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Image Processing, International Conference on (1995)
Washington D.C.
Oct. 23, 1995 to Oct. 26, 1995
ISBN: 0-8186-7310-9
TABLE OF CONTENTS
E. Cordonnier , CERIUM Fac. of Med., Rennes I Univ., France
M. Eichelberg , CERIUM Fac. of Med., Rennes I Univ., France
J. Piqueras , CERIUM Fac. of Med., Rennes I Univ., France
C. Treguier , CERIUM Fac. of Med., Rennes I Univ., France
J.-F. Heautot , CERIUM Fac. of Med., Rennes I Univ., France
pp. 2001
R.M. Gray , Dept. of Electr. Eng., Stanford Univ., CA, USA
R.A. Olshen , Dept. of Electr. Eng., Stanford Univ., CA, USA
D. Ikeda , Dept. of Electr. Eng., Stanford Univ., CA, USA
P.C. Cosman , Dept. of Electr. Eng., Stanford Univ., CA, USA
S. Perlmutter , Dept. of Electr. Eng., Stanford Univ., CA, USA
C. Nash , Dept. of Electr. Eng., Stanford Univ., CA, USA
K. Perlmutter , Dept. of Electr. Eng., Stanford Univ., CA, USA
pp. 2005
S.-C.B. Lo , ISIS Centre, Georgetown Univ., Washington, DC, USA
Huai Li , ISIS Centre, Georgetown Univ., Washington, DC, USA
B.H. Krasner , ISIS Centre, Georgetown Univ., Washington, DC, USA
M.T. Freedman , ISIS Centre, Georgetown Univ., Washington, DC, USA
S.K. Mun , ISIS Centre, Georgetown Univ., Washington, DC, USA
pp. 2009
B.J. Sullivan , Ameritech, Hoffman Estates, IL, USA
R. Ansari , Ameritech, Hoffman Estates, IL, USA
M.L. Giger , Ameritech, Hoffman Estates, IL, USA
H. MacMahon , Ameritech, Hoffman Estates, IL, USA
pp. 2013
M.T. Orchard , Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
A. Nosratinia , Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
R. Rajagopalan , Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
pp. 2017
H.S. Wong , Dept. of Electr. Eng., Sydney Univ., NSW, Australia
L. Guan , Dept. of Electr. Eng., Sydney Univ., NSW, Australia
H. Hong , Dept. of Electr. Eng., Sydney Univ., NSW, Australia
pp. 2021
P.L. Combettes , Dept. of Electr. Eng., City Univ. of New York, NY, USA
pp. 2025
P.J.S.G. Ferreira , Dept. de Electron. e Telecoms, Aveiro Univ., Portugal
pp. 2029
M. Muneyasu , Fac. of Eng., Hiroshima Univ., Japan
K. Yamamoto , Fac. of Eng., Hiroshima Univ., Japan
T. Hinamoto , Fac. of Eng., Hiroshima Univ., Japan
pp. 2033
H. Ahn , Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
A.E. Yagle , Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
pp. 2037
M.K. Ng , Comput. Sci. Lab., Australian Nat. Univ., Canberra, ACT, Australia
pp. 2041
P.K. Nanda , Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, India
K. Sunil Kumar , Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, India
S. Ghokale , Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, India
U.B. Desai , Dept. of Electr. Eng., Indian Inst. of Technol., Bombay, India
pp. 2045
P. Richardson , Dept. of Electr. & Comput. Syst. Eng., Monash Univ., Clayton, Vic., Australia
D. Suter , Dept. of Electr. & Comput. Syst. Eng., Monash Univ., Clayton, Vic., Australia
pp. 2049
F. Alajaji , Dept. of Math. & Stat., Queen's Univ., Kingston, Ont., Canada
P. Burlina , Dept. of Math. & Stat., Queen's Univ., Kingston, Ont., Canada
pp. 2053
H. Aydinoglu , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
F. Kossentini , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Qin Jiang , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
M.H. Hayes, III , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 2057
M. Effros , Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
P.A. Chou , Dept. of Electr. Eng., California Inst. of Technol., Pasadena, CA, USA
pp. 2061
T.P. O'Rourke , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
R.L. Stevenson , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
Yih-Fang Huang , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
D.J. Costello, Jr. , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
pp. 2065
S.J.P. Westen , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
R.L. Lagendijk , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
J. Biemond , Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
pp. 2069
Chia-Yuan Teng , Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
D.L. Neuhoff , Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
pp. 2073
M.J. Ruf , Inst. for Commun. Technol., German Aerosp. Res. Establ., Wessling, Germany
J.W. Modestino , Inst. for Commun. Technol., German Aerosp. Res. Establ., Wessling, Germany
pp. 2077
R.A. Vander Kam , Dept. of Electr. Eng., Stanford Univ., CA, USA
Ping Wah Wong , Dept. of Electr. Eng., Stanford Univ., CA, USA
R.M. Gray , Dept. of Electr. Eng., Stanford Univ., CA, USA
pp. 2081
B. Belzer , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
J.D. Villasenor , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
B. Girod , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 2085
P. Liu , Sch. of Appl. Sci., Nanyang Technol. Univ., Singapore
M.N. Chong , Sch. of Appl. Sci., Nanyang Technol. Univ., Singapore
W.B. Goh , Sch. of Appl. Sci., Nanyang Technol. Univ., Singapore
pp. 2089
K.D. Sauer , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
S. Borman , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
C.A. Bouman , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
pp. 2093
R.W. Hall , Dept. of Electr. Eng., Pittsburgh Univ., PA, USA
Chih-Yuan Hu , Dept. of Electr. Eng., Pittsburgh Univ., PA, USA
pp. 2097
A. Moga , Signal Process. Lab., Tampere Univ. of Technol., Finland
B. Cramariuc , Signal Process. Lab., Tampere Univ. of Technol., Finland
M. Gabbouj , Signal Process. Lab., Tampere Univ. of Technol., Finland
pp. 2101
A. Ferreira , LIP, CNRS, Lyon, France
S. Ubeda , LIP, CNRS, Lyon, France
pp. 2105
N. Steffensen , Motorola Inc., Phoenix, AZ, USA
N. Bourbakis , Motorola Inc., Phoenix, AZ, USA
pp. 2109
B. Olstad , Div. of Comput. Syst. & Telematics, Norwegian Inst. of Technol., Trondheim, Norway
E. Steen , Div. of Comput. Syst. & Telematics, Norwegian Inst. of Technol., Trondheim, Norway
A. Halaas , Div. of Comput. Syst. & Telematics, Norwegian Inst. of Technol., Trondheim, Norway
pp. 2113
Kyung Sub Joo , Dept. of Electr. Eng., Colorado Univ., Denver, CO, USA
T. Bose , Dept. of Electr. Eng., Colorado Univ., Denver, CO, USA
pp. 2117
KyungHi Chang , Electron. & Telecommun. Res. Inst., Taejon, South Korea
XuDuan Lin , Electron. & Telecommun. Res. Inst., Taejon, South Korea
pp. 2121
R. Oten , Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
R.J.P. de Figueiredo , Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
pp. 2125
Yiu-Fai Wong , Div. of Eng., Texas Univ., San Antonio, TX, USA
E. Viscito , Div. of Eng., Texas Univ., San Antonio, TX, USA
E. Linzer , Div. of Eng., Texas Univ., San Antonio, TX, USA
pp. 2129
Young-Ho Lee , Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
M. Kawamata , Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
T. Higuchi , Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan
pp. 2133
J. Caeiro , INESC, Lisbon, Portugal
M. Piedade , INESC, Lisbon, Portugal
pp. 2137
Jinyou Zhang , Fachbereich Inf., Bremen Univ., Germany
pp. 2141
Yuping Wang , Sch. of Electron. & Inf. Eng., Xi'an Jiaotong Univ., China
Yuanlong Cai , Sch. of Electron. & Inf. Eng., Xi'an Jiaotong Univ., China
pp. 2145
M. Das , Dept. of Electr. & Syst. Eng., Oakland Univ., Rochester, MI, USA
J. Anand , Dept. of Electr. & Syst. Eng., Oakland Univ., Rochester, MI, USA
pp. 2149
Zhiqian Wang , Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
K. Raghunath Rao , Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
J. Ben-Arie , Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
pp. 2153
N. Nikolaidis , Dept. of Electr. Comput. Eng., Thessaloniki Univ., Greece
I. Pitas , Dept. of Electr. Comput. Eng., Thessaloniki Univ., Greece
pp. 2157
Hui Li , HNC Software Inc., San Diego, CA, USA
Yi-Tong Zhou , HNC Software Inc., San Diego, CA, USA
pp. 2161
S.S. Ganugapati , Fac. of Eng. & Appl. Sci., Memorial Univ. of Newfoundland, St. John's, Nfld., Canada
C.R. Moloney , Fac. of Eng. & Appl. Sci., Memorial Univ. of Newfoundland, St. John's, Nfld., Canada
pp. 2165
D. Demigny , ENSEA-UCP, Cergy Pontoise, France
F.G. Lorca , ENSEA-UCP, Cergy Pontoise, France
L. Kessal , ENSEA-UCP, Cergy Pontoise, France
pp. 2169
A. Restrepo , Univ. de Los Andes, Bogota, Colombia
A. Naranjo , Univ. de Los Andes, Bogota, Colombia
M. Valderrama , Univ. de Los Andes, Bogota, Colombia
M. Daniels , Univ. de Los Andes, Bogota, Colombia
R. de la Vega , Univ. de Los Andes, Bogota, Colombia
pp. 2173
M. Sun , Dept. of Neurology, Pittsburgh Univ., PA, USA
R.J. Sclabassi , Dept. of Neurology, Pittsburgh Univ., PA, USA
pp. 2177
T. Carron , Univ. de Savole, Annecy, France
P. Lambert , Univ. de Savole, Annecy, France
pp. 2181
Y. Wang , Dept. of Electr. Eng., Polytechnic Univ., Brooklyn, NY, USA
X.-M. Hsieh , Dept. of Electr. Eng., Polytechnic Univ., Brooklyn, NY, USA
J.-H. Hu , Dept. of Electr. Eng., Polytechnic Univ., Brooklyn, NY, USA
O. Lee , Dept. of Electr. Eng., Polytechnic Univ., Brooklyn, NY, USA
pp. 2185
V.-N. Dang , INRS Telecommun., Ile des Soeurs, Que., Canada
A.-R. Mansouri , INRS Telecommun., Ile des Soeurs, Que., Canada
J. Konrad , INRS Telecommun., Ile des Soeurs, Que., Canada
pp. 2189
J.L. Barron , Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
R. Eagleson , Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
pp. 2193
M. Karczewicz , Signal Process. Lab., Tampere Univ. of Technol., Finland
J. Nieweglowski , Signal Process. Lab., Tampere Univ. of Technol., Finland
P. Haavisto , Signal Process. Lab., Tampere Univ. of Technol., Finland
pp. 2197
N. Vasconcelos , Media Lab., MIT, Cambridge, MA, USA
A. Lippman , Media Lab., MIT, Cambridge, MA, USA
pp. 2201
Y. Wong , Integrated Syst. Lab., Texas Instrum. Inc., Dallas, TX, USA
pp. 2205
Yiu-Hung Fok , Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
O.C. Au , Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
R.D. Murch , Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
pp. 2209
S.N. Efstratiadis , Inform. Process. Lab., Aristotelian Univ. of Thessaloniki, Greece
M.G. Strintzis , Inform. Process. Lab., Aristotelian Univ. of Thessaloniki, Greece
A.K. Katsaggelos , Inform. Process. Lab., Aristotelian Univ. of Thessaloniki, Greece
pp. 2213
A.N. Delopoulos , Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
A.G. Constantinides , Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
pp. 2217
T.J. Hebert , Dept. of Electr. & Comput. Eng., Houston Univ., TX, USA
X. Yang , Dept. of Electr. & Comput. Eng., Houston Univ., TX, USA
pp. 2221
S. Sista , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
C.A. Bouman , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
J.P. Allebach , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 2225
R.S. Jasinschi , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
J.M.F. Moura , Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 2229
T. Kida , Dept. of Inf. Process., Tokyo Inst. of Technol., Japan
pp. 2233
L. Vandendorpe , UCL Telecommun. & Remote Sensing Lab., Louvain-la-Neuve, Belgium
P. Delogne , UCL Telecommun. & Remote Sensing Lab., Louvain-la-Neuve, Belgium
D. Boucquey , UCL Telecommun. & Remote Sensing Lab., Louvain-la-Neuve, Belgium
pp. 2237
B.K. Natarajan , Hewlett-Packard Co., Palo Alto, CA, USA
B. Vasudev , Hewlett-Packard Co., Palo Alto, CA, USA
pp. 2241
S.A. Martucci , David Sarnoff Res. Center, Princeton, NJ, USA
pp. 2244
T. Mitsunaga , Sony Corp., Tokyo, Japan
T. Yokoyama , Sony Corp., Tokyo, Japan
T. Totsuka , Sony Corp., Tokyo, Japan
pp. 2248
K. Shen , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
E.J. Delp , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 2252
W.Y. Ma , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
B.S. Manjunath , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 2256
B.-L. Yeo , Dept. of Electr. Eng., Princeton Univ., NJ, USA
B. Liu , Dept. of Electr. Eng., Princeton Univ., NJ, USA
pp. 2260
C. Stiller , INRS Telecommun., Ile des Soeurs, Que., Canada
J. Konrad , INRS Telecommun., Ile des Soeurs, Que., Canada
pp. 2264
Y.-L. You , Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
W. Xu , Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
M. Kaveh , Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
A. Tannenbaum , Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
pp. 2268
T. Tjahjadi , Dept. of Eng., Warwick Univ., Coventry, UK
D. Litwin , Dept. of Eng., Warwick Univ., Coventry, UK
Y.-H. Yang , Dept. of Eng., Warwick Univ., Coventry, UK
pp. 2272
J.M. Francos , Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
B. Friedlander , Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
pp. 2276
J.P. Havlicek , Lab. for Vision Syst., Texas Univ., Austin, TX, USA
D.S. Harding , Lab. for Vision Syst., Texas Univ., Austin, TX, USA
A.C. Bovik , Lab. for Vision Syst., Texas Univ., Austin, TX, USA
pp. 2280
Z. Zhou , Dept. Electr. Eng., Signal & Image Process. Inst., Los Angeles, CA, USA
R. Leahy , Dept. Electr. Eng., Signal & Image Process. Inst., Los Angeles, CA, USA
pp. 2284
Y. Ricquebourg , IRISA, Rennes, France
P. Bouthemy , IRISA, Rennes, France
pp. 2288
T. Kanungo , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
D.M. Gay , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
R.M. Haralick , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
pp. 2292
S.Z. Li , Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
Y.H. Huang , Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
J.S. Fu , Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
pp. 2296
H. Shekarforoush , Inst. Nat. de Recherche en Inf. et Autom., Sophia Antipolis, France
M. Berthod , Inst. Nat. de Recherche en Inf. et Autom., Sophia Antipolis, France
J. Zerubia , Inst. Nat. de Recherche en Inf. et Autom., Sophia Antipolis, France
pp. 2300
R.N. Beck , Center for Imaging Sci., Chicago Univ., IL, USA
pp. 2304
M.D. Gross , Coll. of Archit. & Planning, Colorado Univ., Boulder, CO, USA
E.Y.-L. Do , Coll. of Archit. & Planning, Colorado Univ., Boulder, CO, USA
pp. 2308
J.P. Refling , Lawrence Berkeley Lab., CA, USA
C.R. Pennypacker , Lawrence Berkeley Lab., CA, USA
pp. 2312
G. Stockman , Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
J. Weng , Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
pp. 2315
M. Rodriguez , RR Donnelley & Sons Co., Lisle, IL, USA
pp. 2319
M. Wolski , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
C.A. Bouman , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
J.P. Allebach , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
E. Walowit , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 2323
R. Balasubramanian , Xerox Digital Imaging Technol. Center, Webster, NY, USA
pp. 2327
Qian Lin , Hewlett-Packard Co., Palo Alto, CA, USA
pp. 2331
A. Sherstinsky , Media Lab., MIT, Cambridge, MA, USA
R.W. Picard , Media Lab., MIT, Cambridge, MA, USA
pp. 2335
J.R. Alford , Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
T. Mitsa , Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
pp. 2339
D.J. Heeger , Dept. of Psychol., Stanford Univ., CA, USA
P.C. Teo , Dept. of Psychol., Stanford Univ., CA, USA
pp. 2343
Je-Ho Lee , Div. of Electron. & Inf. Technol., Korea Inst. of Sci. & Technol., Seoul, South Korea
Yong-Moo Kwon , Div. of Electron. & Inf. Technol., Korea Inst. of Sci. & Technol., Seoul, South Korea
Hyoung-Gon Kim , Div. of Electron. & Inf. Technol., Korea Inst. of Sci. & Technol., Seoul, South Korea
pp. 2346
G.L. Grard , Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
H.J. Trussell , Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
pp. 2350
Tae-Eun Kim , Dept. of Electron. Eng., Chung-Ang Univ., Seoul, South Korea
Jong-Soo Choi , Dept. of Electron. Eng., Chung-Ang Univ., Seoul, South Korea
pp. 2354
F. Pedersini , Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
A. Sarti , Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
S. Tubaro , Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
pp. 2358
A.S. Bedekar , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
R.M. Haralick , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
pp. 2362
I.J. Cox , NEC Res. Inst., Princeton, NJ, USA
S. Roy , NEC Res. Inst., Princeton, NJ, USA
S.L. Hingorani , NEC Res. Inst., Princeton, NJ, USA
pp. 2366
P. Pochec , Fac. of Comput. Sci., New Brunswick Univ., Fredericton, NB, Canada
pp. 2370
M. Accame , Dept. of Electr. Eng., Genoa Univ., Italy
F.G.B. De Natale , Dept. of Electr. Eng., Genoa Univ., Italy
D.D. Giusto , Dept. of Electr. Eng., Genoa Univ., Italy
pp. 2374
B.L. Tseng , Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
D. Anastassiou , Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
pp. 2378
N. Grammalidis , Inf. Processing Lab., Aristotelian Univ. of Thessaloniki, Greece
D. Tzovarns , Inf. Processing Lab., Aristotelian Univ. of Thessaloniki, Greece
M.G. Strintzis , Inf. Processing Lab., Aristotelian Univ. of Thessaloniki, Greece
pp. 2382
B. Thomas , Naval Sci. & Technol., Visakhapatnam, India
B. Yegnanarayana , Naval Sci. & Technol., Visakhapatnam, India
S. Das , Naval Sci. & Technol., Visakhapatnam, India
pp. 2386
K. Schroder , Lehrstuhl fur Nachrichtentech., Dortmund Univ., Germany
R. Mech , Lehrstuhl fur Nachrichtentech., Dortmund Univ., Germany
pp. 2390
Y. Altunbasak , Dept. of Electr. Eng., Rochester Univ., NY, USA
A. Murat Tekalp , Dept. of Electr. Eng., Rochester Univ., NY, USA
G. Bozdagi , Dept. of Electr. Eng., Rochester Univ., NY, USA
pp. 2394
T. Saito , Dept. of Electr. Eng., Kanagawa Univ., Yokohama, Japan
T. Komatsu , Dept. of Electr. Eng., Kanagawa Univ., Yokohama, Japan
Y. Akimoto , Dept. of Electr. Eng., Kanagawa Univ., Yokohama, Japan
pp. 2402
L. Wu , La Chantrerie, Nantes, France
J. Benois-Pineau , La Chantrerie, Nantes, France
D. Barba , La Chantrerie, Nantes, France
pp. 2406
Xiaonong Ran , Nat. Semicond. Corp., Santa Clara, CA, USA
C.Y. Choo , Nat. Semicond. Corp., Santa Clara, CA, USA
pp. 2410
Guo Yao Yu , AT&T Bell Labs., Holmdel, NJ, USA
Cheng-Tie Chen , AT&T Bell Labs., Holmdel, NJ, USA
pp. 2414
A. Eleftheriadis , Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
A. Jacquin , Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
pp. 2418
G. Caleagno , Dipartimento di Elettronica e Inf., Padova Univ., Italy
R. Rinaldo , Dipartimento di Elettronica e Inf., Padova Univ., Italy
pp. 2422
J.G. Apostolopoulos , Res. Lab. of Electron., MIT, Cambridge, MA, USA
J.S. Lim , Res. Lab. of Electron., MIT, Cambridge, MA, USA
pp. 2426
V. Solo , Dept. of Stat., Macquarie Univ., North Ryde, NSW, Australia
pp. 2430
B. Hall , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
H. Na , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 2433
E. Sutton , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
H. Na , Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
pp. 2437
S.D. Booth , Dept. of Electr. Eng., Michigan Univ., Ann Arbor, MI, USA
J.A. Fessler , Dept. of Electr. Eng., Michigan Univ., Ann Arbor, MI, USA
pp. 2441
F. Rashid-Farrokhi , Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
K.J.R. Liu , Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
C.A. Berenstein , Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
D. Walnut , Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
pp. 2445
Chi-hsin Wu , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
P.C. Doerschuk , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 2449
J.M.N. Leitao , Dept. de Engenharia Electrotecnica e de Comput., Inst. Superior Tecnico, Lisbon, Portugal
M.A.T. Figueiredo , Dept. de Engenharia Electrotecnica e de Comput., Inst. Superior Tecnico, Lisbon, Portugal
pp. 2453
J.M. Silkaitis , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
H. Lee , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 2457
A.E. Yagle , Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
pp. 2461
J. Hsieh , Appl. Sci. Lab., GE Med. Syst., Milwaukee, WI, USA
pp. 2464
O. Monga , Inst. Nat. de Recherche en Inf. et Autom., Le Chesnay, France
N. Armande , Inst. Nat. de Recherche en Inf. et Autom., Le Chesnay, France
P. Montesinos , Inst. Nat. de Recherche en Inf. et Autom., Le Chesnay, France
pp. 2468
Y. Hode , FORENAP, Rouffach, France
A. Deruyver , FORENAP, Rouffach, France
B. Bendriem , FORENAP, Rouffach, France
N. Volkow , FORENAP, Rouffach, France
pp. 2472
R. Wasserman , Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
R. Acharya , Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
C. Sibata , Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
K.H. Shin , Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
pp. 2476
L.H. Staib , Dept. of Diagnostic Radiol., Yale Univ., New Haven, CT, USA
A. Sinusas , Dept. of Diagnostic Radiol., Yale Univ., New Haven, CT, USA
pp. 2480
R. Sammouda , Dept. of Inf. Sci., Tokushima Univ., Japan
N. Niki , Dept. of Inf. Sci., Tokushima Univ., Japan
H. Nishitani , Dept. of Inf. Sci., Tokushima Univ., Japan
pp. 2484
F.S. Cohen , Imaging & Comput. Vision Center, Drexel Univ., Philadelphia, PA, USA
G. Georgiou , Imaging & Comput. Vision Center, Drexel Univ., Philadelphia, PA, USA
pp. 2488
P. Clarysse , CREATIS, Inst. Nat. des Sci. Appliquees, Villeurbanne, France
F. Poupon , CREATIS, Inst. Nat. des Sci. Appliquees, Villeurbanne, France
B. Barbier , CREATIS, Inst. Nat. des Sci. Appliquees, Villeurbanne, France
I.E. Magnin , CREATIS, Inst. Nat. des Sci. Appliquees, Villeurbanne, France
pp. 2492
J.C. McEachen, II , Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
A. Nehorai , Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
J.S. Duncan , Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA
pp. 2496
Y. Kawata , Dept. of Opt. Sci., Tokushima Univ., Japan
N. Niki , Dept. of Opt. Sci., Tokushima Univ., Japan
T. Kumazaki , Dept. of Opt. Sci., Tokushima Univ., Japan
pp. 2500
A. Mojsilovic , Fac. of Electr. Eng., Belgrade Univ., Serbia
M. Popovic , Fac. of Electr. Eng., Belgrade Univ., Serbia
A. Popovic , Fac. of Electr. Eng., Belgrade Univ., Serbia
A. Neskovic , Fac. of Electr. Eng., Belgrade Univ., Serbia
V. Obradovic , Fac. of Electr. Eng., Belgrade Univ., Serbia
pp. 2504
D. Keightley , Div. of Inf. Technol., CSIRO, Canberra, ACT, Australia
B.R. Hunt , Div. of Inf. Technol., CSIRO, Canberra, ACT, Australia
pp. 2508
V.Z. Mesarovic , Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
N.P. Galatsanos , Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
M.N. Wernick , Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
pp. 2512
M. Vrhel , Nat. Centre for Res. Resources, Nat. Inst. of Health, Bethesda, MD, USA
B.L. Trus , Nat. Centre for Res. Resources, Nat. Inst. of Health, Bethesda, MD, USA
pp. 2516
A. Stajniak , Inst. of Control & Ind. Electron., Warsaw Univ. of Technol., Poland
J. Szostakowski , Inst. of Control & Ind. Electron., Warsaw Univ. of Technol., Poland
pp. 2520
Sung-Wai Hong , Dept. of Electron. Eng., Hong Kong Polytech. Univ., Hong Kong
Yuk-Hee Chan , Dept. of Electron. Eng., Hong Kong Polytech. Univ., Hong Kong
Wan-Chi Siu , Dept. of Electron. Eng., Hong Kong Polytech. Univ., Hong Kong
pp. 2523
Kook Yeon Kwak , Dept. of Electr. Eng., Polytechnic Univ., Brooklyn, NY, USA
R.A. Haddad , Dept. of Electr. Eng., Polytechnic Univ., Brooklyn, NY, USA
pp. 2527
Beng-Heok Tan , Sch. of Appl. Sci., Nanyang Technol. Univ., Singapore
A. Wahah , Sch. of Appl. Sci., Nanyang Technol. Univ., Singapore
Eng-Chong Tan , Sch. of Appl. Sci., Nanyang Technol. Univ., Singapore
pp. 2531
Jia-Guu Leu , Dept. of Stat., Nat. Chung-Hsing Univ., Taichung, Taiwan
pp. 2535
B.C. Tom , Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
A.K. Katsaggelos , Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL, USA
pp. 2539
G. Keesman , Philips Res. Lab., Eindhoven, Netherlands
A. Cotton , Philips Res. Lab., Eindhoven, Netherlands
D. Kessler , Philips Res. Lab., Eindhoven, Netherlands
J. De Lameillieure , Philips Res. Lab., Eindhoven, Netherlands
J.-P. Henot , Philips Res. Lab., Eindhoven, Netherlands
A. Nicoulin , Philips Res. Lab., Eindhoven, Netherlands
D. Kalivas , Philips Res. Lab., Eindhoven, Netherlands
pp. 2543
Fu-Huei Lin , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
R.M. Mersereau , Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 2547
Jia-Bao Cheng , Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Hsueh-Ming Hang , Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
pp. 2551
J. Katto , Inf. Technol. Res. Labs., NEC Corp., Kanagawa, Japan
M. Ohta , Inf. Technol. Res. Labs., NEC Corp., Kanagawa, Japan
pp. 2555
T. Wiegand , Centre for Inf. Process. Res., California Univ., Santa Barbara, CA, USA
M. Lightstone , Centre for Inf. Process. Res., California Univ., Santa Barbara, CA, USA
T.G. Campbell , Centre for Inf. Process. Res., California Univ., Santa Barbara, CA, USA
S.K. Mitra , Centre for Inf. Process. Res., California Univ., Santa Barbara, CA, USA
pp. 2559
A. Nosratinia , Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
M.T. Orchard , Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
pp. 2563
G. Lilienfield , Centre for Image Process. Res., Rensselaer Polytech. Inst., Troy, NY, USA
J.W. Woods , Centre for Image Process. Res., Rensselaer Polytech. Inst., Troy, NY, USA
pp. 2567
Tihao Chiang , David Sarnoff Res. Centre, SRI Int., Princeton, NJ, USA
Huifang Sun , David Sarnoff Res. Centre, SRI Int., Princeton, NJ, USA
J.W. Zdepski , David Sarnoff Res. Centre, SRI Int., Princeton, NJ, USA
pp. 2571
M. Nakamura , Dept. of Inf. Network Eng., Aichi Inst. of Technol., Toyota, Japan
K. Sawada , Dept. of Inf. Network Eng., Aichi Inst. of Technol., Toyota, Japan
pp. 2575
Tsuhan Chen , AT&T Bell Labs., Holmdel, NJ, USA
H.P. Graf , AT&T Bell Labs., Holmdel, NJ, USA
B. Haskell , AT&T Bell Labs., Holmdel, NJ, USA
E. Petajan , AT&T Bell Labs., Holmdel, NJ, USA
Yao Wang , AT&T Bell Labs., Holmdel, NJ, USA
H. Chen , AT&T Bell Labs., Holmdel, NJ, USA
Wu Chou , AT&T Bell Labs., Holmdel, NJ, USA
pp. 2579
Jiebo Luo , Dept. of Electr. Eng., Rochester Univ., NY, USA
Chang Wen Chen , Dept. of Electr. Eng., Rochester Univ., NY, USA
K.J. Parker , Dept. of Electr. Eng., Rochester Univ., NY, USA
pp. 2583
L. Strub , Dept. of Syst. Design Eng., Waterloo Univ., Ont., Canada
J. Robinson , Dept. of Syst. Design Eng., Waterloo Univ., Ont., Canada
pp. 2587
Tsuhan Chen , AT&T Bell Labs., Holmdel, NJ, USA
Yao Wang , AT&T Bell Labs., Holmdel, NJ, USA
H.P. Graf , AT&T Bell Labs., Holmdel, NJ, USA
C. Swain , AT&T Bell Labs., Holmdel, NJ, USA
pp. 2591
D.L. Swets , Michigan State Univ., East Lansing, MI, USA
B. Punch , Michigan State Univ., East Lansing, MI, USA
J. Weng , Michigan State Univ., East Lansing, MI, USA
pp. 2595
R. Lopez , Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
T.S. Huang , Beckman Inst. for Adv. Sci. & Technol., Illinois Univ., Urbana, IL, USA
pp. 2599
G. Galicia , California Univ., Berkeley, CA, USA
A. Zakhor , California Univ., Berkeley, CA, USA
pp. 2603
L.C. de Silva , Fac. of Eng., Tokyo Univ., Japan
M. Tahara , Fac. of Eng., Tokyo Univ., Japan
K. Aizawa , Fac. of Eng., Tokyo Univ., Japan
M. Hatori , Fac. of Eng., Tokyo Univ., Japan
pp. 2607
Chung-Lin Huang , Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Wen-Yi Huang , Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Cheng-Chang Lien , Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 2611
Jun Zhang , Dept. of Electr. Eng. & Comput. Sci., Wisconsin Univ., Milwaukee, WI, USA
Jianhua Lin , Dept. of Electr. Eng. & Comput. Sci., Wisconsin Univ., Milwaukee, WI, USA
pp. 2615
A. Deruyver , Dept. d'Inf, IUT Strasbourg Sud, Illkirch, France
Y. Hode , Dept. d'Inf, IUT Strasbourg Sud, Illkirch, France
pp. 2619
G.C. Lai , Lab. for Machine Intelligence, Vision, & Neural Comput., California Univ., Irvine, CA, USA
R.J.P. De Figueiredo , Lab. for Machine Intelligence, Vision, & Neural Comput., California Univ., Irvine, CA, USA
pp. 2623
M.H. Davis , Dept. of Electr. Eng., Southern Methodist Univ., Dallas, TX, USA
A. Khotanzad , Dept. of Electr. Eng., Southern Methodist Univ., Dallas, TX, USA
D.P. Flamig , Dept. of Electr. Eng., Southern Methodist Univ., Dallas, TX, USA
S.E. Harms , Dept. of Electr. Eng., Southern Methodist Univ., Dallas, TX, USA
pp. 2627
D. Nair , Comput. & Vision Res. Center, Texas Univ., Austin, TX, USA
A. Mitiche , Comput. & Vision Res. Center, Texas Univ., Austin, TX, USA
J.K. Aggarwal , Comput. & Vision Res. Center, Texas Univ., Austin, TX, USA
pp. 2631
Zhibin Lei , Div. of Eng., Brown Univ., Providence, RI, USA
D. Keren , Div. of Eng., Brown Univ., Providence, RI, USA
D. Cooper , Div. of Eng., Brown Univ., Providence, RI, USA
pp. 2635
J. You , Sch. of Comput. & Inf. Sci., Univ. of South Australia, The Levels, SA, Australia
H.A. Cohen , Sch. of Comput. & Inf. Sci., Univ. of South Australia, The Levels, SA, Australia
E. Pissaloux , Sch. of Comput. & Inf. Sci., Univ. of South Australia, The Levels, SA, Australia
pp. 2639
Quang Minh Tieng , Signal Process. Res. Centre, Queensland Univ. of Technol., Brisbane, Qld., Australia
W.W. Boles , Signal Process. Res. Centre, Queensland Univ. of Technol., Brisbane, Qld., Australia
M. Deriche , Signal Process. Res. Centre, Queensland Univ. of Technol., Brisbane, Qld., Australia
pp. 2643
S. Sull , NASA Ames Res. Center, Moffett Field, CA, USA
B. Sridhar , NASA Ames Res. Center, Moffett Field, CA, USA
pp. 2647
F. Xia , Dept. of Inf. Syst., Macau Univ., Macau
pp. 2651
pp. 2655
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