ISBN: 0-8186-7898-4

F. LeBourgeois, Laboratoire de Reconnaissance de Formes et Vision

P. Foggia, Dipartimento di Informatica e Sistemistica, Universita' degli Studi di Napoli "Federico II"

C. Sansone, Dipartimento di Informatica e Sistemistica, Universita' degli Studi di Napoli "Federico II"

F. Tortorella, Dipartimento di Informatica e Sistemistica, Universita' degli Studi di Napoli "Federico II"

M. Vento, Dipartimento di Informatica e Sistemistica, Universita' degli Studi di Napoli "Federico II"

Kyusik Chung, Dept. of Electron. Eng., Soongsil Univ., Seoul, South Korea

Jongmin Yoon, Dept. of Electron. Eng., Soongsil Univ., Seoul, South Korea

Takeshi Nagasaki, Tokyo Univ. of Agriculture and Technology

Takayoshi Yamamoto, Tokyo Univ. of Agriculture and Technology

Masaki Nakagawa, Tokyo Univ. of Agriculture and Technology

Y. Waizumi, Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan

N. Kato, Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan

K. Saruta, Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan

Y. Nemoto, Graduate Sch. of Inf. Sci., Tohoku Univ., Sendai, Japan

Toru Wakahara, NTT Human Interface Laboratories

Kazumi Odaka, NTT Human Interface Laboratories

Anil K. Jain, Michigan State University

Bin Yu, Michigan State University

Hongwei Shi, State University of New York at Stony Brook

Theo Pavlidis, State University of New York at Stony Brook

Yasuto Ishitani

Sueki Matsumura, NTT Human Interface Laboratories

Tomonori Kobayashi, NTT Human Interface Laboratories

Osamu Nakamura, NTT Human Interface Laboratories

Kenji Ogura, NTT Human Interface Laboratories

Rolf Brugger, University of Fribourg

Abdelwahab Zramdini, University of Fribourg

Rolf Ingold, University of Fribourg

P. Suda, Siemens AG, Otto-Hahn-Ring 6, D-81730 M?nchen ENST, 46, Rue Barrault, F-75634 Paris

C. Bridoux, Siemens AG, Otto-Hahn-Ring 6, D-81730 M?nchen ENST, 46, Rue Barrault, F-75634 Paris

B. Kämmerer, Siemens AG, Otto-Hahn-Ring 6, D-81730 M?nchen ENST, 46, Rue Barrault, F-75634 Paris

G. Maderlechner, Siemens AG, Otto-Hahn-Ring 6, D-81730 M?nchen ENST, 46, Rue Barrault, F-75634 Paris

Huizhu Luo, The Pennsylvania State University

Rangachar Kasturi, The Pennsylvania State University

Juan F. Arias, NYNEX Science and Technology

Atul Chhabra, NYNEX Science and Technology

Lin Yu Tseng, National Chung Hsing University

Rung-Ching Chen, National Chung Hsing University

Dov Dori

Liu Wenyin

Jien Kato

Toyohide Watanabe

Takeshi Nakayama

U. Bohnacker, Res. Center, Daimler-Benz AG, Ulm, Germany

J. Schacht, Res. Center, Daimler-Benz AG, Ulm, Germany

T. Yucel, Res. Center, Daimler-Benz AG, Ulm, Germany

J.T. Favata, CEDAR, State Univ. of New York, Buffalo, NY, USA

Loris Navoni, SGS-Thomson Microelectronics

Roberto Canegallo, SGS-Thomson Microelectronics

Mauro Chinosi, SGS-Thomson Microelectronics

Giovanni Gozzini, SGS-Thomson Microelectronics

Alan Kramer, SGS-Thomson Microelectronics

Pier Luigi Rolandi, SGS-Thomson Microelectronics

V. Bouletreau

N. Vincent

R. Sabourin

H. Emptoz

Myriam Coté

Mohamed Cheriet

Eric Lecolinet

Chin Y. Suen

E. Anquetil, IRISA

G. Lorette, IRISA

G. Saon, CRIN, CNRS, Vandoevre-les-Nancy, France

A. Belaid, CRIN, CNRS, Vandoevre-les-Nancy, France

Fu Chang, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan

Ya-Ching Lu, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan

T. Pavlidis, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan

Jin-Yong Yoo, Computer Vision Lab., Chung-Ang University

Min-Ki Kim, Computer Vision Lab., Chung-Ang University

Sang Yong Han, Computer Vision Lab., Chung-Ang University

Young-Bin Kwon, Computer Vision Lab., Chung-Ang University

Hirobumi Nishida, Ricoh Information and Communication R&D Center

N. H. Han, Inha University

C. W. La, Inha University

P. K. Rhee, Inha University

Changming Sun, CSIRO Mathematical and Information Sciences

Deyi Si, Beijing Univ. of Aeronautics and Astronautics

Jaakko Sauvola, Machine Vision and Media Processing Group Infotech Oulu, University of Oulu

Tapio Seppänen, Machine Vision and Media Processing Group Infotech Oulu, University of Oulu

Sami Haapakoski, Machine Vision and Media Processing Group Infotech Oulu, University of Oulu

Matti Pietikäinen, Machine Vision and Media Processing Group Infotech Oulu, University of Oulu

Jianchang Mao, IBM Almaden Res. Center, San Jose, CA, USA

R. Lorie, IBM Almaden Res. Center, San Jose, CA, USA

K. Mohiuddin, IBM Almaden Res. Center, San Jose, CA, USA

J.H. Shamilian, Lucent Technol. Inc., AT&T Bell Labs., Holmdel, NJ, USA

H.S. Baird, Lucent Technol. Inc., AT&T Bell Labs., Holmdel, NJ, USA

T.L. Wood, Lucent Technol. Inc., AT&T Bell Labs., Holmdel, NJ, USA

Hiroyuki Arai, NTT Human Interface Laboratories

Kazumi Odaka, NTT Human Interface Laboratories

Yuan Y. Tang, Hong Kong Baptist University, Kowloon Tong, Hong Kong

Jiming Liu, Hong Kong Baptist University, Kowloon Tong, Hong Kong

F. Cesarini

E. Francesconi M. Gori

S. Marinai

J.Q. Sheng

G. Soda

C. Cracknell, University of Essex

A. C. Downton, University of Essex

L. Du, University of Essex

Wilson W.S. Ip, Hong Kong Polytechnic University

Korris F.L. Chung, Hong Kong Polytechnic University

Daniel S. Yeung, Hong Kong Polytechnic University

Adnan Amin, University of New South Wales

Seung-Gwon Kim, University of New South Wales

Claude Sammut, University of New South Wales

Choi Baek Young, Dept. of Comput. Sci. & Eng., Pohang Univ. of Sci. & Technol., South Korea

Bang Sung-Yang, Dept. of Comput. Sci. & Eng., Pohang Univ. of Sci. & Technol., South Korea

Keiji Yamada, Information Technology Research Laboratories, NEC Corporation

Youbin Chen, Tsinghua University

Xiaoqing Ding, Tsinghua University

Youshou Wu, Tsinghua University

Ke Liu, Concordia University

Yea S. Huang, Concordia University

Ching Y. Suen, Concordia University

Toyohide Watanabe, Nagoya University

Xiaoou Huang, Nagoya University

A. Lawrence Spitz, Daimler Benz Research and Technology Center

Francine R. Chen, Xerox Palo Alto Research Center

Dan S. Bloomberg, Xerox Palo Alto Research Center

Aya Soffer, Computer Science and EE Department University of Maryland Baltimore County

L. Du, University of Essex

A. C. Downton, University of Essex

S. M. Lucas, University of Essex

B. Al-Badr, University of Essex

H. Walischewski, Daimler-Benz AG

Jiangying Zhou, Panasonic Information and Networking Technology Laboratory

Daniel Lopresti, Panasonic Information and Networking Technology Laboratory

R.S. Kashi, Bell Labs, Lucent Technologies

J. Hu, Bell Labs, Lucent Technologies

W. L. Nelson, Bell Labs, Lucent Technologies

W. Turin, AT&T Research Lab

N. Nobile, Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada

S. Bergler, Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada

C.Y. Suen, Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada

S. Khoury, Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada

C. Schmidt, RWTH Aachen, Lehrstuhl fur Technische Informatik Ahornstr

K.-F. Kraiss, RWTH Aachen, Lehrstuhl fur Technische Informatik Ahornstr

B. Wirtz, Central Res. & Dev., Siemens AG, Munich, Germany

Marcel Worring, Intelligent Sensory Information Systems, University of Amsterdam

Arnold W.M. Smeulders, Intelligent Sensory Information Systems, University of Amsterdam

George Nagy, Electrical, Computer, and Systems Engineering Rensselaer Polytechnic Institute

Yihong Xu, Electrical, Computer, and Systems Engineering Rensselaer Polytechnic Institute

Raymund Yee-Mian Teo, Concordia University

Rajjan Shinghal, Concordia University

Il-Seok Oh, Concordia University

Ching Y. Suen, Concordia University

Jie Zhou

Qiang Gan

Ching Y. Suen

Hiroyuki Hase, Toyama University

Toshiyuki Shinokawa, Toyama University

Masaaki Yoneda, Toyama University

Mitsuru Sakai, Toyama University

Hiroshi Maruyama, Toyama University

M. Watanabe, Faculty of Engineering Yamaguchi University

Y. Hamamoto, Faculty of Engineering Yamaguchi University

T. Yasuda, Faculty of Engineering Yamaguchi University

S. Tomita, Faculty of Engineering Yamaguchi University

J.J. Hull, Ricoh California Res. Center, Menlo Park, CA, USA

J.F. Cullen, Ricoh California Res. Center, Menlo Park, CA, USA

D. Doermann, Institute for Advanced Computer Studies, University of Maryland, College Park

H. Li, Institute for Advanced Computer Studies, University of Maryland, College Park

O. Kia, Institute for Advanced Computer Studies, University of Maryland, College Park

J.K. Guo

D. Doermann

A Rosenfeld

F. Cesarini, Soda.

E. Francesconi, Soda.

M. Gori, Soda.

S. Marinai, Soda.

J.Q. Sheng, Soda.

G. Soda, Soda.

V.F. Maergner, Institute for Communication Technology, Technical University Braunschweig

P. Karcher, Institute for Communication Technology, Technical University Braunschweig

A.-K. Pawlowski, Institute for Communication Technology, Technical University Braunschweig

Liang-Hua Chen

Jiing-Yuh Wang

B. Poirier, Dept. de Genie Electr., Ecole Polytech. de Montreal, Que., Canada

M. Dagenais, Dept. de Genie Electr., Ecole Polytech. de Montreal, Que., Canada

Christian Ah-Soon, CRIN/CNRS & INRIA Lorraine

Karl Tombre, CRIN/CNRS & INRIA Lorraine

Diana Galindo, URA CNRS 820, ENST-SIG

Claudie Faure, URA CNRS 820, ENST-SIG

Stephane Lavirotte, INRIA Sophia Antipolis, projet SAFIR

Hao Chen

Oscar E. Agazzi

Ching Y. Suen

K. Takahashi, Waseda University

H. Yasuda, Waseda University

T. Matsumoto, Waseda University

Masaki Nakagawa

Takao Higashiyama

Yukiko Yamanaka

Shin-ichi Sawada

Levan Higashigawa

Katsuhiko Akiyama

Adel M. Alimi, REGIM: Research Group on Intelligent Machines

L. Vuurpijl, Inst. for Cognition & Inf., Nijmegen Univ., Netherlands

L. Schomaker, Inst. for Cognition & Inf., Nijmegen Univ., Netherlands

John D. Hobby, Bell Labs, Lucent Technologies

Tin Kam Ho, Bell Labs, Lucent Technologies

A. Bagdanov, Inf. Sci. Res. Inst., Nevada Univ., Las Vegas, NV, USA

J. Kanai, Inf. Sci. Res. Inst., Nevada Univ., Las Vegas, NV, USA

Ryoji Haruki, Fundamental Mathematical Sciences Laboratory

Takahiko Horiuchi, Fundamental Mathematical Sciences Laboratory

K.S. Ng, Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, Hong Kong

L.M. Cheng, Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, Hong Kong

C.H. Wong, Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, Hong Kong

Gao Jingbo, Tsinghua University

Li Xinyou, Tsinghua University

Tang Zesheng, Tsinghua University

Y. Ariki, Ryukoku University

T. Teranishi, Ryukoku University

Takashi Miyamoto, Toshiba Corporation OME Works

Yasuto Ishitani, Toshiba Corporation OME Works

Kazushi Seino, Toshiba Corporation OME Works

Toshihiro Nakamura, Toshiba Corporation OME Works

Yoshihisa Tanabe, Toshiba Corporation OME Works

Horst Bunke

Rene Gonin

Daniel Moeri

A. Hennig, The Nottingham Trent University

E. Marongiu, The Nottingham Trent University

N. Sherkat, The Nottingham Trent University

R. J. Whitrow, The Nottingham Trent University

G. Raza, The Nottingham Trent University

A. Hennig, The Nottingham Trent University

N. Sherkat, The Nottingham Trent University

R. J. Whitrow, The Nottingham Trent University

K.T. Miura, Dept. of Mech. Eng., Shizuoka Univ., Hamamatsu, Japan

R. Sato, Dept. of Mech. Eng., Shizuoka Univ., Hamamatsu, Japan

S. Mori, Dept. of Mech. Eng., Shizuoka Univ., Hamamatsu, Japan

Z. Shi, Center of Excellence for Document Analysis and Recognition State University of New York at Buffalo, Buffalo, NY 14260, U.S.A.

S. N. Srihari, Center of Excellence for Document Analysis and Recognition State University of New York at Buffalo, Buffalo, NY 14260, U.S.A.

Y-C. Shin, Center of Excellence for Document Analysis and Recognition State University of New York at Buffalo, Buffalo, NY 14260, U.S.A.

V. Ramanaprasad, Center of Excellence for Document Analysis and Recognition State University of New York at Buffalo, Buffalo, NY 14260, U.S.A.

Jongryeol Kim, Dept. of Electron. Eng., Soongsil Univ., Seoul, South Korea

Kukhwan Seo, Dept. of Electron. Eng., Soongsil Univ., Seoul, South Korea

Kyusik Chung, Dept. of Electron. Eng., Soongsil Univ., Seoul, South Korea

Maurice Szmurlo, Universite de Caen, Laboratoire d'informatique

Luan Ling Lee, DECOM-FEEC-UNICAMP

Natanael Rodrigues Gomes, DECOM-FEEC-UNICAMP

Xiaofan Lin, Image Processing Division Tsinghua University, Beijing 100084, P.R.C

Xiaoqing Ding, Image Processing Division Tsinghua University, Beijing 100084, P.R.C

Youshou Wu, Image Processing Division Tsinghua University, Beijing 100084, P.R.C

Kazuhiro Sawa

Shinji Tsuruoka

Tetsushi Wakabayashi

Fumitaka Kimura

Yasuji Miyake

Sang-Yup Kim, Korea University

Seong-Whan Lee, Korea University

Mehmet Ali Ozdil-Fatos T. Yarman Vural, Middle East Technical University

Rolf Bippus, Institute for Communication Technology, Technical Univ. Braunschweig(Germany)

Minako Sawaki, NTT Basic Research Laboratories and NTT Communication Science Laboratories

Norihiro Hagita, NTT Basic Research Laboratories and NTT Communication Science Laboratories

Kenichiro Ishii, NTT Basic Research Laboratories and NTT Communication Science Laboratories

Toshifumi Yamauchi, NEC Corporation

Yasuharu Itamoto, NEC Corporation

Jun Tsukumo, NEC Corporation

L. Prevost

M. Milgram

Takashi Hirano, Human media department Information Technology R&D Center, Mitsubishi Electric Corp.

Yasuhiro Okada, Human media department Information Technology R&D Center, Mitsubishi Electric Corp.

Fumio Yoda, Human media department Information Technology R&D Center, Mitsubishi Electric Corp.

Takahiko Horiuchi, Inst. Info. Sci. and Elec. University of Tsukuba

Ryoji Haruki, Inst. Info. Sci. and Elec. University of Tsukuba

Hiromitsu Yamada, Machine Understanding Division, Electrotechnical Lab.

Kazuhiko Yamamoto, Faculty of Engineering, Gifu University

J. Franke, Research Center Ulm

J. M. Gloger, Research Center Ulm

A. Kaltenmeier, Research Center Ulm

E. Mandler, Research Center Ulm

P.M. Lallican, IRESTE/SEI EP CNRS 63

C. Viard-Gaudin, IRESTE/SEI EP CNRS 63

Bin Zhao, Tsinghua University

Hui Su, Tsinghua University

Shaowei Xia, Tsinghua University

Stefan Jaeger, Daimler-Benz AG

Jean Marc Ogier

Rémy Mullot

Jacques LaBiche

Yves LeCoutier

S. Madhvanath, IBM Almaden Research Center

V. Govindaraju, CEDAR, Department of Computer Science, SUNY at Buffalo

Satoshi Naoi, Fujitsu Laboratories LTD.

Maki Yabuki, Fujitsu Laboratories LTD.

Didier Guillevic, CENPARMI, Suite GM-606

Ching Y. Suen, CENPARMI, Suite GM-606

Christian Olivier, PSI-La3i, universit? de Rouen

Frédéric Jouzel, PSI-La3i, universit? de Rouen

Manuel Avila, PSI-La3i, universit? de Rouen

S. Madhvanath, IBM Almaden Research Center

V. Krpasundar, Viewlogic Systems Inc.

J.M. Gloger, Daimler-Benz Research Center Ulm

A. Kaltenmeier, Daimler-Benz Research Center Ulm

E. Mandler, Daimler-Benz Research Center Ulm

L. Andrews, Siemens Electrocom GmbH

C. Aufmuth, Res. Center, Daimler-Benz AG, Ulm, Germany

A. Djematen, Laboratoire d'Informatique du Havre

B. Taconet, Laboratoire d'Informatique du Havre

A. Zahour, Laboratoire d'Informatique du Havre

Lin Yu Tseng, National Chung Hsing University

Rung-Ching Chen, National Chung Hsing University

S.X. Liao, Dept. of Bus. Comput., Winnipeg Univ., Man., Canada

Qin Lu, Dept. of Bus. Comput., Winnipeg Univ., Man., Canada

U. Pal, Computer Vision and Pattern Recognition Unit Indian Statistical Institute

B. B. Chaudhuri, Computer Vision and Pattern Recognition Unit Indian Statistical Institute

H. Miled, Rouen Univ., Mont-Saint-Aignan, France

C. Olivier, Rouen Univ., Mont-Saint-Aignan, France

M. Cheriet, Rouen Univ., Mont-Saint-Aignan, France

Y. Lecoutier, Rouen Univ., Mont-Saint-Aignan, France

Chungnan Lee, National Sun Yat-Sen University

Bohom Wu, National Sun Yat-Sen University

Wen-Chen Huang, Chia-Nan College of Pharmacy and Science

C.L. Yu, Center for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada

C.Y. Suen, Center for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada

Y.Y. Tang, Center for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada

Torsten Caesar, Daimler-Benz Research Center Ulm

Adnan Amin, University of New South Wales

Kanad Keeni, JAIST, Hokuriku

Hiroshi Shimodaira, JAIST, Hokuriku

Kenji Nakayama, Kanazawa University

Kyung Hee Kim, Software Center, Samsung Electron., South Korea

Tae Jin Seong, Software Center, Samsung Electron., South Korea

Jeong In Doh, Software Center, Samsung Electron., South Korea

Tzren-Ru Chou, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan

Fu Chang, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan

Adnan Amin, University of New South Wales

Wathiq Mansoor, University of New South Wales

Xingyuan Li, Image Process. Dept., Syst. Eng. Res. Inst., Taejon, South Korea

Weon-Geun Oh, Image Process. Dept., Syst. Eng. Res. Inst., Taejon, South Korea

Jiarong Hong, Image Process. Dept., Syst. Eng. Res. Inst., Taejon, South Korea

Wen Gao, Image Process. Dept., Syst. Eng. Res. Inst., Taejon, South Korea

Jing Zheng, Dept. of Electron. Eng., Tsinghua Univ., Beijing, China

Xiaoqing Ding, Dept. of Electron. Eng., Tsinghua Univ., Beijing, China

Youshou Wu, Dept. of Electron. Eng., Tsinghua Univ., Beijing, China

Deya Motawa, University of New South Wales

Adnan Amin, University of New South Wales

Robert Sabourin, University of New South Wales

Yi-Hong Tseng, National Chiao Tung University

Chi-Chang Kuo, National Chiao Tung University

Hsi-Jian Lee, National Chiao Tung University

Y. Tonouchi, Knowledge & Media Technol. Dept., Toshiba Corp., Kawasaki, Japan

A. Kawamura, Knowledge & Media Technol. Dept., Toshiba Corp., Kawasaki, Japan

Fevzi Alimoglu, Bogazici University

Ethem Alpaydin, Bogazici University

Andreas Kosmala, Duisburg University

Joerg Rottland, Duisburg University

Gerhard Rigoll, Duisburg University

Z. Xuejun, - Zhao Xuejin; Liu Xinyu; Zheng Shengling; Pan Baochang; Tang, Y.Y. Chongqing Univ., China

L. Xinyu, - Zhao Xuejin; Liu Xinyu; Zheng Shengling; Pan Baochang; Tang, Y.Y. Chongqing Univ., China

Z. Shengling, - Zhao Xuejin; Liu Xinyu; Zheng Shengling; Pan Baochang; Tang, Y.Y. Chongqing Univ., China

P. Baochang, - Zhao Xuejin; Liu Xinyu; Zheng Shengling; Pan Baochang; Tang, Y.Y. Chongqing Univ., China

Y. Tang, - Zhao Xuejin; Liu Xinyu; Zheng Shengling; Pan Baochang; Tang, Y.Y. Chongqing Univ., China

Shahram Moin1

Jean-Jules Brault

Ronny Martens, IMEC vzw

Luc Claesen, IMEC vzw

Ronny Martens, IMEC vzw

Luc Claesen, IMEC vzw

Robert Sabourin, Laboratoire d'Imagerie, de Vision et d'Intelligence Artificielle (LIVIA)

J.-P. Drouhard, Laboratoire d'Imagerie, de Vision et d'Intelligence Artificielle (LIVIA)

Etienne Sum Wah, Laboratoire d'Imagerie, de Vision et d'Intelligence Artificielle (LIVIA)

H. Shinjo, Hitachi Ltd, Japan

K. Nakashima, Hitachi Ltd, Japan

M. Koga, Hitachi Ltd, Japan

K. Marukawa, Hitachi Ltd, Japan

Y. Shima, Hitachi Ltd, Japan

E. Hadano, Hitachi Ltd, Japan

Majdi Ben Hadj Ali, German Research Center for Artificial Intelligence

K. S. Ng, City University of Hong Kong

L. M. Cheng, City University of Hong Kong

Masami Oguro

Apostolos Antonacopoulos, University of Liverpool

Veronique Eglin, Laboratoire de Reconnaissance de Formes et Vision RFV

Hubert Emptoz, Laboratoire de Reconnaissance de Formes et Vision RFV

Yuan Y. Tang

Jiming Liu

Lihua Yang

A. Abak

U. Baris

B. Sankur

Kazuhide Sugawara, Tokyo Research Laboratory, IBM Japan Ltd.

Konstantin Zuyev, Bit Software, Moscow, Russia.

Yasushi Yamazaki, Department of Electronics & Communication Engineering School of Science & Engineering, Waseda University

Naohisa Komatsu, Department of Electronics & Communication Engineering School of Science & Engineering, Waseda University

Paul O'Neil, Rome Laboratory (USAF)

J.F. Cullen, Ricoh Silicon Valley Inc., Ricoh California Res. Center, CA, USA

J.J. Hull, Ricoh Silicon Valley Inc., Ricoh California Res. Center, CA, USA

P.E. Hart, Ricoh Silicon Valley Inc., Ricoh California Res. Center, CA, USA

Floriana Esposito, Universita' degli Studi di Bari

Donato Malerba, Universita' degli Studi di Bari

Giovanni Semeraro, Universita' degli Studi di Bari

Cesare Daniele Antifora, Universita' degli Studi di Bari

Gioacchino de Gennaro, Universita' degli Studi di Bari

Karl-Hans Bläsius, Fachbereich Angewandte Informatik

Beate Grawemeyer, Fachbereich Angewandte Informatik

Isabel John, Fachbereich Angewandte Informatik

Norbert Kuhn, Fachbereich Angewandte Informatik

Claudia Wenzel, German Research Center for Artificial Intelligence DFKI GmbH

F. Chang

T.F. Chiu

T.R. Chou

M.C. Lee

Y.C. Lu

T.Y. Shuai

T.M. Tan

J.J. Wu

C.S. Young

T. A. Bayer, Daimler-Benz Research Information Technology Text Understanding Systems

H. U. Mogg-Schneider, Daimler-Benz Research Information Technology Text Understanding Systems

F. Bapst, University of Fribourg

A. Zramdini, University of Fribourg

R. Ingold, University of Fribourg

Salim Djeziri, Universite du Quebec a Trois-Rivieres

Fathallah Nouboud, Universite du Quebec a Trois-Rivieres

Rejean Plamondon, Ecole Polytechnique de Montreal

M. Wolf, Bavarian Research Center for Knowledge Based Systems (FORWISS)

H. Niemann, Bavarian Research Center for Knowledge Based Systems (FORWISS)

W. Schmidt, Siemens AG, AUT V21

R. Safari

N. Narasimhamurthy

M. Shridhar

M. Ahmadi

S. Diana, Laboratoire PSI / La3I, Universite de Rouen

E. Trupin, Laboratoire PSI / La3I, Universite de Rouen

F. Jouzel, Laboratoire PSI / La3I, Universite de Rouen

Y. Lecourtier, Laboratoire PSI / La3I, Universite de Rouen

J. Labiche, Laboratoire ISMRA / LACP

Gregory Dzuba, Parascript, LLC, 1035 Pearl Street, Suite 206, Boulder, CO 80302 USA

Alexander Filatov, Parascript, LLC, 1035 Pearl Street, Suite 206, Boulder, CO 80302 USA

Alexander Volgunin, Parascript, LLC, 1035 Pearl Street, Suite 206, Boulder, CO 80302 USA

G. Hutton, University of Nottingham, England

M. Cripps, University of Nottingham, England

D.G. Elliman, University of Nottingham, England

C.A. Higgins, University of Nottingham, England

S. Ablameyko, Institute of Engineering Cybernetics, Belarussian Academy of Sciences

V. Bereishik, Institute of Engineering Cybernetics, Belarussian Academy of Sciences

O. Frantskevich, Institute of Engineering Cybernetics, Belarussian Academy of Sciences

M. Homenko, Institute of Engineering Cybernetics, Belarussian Academy of Sciences

N. Paramonova, Institute of Engineering Cybernetics, Belarussian Academy of Sciences

J.Y. Ramel

N. Vincent

J.M. Brun

Michael H. Malburg, DFKI GmbH

J.F. Arias, NYNEX Sci. & Technol., White Plains, NY, USA

A. Chhabra, NYNEX Sci. & Technol., White Plains, NY, USA

V. Misra, NYNEX Sci. & Technol., White Plains, NY, USA

Tadahiro Kitahashi

Muneki Ohya

Koh Kakusho

Noboru Babaguchi

A.M. Vossepoel, Delft Univ. of Technol., Netherlands

K. Schutte, Delft Univ. of Technol., Netherlands

C.F.P. Delanghe, Delft Univ. of Technol., Netherlands

E. Lank, Dept. of Comput. & Inf. Sci., Queen's Univ., Kingston, Ont., Canada

D. Blostein, Dept. of Comput. & Inf. Sci., Queen's Univ., Kingston, Ont., Canada

Toyohide Watanabe, Nagoya University Furo-cho

Rui Zhang, Nagoya University Furo-cho

Jairo Rocha Rafael Bernardino, University of the Balearic Islands