• I
  • ICDAR
  • 1995
  • Third International Conference on Document Analysis and Recognition (ICDAR'95) - Volume 1
Advanced Search 
Third International Conference on Document Analysis and Recognition (ICDAR'95) - Volume 1
Montr?al, Canada
August 14-August 15
ISBN: 0-8186-7128-9
Table of Contents
Keynote Speech:
Session 1.2-A: Word Recognition I
S.N. Srihari, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
Yong-Chul Shin, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
V. Ramanaprasad, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
Dar-Shyang Lee, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
pp. 5
D. Guillevic, CENPARMI, Concordia Univ., Montreal, Que., Canada
C.Y. Suen, CENPARMI, Concordia Univ., Montreal, Que., Canada
pp. 11
J.-P. Dodel, Dept. of Comput. Sci., Concordia Univ., Montreal, Que., Canada
R. Shinghal, Dept. of Comput. Sci., Concordia Univ., Montreal, Que., Canada
pp. 15
C. Olivier, Rouen Univ., Mont-Saint-Aignan, France
T. Paquet, Rouen Univ., Mont-Saint-Aignan, France
M. Avila, Rouen Univ., Mont-Saint-Aignan, France
Y. Lecourtier, Rouen Univ., Mont-Saint-Aignan, France
pp. 19
Gyeonghwan Kim, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
V. Govindaraju, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
pp. 24
Session 1.2-B: Neural Networks
Seong-Whan Lee, Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
Jong-Soo Kim, Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
pp. 28
Dar-Shyang Lee, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
S.N. Srihari, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
pp. 42
Hui Su, Dept. of Autom., Tsinghua Univ., Beijing, China
Wei Wang, Dept. of Autom., Tsinghua Univ., Beijing, China
Xinyou Li, Dept. of Autom., Tsinghua Univ., Beijing, China
Shaowei Xia, Dept. of Autom., Tsinghua Univ., Beijing, China
pp. 46
Session 1.2-C: On-Line Recognition I
S. Garcia-Salicetti, Inst. Nat. des Telecommun., Evry, France
B. Doizzi, Inst. Nat. des Telecommun., Evry, France
P. Gallinari, Inst. Nat. des Telecommun., Evry, France
A. Mellouk, Inst. Nat. des Telecommun., Evry, France
D. Fanchon, Inst. Nat. des Telecommun., Evry, France
pp. 50
Pyeoung Kee Kim, Dept. of Comput. Sci., Pusan Women's Univ., South Korea
Hang Joon Kim, Dept. of Comput. Sci., Pusan Women's Univ., South Korea
pp. 54
R.K. Powalka, Dept. of Comput., Nottingham Trent Univ., UK
N. Sherkat, Dept. of Comput., Nottingham Trent Univ., UK
R.J. Whitrow, Dept. of Comput., Nottingham Trent Univ., UK
pp. 64
R.K. Powalka, Dept. of Comput., Nottingham Trent Univ., UK
N. Sherkat, Dept. of Comput., Nottingham Trent Univ., UK
R.J. Whitrow, Dept. of Comput., Nottingham Trent Univ., UK
pp. 68
Session 1.2-D: Application Systems
N.W. Strathy, Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada
C.Y. Suen, Centre for Pattern Recognition & Machine Intelligence, Concordia Univ., Montreal, Que., Canada
pp. 74
Jianchang Mao, IBM Almaden Res. Center, San Jose, CA, USA
K. Mohiuddin, IBM Almaden Res. Center, San Jose, CA, USA
T. Fujisaki, IBM Almaden Res. Center, San Jose, CA, USA
pp. 78
S. Madhvanath, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
V. Govindaraju, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
V. Ramanaprasad, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
D.S. Lee, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
S.N. Srihari, Center of Excellence for Document Anal. & Recognition, State Univ. of New York, Buffalo, NY, USA
pp. 82
L. Simoncini, Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
Z.M. Kovacs, Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
pp. 86
E. Lethelier, Service de Recherche Tech. de La Poste, Nantes, France
M. Leroux, Service de Recherche Tech. de La Poste, Nantes, France
M. Gilloux, Service de Recherche Tech. de La Poste, Nantes, France
pp. 92
Session 1.3-A: Handwritten Character Recognition
N. Feray, LACIS, Mont Saint Aignan, France
D. de Brucq, LACIS, Mont Saint Aignan, France
K. Romeo-Pakker, LACIS, Mont Saint Aignan, France
T. Paquet, LACIS, Mont Saint Aignan, France
pp. 104
J. Cao, Windsor Univ., Ont., Canada
M. Shridhar, Windsor Univ., Ont., Canada
M. Ahmadi, Windsor Univ., Ont., Canada
pp. 108
Moon Jeung Joe, LG Electron. Res. Center, Seoul, South Korea
Huen Joo Lee, LG Electron. Res. Center, Seoul, South Korea
pp. 112
Hung-Pin Chiu, Inst. of Comput. Sci. & Inf. Eng., Nat. Central Univ., Chung-Li, Taiwan
Din-Chang Tseng, Inst. of Comput. Sci. & Inf. Eng., Nat. Central Univ., Chung-Li, Taiwan
Jen-Chieh Cheng, Inst. of Comput. Sci. & Inf. Eng., Nat. Central Univ., Chung-Li, Taiwan
pp. 116
Session 1.3-B: Segmentation I
U. Mahadevan, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
R.C. Nagabushnam, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
pp. 124
N. Normand, Lab. Syst. Electron. et Inf., IRESTE, Nantes, France
C. Viard-Gaudin, Lab. Syst. Electron. et Inf., IRESTE, Nantes, France
pp. 138
Session 1.3-C: Image Processing Techniques
Y.J. Gao, Inst. of Syst. Sci., Nat. Univ. of Singapore, Singapore
J.J. Lim, Inst. of Syst. Sci., Nat. Univ. of Singapore, Singapore
A.D. Narasimhalu, Inst. of Syst. Sci., Nat. Univ. of Singapore, Singapore
pp. 142
Yu Zhong, Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
K. Karu, Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
A.K. Jain, Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
pp. 146
S. Shimada, Central Res. Lab., Hitachi Ltd., Japan
K. Maruyama, Central Res. Lab., Hitachi Ltd., Japan
A. Matsumoto, Central Res. Lab., Hitachi Ltd., Japan
K. Hiraki, Central Res. Lab., Hitachi Ltd., Japan
pp. 154
Session 1.3-D: Database and Document Retrieval
Tyne Liang, Inst. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Suh-Yin Lee, Inst. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Wei-Pang Yang, Inst. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
pp. 159
S. Satoh, Nat. Center for Sci. Inf. Syst., Tokyo, Japan
A. Takasu, Nat. Center for Sci. Inf. Syst., Tokyo, Japan
E. Katsura, Nat. Center for Sci. Inf. Syst., Tokyo, Japan
pp. 163
M. Sugimoto, Dept. of Res. & Dev., NACSIS, Tokyo, Japan
K. Hori, Dept. of Res. & Dev., NACSIS, Tokyo, Japan
S. Ohsuga, Dept. of Res. & Dev., NACSIS, Tokyo, Japan
pp. 167
K. Tsuda, Dept. of Inf. Sci., Kyoto Univ., Japan
S. Senda, Dept. of Inf. Sci., Kyoto Univ., Japan
M. Minoh, Dept. of Inf. Sci., Kyoto Univ., Japan
K. Ikeda, Dept. of Inf. Sci., Kyoto Univ., Japan
pp. 171
F. Kanehara, Nat. Center for Sci. Inf. Syst., Tokyo Univ., Japan
S. Satoh, Nat. Center for Sci. Inf. Syst., Tokyo Univ., Japan
T. Hamada, Nat. Center for Sci. Inf. Syst., Tokyo Univ., Japan
pp. 175
Session 1.4-A: Signature Verificaton
F. Bauer, Ecole Nat. Superieure des Telecommun. de Bretagne, Brest, France
B. Wirtz, Ecole Nat. Superieure des Telecommun. de Bretagne, Brest, France
pp. 183
Ke Han, Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
I.K. Sethi, Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
pp. 187
N.A. Murshed, Dept. de Inf., CEFET-PR, Curitiba, Brazil
F. Bortolozzi, Dept. de Inf., CEFET-PR, Curitiba, Brazil
R. Sabourin, Dept. de Inf., CEFET-PR, Curitiba, Brazil
pp. 191
R. Sabourin, Departement de Genie de la Production Autom., Ecole de Technol. Superieure, Montreal, Que., Canada
G. Genest, Departement de Genie de la Production Autom., Ecole de Technol. Superieure, Montreal, Que., Canada
pp. 197
Xu-Hong Xiao, Inst. of Autom., Acad. Sinica, Beijing, China
Ru-Wei Dai, Inst. of Autom., Acad. Sinica, Beijing, China
pp. 202
Session 1.4-B: Model-Base Document Analysis
O.T. Akindele, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
A. Belaïd, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
pp. 206
M. Cheriet, Ecole de Technol. Superieure, Quebec Univ., Montreal, Que., Canada
J.N. Said, Ecole de Technol. Superieure, Quebec Univ., Montreal, Que., Canada
C.Y. Suen, Ecole de Technol. Superieure, Quebec Univ., Montreal, Que., Canada
pp. 210
E. Green, Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
M. Krishnamoorthy, Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY, USA
pp. 214
O. Hori, Center for Autom. Res., Maryland Univ., College Park, MD, USA
D.S. Doermann, Center for Autom. Res., Maryland Univ., College Park, MD, USA
pp. 218
H. Bunke, Inst. fur Inf. und Angewandte Math., Bern Univ., Switzerland
R. Liviero, Inst. fur Inf. und Angewandte Math., Bern Univ., Switzerland
pp. 222
Session 1.4-C: Image Processing
Fu Chang, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Yung-Ping Cheng, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
T. Pavlidis, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Tsuey-Yuh Shuai, Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
pp. 227
Seong-Whan Lee, Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
Eun-Soon Kim, Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
Y.Y. Tang, Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
pp. 235
A. Takasu, Res. & Dev. Dept., Nat. Center for Sci. Inf. Syst., Tokyo, Japan
S. Satoh, Res. & Dev. Dept., Nat. Center for Sci. Inf. Syst., Tokyo, Japan
E. Katsura, Res. & Dev. Dept., Nat. Center for Sci. Inf. Syst., Tokyo, Japan
pp. 239
M. Röösli, Inst. fur Informationssyst., Eidgenossische Tech. Hochschule, Zurich, Switzerland
G. Monagan, Inst. fur Informationssyst., Eidgenossische Tech. Hochschule, Zurich, Switzerland
pp. 243
Session 1.4-D: Map Interpretation
Huizhu Luo, Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
G. Agam, Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
I. Dinstein, Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
pp. 257
Session 2.1 -A: Classification Methods
T. Horiuchi, Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
K. Toraichi, Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
K. Yamamoto, Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
H. Yamada, Inst. of Inf. Sci. & Electron., Tsukuba Univ., Ibaraki, Japan
pp. 266
Tao Hong, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
S.W. Lam, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
J.J. Hull, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
S.N. Srihari, Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
pp. 270
H. Mori, Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
H. Aso, Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
S. Makino, Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
pp. 274
Tin Kam Ho, AT&T Bell Labs., Murray Hill, NJ, USA
pp. 278
S. Senda, Dept. of Inf. Sci., Kyoto Univ., Japan
M. Minoh, Dept. of Inf. Sci., Kyoto Univ., Japan
I. Katsuo, Dept. of Inf. Sci., Kyoto Univ., Japan
pp. 283
Session 2.1 -B: Document Understanding
G.S.D. Farrow, Div. of Electr. Eng., Manchester Univ., UK
C.S. Xydeas, Div. of Electr. Eng., Manchester Univ., UK
J.P. Oakley, Div. of Electr. Eng., Manchester Univ., UK
pp. 293
K.H.C. Lin, Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Rey-Long Liu, Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Von-Wun Soo, Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 297
A. Ting, Sch. of Appl. Sci., Nanyang Technol. Inst., Singapore
M.K. Leung, Sch. of Appl. Sci., Nanyang Technol. Inst., Singapore
Siu-Cheung Hui, Sch. of Appl. Sci., Nanyang Technol. Inst., Singapore
Kai-Yun Chan, Sch. of Appl. Sci., Nanyang Technol. Inst., Singapore
pp. 301
K. Gyohten, Inst. of Sci. & Ind. Res., Osaka Univ., Japan
T. Sumiya, Inst. of Sci. & Ind. Res., Osaka Univ., Japan
N. Babaguchi, Inst. of Sci. & Ind. Res., Osaka Univ., Japan
K. Kakusho, Inst. of Sci. & Ind. Res., Osaka Univ., Japan
T. Kitahashi, Inst. of Sci. & Ind. Res., Osaka Univ., Japan
pp. 305
Session 2.1 -C: Feature Extraction
D. Lopresti, Matsushita Inf. Technol. Lab., Princeton, NJ, USA
Jiangying Zhou, Matsushita Inf. Technol. Lab., Princeton, NJ, USA
G. Nagy, Matsushita Inf. Technol. Lab., Princeton, NJ, USA
P. Sarkar, Matsushita Inf. Technol. Lab., Princeton, NJ, USA
pp. 309
W. Utschick, Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
P. Nachbar, Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
C. Knobloch, Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
A. Schuler, Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
J.A. Nossek, Inst. of Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
pp. 315
L.R. Blando, Inf. Sci. Res. Inst., Nevada Univ., Las Vegas, NV, USA
J. Kanai, Inf. Sci. Res. Inst., Nevada Univ., Las Vegas, NV, USA
T.A. Nartker, Inf. Sci. Res. Inst., Nevada Univ., Las Vegas, NV, USA
pp. 319
P.V.S. Rao, Comput. Syst. & Commun. Group, Tata Inst. of Fundamental Res., Bombay, India
T.M. Ajitha, Comput. Syst. & Commun. Group, Tata Inst. of Fundamental Res., Bombay, India
pp. 323
D.X. Le, Nat. Libr. of Med., Bethesda, MD, USA
G.R. Thoma, Nat. Libr. of Med., Bethesda, MD, USA
H. Wechsler, Nat. Libr. of Med., Bethesda, MD, USA
pp. 327
Session 2.1 -D: Reconstruction and Interpretation
C. Ah-Soon, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
K. Tombre, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
pp. 331
M. Weiss, Fac. of Ind. Eng. & Manage., Technion-Israel Inst. of Technol., Haifa, Israel
D. Dori, Fac. of Ind. Eng. & Manage., Technion-Israel Inst. of Technol., Haifa, Israel
pp. 335
H. Tanahashi, Dept. of Eng. & Design, Gifu Prefectural Ceramic Res. Inst., Japan
K. Sakaue, Dept. of Eng. & Design, Gifu Prefectural Ceramic Res. Inst., Japan
K. Yamamoto, Dept. of Eng. & Design, Gifu Prefectural Ceramic Res. Inst., Japan
pp. 339
R.E. Marston, Dept. of Comput. Sci., Nottingham Univ., UK
M.H. Kuo, Dept. of Comput. Sci., Nottingham Univ., UK
pp. 343
A.K. Das, Dept. of Mech. & Aerosp. Eng., Rutgers Univ., Piscataway, NJ, USA
N.A. Langrana, Dept. of Mech. & Aerosp. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 347
Session 2.2-A: Word Recognition II
S.X. Zhao, Commun. Intelligence Corp., Redwood Shores, CA, USA
S.N. Srihari, Commun. Intelligence Corp., Redwood Shores, CA, USA
pp. 351
B. Al-Badr, Intelligent Syst. Lab., Washington Univ., Seattle, WA, USA
R.M. Haralick, Intelligent Syst. Lab., Washington Univ., Seattle, WA, USA
pp. 355
C. Fang, CEDAR, State Univ. of New York, Buffalo, NY, USA
J.J. Hull, CEDAR, State Univ. of New York, Buffalo, NY, USA
pp. 360
J.-M. Bertille, Service de Recherche Tech. de La Poste, Nantes, France
M. Gilloux, Service de Recherche Tech. de La Poste, Nantes, France
pp. 368
Session 2.2-B: Document Analysis
J. Hochberg, Dept. of Comput. Res., Los Alamos Nat. Lab., NM, USA
L. Kerns, Dept. of Comput. Res., Los Alamos Nat. Lab., NM, USA
P. Kelly, Dept. of Comput. Res., Los Alamos Nat. Lab., NM, USA
T. Thomas, Dept. of Comput. Res., Los Alamos Nat. Lab., NM, USA
pp. 378
T. Caesar, Daimler-Benz AG, Ulm, Germany
J.M. Gloger, Daimler-Benz AG, Ulm, Germany
E. Mandler, Daimler-Benz AG, Ulm, Germany
pp. 382
A. Jonk, Dept. of Math. & Comput. Sci., Amsterdam Univ., Netherlands
A.W.M. Smeulders, Dept. of Math. & Comput. Sci., Amsterdam Univ., Netherlands
pp. 386
I.S.I. Abuhaiba, Dept. of Comput. Eng., King Saud Univ., Riyadh, Saudi Arabia
S. Datta, Dept. of Comput. Eng., King Saud Univ., Riyadh, Saudi Arabia
M.J.J. Holt, Dept. of Comput. Eng., King Saud Univ., Riyadh, Saudi Arabia
pp. 390
Session 2.2-C: Neural Networks and Systems
M. Gilloux, Service de Recherche Tech. de La Poste, Nantes, France
B. Lemarie, Service de Recherche Tech. de La Poste, Nantes, France
M. Leroux, Service de Recherche Tech. de La Poste, Nantes, France
pp. 394
F.R. Chen, Xerox Palo Alto Res. Center, CA, USA
L.D. Wilcox, Xerox Palo Alto Res. Center, CA, USA
D.S. Bloomberg, Xerox Palo Alto Res. Center, CA, USA
pp. 398
S. Manke, Dept. of Comput. Sci., Karlsruhe Univ., Germany
M. Finke, Dept. of Comput. Sci., Karlsruhe Univ., Germany
A. Waibel, Dept. of Comput. Sci., Karlsruhe Univ., Germany
pp. 403
Hee-Seon Park, Dept. of Comput. Sci., Chungbuk Nat. Univ., Chungbuk, South Korea
Seong-Whan Lee, Dept. of Comput. Sci., Chungbuk Nat. Univ., Chungbuk, South Korea
pp. 409
Seong-Whan Lee, Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
Eung-Jae Lee, Dept. of Comput. Sci., Korea Univ., Seoul, South Korea
pp. 413
Session 2.2-D: Symbol Recognition
A. Grbavec, Dept. of Comput. & Inf. Sci., Queen's Univ., Kingston, Ont., Canada
D. Blostein, Dept. of Comput. & Inf. Sci., Queen's Univ., Kingston, Ont., Canada
pp. 417
Yung-Sheng Chen, Dept. of Electr. Eng., Yuan-Ze Inst. of Technol., Chungli, Taiwan
pp. 422
H.M. Twaakyondo, Fac. of Eng., Shinshu Univ., Nagano, Japan
M. Okamoto, Fac. of Eng., Shinshu Univ., Nagano, Japan
pp. 430
Cheng-Lin Liu, Inst. of Autom., Acad. Sinica, Beijing, China
Ru-Wei Dai, Inst. of Autom., Acad. Sinica, Beijing, China
Ying-Jian Liu, Inst. of Autom., Acad. Sinica, Beijing, China
pp. 438
Session 2.3-A: Postprocessing
T. Hong, CEDAR, State Univ. of New York, Buffalo, NY, USA
J.J. Hull, CEDAR, State Univ. of New York, Buffalo, NY, USA
pp. 442
R. Garcia Garcia, Dept. of Syst. Eng. & Control, Valladolid Univ., Spain
Y.A. Dimitriadis, Dept. of Syst. Eng. & Control, Valladolid Univ., Spain
F. Merino Pastor, Dept. of Syst. Eng. & Control, Valladolid Univ., Spain
J. Lopez Coronado, Dept. of Syst. Eng. & Control, Valladolid Univ., Spain
pp. 446
Hsi-Jian Lee, Dept. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Cheng-Huang Tung, Dept. of Comput. Sci. & Inf. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
pp. 450
Session 2.3-B: Document Structure and Analysis
F. Esposito, Dipartimento di Inf., Bari Univ., Italy
D. Malerba, Dipartimento di Inf., Bari Univ., Italy
G. Semeraro, Dipartimento di Inf., Bari Univ., Italy
pp. 466
D. Niyogi, CEDAR, State Univ. of New York, Buffalo, NY, USA
S.N. Srihari, CEDAR, State Univ. of New York, Buffalo, NY, USA
pp. 472
P. Lefevre, Electr. de France, Clamart, France
F. Reynaud, Electr. de France, Clamart, France
pp. 480
Session 2.3-C: Modeling Methods
W. Guerfali, Ecole Polytech. de Montreal, Que., Canada
R. Plamondon, Ecole Polytech. de Montreal, Que., Canada
pp. 495
G. Menier, IRISA, Rennes, France
G. Lorette, IRISA, Rennes, France
P. Gentric, IRISA, Rennes, France
pp. 499
A.J. Elms, Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
J. Illingworth, Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
pp. 504
G. Saon, Inst. Nat. de Recherche en Inf. et Autom., Vandoeuvre-les-Nancy, France
A. Belaïd, Inst. Nat. de Recherche en Inf. et Autom., Vandoeuvre-les-Nancy, France
Y. Gong, Inst. Nat. de Recherche en Inf. et Autom., Vandoeuvre-les-Nancy, France
pp. 508
Session 2.3-D: Drawing and Map Recognition
W. Lu, Inst. of Ind. Sci., Tokyo Univ., Japan
W. Wu, Inst. of Ind. Sci., Tokyo Univ., Japan
M. Sakauchi, Inst. of Ind. Sci., Tokyo Univ., Japan
pp. 512
C. Nakajima, Dept. of Inf. Sci., Central Res. Inst. of Electr. Power Ind., Tokyo, Japan
T. Yazawa, Dept. of Inf. Sci., Central Res. Inst. of Electr. Power Ind., Tokyo, Japan
pp. 516
W. Lu, Inst. of Ind. Sci., Tokyo Univ., Japan
T. Okuhashi, Inst. of Ind. Sci., Tokyo Univ., Japan
M. Sakauchi, Inst. of Ind. Sci., Tokyo Univ., Japan
pp. 520
Dong-June Lee, Dept. of Strategic Technol., Korea Telecom, Seoul, South Korea
Seong-Whan Lee, Dept. of Strategic Technol., Korea Telecom, Seoul, South Korea
pp. 524
Jingbo Gao, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Long Tang, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Wenyin Liu, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Zesheng Tang, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
pp. 528
Usage of this product signifies your acceptance of the Terms of Use.