. of Comput. Sci., Stanford Univ., CA, USA
L. Pereira, Dept. of Comput. Sci., Stanford Univ., CA, USA
pp. 186
G. Lambert, Inst. of Control Eng., Darmstadt Univ. of Technol., Germany
F. Bock, Inst. of Control Eng., Darmstadt Univ. of Technol., Germany
pp. 201
Bin Tian, Thomas H. Vonder Haar, and Donald Reinke
pp. 209
R.M. Rangayyan, Dept. of Electr. & Comput. Eng., Calgary Univ., Alta., Canada
A.C.G. Martins, Dept. of Electr. & Comput. Eng., Calgary Univ., Alta., Canada
pp. 217
 | WA07: Stereo/Registration Poster |
Jianhua Xuan, Wendelin Hayes, Matthew T. Freedman, and Seong K. Mun
Yue Wang, Wendelin Hayes, Matthew T. Freedman, and Seong K. Mun
Tulay Adali, Wendelin Hayes, Matthew T. Freedman, and Seong K. Mun
Qinfen Zheng, Wendelin Hayes, Matthew T. Freedman, and Seong K. Mun
pp. 236
A. El Zaart, Dept. de Math. et d'Inf., Sherbrooke Univ., Que., Canada
D. Ziou, Dept. de Math. et d'Inf., Sherbrooke Univ., Que., Canada
F. Dubeau, Dept. de Math. et d'Inf., Sherbrooke Univ., Que., Canada
pp. 244
C.L. Pagliari, Dept. of Electron. Syst. Eng., Essex Univ., Colchester, UK
T.J. Dennis, Dept. of Electron. Syst. Eng., Essex Univ., Colchester, UK
pp. 256
Bin Tian, Signal/Image Processing Laboratory
pp. 260
I. Bloch, Dept. Images, Ecole Nat. Superieure des Telecommun., Paris, France
L. Aurdal, Dept. Images, Ecole Nat. Superieure des Telecommun., Paris, France
D. Bijno, Dept. Images, Ecole Nat. Superieure des Telecommun., Paris, France
J. Muller, Dept. Images, Ecole Nat. Superieure des Telecommun., Paris, France
pp. 268
Z.-P. Liang, Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
H. Pan, Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
R.L. Magin, Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
N. Ahuja, Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
T.S. Huang, Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
pp. 272
A. Marugame, C&C Media Res. Labs., NEC Corp., Kawasaki, Japan
M. Ohta, C&C Media Res. Labs., NEC Corp., Kawasaki, Japan
pp. 276
Oliver Rockinger, Systems Technology Research, Intelligent Systems Group Daimler Benz AG
pp. 288
 | WA08: Character, Pattern, and Face Poster Recognition |
N. Boujemaa, Lab. d'Inf., Ecole d'Ingenieurs en Inf. pour l'Ind., Tours, France
G. Roux, Lab. d'Inf., Ecole d'Ingenieurs en Inf. pour l'Ind., Tours, France
B. Vattolo, Lab. d'Inf., Ecole d'Ingenieurs en Inf. pour l'Ind., Tours, France
pp. 296
T. Kurita, Div. of Inf. Sci., Electrotech. Lab., Ibaraki, Japan
Y. Kobayashi, Div. of Inf. Sci., Electrotech. Lab., Ibaraki, Japan
T. Mishima, Div. of Inf. Sci., Electrotech. Lab., Ibaraki, Japan
pp. 722
M. Kampmann, Inst. fur Theor. Nachrichtentech. und Inf., Hannover Univ., Germany
pp. 300
L. Wiskott, Inst. fur Neuroinf., Ruhr-Univ., Bochum, Germany
pp. 308
M.J. Turmon, Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
S. Mukhtar, Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
pp. 320
Chorkin Chan, Dept. of Comput. Sci., Hong Kong Univ., Hong Kong
pp. 324
Takaaki Baba, Computer Systems Laboratory, Stanford University()
Tatsuo Otsuki, Computer Systems Laboratory, Stanford University()
pp. 336
Kuntal Sengupta, ATR Media Integration and Communications Research Laboratories
Jun Ohya, ATR Media Integration and Communications Research Laboratories
pp. 340
 | WA09: Optical Flow and Diffusion Poster |
Hairong Qi, Center for Adv. Comput. & Commun., North Carolina State Univ., Raleigh, NC, USA
W.E. Snyder, Center for Adv. Comput. & Commun., North Carolina State Univ., Raleigh, NC, USA
G.L. Bilbro, Center for Adv. Comput. & Commun., North Carolina State Univ., Raleigh, NC, USA
pp. 352
R. Kimmel, University of California, Berkeley
N. Sochen, University of California, Berkeley
pp. 368
 | WP01: PDE and Image Diffusion Oral |
V. Caselles, Dept. de Math., Univ. de les Illes Balears, Palma de Mallorca, Spain
J.-M. Morel, Dept. de Math., Univ. de les Illes Balears, Palma de Mallorca, Spain
C. Sbert, Dept. de Math., Univ. de les Illes Balears, Palma de Mallorca, Spain
pp. 376
P. Blomgren, Dept. of Math., California Univ., Los Angeles, CA, USA
T.F. Chan, Dept. of Math., California Univ., Los Angeles, CA, USA
P. Mulet, Dept. of Math., California Univ., Los Angeles, CA, USA
C.K. Wong, Dept. of Math., California Univ., Los Angeles, CA, USA
pp. 384
 | WP02: Fuzzy and Neural Image Oral Processing |
S. Kollias, Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Greece
N. Doulamis, Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Greece
A. Doulamis, Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Greece
pp. 424
 | WP03: Video Coding IV Oral |
A. Fuldseth, Dept. of Telecommun., Norwegian Univ. of Sci. & Technol., Trondheim, Norway
T.A. Ramstad, Dept. of Telecommun., Norwegian Univ. of Sci. & Technol., Trondheim, Norway
pp. 428
A. Polzer, Rheinische Friedrich-Wilhelms-Univ., Bonn, Germany
H. Klock, Rheinische Friedrich-Wilhelms-Univ., Bonn, Germany
J.M. Buhrmann, Rheinische Friedrich-Wilhelms-Univ., Bonn, Germany
pp. 436
Y. Yemez, Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
B. Sankur, Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
E. Anarim, Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
pp. 444
S.S. Pradhan, Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
K. Ramchandran, Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
pp. 452
Gi Hun Lee, Dept. of Electronic Engineering, Sogang University
Joon Ho Song, Dept. of Electronic Engineering, Sogang University
Rae-Hong Park, Dept. of Electronic Engineering, Sogang University
pp. 456
F.-H. Lin, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
W. Gass, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
R.M. Mersereau, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 460
 | WP04: Target Tracking Oral |
R. Meth, Center for Autom. Res., Maryland Univ., College Park, MD, USA
R. Chellappa, Center for Autom. Res., Maryland Univ., College Park, MD, USA
pp. 464
Q.A. Holmes, Environ. Res. Inst. of Michigan, Ann Arbor, MI, USA
X. Zhang, Environ. Res. Inst. of Michigan, Ann Arbor, MI, USA
D. Zhao, Environ. Res. Inst. of Michigan, Ann Arbor, MI, USA
pp. 468
A.O. Hero, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
C. Guillouet, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
pp. 472
S.M. Sowelam, Gen. Electr. Corp. Res. & Dev. Center, Niskayuna, NY, USA
A.H. Tewfik, Gen. Electr. Corp. Res. & Dev. Center, Niskayuna, NY, USA
pp. 476
S.N. Ngoc, Eur. Molecular Biol. Lab., Heidelberg, Germany
C. Boulin, Eur. Molecular Biol. Lab., Heidelberg, Germany
J.-C. Olivo, Eur. Molecular Biol. Lab., Heidelberg, Germany
pp. 484
Y.-H. Gu, Dept. of Appl. Electron., Chalmers Univ. of Technol., Goteborg, Sweden
V. Gui, Dept. of Appl. Electron., Chalmers Univ. of Technol., Goteborg, Sweden
T. Tjahjadi, Dept. of Appl. Electron., Chalmers Univ. of Technol., Goteborg, Sweden
pp. 492
 | WP05: Medical Image Analysis II Poster |
Y. Watanabe, Kanazawa Inst. of Technol., Ishikawa, Japan
M. Nakazawa, Kanazawa Inst. of Technol., Ishikawa, Japan
pp. 496
L. Li, Dept. of Radiol., Univ. of South Florida, Tampa, FL, USA
F. Mao, Dept. of Radiol., Univ. of South Florida, Tampa, FL, USA
W. Qian, Dept. of Radiol., Univ. of South Florida, Tampa, FL, USA
L.P. Clarke, Dept. of Radiol., Univ. of South Florida, Tampa, FL, USA
pp. 500
R.C. Chan, Healt Sci. & Tech., MIT, Cambridge, MA, USA
W.C. Karl, Healt Sci. & Tech., MIT, Cambridge, MA, USA
R.S. Lees, Healt Sci. & Tech., MIT, Cambridge, MA, USA
pp. 508
C. Pattichis, Div. of Comput. Sci., Nat. Tech. Univ. of Athens, Greece
S. Kollias, Div. of Comput. Sci., Nat. Tech. Univ. of Athens, Greece
pp. 512
M.S. Brown, Sch. of Med., California Univ., Los Angeles, CA, USA
J.G. Goldin, Sch. of Med., California Univ., Los Angeles, CA, USA
D.R. Aberle, Sch. of Med., California Univ., Los Angeles, CA, USA
pp. 516
H. Jiang, Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan
W. Tiu, Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan
S. Yamamoto, Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan
S.-I. Iisaku, Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan
pp. 520
C.-M. Chang, Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
A. Laine, Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
pp. 524
Y. Kawata, Fac. of Eng., Tokushima Univ., Japan
N. Niki, Fac. of Eng., Tokushima Univ., Japan
K. Eguchi, Fac. of Eng., Tokushima Univ., Japan
M. Kaneko, Fac. of Eng., Tokushima Univ., Japan
pp. 528
K. Mino, Dept. of Opt. Sci., Tokushima Univ., Japan
N. Niki, Dept. of Opt. Sci., Tokushima Univ., Japan
N. Nakasato, Dept. of Opt. Sci., Tokushima Univ., Japan
pp. 531
S. Markovic, Fac. of Electr. Eng., Belgrade Univ., Serbia
M. Popovic, Fac. of Electr. Eng., Belgrade Univ., Serbia
pp. 547
M. Kubo, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
T. Tozaki, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
N. Niki, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
S. Nakagawa, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
K. Eguchi, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
M. Kaneko, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
H. Omatsu, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
N. Moriyama, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
N. Yamaguchi, Nat. Cancer Center Res. Inst., Tokushima Univ., Japan
pp. 551
 | WP06: Image/Video Transmission Poster |
J. He, Dept. of Electr. Eng., Notre Dame Univ., IN, USA
Y.-F. Huang, Dept. of Electr. Eng., Notre Dame Univ., IN, USA
pp. 559
W.S. Lee, Sch. of Electr. Eng., Australian Defence Force Acad., Canberra, ACT, Australia
M.R. Frater, Sch. of Electr. Eng., Australian Defence Force Acad., Canberra, ACT, Australia
M.R. Pickering, Sch. of Electr. Eng., Australian Defence Force Acad., Canberra, ACT, Australia
J.F. Arnold, Sch. of Electr. Eng., Australian Defence Force Acad., Canberra, ACT, Australia
pp. 563
M. Boliek, RICOH California Res. Center, Menlo Park, CA, USA
M.J. Gormish, RICOH California Res. Center, Menlo Park, CA, USA
A. Keith, RICOH California Res. Center, Menlo Park, CA, USA
pp. 567
S. Bilato, Dipt. di Elettronica e Inf., Padova Univ., Italy
G. Calvagno, Dipt. di Elettronica e Inf., Padova Univ., Italy
G.A. Mian, Dipt. di Elettronica e Inf., Padova Univ., Italy
R. Rinaldo, Dipt. di Elettronica e Inf., Padova Univ., Italy
pp. 571
Young Huh, Power Telecommun. Team, KERI, Kyungnam, South Korea
K. Panusopone, Power Telecommun. Team, KERI, Kyungnam, South Korea
K.R. Rao, Power Telecommun. Team, KERI, Kyungnam, South Korea
pp. 575
W.S. Lee, Australian Defence Force Acad., Canberra, ACT, Australia
M.R. Frater, Australian Defence Force Acad., Canberra, ACT, Australia
M.R. Pickering, Australian Defence Force Acad., Canberra, ACT, Australia
J.F. Arnold, Australian Defence Force Acad., Canberra, ACT, Australia
pp. 582
Joon Ho Song, Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
Gi Hun Lee, Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
Rae-Hong Park, Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea
pp. 590
 | WP07: Motion Compensation Poster |
Lai-Man Po, CityU Image Process. Lab., City Univ. of Hong Kong, Hong Kong
pp. 606
Jie-Bin Xu, CityU Image Process. Lab., City Univ. of Hong Kong, Hong Kong
Lai-Man Po, CityU Image Process. Lab., City Univ. of Hong Kong, Hong Kong
pp. 610
Jie Wei, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Ze-Nian Li, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
pp. 614
Dong-Il Chang, Lab. of Image Commun., Seoul Nat. Univ., South Korea
Joonhyun Sung, Lab. of Image Commun., Seoul Nat. Univ., South Korea
pp. 618
Bo Tao, Dept. of Electr. Eng., Princeton Univ., NJ, USA
M.T. Orchard, Dept. of Electr. Eng., Princeton Univ., NJ, USA
pp. 626
C.D. Creusere, Naval Air Warfare Centre Weapons Div., China Lake, CA, USA
pp. 634
Jiajun Zhang, Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada
M.O. Ahmad, Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada
M.N.S. Swamy, Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada
pp. 642
Pohsiang Hsu, Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
K.J.R. Liu, Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
T. Chen, Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
pp. 646
P. Ishwar, Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
P. Moulin, Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
pp. 650
 | WP08: Image Coding III Poster |
J. Andrew, Canon Inf. Syst. Res., North Ryde, NSW, Australia
pp. 658
N. Memon, Dept. of Comput. Sci., Northern Illinois Univ., DeKalb, IL, USA
N. Moayeri, Dept. of Comput. Sci., Northern Illinois Univ., DeKalb, IL, USA
pp. 662
J.-L. Dugelay, Dept. of Multimedia Commun., Inst. EURECOM, Sophia Antipolis, France
A. Gersho, Dept. of Multimedia Commun., Inst. EURECOM, Sophia Antipolis, France
pp. 726
K. Schroder, Lehrstuhl fur Nachrichtentechnik, Dortmund Univ., Germany
pp. 666
J.A. Bloom, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
T.R. Reed, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
pp. 670
Wen Jiang, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong
Xiaolin Wu, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong
Wai Yin Ng, Dept. of Inf. Eng., Chinese Univ. of Hong Kong, Shatin, Hong Kong
pp. 678
A. Tremeau, Equipe Ingenierie de la Vision, Univ. Jean Monnet, Saint-Etienne, France
C. Charrier, Equipe Ingenierie de la Vision, Univ. Jean Monnet, Saint-Etienne, France
H. Cherifi, Equipe Ingenierie de la Vision, Univ. Jean Monnet, Saint-Etienne, France
pp. 682
T.J. Klausutis, Centre for Signal & Image Process., Georgia Inst. of Technol., Atlanta, GA, USA
V.K. Madisetti, Centre for Signal & Image Process., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 686
O.E. Kia, Lab. of Inf. Technol., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
D.S. Doermann, Lab. of Inf. Technol., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
pp. 690
J.R. Smith, IBM Thomas J. Watson Res. Center, Hawthorne, NY, USA
Shih-Fu Chang, IBM Thomas J. Watson Res. Center, Hawthorne, NY, USA
pp. 702
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