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1999 IEEE International Conference on Computer Design (ICCD'99)
Multiple Paths Sensitization of Digital Oscillation Built-In Self Test
Austin, Texas
October 10-October 13
ISBN: 0-7695-0406-X
| ASCII Text | x | ||
| Christian Dufaza, "Multiple Paths Sensitization of Digital Oscillation Built-In Self Test," 2012 IEEE 30th International Conference on Computer Design (ICCD), pp. 166, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999. | |||
| BibTex | x | ||
| @article{ 10.1109/ICCD.1999.808422, author = {Christian Dufaza}, title = {Multiple Paths Sensitization of Digital Oscillation Built-In Self Test}, journal ={2012 IEEE 30th International Conference on Computer Design (ICCD)}, volume = {0}, year = {1999}, issn = {1063-6404}, pages = {166}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICCD.1999.808422}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE 30th International Conference on Computer Design (ICCD) TI - Multiple Paths Sensitization of Digital Oscillation Built-In Self Test SN - 1063-6404 SP EP A1 - Christian Dufaza, PY - 1999 KW - Test KW - Built-In Self Test KW - DOBIST VL - 0 JA - 2012 IEEE 30th International Conference on Computer Design (ICCD) ER - | |||
Digital Oscillation Built-In Self Test (DOBIST) deals with testing path delay, gate delay and stuck-at faults in digital integrated circuits. This test methodology consists of sensitizing paths in the circuit under test so that they can oscillate as ring oscillators. While the 1st version of DOBIST is limited to single path sensitization, equations reported in this paper allow concurrent multiple paths sensitization. It results a simplification of the test generation procedure and a significant decrease of the test time
Index Terms:
Test, Built-In Self Test, DOBIST
Citation:
Christian Dufaza, "Multiple Paths Sensitization of Digital Oscillation Built-In Self Test," iccd, pp.166, 1999 IEEE International Conference on Computer Design (ICCD'99), 1999
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