ISBN: 0-7695-1921-0

Misato Tasaka, Tokyo Institute of Technology

Hélène Arfaoui, Tokyo Institute of Technology

Teruyoshi Zenmyo, Tokyo Institute of Technology

Kinji Mori, Tokyo Institute of Technology

Megumi Hisayuki, Hiroshima City University

Shinji Inoue, Hiroshima City University

Yoshiaki Kakuda, Hiroshima City University

Kenji Toda, National Institute of Advanced Industrial Science and Technology Information Technology Research Institute

Kuniyasu Suzaki, National Institute of Advanced Industrial Science and Technology Information Technology Research Institute

Junichi Funasaka, Hiroshima City University

Nozomi Nakawaki, Hiroshima City University

Kenji Ishida, Hiroshima City University

Kitsutaro Amano, Hiroshima City University

Chin-Tser Huang, University of Texas at Austin

Mohamed G. Gouda, University of Texas at Austin

E. N. Elnozahy, IBM Austin Research Lab

A.G. Voyiatzis, University of Patras

D.N. Serpanos, University of Patras

Naohiro Kaji, Tokyo Institute of Technology

Khaled Ragab, Tokyo Institute of Technology

Takanori Ono, Tokyo Institute of Technology

Kinji Mori, Tokyo Institute of Technology

Hsin-hung Lin, National Chung Cheng University

Chih-wen Hsueh, National Chung Cheng University

Chung-hung Chen, National Chung Cheng University

A.S. Prayati, University of Patras

A.P. Kalogeras, University of Patras

K. Lorentz, University of Magdeburg

S. Koubias, University of Patras

Dan Zhou, Florida Atlantic University

Jie Wu, Florida Atlantic University

Xianbing Wang, Hong Kong Polytechnic University and Wuhan University

Jiannong Cao, Hong Kong Polytechnic University

Mehmet Aksit, University of Twente

Zi? Choukair, Technop?le de l'Iroise

Silvia Llorente, Universitat Pompeu Fabra

Jaime Delgado, Universitat Pompeu Fabra

Christian Becker, University of Stuttgart

Gregor Schiele, University of Stuttgart

Michael Atighetchi, BBN Technologies LLC

Partha P. Pal, BBN Technologies LLC

Christopher C. Jones, BBN Technologies LLC

Paul Rubel, BBN Technologies LLC

Richard E. Schantz, BBN Technologies LLC

Joseph P. Loyall, BBN Technologies LLC

John A. Zinky, BBN Technologies LLC

F. Ogel, INRIA and Université Pierre et Marie Curie

B. Folliot, INRIA and Université Pierre et Marie Curie

I. Piumarta, INRIA and Université Pierre et Marie Curie

Andreas Ulbrich, Technical University of Berlin

Torben Weis, Technical University of Berlin

Kurt Geihs, Technical University of Berlin

Erik Putrycz, Institut National des Télécommunications

Guy Bernard, Institut National des Télécommunications

Lin Wujuan, National University of Singapore

Bharadwaj Veeravalli, National University of Singapore

Javier Ja? Mart?nez, Universidad Polit?cnica de Valencia

Isidro Ramos Salavert, Universidad Polit?cnica de Valencia

Christoph Hartwich, Freie Universitaet Berlin

Victor Budau, Institut National des Télécommunications

Guy Bernard, Institut National des Télécommunications

George Din, Fraunhofer Research Center for Open Communication Systems

Akihiro Hayakawa, NTT DATA Corporation

Ina Schieferdecker, Fraunhofer Research Center for Open Communication Systems

Peter Deussen, Fraunhofer Research Center for Open Communication Systems

Gary Toth, Naval Research in Arlington

Angela Uvarov, University of Rhode Island

Victor Fay-Wolfe, University of Rhode Island

Stuart Anderson, University of Edinburgh

Juliana Küster Filipe, University of Edinburgh

Jing Chen, National Cheng-Kung University

Daniela Micucci, Università degli Studi di Milano-Bicocca

Francesco Tisato, Università degli Studi di Milano-Bicocca

Andrea Trentini, Università degli Studi di Milano

Hans-Arno Jacobsen, Naval Research in Arlington

Gerardo Pardo-Castellote, Real-Time Innovations, Inc.

J. H. van 't Hag, Thales Naval Nederland

Azer Bestavros, Boston University

Shudong Jin, Boston University

T. Abdelzaher, University of Virginia

J. Stankovic, University of Virginia

S. Son, University of Virginia

B. Blum, University of Virginia

T. He, University of Virginia

A. Wood, University of Virginia

Chenyang Lu, University of Washington at St. Louis

Sooyeon Kim, Seoul National University

Sang H. Son, University of Virginia

John A. Stankovic, University of Virginia

Shuoqi Li, University of Virginia

Yanghee Choi, Seoul National University

Lyndell St. Ville, University of Glasgow

Peter Dickman, University of Glasgow

D. Pakkala, VTT Electronics

P. V?litalo, VTT Electronics

J. Latvakoski, VTT Electronics

Masaki Ito, Keio University

Akiko Iwaya, Keio University

Masato Saito, Keio University

Kenichi Nakanishi, Keio University

Kenta Matsumiya, Keio University

Jin Nakazawa, Keio University

Nobuhiko Nishio, Keio University

Kazunori Takashio, Keio University

Hideyuki Tokuda, Keio University

Matthew Lease, Brown University

Guy Eddon, Brown University

Michael Rohs, Swiss Federal Institute of Technology

J? Bohn, Swiss Federal Institute of Technology

Alexandros Karypidis, Foundation for Research & Technology Hellas and University of Thessaly

Spyros Lalis, Foundation for Research & Technology Hellas and University of Thessaly

Jeffrey Nichols, Carnegie Mellon University

Brad A. Myers, Carnegie Mellon University

Jacob O. Wobbrock, Carnegie Mellon University

Brad A. Myers, Carnegie Mellon University

Scott E. Hudson, Carnegie Mellon University

Kerstin Heuwinkel, Fraunhofer Institute for Software and Systems Engineering

Wolfgang Deiters, Fraunhofer Institute for Software and Systems Engineering

Thomas K?nigsmann, Fraunhofer Institute for Software and Systems Engineering

Thorsten L?ffeler, Fraunhofer Institute for Software and Systems Engineering

Joachim Tesch, The ICPNM Academy

Leonhard Dietze, University for Applied Sciences (FH) Mainz

L. Miguel Encarna??, The ICPNM Academy

Georg Acher, Technische Universität München

Detlef Fliegl, Technische Universität München

Peter Robinson, University of Cambridge Computer Laboratory

Stefan Hild, IBM Zurich Research Laboratory

Martin Bauer, University of Stuttgart

Christian Becker, University of Stuttgart

J? H?hner, University of Stuttgart

Gregor Schiele, University of Stuttgart

Yasue Kishino, Osaka University

Masahiko Tsukamoto, Osaka University

Yutaka Sakane, Shizuoka University

Shojiro Shojiro, Osaka University

T. Lashina, Philips Research Laboritories

F. Vignoli, Philips Research Laboritories

V. Buil, Philips Research Laboritories

S. van de Wijdeven, Philips Research Laboritories

G. Hollemans, Philips Research Laboritories

J. Hoonhout, Philips Research Laboritories

Christian Decker, University of Karlsruhe

Uwe Kubach, SAP AG

Michael Beigl, University of Karlsruhe

Erwin Aitenbichler, Darmstadt University of Technology

Max M?hlh?user, Darmstadt University of Technology

Marco Mamei, Universit? di Modena e Reggio Emilia

Franco Zambonelli, Universit? di Modena e Reggio Emilia

Letizia Leonardi, Universit? di Modena e Reggio Emilia

Eiko Yoneki, University of Cambridge Computer Laboratory

Jean Bacon, University of Cambridge Computer Laboratory

Andreas Zeidler, Technical University of Darmstadt

Ludger Fiege, Technical University of Darmstadt

Radu Handorean, Washington University in St. Louis

Jamie Payton, Washington University in St. Louis

Christine Julien, Washington University in St. Louis

Gruia-Catalin Roman, Washington University in St. Louis

Alan Cole, IBM T.J. Watson Research Center

Sastry Duri, IBM T.J. Watson Research Center

Jonathan Munson, IBM T.J. Watson Research Center

Jay Murdock, IBM T.J. Watson Research Center

David Wood, IBM T.J. Watson Research Center

Olufisayo Omojokun, University of North Carolina at Chapel Hill

Prasun Dewan, University of North Carolina at Chapel Hill

Paul Grace, Lancaster University

Gordon S. Blair, Lancaster University

Sam Samuel, Lucent Technologies

Marija Mikic-Rakic, University of Southern California

Nenad Medvidovic, University of Southern California

Ken Ohta, NTT DoCoMo, Inc.

Takashi Yoshikawa, NTT DoCoMo, Inc.

Tomohiro Nakagawa, NTT DoCoMo, Inc.

Yoshinori Isoda, NTT DoCoMo, Inc.

Shoji Kurakake, NTT DoCoMo, Inc.

Ken C. K. Lee, Hong Kong Polytechnic University

Hong Va Leong, Hong Kong Polytechnic University

Antonio Si, Oracle Corporation

Sumit Roy, Hewlett-Packard Laboratories

Michele Covell, Hewlett-Packard Laboratories

John Ankcorn, Hewlett-Packard Laboratories

Susie Wee, Hewlett-Packard Laboratories

Takeshi Yoshimura, NTT DoCoMo

Yuni Xia, Purdue University

Sunil Prabhakar, Purdue University

Oleg Shigiltchoff, University of Pittsburgh

Panos K. Chrysanthis, University of Pittsburgh

Evaggelia Pitoura, University of Ioannina

Pushkar Pradhan, University of Florida

Abdelsalam (Sumi) Helal, University of Florida

Yingqi Xu, Pennsylvania State University

Wang-Chien Lee, Pennsylvania State University

Hugo Miranda, Universidade de Lisboa

Luís Rodrigues, Universidade de Lisboa

Klaus Herrmann, Berlin University of Technology

Gang Xu, Rutgers University

Cristian Borcea, Rutgers University

Liviu Iftode, University of Maryland at College Park

Wayne Goddard, Clemson University

Stephen T. Hedetniemi, Clemson University

David P. Jacobs, Clemson University

Pradip K. Srimani, Clemson University

Yanxiang He, Wuhan University

Yifeng Chen, Wuhan University

Georgia Kastidou, University of Ioannina

Evaggelia Pitoura, University of Ioannina

George Samaras, University of Cyprus

G. Anastasi, University of Pisa

R. Bandelloni, University of Trento

M. Conti, IIT-National Research Council

F. Delmastro, IIT-National Research Council

E. Gregori, IIT-National Research Council

G. Mainetto, IIT-National Research Council

Jingyang Zhou, Nanjing University

Zhiyong Jia, Nanjing University

Daoxu Chen, Nanjing University

D. Janaki Ram, Indian Institute of Technology Madras

M. A. Maluk Mohamed, Indian Institute of Technology Madras

V. R. Devanathan, Indian Institute of Technology Madras

Cheng-Zhong Xu, Wayne State University

Song Fu, Wayne State University

Wanxia Xie, Georgia Institute of Technology

Shamkant B. Navathe, Georgia Institute of Technology

Sushil K. Prasad, Georgia State University

Jingqiang Li, Xi?an Jiaotong University

Weijia Jia, City University of Hong Kong

Mark Claypool, Worcester Polytechnic Institute

Yali Zhu, Worcester Polytechnic Institute

Bhed Bahadur Bista, Iwate Prefectural University

Goutam Chakraborty, Iwate Prefectural University

Toyoo Takata, Iwate Prefectural University

Tomoya Enokido, Tokyo Denki University

Makoto Takizawa, Tokyo Denki University

Chu-Sing Yang, National Sun Yat-Sen University

Yih-Ching Su, National Sun Yat-Sen University

Chen-Wei Lee, National Sun Yat-Sen University

Hirozumi Yamaguchi, Osaka University

Cao Man Letan, Osaka University

Akihito Hiromori, Osaka University

Takeshi Yamashita, Osaka University

Keiichi Yasumoto, Nara Institute of Science and Technology

Teruo Higashino, Osaka University

Kenichi Taniguchi, Osaka University

Shu-Ching Chen, Florida International University

Mei-Ling Shyu, University of Miami

Irina Gray, Florida International University

Hongli Luo, University of Miami

Yuko Onoe, NTT DoCoMo

Hiroaki Hagino, NTT DoCoMo

Yukio Atsumi, NTT DoCoMo

Yuuichirou Miyazaki, NTT DoCoMo

Hirotaka Komaki, IBM Research

Takayuki Kushida, IBM Research

Nagatsugu Yamanouchi, Toho University

Rong Zhao, State University of New York at Stony Brook

William I. Grosky, University of Michigan-Dearborn

Nobuyoshi Sato, Toyo University

Minoru Udagawa, Toyo University

Minoru Uehara, Toyo University

Yoshifumi Sakai, Toyo University

Hideki Mori, Toyo University

C. Kailasanathan, University of Wollongong

R. Safavi Naini, University of Wollongong

P. Ogunbona, Motorola Australian Research Centre

Kojiro Taguchi, Tokyo Denki University

Tomoya Enokido, Tokyo Denki University

Makoto Takizawa, Tokyo Denki University

H. Elsayed, City College of New York

A. Abd El Al, City College of New York

T. Saadawi, City College of New York

M. Lee, City College of New York

Michiru Tanaka, Soka University

Yoshimi Teshigawara, Soka University

Y. Bai, University of British Columbia

M.R. Ito, University of British Columbia

Kazuo Takahata, Shinshu Junior College

Norihiko Uchida, Iwate Prefectural University

Yoshitaka Shibata, Iwate Prefectural University

Ch. Bouras, University of Patras and Research Academic Computer Technology Institute

D. Psaltoulis, University of Patras

Ch. Psaroudis, University of Patras

Th. Tsiatsos, University of Patras and Research Academic Computer Technology Institute

Ying-Hong Wang

Chih-Hao Lin

Hidetoshi Kawai, Iwaki Meisei University

Fumio Takayama, Iwaki Meisei University

Takayuki Anzai, Iwaki Meisei University

Takanobu Manome, Iwaki Meisei University

Hiroki Yoshida, Iwaki Meisei University

Te Yi Chan, Chung Yuan Christian University

Yu Lung Wu, Chung Yuan Christian University

Bin Shyan Jong, Chung Yuan Christian University

Tsong Wuu Lin, Soochow University

V. K. Murthy, University of New South Wales

E.V. Krishnamurthy, Australian National University

Chung-wei Lee, Auburn University

Wen-Chen Hu, University of North Dakota

Jyh-haw Yeh, Boise State University

Kyung-Ah Chang, Samsung Electronics

Byung-Rae Lee, Samsung Electronics

Timothy K. Shih, Tamkang University

Jung-Ken Chuang, Tamkang University

Nigel H. Lin, Tamkang University

Aiguo He, University of Aizu

Yu-lung Lo, Chaoyang University of Technology

Shiou-Jiuan Chen, Chaoyang University of Technology

Koji Hashimoto, Iwate Prefectural University

Yoshitaka Shibata, Iwate Prefectural University

Jun Kong, University of Texas at Dallas

Kang Zhang, University of Texas at Dallas

Yoshitaka Shibata, Iwate Prefectural University

Daisuke Nakamura, Iwate Prefectural University

Noriki Uchida, Iwate Prefectural University

Kazuo Takahata, Iwate Prefectural University

Qing Dai, Florida Atlantic University

Jie Wu, Florida Atlantic University

Keqin Li, State University of New York at New Paltz

Xiang-Yang Li, Illinois Institute of Technology

Yu Wang, Illinois Institute of Technology

Marco Zúñiga, University of Southern California

Bhaskar Krishnamachari, University of Southern California

Guanhua Ye, City University of New York

Tarek Saadawi, City University of New York

Myung Lee, City University of New York

Kemal Akkaya, University of Maryland - Baltimore County

Mohamed Younis, University of Maryland - Baltimore County

Tarek Sheltami, Queen?s University

Hussein Mouftah, Queen?s University and University of Ottawa

Rachid Ait Yaiz, University of Twente

Geert Heijenk, University of Twente and Ericsson EuroLab Netherlands

Fl?via Coimbra Delicato, Federal University of Rio de Janeiro

Paulo F. Pires, Federal University of Rio de Janeiro

Luci Pirmez, Federal University of Rio de Janeiro

Luiz Fernando Rust da Costa Carmo, Federal University of Rio de Janeiro

Paal Engelstad, University of Oslo (UniK)/Telenor R&D

Yan Zheng, University of Oslo (UniK)/Telenor R&D

Tore J?nvik, University of Oslo (UniK)/Telenor R&D

Do Van Thanh, University of Oslo (UniK)/Telenor R&D

Phillip G. Bradford, University of Alabama

Olga V. Gavrylyako, University of Alabama

Sencun Zhu, George Mason University

Shouhuai Xu, University of California at Irvine

Sanjeev Setia, George Mason University

Sushil Jajodia, George Mason University and The MITRE Corporation

Giuseppe Anastasi, University of Pisa

Eleonora Borgia, National Research Council

Marco Conti, National Research Council

Enrico Gregori, National Research Council

Yijun Li, University of Louisiana at Lafayette

Hongyi Wu, University of Louisiana at Lafayette

Dmitri Perkins, University of Louisiana at Lafayette

Nian-Feng Tzeng, University of Louisiana at Lafayette

Magdy Bayoumi, University of Louisiana at Lafayette

Seung-Seok Kang, Michigan State University

Matt W. Mutka, Michigan State University

R. S. Sarath Babu

P. Govindaraj

Ing-Ray Chen, Virginia Tech

Ngoc Anh Phan, Virginia Tech

Weigang Ni, University of Alabama

Qiu Fang, University of Alabama

Susan V. Vrbsky, University of Alabama

Zhijun Wang, University of Texas at Arlington

Sajal Das, University of Texas at Arlington

Hao Che, University of Texas at Arlington

Mohan Kumar, University of Texas at Arlington

Sushil K. Prasad, Georgia State University

Anu G. Bourgeois, Georgia State University

Erdogan Dogdu, Georgia State University

Raj Sunderraman, Georgia State University

Yi Pan, Georgia State University

Sham Navathe, Georgia Institute of Technology

Vijay Madisetti, Georgia Institute of Technology

Anmol Sheth, University of Colorado

Richard Han, University of Colorado

P. P??kk?nen, VTT Technical Research Centre of Finland

J. Latvakoski, VTT Technical Research Centre of Finland

Yang Xiao, University of Memphis

Kui Wu, University of Victoria

Ying Luo, Georgia State University

Yi Pan, Georgia State University

Jie Li, University of Tsukuba

Yang Xiao, University of Memphis

Xiaola Lin, City University of Hong Kong

Huai-Rong Shao, Mitsubishi Electric Research Laboratories

Chia Shen, Mitsubishi Electric Research Laboratories

Daqing Gu, Mitsubishi Electric Research Laboratories

Jinyun Zhang, Mitsubishi Electric Research Laboratories

Philip Orlik, Mitsubishi Electric Research Laboratories

Jian Ye, New Jersey Institute of Technology

Jiongkuan Hou, New Jersey Institute of Technology

Symeon Papavassiliou, New Jersey Institute of Technology

Chengzhou Li, New Jersey Institute of Technology

Symeon Papavassiliou, New Jersey Institute of Technology

Hang Chen, University of Cincinnati

Qing-An Zeng, University of Cincinnati

Dharma P. Agrawal, University of Cincinnati

Liang Zhang, Hong Kong Polytechnic University

Jiannong Cao, Hong Kong Polytechnic University

Sajal K. Das, University of Texas at Arlington

Hannes Ekstr?, Ericsson Research

Reiner Ludwig, Ericsson Research

Vijay Arya, INRIA Sophia Antipolis

Thierry Turletti, INRIA Sophia Antipolis

Waleed S. Al-Numay, University of Oklahoma

Sridhar Radhakrishnan, University of Oklahoma

Tao Zheng, University of Oklahoma

Chandra N. Sekharan, Loyola University at Chicago

Srivatsan Varadarajan, University of Minnesota

Raja Harinath, University of Minnesota

Jaideep Srivastava, University of Minnesota

Zhi-Li Zhang, University of Minnesota

Sumi Choi, Washington University in St. Louis

Yuval Shavitt, Tel-Aviv University

Hai Liu, City University of Hong Kong

Xiaohua Jia, City University of Hong Kong

Deying Li, City University of Hong Kong

C. H. Lee, City University of Hong Kong

Abd-Elhamid M. Taha, Queen?s University

Ahmed E. Kamal, Iowa State University

Israel Cidon, Technion - Israel Institute of Technology

Oren Unger, Technion and Zoran Microelectronics

Huamin Chen, University of California at Davis

Prasant Mohapatra, University of California at Davis

Huamin Chen, University of California at Davis

Prasant Mohapatra, University of California at Davis

Mohamed Vall O. Mohamed-Salem, University of Montreal

Gregor von Bochmann, University of Ottawa

Johnny W. Wong, University of Waterloo

Markus J. Kaiser, University of Connecticut

Kwok Ching Tsui, Hong Kong Baptist University

Jiming Liu, Hong Kong Baptist University

K.Y. Leung, City University of Hong Kong

Eric W.M. Wong, City University of Hong Kong

K.H. Yeung, City University of Hong Kong

Liu Zhong, Changsha Institute of Technology

Dou Wen, Changsha Institute of Technology

Zhang Wei Ming, Changsha Institute of Technology

Zou Peng, Changsha Institute of Technology

Helen S. Du, City University of Hong Kong

Xiaohua Jia, City University of Hong Kong

Chi-Chung Cheung, City University of Hong Kong

Man-Ching Yuen, City University of Hong Kong

Angus C H Yip, City University of Hong Kong