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2008 International Conference on Embedded Software and Systems
An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller
July 29-July 31
ISBN: 978-0-7695-3287-5
| ASCII Text | x | ||
| Tian Wugang, Pan Mengchun, Luo Feilu, Su Jianbin, Chen Dixiang, "An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller," Embedded Software and Systems, Second International Conference on, pp. 237-242, 2008 International Conference on Embedded Software and Systems, 2008. | |||
| BibTex | x | ||
| @article{ 10.1109/ICESS.2008.53, author = {Tian Wugang and Pan Mengchun and Luo Feilu and Su Jianbin and Chen Dixiang}, title = {An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller}, journal ={Embedded Software and Systems, Second International Conference on}, volume = {0}, year = {2008}, isbn = {978-0-7695-3287-5}, pages = {237-242}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICESS.2008.53}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Embedded Software and Systems, Second International Conference on TI - An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller SN - 978-0-7695-3287-5 SP237 EP242 A1 - Tian Wugang, A1 - Pan Mengchun, A1 - Luo Feilu, A1 - Su Jianbin, A1 - Chen Dixiang, PY - 2008 KW - Embedded system KW - borescope KW - eddy current testing KW - nondestructive testing (NDT) KW - ARM microcontroller KW - embedded operating system VL - 0 JA - Embedded Software and Systems, Second International Conference on ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICESS.2008.53
In this paper, based on ARM9 microcontroller S3C2440A and embedded operating system Windows CE, a new nondestructive system was established. The system uses borescope and eddy current testing dual techniques combined into a single probe, which takes advantage of borescope and eddy current testing. The system combines traditional nondestructive testing technology with some advanced technologies, such as digital signal processing, automatic testing and embedded system. The system has excellent characteristics of miniaturization, low power consumption, intelligence, etc. The hardware and software of the system are described. The system works successfully, the detection results are available. The system can meet the requirements of in situ nondestructive testing for equipments.
Index Terms:
Embedded system, borescope, eddy current testing, nondestructive testing (NDT), ARM microcontroller, embedded operating system
Citation:
Tian Wugang, Pan Mengchun, Luo Feilu, Su Jianbin, Chen Dixiang, "An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller," icess, pp.237-242, 2008 International Conference on Embedded Software and Systems, 2008
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