ISBN: 0-7695-1263-1

G. Nagy

Sargur N. Srihari, Center of Excellence for Document Analysis and Recognition (CEDAR) University at Buffalo, State University of New York

Sung-Hyuk Cha, Center of Excellence for Document Analysis and Recognition (CEDAR) University at Buffalo, State University of New York

Sangjik Lee, Center of Excellence for Document Analysis and Recognition (CEDAR) University at Buffalo, State University of New York

Eiki Ishidera, Multi Media Research Labs, NEC Corporation

Atsushi Sato, Multi Media Research Labs, NEC Corporation

Kye Kyung Kim, Electronics and Telecommunications Research Institute, Taejon, Korea and CENPARMI, Concordia University

Yun Koo Chung, Electronics and Telecommunications Research Institute, Taejon, Korea

Jin Ho Kim, CENPARMI, Concordia University and Kyungil University

Ching Y. Suen, Concordia University

Eugene H. Ratzlaff, IBM T.J. Watson Research Center

Christophe Choisy, LORIA

Abdel Belaid, LORIA

A. Bellili, LIP6, Universit? Pierre et Marie Curie and La Poste

M. Gilloux, La Poste

P. Gallinari, LIP6, Universit? Pierre et Marie Curie

Liying Fan, National University of Singapore

Lixin Fan, National University of Singapore

Chew Lim Tan, National University of Singapore

Mohammad Asad Ronee, Kyushu University

Seiichi Uchida, Kyushu University

Hiroaki Sakoe, Kyushu University

Ruini Cao, National University of Singapore

Chew Lim Tan, National University of Singapore

Amer Dawoud, University of Waterloo

Mohamed Kamel, University of Waterloo

Mauritius Seeger, Xerox Research Centre Europe

Christopher Dance, Xerox Research Centre Europe

Seon-Kyu Kim, Pukyong National University

Bong-Kee Sin, Pukyong National University

Seong-Whan Lee, Center for Artificial Vision Research, Korea University

Il-Seok Oh, Chonbuk National University

Jin-Seon Lee, Woosuk University

Ching Y. Suen, Concordia University

Housem Miled, Facult? des Sciences de Monastir, Tunisie

Najoua Essoukri Ben Amara, Ecole Nationale d'Ing?nieurs de Monastir, Tunisie

Lu Da, Changshu College

Pu Wei, Changshu College

Brendan McCane, University of Otago

Andrew D. Bagdanov, University of Amsterdam

Marcel Worring, University of Amsterdam

Sung J. Cho, KAIST

Jin H. Kim, KAIST

Gilles F. Houle, Computer Sciences Corporation

Katerina Blinova, Computer Sciences Corporation

M. Shridhar, University Michigan-Dearborn

Hanhong Xue, CEDAR, SUNY at Buffalo

Venu Govindaraju, CEDAR, SUNY at Buffalo

U.-V. Marti, Universit?t Bern

R. Messerli, Universit?t Bern

H. Bunke, Universit?t Bern

Sargur N. Srihari, University at Buffalo, State University of New York

Sung-Hyuk Cha, University at Buffalo, State University of New York

Hina Arora, University at Buffalo, State University of New York

Sangjik Lee, University at Buffalo, State University of New York

M. Hanmandlu, Multimedia University

K R Murali Mohan, Department of Science & Technology

Sourav Chakraborty, University of Delhi

Gaurav Garg, Delhi College of Engineering

Daniel Lopresti, Bell Labs, Lucent Technologies Inc.

Gordon Wilfong, Bell Labs, Lucent Technologies Inc.

Masayuki Okamoto, Shinshu University

Hiroki Imai, Shinshu University

Kazuhiko Takagi, Shinshu University

Jianying Hu, Avaya Labs

Ramanujan Kashi, Avaya Labs

Daniel Lopresti, Bell Labs

Gordon Wilfong, Bell Labs

George Nagy, Rensselaer Polytechnic Institute

Liangrui Peng, Tsinghua University

Ming Chen, Tsinghua University

Changsong Liu, Tsinghua University

Xiaoqing Ding, Tsinghua University

Jirong Zheng, Tsinghua University

J.C. Lecoq, PSI, Insa de Rouen

L. Najman, Oc? Print Logic Technologies

O. Gibot, Oc? Print Logic Technologies

E. Trupin, PSI, Universit? de Rouen

Srirangaraj Setlur, Center of Excellence for Document Analysis and Recognition

Venu Govindaraju, Center of Excellence for Document Analysis and Recognition

Sargur Srihari, Center of Excellence for Document Analysis and Recognition

Alfred Lawson, United States Postal Service

S.M. Lucas, University of Essex

A.C. Tams, University of Essex

Sung J. Cho, University of Essex

A.C. Downton, University of Essex

Sungho Ryu, AI Lab, Division of Computer Science, KAIST

Adnan El-Nasan, Rensselaer Polytechnic Institute

Sriharsha Veeramachaneni, Rensselaer Polytechnic Institute

George Nagy, Rensselaer Polytechnic Institute

Takafumi Koshinaka, NEC Laboratories

Daisuke Nishiwaki, NEC Laboratories

Keiji Yamada, NEC Laboratories

U.-V. Marti, Universit?t Bern

H. Bunke, Universit?t Bern

Sergey Tulyakov, CEDAR, SUNY Buffalo

Venu Govindaraju, CEDAR, SUNY Buffalo

Thomas Y. Kwok, IBM T.J. Watson Research Center

Michael P. Perrone, IBM T.J. Watson Research Center

Donato Malerba, Universit? degli Studi di Bari

Floriana Esposito, Universit? degli Studi di Bari

Francesca A. Lisi, Universit? degli Studi di Bari

Oronzo Altamura, Universit? degli Studi di Bari

Shuyan Zhao, Institute of Image Processing and Pattern Recognition and The Hong Kong Polytechnic University

Zheru Chi, The Hong Kong Polytechnic University

Pengfei Shi, Shanghai JiaoTong University

Qing Wang, The Hong Kong Polytechnic University and Northwestern Polytechnical University

Shuji Senda, NEC Corporation

Keiji Yamada, NEC Corporation

Soo H. Kim, Concordia University

Ching Y. Suen, Concordia University

S. Jeong, ETRI

Guee-Sang Lee, Chonnam National University

Boulos Waked, Concordia University

Ching Y. Suen, Concordia University

Sabine Bergler, Concordia University

Poh Kok Loo, Singapore Polytechnic

Chew Lim Tan, National University of Singapore

Sungsoo Yoon, Yonsei University

Yillbyung Lee, Yonsei University

Gyeonghwan Kim, Sogang University

Yeongwoo Choi, Sookmyung Women's University

Kongqiao Wang, Nokia (China) Research Center

Jari A. Kangas, Nokia (China) Research Center

Wenwen Li, Nokia (China) Research Center

Bertrand Coüasnon, IRISA/INSA-D?partement Informatique

N.E. Ayat, LIVIA, ?cole de Technologie Sup?rieure and Concordia University

M. Cheriet, LIVIA, ?cole de Technologie Sup?rieure

L. Remaki, LIVIA, ?cole de Technologie Sup?rieure

C.Y. Suen, Concordia University

Rui Zhang, Tsinghua University

Xiaoqing Ding, Tsinghua University

Jiayong Zhang, Tsinghua University

Gernot A. Fink, Bielefeld University

Markus Wienecke, Bielefeld University

Gerhard Sagerer, Bielefeld University

Wenwei Wang, Gerhard-Mercator-University Duisburg

Anja Brakensiek, Gerhard-Mercator-University Duisburg

Andreas Kosmala, Gerhard-Mercator-University Duisburg

Gerhard Rigoll, Gerhard-Mercator-University Duisburg

Daming Shi, University of Southampton

Steve R. Gunn, University of Southampton

Robert I. Damper, University of Southampton

Anja Brakensiek, Gerhard-Mercator-University Duisburg

Gerhard Rigoll, Gerhard-Mercator-University Duisburg

M. Maragoudakis, University of Patras

E. Kavallieratou, University of Patras

N. Fakotakis, University of Patras

G. Kokkinakis, University of Patras

Gregory N. Hullender, Microsoft Corporation

Zhu Xiaoyan, Tsinghua University

Shi Yifan, Tsinghua University

U.-V. Marti, Universit?t Bern

H. Bunke, Universit?t Bern

Hong Yan, City University of Hong Kong

Shen-Zheng Wang, National Chiao Tung University

Hsi-Jian Lee, National Chiao Tung University

Hsi-Ming Yang, National Chiao Tung University

Jainn-Jyh Lu, National Chiao Tung University

Hsi-Jian Lee, National Chiao Tung University

A. Zahour, Universit? du Havre

B. Taconet, Universit? du Havre

P. Mercy, Universit? du Havre

S. Ramdane, Universit? du Havre

Matti Pietikäinen, University of Oulu

Oleg Okun, University of Oulu

U. Pal, Indian Statistical Institute

M. Mitra, Indian Statistical Institute

B.B. Chaudhuri, Indian Statistical Institute

Katsuhito Fujimoto, Fujitsu Laboratories Ltd.

Atsuko Ohara, Fujitsu Laboratories Ltd.

Satoshi Naoi, Fujitsu Laboratories Ltd.

Q. Yuan, National University of Singapore

C. L. Tan, National University of Singapore

N. Vincent, LI/ E3I - Universit? de Tours

T. Freche, LI/ E3I - Universit? de Tours

R. Bogush, Polotsk State University

S. Maltsev, Polotsk State University

S. Ablameyko, Institute of Engineering Cybernetics

S. Uchida, Kyushu University

S. Kamata, Kyushu University

Kuo-Chin Fan, National Central University

Tsann-Ran Lay, National Central University

Yuan-Kai Wang, Fu Jen University

P Nagabhushan, University of Mysore

S Murali, University of Mysore

Jian-xiong Dong, Concordia University

Adam Krzyzak, Concordia University

C. Y. Suen, Concordia University

Adnan Amin, University of New South Wales

Tetsushi Wakabayashi, Mie University

Meng Shi, Mie University

Wataru Ohyama, Mie University

Fumitaka Kimura, Mie University

Dan S. Bloomberg, Xerox Palo Alto Research Center

Kris Popat, Xerox Palo Alto Research Center

Thomas P. Minka, Carnegie Mellon University

F. Grandidier, Concordia University, LIVIA, ETS, and P?le ILA, SRTP

R. Sabourin, Concordia University and LIVIA, ETS

M. Gilloux, P?le ILA, SRTP

C.Y. Suen, LIVIA, ETS

E. Lank, Queen's University

J. Thorley, Queen's University

S. Chen, Queen's University

D. Blostein, Queen's University

S. Tabbone

L. Wendling

K. Tombre

Toyohide Wantabe, Nagoya University

Toru Oshitani, Nagoya University

Jean-Marc Viglino, Institut G?ographique National

Laurent Guigues, Institut G?ographique National

Artem Mikheev, LizardTech, Inc.

Luc Vincent, LizardTech, Inc.

Vance Faber, LizardTech, Inc.

Nicolas Roussel, University of Fribourg

Oliver Hitz, University of Fribourg

Rolf Ingold, University of Fribourg

Anjo Anjewierden, University of Amsterdam

F. Le Bourgeois, I.N.S.A. de LYON - B?t 403

H. Emptoz, I.N.S.A. de LYON - B?t 403

E. Trinh, I.N.S.A. de LYON - B?t 403

J. Duong, I.N.S.A. de LYON - B?t 403

Qizhi Xu, Concordia University

Ching Y. Suen, Concordia University

Louisa Lam, Hong Kong Institute of Education and Concordia University

L. S. Oliveira, PUCPR Pontif??cia Universidade Cat?lica do Paran? (PPGIA-LARDOC), TS-Ecole de Technologie Sup?rieure (LIVIA), and CENPARMI Centre for Pattern Recognition and Machine Intelligence

R. Sabourin, PUCPR Pontif??cia Universidade Cat?lica do Paran? (PPGIA-LARDOC), TS-Ecole de Technologie Sup?rieure (LIVIA), and CENPARMI Centre for Pattern Recognition and Machine Intelligence

F. Bortolozzi, PUCPR Pontif??cia Universidade Cat?lica do Paran? (PPGIA-LARDOC)

C. Y. Suen, CENPARMI Centre for Pattern Recognition and Machine Intelligence

Alceu de S. Britto Jr, Pontif?cia University Cat?lica do Paran? and University Estadual de Ponta Grossa

Robert Sabourin, ?cole de Technologie Sup?rieure and Centre for Pattern Recognition and Machine Intelligence

Flavio Bortolozzi, Pontif?cia University Cat?lica do Paran?

Ching Y. Suen, Centre for Pattern Recognition and Machine Intelligence

Ankur Teredesai, State University of New York at Buffalo

Venu Govindaraju, State University of New York at Buffalo

Claus Bahlmann, Albert Ludwigs University Freiburg

Hans Burkhardt, Albert Ludwigs University Freiburg

N. Gauthier, Universit? Paris 6

T. Artières, Universit? Paris 6

P. Gallinari, Universit? Paris 6

B. Dorizzi, Institut National des T?l?communications

Hiromitsu Nishimura, Kanagawa Institute of Technology

Masayoshi Tsutsumi, Kanagawa Institute of Technology

Minoru Maruyama, Shinshu University

Hidetoshi Miyao, Shinshu University

Yasuaki Nakano, Shinshu University

Toru Wakahara, Hosei University

Yoshimasa Kimura, NTT Cyber Solutions Laboratories

Mutsuo Sano, NTT Cyber Solutions Laboratories

Zheng Zhang, National University of Singapore

Chew Lim Tan, National University of Singapore

Seiichi Uchida, Kyushu University

Eiji Taira, Kyushu University

Hiroaki Sakoe, Kyushu University

Jinhong K. Guo, Panasonic Information and Networking Technologies Laboratory

Matthew Y. Ma, Panasonic Information and Networking Technologies Laboratory

Léon Bottou, AT&T Labs - Research

Patrick Haffner, AT&T Labs - Research

Yann LeCun, AT&T Labs - Research

Tin Kam Ho, Bell Labs, Lucent Technologies

George Nagy, Rensselaer Polytechnic Institute

Ernest Valveny, Universitat Aut?noma de Barcelona

Enric Martí, Universitat Aut?noma de Barcelona

Jean-Philippe Valois, LIVIA, ?cole de Technologie Sup?rieure

Myriam Côté, LIVIA, ?cole de Technologie Sup?rieure

Mohamed Cheriet, LIVIA, ?cole de Technologie Sup?rieure

Gemma Sánchez, Universitat Aut?noma de Barcelona

Josep Lladós, Universitat Aut?noma de Barcelona

Josep Lladós, Universitat Aut?noma de Barcelona

Felipe Lumbreras, Universitat Aut?noma de Barcelona

Vicente Chapaprieta, Universitat Aut?noma de Barcelona

Joan Queralt, Universitat Aut?noma de Barcelona

Juyang Weng, Michigan State University

Wey-Shiuan Hwang, Michigan State University

Marc Parizeau, Universit? Laval

Alexandre Lemieux, Universit? Laval

Christian Gagné, Universit? Laval

Anja Brakensiek, Gerhard-Mercator-University Duisburg

Andreas Kosmala, Gerhard-Mercator-University Duisburg

Gerhard Rigoll, Gerhard-Mercator-University Duisburg

Mitsuru Nakai, Japan Advanced Institute of Science and Technology

Naoto Akira, Japan Advanced Institute of Science and Technology

Hiroshi Shimodaira, Japan Advanced Institute of Science and Technology

Shigeki Sagayama, The University of Tokyo

Kaoru Matsumoto, Tokyo University of Agriculture &Technology

Takahiro Fukushima, Tokyo University of Agriculture &Technology

Masaki Nakagawa, Tokyo University of Agriculture &Technology

Vuokko Vuori, Helsinki University of Technology

Jorma Laaksonen, Helsinki University of Technology

Erkki Oja, Helsinki University of Technology

Jari Kangas, Nokia Research Center

F. Le Bourgeois, I.N.S.A. de LYON

H. Emptoz, I.N.S.A. de LYON

S. Souafi Bensafi, I.N.S.A. de LYON

Bertin Klein, Insiders Information Management GmbH

Serdar Gökkus, Insiders Information Management GmbH

Thomas Kieninger, Deutsches Forschungszentrum f?r K?nstliche Intelligenz (DFKI)

Andreas Dengel, Deutsches Forschungszentrum f?r K?nstliche Intelligenz (DFKI)

Thomas Kieninger, German Research Center for Artificial Intelligence (DFKI GmbH)

Andreas Dengel, German Research Center for Artificial Intelligence (DFKI GmbH)

Matthew Hurst, WhizBang!Labs

Yalin Wang, University of Washington Seattle

Robert Haralick, University of Washington Seattle

Ihsin T. Phillips, CUNY Flushing

Akira Amano, Hiroshima City University

Naoki Asada, Hiroshima City University

Takayuki Motoyama, Hiroshima City University

Taiji Sumiyoshi, Hiroshima City University

Koji Suzuki, Hiroshima City University

Yalin Wang, University of Washington Seattle

Robert Haralick, University of Washington Seattle

Ihsin T. Phillips, CUNY Flushing

Xian-Sheng Hua, Peking University

Liu Wenyin, Microsoft Research China

Hong-Jiang Zhang, Microsoft Research China

Qing Wang, The Hong Kong Polytechnic University

Zheru Chi, The Hong Kong Polytechnic University

David D. Feng, The Hong Kong Polytechnic University

Rongchun Zhao, Northwestern Polytechnical University

Ondrej Velek, Tokyo University of Agriculture & Technology

Masaki Nakagawa, Tokyo University of Agriculture & Technology

Cheng-Lin Liu, Hitachi Ltd.

E. Kavallieratou, University of Patras

N. Liolios, University of Patras

E. Koutsogeorgos, University of Patras

N. Fakotakis, University of Patras

G. Kokkinakis, University of Patras

Stefan Jaeger, Tokyo University of Agriculture and Technology

Masaki Nakagawa, Tokyo University of Agriculture and Technology

Takahiko Horiuchi, Iwate Prefectural University

Wumo Pan, Nankai University

Jianming Jin, Nankai University

Guangshun Shi, Nankai University

Q.R. Wang, Nankai University

Kenji Iwata, Gifu University

Kazuhiko Yamamoto, Gifu University

Masakazu Yasuda, Gifu University

Kunihito Kato, Gifu University

Masahiko Ishida, Hitachi System & Service, Ltd.

Keishi Murata, R&D Dep. of Softpia Japan

Laurent Najman, Oc? Print Logic Technologies SA

Olivier Gibot, Oc? Print Logic Technologies SA

Stéphane Berche, Oc? Print Logic Technologies SA

Koichi Kise, German Research Center for Artificial Intelligence (DFKI)

Markus Junker, German Research Center for Artificial Intelligence (DFKI)

Andreas Dengel, German Research Center for Artificial Intelligence (DFKI)

Keinosuke Matsumoto, Osaka Prefecture Univ.

Taizo Kameshiro, Mitsubishi Electric Co.

Takashi Hirano, Mitsubishi Electric Co.

Yasuhiro Okada, Mitsubishi Electric Co.

Fumio Yoda, Mitsubishi Electric Co.

Cholwich Nattee, Tokyo Institute of Technology

Masayuki Numao, Tokyo Institute of Technology

M. S. Hoque, University of Kent

M. C. Fairhurst, University of Kent

Takashi Kobayashi, Shizuoka University

Kaori Nakamura, Shizuoka University

Hirokazu Muramatsu, Shizuoka University

Takahiro Sugiyama, Shizuoka University

Keiichi Abe, Shizuoka University

San-Lung Zhao, National Chiao Tung University

Hsi-Jian Lee, National Chiao Tung University

Ahmed M. Elgammal, University of Maryland

Mohamed A. Ismail, University of Alexandria

Vu Hai Quan, University of Natural Sciences, HoChiMinh

Hoang Kiem, University of Natural Sciences, HoChiMinh

Pham Nam Trung, University of Natural Sciences, HoChiMinh

LamTri Tin, University of Natural Sciences, HoChiMinh

Nguyen Duc Hoang Ha, University of Natural Sciences, HoChiMinh

An. H Nguyen, Northwestern Polytechnic University

Lei Huang, Chinese Academy of Sciences

Xiao Huang, Michigan State University

Xue Gao, South China University of Technology

Lian-Wen Jin, South China University of Technology

Jun-Xun Yin, South China University of Technology

Jian-Cheng Huang, Motorola China Research Center

Weihua Huang, University of Singapore

Chew Lim Tan, University of Singapore

Sam Yuan Sung, University of Singapore

Yi Xu, University of Singapore

Taik H. Rhee, KAIST

Sung J. Cho, KAIST

Jin H. Kim, KAIST

Minoru Mori, NTT Corporation

Minako Sawaki, NTT Corporation

Norihiro Hagita, NTT Corporation

Hiroshi Murase, NTT Corporation

Naoki Mukawa, NTT Corporation

Natanael Rodrigues Gomes, UNICAMP, SP - BRAZIL

Lee Luan Ling, UNICAMP, SP - BRAZIL

Faten Hussein, University of British Columbia

Rabab Ward, University of British Columbia

Nawwaf Kharma, Concordia University

Alessandro L. Koerich, ?cole de Technologie Sup?rieure

Robert Sabourin, ?cole de Technologie Sup?rieure

Ching Y. Suen, Concordia University

Cinthia O. A. Freitas, Pontif?cia Universidade Cat?lica do Paran?

Flávio Bortolozzi, Pontif?cia Universidade Cat?lica do Paran?

Robert Sabourin, ?cole de Technologie Sup?rieure

Yimei Ding, Mie University

Masayuki Okada, Mie University

Fumitaka Kimura, Mie University

Yasuji Miyake, Chubu University

Gyeonghwan Kim, Sogang University

Seokgoo Lee, Sogang University

Miyoung Shin, Electronics and Telecommunications Research Institute

Yun Seok Nam, Electronics and Telecommunications Research Institute

Laurence Likforman-Sulem, Ecole Nationale Sup?rieure des T?l?communications

Graham Leedham, Nanyang Technological University

Wei Kei Tan, Nanyang Technological University

Weng Lee Yap, Nanyang Technological University

A. Belaïd, LORIA-CNRS

Y. Belaïd, LORIA-University of Nancy 2

Late N. Valverde, ITESOFT

S. Kébairi, ITESOFT

Hiroshi Shinjo, Hitachi, Ltd.

Eiichi Hadano, Hitachi, Ltd.

Katsumi Marukawa, Hitachi, Ltd.

Yoshihiro Shima, Hitachi, Ltd.

Hiroshi Sako, Hitachi, Ltd.

Yefeng Zheng, Tsinghua University

Changsong Liu, Tsinghua University

Xiaoqing Ding, Tsinghua University

Shiyan Pan, Tsinghua University

Kuo-Chin Fan, National Central University

Mei-Lin Chang, National Central University

Yuan-Kai Wang, Fu Jen University

Shinji Tsuruoka, Mie University

Toru Tanaka, Mie University

Tomohiro Yoshikawa, Mie University

Tsuyoshi Shinogi, Mie University

Kensuke Takao, Suzuka Fuji Xerox Co.

Xiangyun Ye, Concordia University

Mohamed Cheriet, Concordia University

Ching Y. Suen, University of Quebec

John F. Pitrelli, IBM Research

Amit Roy, IBM Research

John F. Pitrelli, IBM Research

Amit Roy, IBM Research

Yong Haur Tay, Universiti Teknologi Malaysia

Marzuki Khalid, Universiti Teknologi Malaysia

Pierre-Michel Lallican, Vision Objects

Stefan Knerr, Vision Objects

Christian Viard-Gaudin, Ecole Polytechnique de l'Universit? de Nantes

S. Marukatat, Universit? Paris 6

T. Artières, Universit? Paris 6

P. Gallinari, Universit? Paris 6

B. Dorizzi, Institut National des T?l?communications

Takashi Hirano, Mitsubishi Electric Corp.

Yasuhiro Okada, Mitsubishi Electric Corp.

Fumio Yoda, Mitsubishi Electric Corp.

Markus Feldbach, Otto-von-Guericke University of Magdeburg

Klaus D. Tönnies, Otto-von-Guericke University of Magdeburg

Wing Seong Wong, The Nottingham Trent University

Nasser Sherkat, The Nottingham Trent University

Tony Allen, The Nottingham Trent University

Ming Ye, University of Washington

Marshall Bern, Xerox Palo Alto Research Center

David Goldberg, Xerox Palo Alto Research Center

Yuko Eto, Toshiba Corporation e-Solution Company

Masakazu Suzuki, Kyushu University

Richard Zanibbi, Queen's University

Dorothea Blostein, Queen's University

James R. Cordy, Queen's University

Kam-Fai Chan, The Hong Kong University of Science and Technology

Dit-Yan Yeung, The Hong Kong University of Science and Technology

Bertrand Coüasnon, IRISA / INSA-D?partement Informatique

Laurent Pasquer, IRISA / Universit? de Rennes 1

A. Antonacopoulos, University of Liverpool

D.P. Kennedy, University of Liverpool

U. Pal, Indian Statistical Institute

B. B. Chaudhuri, Indian Statistical Institute

B.B. Chaudhuri, Indian Statistical Institute

U. Pal, Indian Statistical Institute

M. Mitra, Indian Statistical Institute

Veena Bansal, Indian Institute of Technology

M. K. Sinha, Indian Institute of Technology

U. Garain, Indian Statistical Institute

B. B. Chaudhuri, Indian Statistical Institute

Jungpil Shin, University of Aizu

Véronique Eglin, INSA de Lyon

Antoine Gagneux, INSA de Lyon

Thomas M. Breuel, Xerox PARC

Don Sylwester, Concordia University

Sharad Seth, University of Nebraska, Lincoln

Souad Souafi-Bensafi, I.N.S.A. de LYON

Marc Parizeau, Universit? Laval

Franck Lebourgeois, I.N.S.A. de LYON

Hubert Emptoz, I.N.S.A. de LYON