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2003 International Conference on Computer-Aided Design (ICCAD '03)
A Methodology for the Computation of an Upper Bound on Nose Current Spectrum of CMOS Switching Activity
San Jose, CA
November 09-November 13
ISBN: 1-58113-762-1
Alessandra Nardi, University of California, Berkeley
Haibo Zeng, University of California, Berkeley
Joshua L. Garrett, University of California, Berkeley
Luca Daniel, University of California, Berkeley
Alberto L. Sangiovanni-Vincentelli, University of California, Berkeley
Currents injected by CMOS digital circuit blocks into the power grid and into the substrate of a system-on-a-chip may affect reliability and performance of other sensitive circuit blocks. To verify the correct operation of the system, an upper bound for the spectrum of the noise current has to be provided with respect to all possible transitions of the circuit inputs. The number of input transitions is exponential in the number of circuit inputs. In this paper, we present a novel approach for the computation of the upper bound that avoids the untractable exhaustive exploration of the entire space. Its computational complexity is indeed linear in the number of gates. Our approach requires CMOS standard cell libraries to be characterized for injected noise current. In this paper, we also present an approach for this characterization of CMOS standard cells. Experimental results have proven the accuracy of both the algorithm and the noise current models used for the library characterization.
Citation:
Alessandra Nardi, Haibo Zeng, Joshua L. Garrett, Luca Daniel, Alberto L. Sangiovanni-Vincentelli, "A Methodology for the Computation of an Upper Bound on Nose Current Spectrum of CMOS Switching Activity," iccad, pp.778, 2003 International Conference on Computer-Aided Design (ICCAD '03), 2003
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