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Proceedings of 3rd International Conference on Document Analysis and Recognition (1995)
Montreal, Quebec, Canada
Aug. 14, 1995 to Aug. 16, 1995
ISBN: 0-8186-7128-9
TABLE OF CONTENTS
Reviewers (PDF)
pp. xxiv,xxv
Reviewers (PDF)
pp. xxiv
Keynote Speech:
P.E. Baier , Mannheim Univ., Germany
pp. 1
Session 1.2-A: Word Recognition I
S.N. Srihari , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
Yong-Chul Shin , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
V. Ramanaprasad , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
Dar-Shyang Lee , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
pp. 5
D. Guillevic , CENPARMI, Concordia Univ., Montreal, Que., Canada
C.Y. Suen , CENPARMI, Concordia Univ., Montreal, Que., Canada
pp. 11
J.-P. Dodel , Dept. of Comput. Sci., Concordia Univ., Montreal, Que., Canada
R. Shinghal , Dept. of Comput. Sci., Concordia Univ., Montreal, Que., Canada
pp. 15
C. Olivier , Rouen Univ., Mont-Saint-Aignan, France
T. Paquet , Rouen Univ., Mont-Saint-Aignan, France
M. Avila , Rouen Univ., Mont-Saint-Aignan, France
Y. Lecourtier , Rouen Univ., Mont-Saint-Aignan, France
pp. 19
Gyeonghwan Kim , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
V. Govindaraju , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
pp. 24
Session 1.2-B: Neural Networks
Seong-Whan Lee , Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
Jong-Soo Kim , Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
pp. 28
Dar-Shyang Lee , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
S.N. Srihari , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
pp. 42
Hui Su , Dept. of Autom., Tsinghua Univ., Beijing, China
Wei Wang , Dept. of Autom., Tsinghua Univ., Beijing, China
Xinyou Li , Dept. of Autom., Tsinghua Univ., Beijing, China
Shaowei Xia , Dept. of Autom., Tsinghua Univ., Beijing, China
pp. 46
Session 1.2-C: On-Line Recognition I
S. Garcia-Salicetti , Inst. Nat. des Telecommun., Evry, France
B. Doizzi , Inst. Nat. des Telecommun., Evry, France
P. Gallinari , Inst. Nat. des Telecommun., Evry, France
A. Mellouk , Inst. Nat. des Telecommun., Evry, France
D. Fanchon , Inst. Nat. des Telecommun., Evry, France
pp. 50
Pyeoung Kee Kim , Dept. of Comput. Sci., Pusan Women's Univ., South Korea
Hang Joon Kim , Dept. of Comput. Sci., Pusan Women's Univ., South Korea
pp. 54
L. Julia , ENST, CNRS, Paris, France
C. Faure , ENST, CNRS, Paris, France
pp. 58
R.K. Powalka , Dept. of Comput., Nottingham Trent Univ., UK
N. Sherkat , Dept. of Comput., Nottingham Trent Univ., UK
R.J. Whitrow , Dept. of Comput., Nottingham Trent Univ., UK
pp. 64
R.K. Powalka , Dept. of Comput., Nottingham Trent Univ., UK
N. Sherkat , Dept. of Comput., Nottingham Trent Univ., UK
R.J. Whitrow , Dept. of Comput., Nottingham Trent Univ., UK
pp. 68
Session 1.2-D: Application Systems
N.W. Strathy , Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada
C.Y. Suen , Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada
pp. 74
Jianchang Mao , IBM Almaden Res. Center, San Jose, CA, USA
K. Mohiuddin , IBM Almaden Res. Center, San Jose, CA, USA
T. Fujisaki , IBM Almaden Res. Center, San Jose, CA, USA
pp. 78
S. Madhvanath , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
V. Govindaraju , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
V. Ramanaprasad , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
D.S. Lee , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
S.N. Srihari , Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
pp. 82
L. Simoncini , Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
Z.M. Kovacs , Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
pp. 86
E. Lethelier , Service de Recherche Tech. de La Poste, Nantes, France
M. Leroux , Service de Recherche Tech. de La Poste, Nantes, France
M. Gilloux , Service de Recherche Tech. de La Poste, Nantes, France
pp. 92
Session 1.3-A: Handwritten Character Recognition
N. Feray , LACIS, Mont Saint Aignan, France
D. de Brucq , LACIS, Mont Saint Aignan, France
K. Romeo-Pakker , LACIS, Mont Saint Aignan, France
T. Paquet , LACIS, Mont Saint Aignan, France
pp. 104
J. Cao , Windsor Univ., Ont., Canada
M. Shridhar , Windsor Univ., Ont., Canada
M. Ahmadi , Windsor Univ., Ont., Canada
pp. 108
Moon Jeung Joe , LG Electron. Res. Center, Seoul, South Korea
Huen Joo Lee , LG Electron. Res. Center, Seoul, South Korea
pp. 112
Hung-Pin Chiu , Inst. of Comput. Sci. & Inf. Eng., Nat. Central Univ., Chung-Li, Taiwan
Din-Chang Tseng , Inst. of Comput. Sci. & Inf. Eng., Nat. Central Univ., Chung-Li, Taiwan
Jen-Chieh Cheng , Inst. of Comput. Sci. & Inf. Eng., Nat. Central Univ., Chung-Li, Taiwan
pp. 116
Session 1.3-B: Segmentation I
Y. Ariki , Ryukoku Univ., Ohtsu, Japan
Y. Motegi , Ryukoku Univ., Ohtsu, Japan
pp. 120
U. Mahadevan , Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
R.C. Nagabushnam , Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
pp. 124
Shin-Ywan Wang , Canon Inf. Syst., Costa Mesa, CA, USA
T. Yagasaki , Canon Inf. Syst., Costa Mesa, CA, USA
pp. 128
M. Ozaki , Fujii Xerox Palo Alto Lab., CA, USA
pp. 134
N. Normand , Lab. Syst. Electron. et Inf., IRESTE, Nantes, France
C. Viard-Gaudin , Lab. Syst. Electron. et Inf., IRESTE, Nantes, France
pp. 138
Session 1.3-C: Image Processing Techniques
Y.J. Gao , Inst. of Syst. Sci., Nat. Univ. of Singapore, Singapore
J.J. Lim , Inst. of Syst. Sci., Nat. Univ. of Singapore, Singapore
A.D. Narasimhalu , Inst. of Syst. Sci., Nat. Univ. of Singapore, Singapore
pp. 142
Yu Zhong , Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
K. Karu , Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
A.K. Jain , Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
pp. 146
K. Yamada , Inf. Technol. Res. Labs., NEC Corp., Kawasaki, Japan
pp. 150
S. Shimada , Central Res. Lab., Hitachi Ltd., Japan
K. Maruyama , Central Res. Lab., Hitachi Ltd., Japan
A. Matsumoto , Central Res. Lab., Hitachi Ltd., Japan
K. Hiraki , Central Res. Lab., Hitachi Ltd., Japan
pp. 154
Session 1.3-D: Database and Document Retrieval
Tyne Liang , Inst. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Suh-Yin Lee , Inst. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Wei-Pang Yang , Inst. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
pp. 159
S. Satoh , Nat. Center for Sci. Inf. Syst., Tokyo, Japan
A. Takasu , Nat. Center for Sci. Inf. Syst., Tokyo, Japan
E. Katsura , Nat. Center for Sci. Inf. Syst., Tokyo, Japan
pp. 163
M. Sugimoto , Dept. of Res. & Dev., NACSIS, Tokyo, Japan
K. Hori , Dept. of Res. & Dev., NACSIS, Tokyo, Japan
S. Ohsuga , Dept. of Res. & Dev., NACSIS, Tokyo, Japan
pp. 167
K. Tsuda , Dept. of Inf. Sci., Kyoto Univ., Japan
S. Senda , Dept. of Inf. Sci., Kyoto Univ., Japan
M. Minoh , Dept. of Inf. Sci., Kyoto Univ., Japan
K. Ikeda , Dept. of Inf. Sci., Kyoto Univ., Japan
pp. 171
F. Kanehara , Nat. Center for Sci. Inf. Syst., Tokyo Univ., Japan
S. Satoh , Nat. Center for Sci. Inf. Syst., Tokyo Univ., Japan
T. Hamada , Nat. Center for Sci. Inf. Syst., Tokyo Univ., Japan
pp. 175
Session 1.4-A: Signature Verificaton
B. Wirtz , Central Res. & Dev., Siemens AG, Munich, Germany
pp. 179
F. Bauer , Ecole Nat. Superieure des Telecommun. de Bretagne, Brest, France
B. Wirtz , Ecole Nat. Superieure des Telecommun. de Bretagne, Brest, France
pp. 183
Ke Han , Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
I.K. Sethi , Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
pp. 187
N.A. Murshed , Dept. de Inf., CEFET-PR, Curitiba, Brazil
F. Bortolozzi , Dept. de Inf., CEFET-PR, Curitiba, Brazil
R. Sabourin , Dept. de Inf., CEFET-PR, Curitiba, Brazil
pp. 191
R. Sabourin , Departement de Genie de la Production Autom., Ecole de Technol. Superieure, Montreal, Que., Canada
G. Genest , Departement de Genie de la Production Autom., Ecole de Technol. Superieure, Montreal, Que., Canada
pp. 197
Xu-Hong Xiao , Inst. of Autom., Acad. Sinica, Beijing, China
Ru-Wei Dai , Inst. of Autom., Acad. Sinica, Beijing, China
pp. 202
Session 1.4-B: Model-Base Document Analysis
O.T. Akindele , CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
A. Belaïd , CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
pp. 206
M. Cheriet , Ecole de Technol. Superieure, Quebec Univ., Montreal, Que., Canada
J.N. Said , Ecole de Technol. Superieure, Quebec Univ., Montreal, Que., Canada
C.Y. Suen , Ecole de Technol. Superieure, Quebec Univ., Montreal, Que., Canada
pp. 210
E. Green , Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
M. Krishnamoorthy , Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
pp. 214
O. Hori , Center for Autom. Res., Maryland Univ., College Park, MD, USA
D.S. Doermann , Center for Autom. Res., Maryland Univ., College Park, MD, USA
pp. 218
H. Bunke , Inst. fur Inf. und Angewandte Math., Bern Univ., Switzerland
R. Liviero , Inst. fur Inf. und Angewandte Math., Bern Univ., Switzerland
pp. 222
Session 1.4-C: Image Processing
Fu Chang , Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Yung-Ping Cheng , Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
T. Pavlidis , Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Tsuey-Yuh Shuai , Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
pp. 227
Hon-Son Don , Dept. of Electr. Eng., Nat. Chung-Hsing Univ., Taichung, Taiwan
pp. 231
Seong-Whan Lee , Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
Eun-Soon Kim , Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
Y.Y. Tang , Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
pp. 235
A. Takasu , Res. & Dev. Dept., Nat. Center for Sci. Inf. Syst., Tokyo, Japan
S. Satoh , Res. & Dev. Dept., Nat. Center for Sci. Inf. Syst., Tokyo, Japan
E. Katsura , Res. & Dev. Dept., Nat. Center for Sci. Inf. Syst., Tokyo, Japan
pp. 239
M. Röösli , Inst. fur Informationssyst., Eidgenossische Tech. Hochschule, Zurich, Switzerland
G. Monagan , Inst. fur Informationssyst., Eidgenossische Tech. Hochschule, Zurich, Switzerland
pp. 243
Session 1.4-D: Map Interpretation
M. Pierrot-Deseilligny , IGN/DT/MATIS, France
H. Le Men , IGN/DT/MATIS, France
G. Stamon , IGN/DT/MATIS, France
pp. 249
G. Maderlechner , Siemens AG, Munich, Germany
H. Mayer , Siemens AG, Munich, Germany
pp. 253
Huizhu Luo , Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
G. Agam , Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
I. Dinstein , Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
pp. 257
Wei Wu , Tokyo Univ., Japan
Wei Lu , Tokyo Univ., Japan
M. Sakauchi , Tokyo Univ., Japan
pp. 261
Session 2.1 -A: Classification Methods
T. Horiuchi , Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
K. Toraichi , Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
K. Yamamoto , Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
H. Yamada , Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
pp. 266
Tao Hong , Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
S.W. Lam , Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
J.J. Hull , Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
S.N. Srihari , Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
pp. 270
H. Mori , Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
H. Aso , Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
S. Makino , Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
pp. 274
Tin Kam Ho , AT&T Bell Labs., Murray Hill, NJ, USA
pp. 278
S. Senda , Dept. of Inf. Sci., Kyoto Univ., Japan
M. Minoh , Dept. of Inf. Sci., Kyoto Univ., Japan
I. Katsuo , Dept. of Inf. Sci., Kyoto Univ., Japan
pp. 283
Session 2.1 -B: Document Understanding
Y. Ishitani , Res. & Dev. Center, Toshiba Corp., Kawasaki, Japan
pp. 287
G.S.D. Farrow , Div. of Electr. Eng., Manchester Univ., UK
C.S. Xydeas , Div. of Electr. Eng., Manchester Univ., UK
J.P. Oakley , Div. of Electr. Eng., Manchester Univ., UK
pp. 293
K.H.C. Lin , Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Rey-Long Liu , Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Von-Wun Soo , Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 297
A. Ting , Sch. of Appl. Sci., Nanyang Technol. Inst., Singapore
M.K. Leung , Sch. of Appl. Sci., Nanyang Technol. Inst., Singapore
Siu-Cheung Hui , Sch. of Appl. Sci., Nanyang Technol. Inst., Singapore
Kai-Yun Chan , Sch. of Appl. Sci., Nanyang Technol. Inst., Singapore
pp. 301
K. Gyohten , Inst. of Sci. & Ind. Res., Osaka Univ., Japan
T. Sumiya , Inst. of Sci. & Ind. Res., Osaka Univ., Japan
N. Babaguchi , Inst. of Sci. & Ind. Res., Osaka Univ., Japan
K. Kakusho , Inst. of Sci. & Ind. Res., Osaka Univ., Japan
T. Kitahashi , Inst. of Sci. & Ind. Res., Osaka Univ., Japan
pp. 305
Session 2.1 -C: Feature Extraction
D. Lopresti , Matsushita Inf. Technol. Lab., Princeton, NJ, USA
Jiangying Zhou , Matsushita Inf. Technol. Lab., Princeton, NJ, USA
G. Nagy , Matsushita Inf. Technol. Lab., Princeton, NJ, USA
P. Sarkar , Matsushita Inf. Technol. Lab., Princeton, NJ, USA
pp. 309
W. Utschick , Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
P. Nachbar , Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
C. Knobloch , Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
A. Schuler , Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
J.A. Nossek , Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
pp. 315
L.R. Blando , Inf. Sci. Res. Inst., Nevada Univ., Las Vegas, NV, USA
J. Kanai , Inf. Sci. Res. Inst., Nevada Univ., Las Vegas, NV, USA
T.A. Nartker , Inf. Sci. Res. Inst., Nevada Univ., Las Vegas, NV, USA
pp. 319
P.V.S. Rao , Comput. Syst. & Commun. Group, Tata Inst. of Fundamental Res., Bombay, India
T.M. Ajitha , Comput. Syst. & Commun. Group, Tata Inst. of Fundamental Res., Bombay, India
pp. 323
D.X. Le , Nat. Libr. of Med., Bethesda, MD, USA
G.R. Thoma , Nat. Libr. of Med., Bethesda, MD, USA
H. Wechsler , Nat. Libr. of Med., Bethesda, MD, USA
pp. 327
Session 2.1 -D: Reconstruction and Interpretation
C. Ah-Soon , CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
K. Tombre , CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
pp. 331
M. Weiss , Fac. of Ind. Eng. & Manage., Technion-Israel Inst. of Technol., Haifa, Israel
D. Dori , Fac. of Ind. Eng. & Manage., Technion-Israel Inst. of Technol., Haifa, Israel
pp. 335
H. Tanahashi , Dept. of Eng. & Design, Gifu Prefectural Ceramic Res. Inst., Japan
K. Sakaue , Dept. of Eng. & Design, Gifu Prefectural Ceramic Res. Inst., Japan
K. Yamamoto , Dept. of Eng. & Design, Gifu Prefectural Ceramic Res. Inst., Japan
pp. 339
R.E. Marston , Dept. of Comput. Sci., Nottingham Univ., UK
M.H. Kuo , Dept. of Comput. Sci., Nottingham Univ., UK
pp. 343
A.K. Das , Dept. of Mech. & Aerosp. Eng., Rutgers Univ., Piscataway, NJ, USA
N.A. Langrana , Dept. of Mech. & Aerosp. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 347
Session 2.2-A: Word Recognition II
S.X. Zhao , Commun. Intelligence Corp., Redwood Shores, CA, USA
S.N. Srihari , Commun. Intelligence Corp., Redwood Shores, CA, USA
pp. 351
B. Al-Badr , Intelligent Syst. Lab., Washington Univ., Seattle, WA, USA
R.M. Haralick , Intelligent Syst. Lab., Washington Univ., Seattle, WA, USA
pp. 355
C. Fang , CEDAR, State Univ. of New York, Buffalo, NY, USA
J.J. Hull , CEDAR, State Univ. of New York, Buffalo, NY, USA
pp. 360
P. Gentric , Lab. d'Electron., Philips Res. Lab., Limeil-Brevannes, France
pp. 364
J.-M. Bertille , Service de Recherche Tech. de La Poste, Nantes, France
M. Gilloux , Service de Recherche Tech. de La Poste, Nantes, France
pp. 368
Session 2.2-B: Document Analysis
P. Suda , Siemens AG
G. Maderlechner , Siemens AG
H. Bock , iXOS Software GmbH
H. P. Klünder , iXOS Software GmbH
pp. 372
J. Hochberg , Dept. of Comput. Res., Los Alamos Nat. Lab., NM, USA
L. Kerns , Dept. of Comput. Res., Los Alamos Nat. Lab., NM, USA
P. Kelly , Dept. of Comput. Res., Los Alamos Nat. Lab., NM, USA
T. Thomas , Dept. of Comput. Res., Los Alamos Nat. Lab., NM, USA
pp. 378
T. Caesar , Daimler-Benz AG, Ulm, Germany
J.M. Gloger , Daimler-Benz AG, Ulm, Germany
E. Mandler , Daimler-Benz AG, Ulm, Germany
pp. 382
A. Jonk , Dept. of Math. & Comput. Sci., Amsterdam Univ., Netherlands
A.W.M. Smeulders , Dept. of Math. & Comput. Sci., Amsterdam Univ., Netherlands
pp. 386
I.S.I. Abuhaiba , Dept. of Comput. Eng., King Saud Univ., Riyadh, Saudi Arabia
S. Datta , Dept. of Comput. Eng., King Saud Univ., Riyadh, Saudi Arabia
M.J.J. Holt , Dept. of Comput. Eng., King Saud Univ., Riyadh, Saudi Arabia
pp. 390
Session 2.2-C: Neural Networks and Systems
M. Gilloux , Service de Recherche Tech. de La Poste, Nantes, France
B. Lemarie , Service de Recherche Tech. de La Poste, Nantes, France
M. Leroux , Service de Recherche Tech. de La Poste, Nantes, France
pp. 394
F.R. Chen , Xerox Palo Alto Res. Center, CA, USA
L.D. Wilcox , Xerox Palo Alto Res. Center, CA, USA
D.S. Bloomberg , Xerox Palo Alto Res. Center, CA, USA
pp. 398
S. Manke , Dept. of Comput. Sci., Karlsruhe Univ., Germany
M. Finke , Dept. of Comput. Sci., Karlsruhe Univ., Germany
A. Waibel , Dept. of Comput. Sci., Karlsruhe Univ., Germany
pp. 403
Hee-Seon Park , Dept. of Comput. Sci., Chungbuk Nat. Univ., Chungbuk, South Korea
Seong-Whan Lee , Dept. of Comput. Sci., Chungbuk Nat. Univ., Chungbuk, South Korea
pp. 409
Seong-Whan Lee , Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
Eung-Jae Lee , Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
pp. 413
Session 2.2-D: Symbol Recognition
A. Grbavec , Dept. of Comput. & Inf. Sci., Queen's Univ., Kingston, Ont., Canada
D. Blostein , Dept. of Comput. & Inf. Sci., Queen's Univ., Kingston, Ont., Canada
pp. 417
Yung-Sheng Chen , Dept. of Electr. Eng., Yuan-Ze Inst. of Technol., Chungli, Taiwan
pp. 422
Y.J. Bae , Kent Univ., Canterbury, UK
M.C. Fairhurst , Kent Univ., Canterbury, UK
pp. 426
H.M. Twaakyondo , Fac. of Eng., Shinshu Univ., Nagano, Japan
M. Okamoto , Fac. of Eng., Shinshu Univ., Nagano, Japan
pp. 430
Cheng-Lin Liu , Inst. of Autom., Acad. Sinica, Beijing, China
Ru-Wei Dai , Inst. of Autom., Acad. Sinica, Beijing, China
Ying-Jian Liu , Inst. of Autom., Acad. Sinica, Beijing, China
pp. 438
Session 2.3-A: Postprocessing
T. Hong , CEDAR, State Univ. of New York, Buffalo, NY, USA
J.J. Hull , CEDAR, State Univ. of New York, Buffalo, NY, USA
pp. 442
R. Garcia Garcia , Dept. of Syst. Eng. & Control, Valladolid Univ., Spain
Y.A. Dimitriadis , Dept. of Syst. Eng. & Control, Valladolid Univ., Spain
F. Merino Pastor , Dept. of Syst. Eng. & Control, Valladolid Univ., Spain
J. Lopez Coronado , Dept. of Syst. Eng. & Control, Valladolid Univ., Spain
pp. 446
Hsi-Jian Lee , Dept. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Cheng-Huang Tung , Dept. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
pp. 450
I. Guyon , AT&T Bell Labs., USA
F. Pereira , AT&T Bell Labs., USA
pp. 454
A. Simon , Sch. of Chem., Leeds Univ., UK
J.-C. Pret , Sch. of Chem., Leeds Univ., UK
A.P. Johnson , Sch. of Chem., Leeds Univ., UK
pp. 458
Session 2.3-B: Document Structure and Analysis
F. Esposito , Dipartimento di Inf., Bari Univ., Italy
D. Malerba , Dipartimento di Inf., Bari Univ., Italy
G. Semeraro , Dipartimento di Inf., Bari Univ., Italy
pp. 466
D. Niyogi , CEDAR, State Univ. of New York, Buffalo, NY, USA
S.N. Srihari , CEDAR, State Univ. of New York, Buffalo, NY, USA
pp. 472
T.A. Bayer , Daimler-Benz AG, Ulm, Germany
H. Walischewski , Daimler-Benz AG, Ulm, Germany
pp. 476
P. Lefevre , Electr. de France, Clamart, France
F. Reynaud , Electr. de France, Clamart, France
pp. 480
Session 2.3-C: Modeling Methods
J.-P. Crettez , ENST, CNRS, Paris, France
pp. 489
W. Guerfali , Ecole Polytech. de Montreal, Que., Canada
R. Plamondon , Ecole Polytech. de Montreal, Que., Canada
pp. 495
G. Menier , IRISA, Rennes, France
G. Lorette , IRISA, Rennes, France
P. Gentric , IRISA, Rennes, France
pp. 499
A.J. Elms , Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
J. Illingworth , Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
pp. 504
G. Saon , Inst. Nat. de Recherche en Inf. et Autom., Vandoeuvre-les-Nancy, France
A. Belaïd , Inst. Nat. de Recherche en Inf. et Autom., Vandoeuvre-les-Nancy, France
Y. Gong , Inst. Nat. de Recherche en Inf. et Autom., Vandoeuvre-les-Nancy, France
pp. 508
Session 2.3-D: Drawing and Map Recognition
W. Lu , Inst. of Ind. Sci., Tokyo Univ., Japan
W. Wu , Inst. of Ind. Sci., Tokyo Univ., Japan
M. Sakauchi , Inst. of Ind. Sci., Tokyo Univ., Japan
pp. 512
C. Nakajima , Dept. of Inf. Sci., Central Res. Inst. of Electr. Power Ind., Tokyo, Japan
T. Yazawa , Dept. of Inf. Sci., Central Res. Inst. of Electr. Power Ind., Tokyo, Japan
pp. 516
W. Lu , Inst. of Ind. Sci., Tokyo Univ., Japan
T. Okuhashi , Inst. of Ind. Sci., Tokyo Univ., Japan
M. Sakauchi , Inst. of Ind. Sci., Tokyo Univ., Japan
pp. 520
Dong-June Lee , Dept. of Strategic Technol., Korea Telecom, Seoul, South Korea
Seong-Whan Lee , Dept. of Strategic Technol., Korea Telecom, Seoul, South Korea
pp. 524
Jingbo Gao , Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Long Tang , Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Wenyin Liu , Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Zesheng Tang , Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
pp. 528
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