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Second IEEE International Conference on Data Mining (ICDM'02)
Maebashi City, Japan
December 09-December 12
ISBN: 0-7695-1754-4
Table of Contents
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Main-Track Regular Papers
Naoki Abe, I.B.M. T. J. Watson Research Center
Edwin Pednault, I.B.M. T. J. Watson Research Center
Haixun Wang, I.B.M. T. J. Watson Research Center
Bianca Zadrozny, I.B.M. T. J. Watson Research Center
Wei Fan, I.B.M. T. J. Watson Research Center
Chid Apte, I.B.M. T. J. Watson Research Center
pp. 3
Tamas Abraham, Defence Science and Technology Organisation
Olivier de Vel, Defence Science and Technology Organisation
pp. 11
Christian Böhm, University for Health Informatics and Technology
Florian Krebs, University of Munich
pp. 43
Fu-lai Chung, Hong Kong Polytechnic University
Tak-chung Fu, Hong Kong Polytechnic University
Robert Luk, Hong Kong Polytechnic University
Vincent Ng, Hong Kong Polytechnic University
pp. 83
Gao Cong, National University of Singapore
Bing Liu, National University of Singapore
pp. 107
Manoranjan Dash, Northwestern University
Kiseok Choi, Northwestern University
Peter Scheuermann, Northwestern University
Huan Liu, Arizona State University
pp. 115
Luc DE RAEDT, University of Freiburg
Manfred JAEGER, University of Freiburg, Univ. of Helsinki, and MPI Informatik
Sau Dan LEE, University of Freiburg
Heikki MANNILA, Univ. of Helsinki
pp. 123
Chris Ding, Lawrence Berkeley National Laboratory
Xiaofeng He, Lawrence Berkeley National Laboratory
pp. 139
Chris Ding, Lawrence Berkeley National Laboratory
Xiaofeng He, Lawrence Berkeley National Laboratory
Hongyuan Zha, Pennsylvania State University,
Horst D. Simon, Lawrence Berkeley National Laboratory
pp. 147
Wei Fan, IBM T.J.Watson Research
Haixun Wang, IBM T.J.Watson Research
Philip S. Yu, IBM T.J.Watson Research
Shaw-hwa Lo, Columbia Univ.
Salvatore Stolfo, Columbia Univ.
pp. 163
Jiawei Han, University of Illinois at Urbana.Champaign
Jianyong Wang, University of Illinois at Urbana.Champaign
Ying Lu, University of Illinois at Urbana.Champaign
Petre Tzvetkov, University of Illinois at Urbana.Champaign
pp. 211
Yin-Fu Huang, National Yunlin University of Science and Technology
Chiech-Ming Wu, National Yunlin University of Science and Technology
pp. 227
Sung Young Jung, LG Electronics Institute of Technology
Jeong-Hee Hong, LG Electronics Institute of Technology
Taek-Soo Kim, LG Electronics Institute of Technology
pp. 235
Nada Lavrac, Jozef Stefan Institute
Peter Flach, University of Bristol
Branko Kavsek, Jozef Stefan Institute
Ljupco Todorovski, Jozef Stefan Institute
pp. 266
Luis Carlos Molina, Universitat Polit?cnica de Catalunya
Lluís Belanche, Universitat Polit?cnica de Catalunya
Àngela Nebot, Universitat Polit?cnica de Catalunya
pp. 306
Eric Ka Ka Ng, Chinese University of Hong Kong
Ada Wai-Chee Fu, Chinese University of Hong Kong
Ke Wang, Simon Fraser University
pp. 322
P. Palmerini, Universit? Ca' Foscari and Consiglio Nazionale delle Ricerche
R. Perego, Consiglio Nazionale delle Ricerche
F. Silvestri, Consiglio Nazionale delle Ricerche and Universit? di Pisa
pp. 338
Pranav Patel, University of California - Riverside
Eamonn Keogh, University of California - Riverside
Jessica Lin, University of California - Riverside
Stefano Lonardi, University of California - Riverside
pp. 370
Jian Pei, State Univ. of New York at Buffalo
Guozhu Dong, Wright State Univ.
Wei Zou, Jiangxi Normal Univ.
Jiawei Han, Univ. of Illinois
pp. 378
Chang-Shing Perng, IBM Thomas J. Watson Research Center
Haixun Wang, IBM Thomas J. Watson Research Center
Sheng Ma, IBM Thomas J. Watson Research Center
Joseph L. Hellerstein, IBM Thomas J. Watson Research Center
pp. 394
Ken Sadohara, National Institute of Advanced Industrial Science and Technology
pp. 410
Yi-Dong Shen, Chinese Academy of Sciences
Zhong Zhang, Simon Fraser University
Qiang Yang, Hong Kong University of Science and Technology
pp. 426
Wing-Ho Shum, Chinese University of Hong Kong
Hui-Dong Jin, Chinese University of Hong Kong
Kwong-Sak Leung, Chinese University of Hong Kong
Man-Leung Wong, Lingnan University
pp. 434
Haixun Wang, IBM T. J. Watson Research Center
Chang-Shing Perng, IBM T. J. Watson Research Center
Sheng Ma, IBM T. J. Watson Research Center
Philip S. Yu, IBM T. J. Watson Research Center
pp. 482
Tak-Lam Wong, Chinese University of Hong Kong
Wai Lam, Chinese University of Hong Kong
pp. 506
Yabo Xu, Chinese University of Hong Kong
Jeffrey Xu Yu, Chinese University of Hong Kong
Guimei Liu, Hong Kong University of Science and Technology
Hongjun Lu, Hong Kong University of Science and Technology
pp. 514
Qiang Yang, Hong Kong University of Science and Technology
Hong Cheng, Hong Kong University of Science and Technology
pp. 522
Hwanjo Yu, University of Illinois
Kevin Chen-Chuan Chang, University of Illinois
Jiawei Han, University of Illinois
pp. 538
Ching-Huang Yun, National Taiwan University
Kun-Ta Chuang, National Taiwan University
Ming-Syan Chen, National Taiwan University
pp. 546
Minghua Zhang, The University of Hong Kong
Ben Kao, The University of Hong Kong
Chi-Lap Yip, The University of Hong Kong
pp. 554
Main-Track Short Papers
Michael R. Berthold, Data Analysis Research Lab, Tripos Inc.
Bernd Wiswedel, Data Analysis Research Lab, Tripos Inc.
David E. Patterson, Data Analysis Research Lab, Tripos Inc.
pp. 581
Laurentiu Cristofor, University of Massachusetts at Boston
Dan Simovici, University of Massachusetts at Boston
pp. 597
Robert L. Grossman, University of Illinois at Chicago
Richard G. Larson, University of Illinois at Chicago
pp. 613
S. Hodgson, University of New England
N. Dunstan, University of New England
R. Murison, University of New England
pp. 617
Se June Hong, IBM T.J. Watson Research Center
Jonathan Hosking, IBM T.J. Watson Research Center
Ramesh Natarajan, IBM T.J. Watson Research Center
pp. 621
Hao Huang, Colorado School of Mines
Xindong Wu, University of Vermont
Richard Relue, Colorado School of Mines
pp. 629
Ning Jiang, University of Central Florida
Kien A. Hua, University of Central Florida
Simon Sheu, National Tsing Hua University
pp. 637
Toshihiro Kamishima, National Institute of Advanced Industrial Science and Technology (AIST)
Shotaro Akaho, National Institute of Advanced Industrial Science and Technology (AIST)
pp. 645
Qi Li, University of Delaware
Tao Li, University of Rochester
Shenghuo Zhu, University of Rochester
Chandra Kambhamettu, University of Delaware
pp. 657
Sheng Ma, IBM T.J. Watson Research Center
Joseph L. Hellerstein, IBM T.J. Watson Research Center
Chang-shing Perng, IBM T.J. Watson Research Center
Genady Grabarnik, IBM T.J. Watson Research Center
pp. 661
Rosa Meo, Universit? degli Studi di Torino
Giuseppe Psaila, Universit? degli Studi di Bergamo
pp. 665
Alexander K. Seewald, Austrian Research Institute for Artificial Intelligence
pp. 685
Phil Tse, Hong Kong Baptist University
Jiming Liu, Hong Kong Baptist University
pp. 689
Ching-Yao Wang, National Chiao-Tung University
Tzung-Pei Hong, National University of Kaohsiung
Shian-Shyong Tseng, National Chiao-Tung University
pp. 693
Jun Wang, University of Illinois at Urbana-Champaign
Bei Yu, University of Illinois at Urbana-Champaign
Les Gasser, University of Illinois at Urbana-Champaign
pp. 697
Dwi H. Widyantoro, Texas A&M University
Thomas R. Ioerger, Texas A&M University
John Yen, The Pennsylvania State University
pp. 705
Graham Williams, CSIRO Enterprise Data Mining
Rohan Baxter, CSIRO Enterprise Data Mining
Hongxing He, CSIRO Enterprise Data Mining
Simon Hawkins, CSIRO Enterprise Data Mining
Lifang Gu, CSIRO Enterprise Data Mining
pp. 709
Yimin Xiong, Hong Kong University of Science and Technology
Dit-Yan Yeung, Hong Kong University of Science and Technology
pp. 717
Xifeng Yan, University of Illinois at Urbana-Champaign
Jiawei Han, University of Illinois at Urbana-Champaign
pp. 721
Michael M. Yin, New Jersey Institute of Technology
Jason T. L. Wang, New Jersey Institute of Technology
pp. 733
Industry-Track Papers
Charles X. Ling, The University of Western Ontario
Tielin Chen, The University of Western Ontario
Qiang Yang, Hong Kong University of Science and Technology
Jie Cheng, Canadian Imperial Bank of Commerce (CIBC)
pp. 767
Teresa Mah, Microsoft Corporation
Ying Li, Microsoft Corporation
pp. 771
Mariko Yohda, The Japan Research Institute, Limited
Makiko Saito-Arita, The Japan Research Institute, Limited
Akira Okada, The Japan Research Institute, Limited
Ryota Suzuki, Hitotsubashi University
Yoshitsugu Kakemoto, The Japan Research Institute, Limited
pp. 779
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