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  • Acoustics, Speech, and Signal Processing, 1996. ICASSP-96 Vol 4. Conference Proceedings., 1996 IEEE International Conference on
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Acoustics, Speech, and Signal Processing, 1996. ICASSP-96 Vol 4. Conference Proceedings., 1996 IEEE International Conference on
Atlanta, GA, USA
May 07-May 10
ISBN: 0-7803-3192-3
Table of Contents
K. Panusopone, Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA
pp. 2021-2023, 2023a
Authors Index (Abstract)
pp. A1-2023, 2023a
H. Puh, Dept. of Electr. Eng., City Univ. of New York, NY, USA
pp. 1862-1865
E.S. Jang, Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
pp. 1878-1881
C.H. Lin, Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
pp. 1886-1889
Xiaolin Wu, Dept. of Comput. Sci., Univ. of Western Ontario, London, Ont., Canada
pp. 1890-1893
A. Moghaddamzadeh, Dept. of Electr. Eng., State Univ. of New York, Binghamton, NY, USA
pp. 1894-1897
H. Naseri, Dept. of Electr. Eng., Missouri Univ., Rolla, MO, USA
pp. 1906-1909
F. Moscheni, Signal Process. Lab., Swiss Federal Inst. of Technol., Lausanne, Switzerland
pp. 1914-1917
Ut-Va Koc, Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
pp. 1930-1933
E. Linzer, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 1934-1937
E.P. Ong, Sch. of Electron. & Electr. Eng., Birmingham Univ., UK
pp. 1938-1941
S. Moni, Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 1954-1961
M.D. Swanson, Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 1958-1961
Kui Zhang, Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
pp. 1978-1981
M. Pardas, Dept. de Teoria del Senyal i Comunicacions, Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 1982-1985
P. Tiwari, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 1994-1997
A. Tsai, CAIP Center, Rutgers Univ., Piscataway, NJ, USA
pp. 2002-2008
J.A. Nicholls, CAIP Center, Rutgers Univ., Piscataway, NJ, USA
pp. 2005-2008
A. Docef, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 2009-2012
A. Bilgin, Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
pp. 2017-2020
A. Narayan, Dept. of Electr. Eng., Iowa State Univ., Ames, IA, USA
pp. 2028-2031
A. Rao, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 2032-2035
D. Comaniciu, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 2036-2039
H.D. Li, Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
pp. 2044-2047
S. Gadkari, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 2048-2051
K. Rose, Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
pp. 2052-2055
P. Salembier, Dept. of Signal Theory & Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 2060-2063
M.C. Chen, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 2096-2099
Y. Altunbasak, Dept. of Electr. Eng., Rochester Univ., NY, USA
pp. 2108-2111
E.N. Farag, Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
pp. 2116-2119
C. Podilchuk, Signal Process. Res. Dept., AT&T Bell Labs., Murray Hill, NJ, USA
pp. 2144-2147
K. Etemad, Center for Autom. Res., Maryland Univ., College Park, MD, USA
pp. 2148-2151
R. Chellappa, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
pp. 2156-2159
P.A. Feineigle, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 2160-2163
X. Zhang, Comput. Vision Lab., Maryland Univ., College Park, MD, USA
pp. 2164-2167
N. Nikolaidis, Dept. of Electr. & Comput. Eng., Thessaloniki Univ., Greece
pp. 2168-2171
C. Canus, Inst. Nat. de Recherche en Inf. et Autom., Le Chesnay, France
pp. 2172-2175
G. Agam, Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
pp. 2184-2187
K. Uma, Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore, India
pp. 2188-2190
H. Aydinoglu, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 2191-2194
Reitseng Lin, Dept. of Comput. & Inf. Sci., Polytechnic Univ., Brooklyn, NY, USA
pp. 2203-2206
J. You, Sch. of Comput. & Inf. Sci., Univ. of South Australia, The Levels, SA, Australia
pp. 2207-2210
S.T. Acton, Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
pp. 2215-2218
J. Fwu, Dept. of Electr. Eng., State Univ. of New York, Stony Brook, NY, USA
pp. 2235-2238
T.P. Weldon, Dept. of Electr. Eng., North Carolina Univ., Charlotte, NC, USA
pp. 2243-2246
S.R. Kadaba, Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 2255-2258
D. Krishnan, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 2279-2282
R.M. Armitano, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 2295-2298
N. Merhav, Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
pp. 2307-2310
K.W. Cheng, Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong
pp. 2311-2314
Hao Bi, Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
pp. 2315-2318
Chi-Kong Wong, Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, Hong Kong
pp. 2327-2330
A. Fuldseth, Dept. of Telecommun., Norwegian Univ. of Sci. & Technol., Trondheim, Norway
pp. 2331-2334
O. Egger, Signal Process. Lab., Swiss Federal Inst. of Technol., Lausanne, Switzerland
pp. 2335-2338
J.R. Casas, Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 2355-2358
K. Cinkler, Telecommun. Dept., Hamburg Univ. of Technol., Germany
pp. 2363-2366
R. Rabenstein, Lehrstuhl fur Nachrichtentech., Erlangen-Nurnberg Univ., Germany
pp. 2375-2378
J. Crespo, Fac. de Inf., Univ. Politecnica de Madrid, Spain
pp. 2391-2394
A.J. den Dekker, Dept. of Appl. Phys., Delft Univ. of Technol., Netherlands
pp. 2395-2398
N. Merhav, Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
pp. 2403-2406
J.M. Francos, Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
pp. 2411-2414
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