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2009 IEEE International Conference on Acoustics, Speech and Signal Processing
Flatbed scanner identification based on dust and scratches over scanner platen
Taipei, Taiwan
April 19-April 24
ISBN: 978-1-4244-2353-8
Ahmet Emir Dirik, Polytechnic Institute of NYU, Electrical&Computer Engineering Dept., Brooklyn, NY, 11201, USA
Husrev Taha Sencar, TOBB Economics and Technology University, Computer Engineering Dept., Sogutozu, Ankara, 06560, Turkey
Nasir Memon, TOBB Economics and Technology University, Computer Engineering Dept., Sogutozu, Ankara, 06560, Turkey
In this paper, a novel individual source scanner identification scheme is proposed. The scheme uses traces of dust, dirt, and scratches over scanner platen on scanned images to characterize a source scanner. The efficacy of the proposed scheme is substantiated with experimental analysis. The robustness of the scheme to the JPEG compression is also investigated. Experimental results show that proposed scheme could be used to match a scanned image to its source.
Citation:
Ahmet Emir Dirik, Husrev Taha Sencar, Nasir Memon, "Flatbed scanner identification based on dust and scratches over scanner platen," icassp, pp.1385-1388, 2009 IEEE International Conference on Acoustics, Speech and Signal Processing, 2009
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