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Acoustics, Speech, and Signal Processing, 1994. ICASSP-94 Vol 3., 1994 IEEE International Conference on
Adelaide, SA, Australia
April 19-April 22
ISBN: 0-7803-1775-0
Table of Contents
H.M. Meng, Lab. for Comput. Sci., MIT, Cambridge, MA, USA
S. Seneff, Lab. for Comput. Sci., MIT, Cambridge, MA, USA
V.W. Zue, Lab. for Comput. Sci., MIT, Cambridge, MA, USA
pp. 1-4
J. Ooi, MIT, Cambridge, MA, USA
V. Viswanathan, Lab. for Comput. Sci., MIT, Cambridge, MA, USA
pp. 101-104
D. Sen, Sch. of Electr. Eng., New South Wales Univ., Kensington, NSW, Australia
W.H. Holmes, Sch. of Electr. Eng., New South Wales Univ., Kensington, NSW, Australia
pp. 105-108
C.G. Gerlach, Inst. for Commun. Syst. & Data Process., Aachen Univ. of Technol., Germany
pp. 109-112
S. Miki, NTT Human Interface Labs., Tokyo, Japan
K. Mano, NTT Human Interface Labs., Tokyo, Japan
Y. Moriya, NTT Human Interface Labs., Tokyo, Japan
K. Oguchi, NTT Human Interface Labs., Tokyo, Japan
H. Ohmuro, NTT Human Interface Labs., Tokyo, Japan
pp. 113-116
P. Mermelstein, INRS Telecommun., Montreal, Que., Canada
P. Zheng, INRS Telecommun., Montreal, Que., Canada
M. Saikaly, INRS Telecommun., Montreal, Que., Canada
pp. 117-120
E. Harborg, SINTEF, Trondheim, Norway
J.E. Knudsen, INRS Telecommun., Montreal, Que., Canada
A. Fuldseth, INRS Telecommun., Montreal, Que., Canada
F.T. Johansen, NTT Human Interface Labs., Tokyo, Japan
pp. 121-124
P.C. Woodland, Dept. of Eng., Cambridge Univ., UK
J.J. Odell, Dept. of Eng., Cambridge Univ., UK
V. Valtchev, Dept. of Eng., Cambridge Univ., UK
S.J. Young, Dept. of Eng., Cambridge Univ., UK
pp. 125-128
X. Aubert, Philips GmbH Res. Lab. Aachen, Germany
C. Dugast, Philips GmbH Res. Lab. Aachen, Germany
H. Ney, Dept. of Eng., Cambridge Univ., UK
V. Steinbiss, Dept. of Eng., Cambridge Univ., UK
pp. 129-132
T. Tashiro, ATR Interpreting Telecommun. Res. Lab., Japan
T. Takezawa, ATR Interpreting Telecommun. Res. Lab., Japan
T. Morimoto, ATR Interpreting Telecommun. Res. Lab., Japan
M. Nagata, Dept. of Eng., Cambridge Univ., UK
pp. 13-16
Jia-Lin Shen, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Hsin-Min Wang, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Bo-Ren Bai, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Lin-Shan Lee, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
pp. 133-136
Jung-Kuei Chen, Telecommun. Lab., Minist. of Commun., Chung-Li, Taiwan
F.K. Soong, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Lin-Shan Lee, Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
pp. 137-140
Y. Minami, NTT Human Interface Labs., Tokyo, Japan
K. Shikano, NTT Human Interface Labs., Tokyo, Japan
S. Takahashi, NTT Human Interface Labs., Tokyo, Japan
T. Yamada, NTT Human Interface Labs., Tokyo, Japan
pp. 141-144
M.K. Brown, AT&T Bell Labs., Murray Hill, NJ, USA
S.C. Glinski, AT&T Bell Labs., Murray Hill, NJ, USA
pp. 145-148
H. Singer, ATR Interpreting Telecommun.Res. Labs., Kyoto, Japan
J. Takami, ATR Interpreting Telecommun.Res. Labs., Kyoto, Japan
S. Matsunaga, ATR Interpreting Telecommun.Res. Labs., Kyoto, Japan
pp. 149-152
W. Chou, Dept. of Res. Technol., AT&T Bell Labs., Murray Hill, NJ, USA
T. Matsuoka, ATR Interpreting Telecommun.Res. Labs., Kyoto, Japan
B.-H. Juang, ATR Interpreting Telecommun.Res. Labs., Kyoto, Japan
C.-H. Lee, NTT Human Interface Labs., Tokyo, Japan
pp. 153-156
H. Garudadri, INRS Telecommun., Vardun, Que., Canada
P. Labute, INRS Telecommun., Vardun, Que., Canada
G. Boulianne, INRS Telecommun., Vardun, Que., Canada
P. Kenny, INRS Telecommun., Vardun, Que., Canada
pp. 157-160
P.S. Gopalakrishnan, Continuous Speech Recognition Group, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
D. Nahamoo, Continuous Speech Recognition Group, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
M. Padmanabhan, Continuous Speech Recognition Group, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
M.A. Picheny, Continuous Speech Recognition Group, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 161-164
L. Devillers, Lab. d'Informatique pour la Mecanique et les Sci. de l'Ingenieur, CNRS, Orsay, France
C. Dugast, Continuous Speech Recognition Group, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 165-168
W. Ward, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
S. Issar, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 17-19
R. Kompe, Lehrstuhl fur Mustererkennung, Erlangen-Nurnberg Univ., Germany
A. Batliner, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
A. Kiessling, Continuous Speech Recognition Group, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
U. Kilian, Continuous Speech Recognition Group, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
H. Niemann, NTT Human Interface Labs., Tokyo, Japan
pp. 173-176
A. Grigoriu, Dept. of Electr. Eng., Sydney Univ., NSW, Australia
J.P. Vonwiller, Dept. of Electr. Eng., Sydney Univ., NSW, Australia
R.W. King, Dept. of Electr. Eng., Sydney Univ., NSW, Australia
pp. 181-184
H. Shimodaira, JAIST, Nomi, Japan
M. Nakai, Dept. of Electr. Eng., Sydney Univ., NSW, Australia
pp. 185-188
S. Kajita, Sch. of Eng., Nagoya Univ., Japan
F. Itakura, Sch. of Eng., Nagoya Univ., Japan
pp. 193-196
M. Bacchiani, ATR Human Inf. Process. Res. Labs, Kyoto, Japan
K. Aikawa, ATR Human Inf. Process. Res. Labs, Kyoto, Japan
pp. 197-200
Y. Laprie, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
M.-O. Berger, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
pp. 201-204
M. Niranjan, Dept. of Eng., Cambridge Univ., UK
I.J. Cox, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
S. Hingorani, Dept. of Electr. Eng., Sydney Univ., NSW, Australia
pp. 205-208
P. Monta, Res. Lab. of Electron., MIT, Cambridge, MA, USA
Shiufun Cheung, Res. Lab. of Electron., MIT, Cambridge, MA, USA
pp. 209-212
S.R. Young, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 21-24
F.J. Casajus Quiros, ETSI Telecomunicacion, Univ. Politecnica de Madrid, Spain
P.F.-C. Enriquez, ETSI Telecomunicacion, Univ. Politecnica de Madrid, Spain
pp. 221-224
A. Nakamura, NHK Sci. & Tech. Res. Labs., Tokyo, Japan
N. Seiyama, NHK Sci. & Tech. Res. Labs., Tokyo, Japan
R. Ikezawa, NHK Sci. & Tech. Res. Labs., Tokyo, Japan
T. Takagi, NHK Sci. & Tech. Res. Labs., Tokyo, Japan
E. Miyasaka, NHK Sci. & Tech. Res. Labs., Tokyo, Japan
pp. 225-228
H. Javkin, Speech Technol. Lab., Panasonic Technol. Inc., Santa Barbara, CA, USA
E. Keate, Speech Technol. Lab., Panasonic Technol. Inc., Santa Barbara, CA, USA
N. Antonanzas-Barroso, Speech Technol. Lab., Panasonic Technol. Inc., Santa Barbara, CA, USA
Y. Yamada, NHK Sci. & Tech. Res. Labs., Tokyo, Japan
K. Youdelman, NHK Sci. & Tech. Res. Labs., Tokyo, Japan
pp. 229-232
J.D. Hoyt, Eng. Res. Facility, Federal Bur. of Investigation, Quantico, VA, USA
H. Wechsler, Speech Technol. Lab., Panasonic Technol. Inc., Santa Barbara, CA, USA
pp. 237-240
S.D. Snyder, Dept. of Mech. Eng., Adelaide Univ., SA, Australia
pp. 241-244
A. Hirano, Inf. Technol. Res. Labs., NEC Corp., Kawasaki, Japan
A. Sugiyama, Inf. Technol. Res. Labs., NEC Corp., Kawasaki, Japan
Y. Arasawa, Speech Technol. Lab., Panasonic Technol. Inc., Santa Barbara, CA, USA
N. Kawayachi, NHK Sci. & Tech. Res. Labs., Tokyo, Japan
pp. 245-248
H.P. Meana, Dept. of Electr. Eng., Univ. Autonoma Metropolitana, Mexico City, Mexico
L.N. de Rivera O, Dept. of Electr. Eng., Univ. Autonoma Metropolitana, Mexico City, Mexico
M.N. Miyatake, Dept. of Electr. Eng., Univ. Autonoma Metropolitana, Mexico City, Mexico
F.C. Sanchez, Dept. of Electr. Eng., Univ. Autonoma Metropolitana, Mexico City, Mexico
J.C.S. Garcia, Dept. of Electr. Eng., Univ. Autonoma Metropolitana, Mexico City, Mexico
pp. 249-252
T. Kawahara, Dept. of Inf. Sci., Kyoto Univ., Japan
M. Araki, Dept. of Inf. Sci., Kyoto Univ., Japan
S. Doshita, Dept. of Inf. Sci., Kyoto Univ., Japan
pp. 25-28
L.J. Eriksson, DIGISONIX Inc., Middleton, WI, USA
M.C. Allie, DIGISONIX Inc., Middleton, WI, USA
D.E. Melton, DIGISONIX Inc., Middleton, WI, USA
S.R. Popovich, DIGISONIX Inc., Middleton, WI, USA
T.A. Laak, DIGISONIX Inc., Middleton, WI, USA
pp. 253-256
P.C. Meuse, Div. of Eng., Brown Univ., Providence, RI, USA
H.F. Silverman, Div. of Eng., Brown Univ., Providence, RI, USA
pp. 257-260
S. Bedard, INRS-Telecommun., Quebec Univ., Verdun, Que., Canada
B. Champagne, INRS-Telecommun., Quebec Univ., Verdun, Que., Canada
A. Stephenne, INRS-Telecommun., Quebec Univ., Verdun, Que., Canada
pp. 261-264
M.G. Siqueira, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
A. Alwan, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 265-268
M. Omologo, Istituto per la Ricerca Sci. e Tecnologica, Trento, Italy
P. Svaizer, Istituto per la Ricerca Sci. e Tecnologica, Trento, Italy
pp. 273-276
B. Colnet, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
J.-P. Haton, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
pp. 281-284
D.J. Kershaw, Mater. Res. Lab., Defence Sci. & Technol. Organ., Ascot Vale, Vic., Australia
R.J. Evans, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
pp. 285-288
C.S. Regazzoni, Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy
A. Tesei, Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy
G. Tacconi, Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy
pp. 289-292
Tung-Hui Chiang, Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Yi-Chung Lin, Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Keh-Yih Su, Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 29-32
J.C. Di Martino, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
B. Colnet, CRIN-INRIA Lorraine, Vandoeuvre-les-Nancy, France
M. Di Martino, Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 293-296
A.B. Gershman, Inst. of Appl. Phys., Acad. of Sci., Nizhny Novgorod, Russia
V.A. Zverev, Inst. of Appl. Phys., Acad. of Sci., Nizhny Novgorod, Russia
pp. 297-300
Y. Stephan, Centre Mil. d'Oceanogr., EPSHOM, Brest, France
F.R. Martin-Lauzer, Centre Mil. d'Oceanogr., EPSHOM, Brest, France
pp. 301-304
F.R. Martin-Lauzer, CMO, Brest, France
D. Mauuary, Centre Mil. d'Oceanogr., EPSHOM, Brest, France
Y. Stephan, Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 305-308
S. Ivandich, Adaptive Signal Process. Lab., Curtin Univ. of Technol., Bentley, WA, Australia
pp. 309-312
R. Rajagopal, Dept. of Electr. & Comput. Eng., Regional Eng. Coll., Tiruchirappalli, India
K.A. Kumar, Dept. of Electr. & Comput. Eng., Regional Eng. Coll., Tiruchirappalli, India
P. Ramakrishna Rao, Dept. of Electr. & Comput. Eng., Regional Eng. Coll., Tiruchirappalli, India
pp. 313-316
A. Kundu, RDT&E Div., Naval Command, Control & Ocean Surveillance Center, San Diego, CA, USA
G.C. Chen, RDT&E Div., Naval Command, Control & Ocean Surveillance Center, San Diego, CA, USA
C.E. Persons, RDT&E Div., Naval Command, Control & Ocean Surveillance Center, San Diego, CA, USA
pp. 325-328
J.J. Smith, Dept. of Electr. & Electron. Eng., Western Australia Univ., Crawley, WA, Australia
Y.H. Leung, Dept. of Electr. & Electron. Eng., Western Australia Univ., Crawley, WA, Australia
A. Cantoni, RDT&E Div., Naval Command, Control & Ocean Surveillance Center, San Diego, CA, USA
pp. 329-332
H. Matsu'ura, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
Y. Masai, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
J. Iwasaki, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
S. Tanaka, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
H. Kamio, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
T. Nitta, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
pp. 33-36
M. Bouvet, Centre Mil. d'Oceanogr., Brest, France
L. Kerleguer, Centre Mil. d'Oceanogr., Brest, France
P. Mennecier, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
M. Cresp, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
pp. 333-336
C.F. Mecklenbrauker, Dept. of Electr. Eng., Ruhr-Univ., Bochum, Germany
J.F. Bohme, Dept. of Electr. Eng., Ruhr-Univ., Bochum, Germany
pp. 337-340
D. Mauuary, Centre d'Etudes des PHenomenes Aleatoires et Geophys., Saint Martin d'Heres, France
G. Jourdain, Centre d'Etudes des PHenomenes Aleatoires et Geophys., Saint Martin d'Heres, France
pp. 341-344
D.W. Tufts, Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA
Hongya Ge, Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA
R. Kumaresan, Dept. of Electr. Eng., Rhode Island Univ., Kingston, RI, USA
pp. 345-348
D. Pantzartzis, Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
D. Alexandrou, Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
V. Premus, Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
pp. 353-356
G.H. Niezgoda, Dept. of Electr. & Comput. Eng., R. Mil. Coll. of Canada, Kingston, Ont., Canada
K.C. Ho, Dept. of Electr. & Comput. Eng., R. Mil. Coll. of Canada, Kingston, Ont., Canada
pp. 357-360
P.P. Kanjilal, Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
S. Palit, Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
pp. 361-364
T. Akgul, Lab. for Comput. Neurosci., Pittsburgh Univ., PA, USA
A. El-Jaroudi, Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India
M. Simaan, Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
pp. 365-368
D.A. Noon, Dept. of Electr. & Comput. Eng., Queensland Univ., Qld., Australia
D. Longstaff, Dept. of Electr. & Comput. Eng., Queensland Univ., Qld., Australia
G.F. Stickley, Dept. of Electr. & Comput. Eng., Queensland Univ., Qld., Australia
pp. 369-372
R. Kuhn, CRIM, Montreal, Que., Canada
R. de mori, CRIM, Montreal, Que., Canada
E. Millien, CRIM, Montreal, Que., Canada
pp. 37-40
A. Zyweck, Microwave Radar Div., Defence Sci. & Technol. Organ., Adelaide, SA, Australia
R.E. Bogner, CRIM, Montreal, Que., Canada
pp. 373-376
N. Ehara, Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
I. Sasase, Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
S. Mori, Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
pp. 377-380
Z. Mohcine, S2HF-IRESTE La Chantrerie, Nantes, France
S. Joseph, S2HF-IRESTE La Chantrerie, Nantes, France
pp. 381-384
P. Delachartre, Univ. Claude Bernard, Villeurbanne, France
D. Tray, S2HF-IRESTE La Chantrerie, Nantes, France
Zhigang Sun, Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
G. Gimenez, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
A. Dziedzic, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
pp. 385-388
Z. Zvonar, Woods Hole Oceanogr. Instn., MA, USA
D. Brady, S2HF-IRESTE La Chantrerie, Nantes, France
J. Catipovic, Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
pp. 389-392
Y.T. Chan, Dept. of Electr. & Comput. Eng., R. Mil. Coll. of Canada, Kingston, Ont., Canada
K.C. Ho, Dept. of Electr. & Comput. Eng., R. Mil. Coll. of Canada, Kingston, Ont., Canada
pp. 393-396
Yisong Ye, Dept. of Electr. Eng., Auburn Univ., AL, USA
J.K. Tugnait, Dept. of Electr. Eng., Auburn Univ., AL, USA
pp. 397-400
M. Vishwanath, Comput. Sci. Lab., Xerox Palo Alto Res. Center, CA, USA
C. Chakrabarti, Dept. of Electr. Eng., Auburn Univ., AL, USA
pp. 401-404
C. Nagendra, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
M.J. Irwin, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
R.M. Owens, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
pp. 405-408
B.M. Gordon, Comput. Syst. Lab., Stanford Univ., CA, USA
T.H.Y. Meng, Comput. Syst. Lab., Stanford Univ., CA, USA
pp. 409-412
W. Gehrke, Lab. fur Informationstechnol., Hannover Univ., Germany
R. Hoffer, Lab. fur Informationstechnol., Hannover Univ., Germany
P. Pirsch, Lab. fur Informationstechnol., Hannover Univ., Germany
pp. 413-416
T. Araki, Semicond. Res. Center, Matsushita Electr. Ind. Co. Ltd., Japan
M. Toyokura, Semicond. Res. Center, Matsushita Electr. Ind. Co. Ltd., Japan
T. Akiyama, Lab. fur Informationstechnol., Hannover Univ., Germany
H. Takeno, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
B. Wilson, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
K. Aono, Multimedia Eng. Lab., Toshiba Corp., Kawasaki, Japan
pp. 417-420
J. Suzuki, NTT Transmission Syst. Labs., Yokosuka, Japan
F. Colin, Semicond. Res. Center, Matsushita Electr. Ind. Co. Ltd., Japan
S. Ono, Lab. fur Informationstechnol., Hannover Univ., Germany
pp. 421-424
L. Diez-Del-Rio, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
S. Moreno-Perez, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
R. Sarmiento, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
J. Parera, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
M. Veiga-Perez, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
R. Garcia-Gomez, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
pp. 425-428
J. Nurmi, Signal Process. Lab., Tampere Univ. of Technol., Finland
V. Eerola, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
E. Ofner, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
A. Gierlinger, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
J. Jernej, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
T. Karema, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
pp. 429-432
L. Guerra, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
M. Potkonjak, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
J. Rabaey, Dept. de Senales, Sistemas y Radiocomunicaciones, Univ. Politecnica de Madrid, Spain
pp. 433-436
M.A.R. Saghir, Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
P. Chow, Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
C.G. Lee, Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
pp. 437-440
S. Dey, C&C Res. Lab., NEC USA, Princeton, NJ, USA
M. Potkonjak, C&C Res. Lab., NEC USA, Princeton, NJ, USA
R.K. Roy, C&C Res. Lab., NEC USA, Princeton, NJ, USA
pp. 441-444
J.L. Pino, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
T.M. Parks, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
E.A. Lee, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
pp. 445-448
M. Pankert, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
O. Mauss, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
S. Ritz, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
H. Meyr, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
pp. 449-452
L.M. Arslan, Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
J.N.L. Hansen, Dept. of Electr. Eng., Duke Univ., Durham, NC, USA
pp. 45-48
P.K. Murthy, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
S.S. Bhattacharyya, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
E.A. Lee, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
pp. 453-456
Wonyong Sung, Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., South Korea
Ki-Il Kum, Inter-Univ. Semicond. Res. Center, Seoul Nat. Univ., South Korea
pp. 457-460
Minjoong Rim, Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
R. Jain, Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
pp. 461-464
V. Zivojnovic, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
S. Ritz, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
H. Meyr, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
pp. 465-468
H.J. Reekie, Univ. of Technol., Sydney, NSW, Australia
J.M. Potter, Univ. of Technol., Sydney, NSW, Australia
pp. 469-472
I.M. Verbauwhede, Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
C.J. Scheers, Univ. of Technol., Sydney, NSW, Australia
J.M. Rabaey, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
pp. 473-476
M. Moonen, ESAT, Katholieke Univ., Leuven, Belgium
I.K. Proudler, Univ. of Technol., Sydney, NSW, Australia
J.G. McWhirter, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
G. Hekstra, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
pp. 477-480
K. Huper, Inst. for Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
S. Paul, Inst. for Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
R. Pauli, Inst. for Network Theory & Circuit Design, Tech. Univ. Munchen, Germany
pp. 481-484
J.P. Openshaw, Dept. of Electr. Eng., Univ. Coll. of Swansea, UK
J.S. Masan, Dept. of Electr. Eng., Univ. Coll. of Swansea, UK
pp. 49-52
E.D. Deprettere, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
H.W. van Dijk, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
G.J. Hekstra, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
pp. 493-496
M. Potkonjak, Comput. & Commun. Res. Lab., NEC USA, Princeton, NJ, USA
M.B. Srivastava, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
pp. 497-500
R. Isotani, ATR Interpreting Telcommun Res. Labs., Kyoto, Japan
S. Matsunaga, ATR Interpreting Telcommun Res. Labs., Kyoto, Japan
pp. 5-8
Jiun-In Guo, Comput. & Commun. Res. Labs., Ind. Technol. Res. Inst., Hsinchu, Taiwan
Chi-Min Liu, ATR Interpreting Telcommun Res. Labs., Kyoto, Japan
Chein-Wei Jen, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
pp. 501-504
K. Nourji, Telecom Paris, Ecole Nat. Superieure des Telecommun., Paris, France
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N.W. Bergmann, CSIRO/Flinders Joint Res. Centre in Inf. Technol., Flinders Univ., Adelaide, SA, Australia
J.C. Mudge, CSIRO/Flinders Joint Res. Centre in Inf. Technol., Flinders Univ., Adelaide, SA, Australia
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S. Bernadas, Crystal Semicond. Corp., Austin, TX, USA
C. Thompson, Crystal Semicond. Corp., Austin, TX, USA
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V.K. Jain, Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
Lei Lin, Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
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Lizhong Wu, Dept. of Comput. Sci. & Technol., Oregon Graduate Inst. of Sci. & Technol., Beaverton, OR, USA
M. Niranjan, Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
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Fei Xie, ESAT, Katholieke Univ., Leuven, Heverlee, Belgium
D. Van Compernolle, ESAT, Katholieke Univ., Leuven, Heverlee, Belgium
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J.C. Principe, Comput. NeuroEng. Lab., Florida Univ., Gainesville, FL, USA
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Mang Zhu, Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
J.A. Cadzow, Dept. of Electr. Eng., Vanderbilt Univ., Nashville, TN, USA
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P. Cosi, Centro di Studio per le Ricerche di Fonetica, CNR, Padova, Italy
E. Magno Caldognetto, Centro di Studio per le Ricerche di Fonetica, CNR, Padova, Italy
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G.A. Mian, Inst. for Integrated Syst. in Signal Process., Tech. Hochschule Aachen, Germany
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Ce Zhu, Dept. of Radio Eng., Southeast Univ., Nanjing, China
Lihua Li, Dept. of Radio Eng., Southeast Univ., Nanjing, China
Zhenya Ile, Dept. of Radio Eng., Southeast Univ., Nanjing, China
Jun Wang, Dept. of Radio Eng., Southeast Univ., Nanjing, China
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B. Qiu, Dept. of Electr. & Electron. Eng., Victoria Univ. of Technol., Melbourne, Vic., Australia
P. Im, Dept. of Electr. & Electron. Eng., Victoria Univ. of Technol., Melbourne, Vic., Australia
A. Pleasants, Dept. of Electr. & Electron. Eng., Victoria Univ. of Technol., Melbourne, Vic., Australia
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S. Kollias, Div. of Comput. Sci., Nat. Tech. Univ. of Athens, Greece
D. Kalogeras, Div. of Comput. Sci., Nat. Tech. Univ. of Athens, Greece
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T. Kobayashi, Dept. of Electr. Eng., Waseda Univ., Tokyo, Japan
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K. Shirai, Dept. of Electr. Eng., Waseda Univ., Tokyo, Japan
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T. Brotherton, ORINCON Corp., San Diego, CA, USA
T. Pollard, ORINCON Corp., San Diego, CA, USA
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A. Yakovleff, Inf. Technol. Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
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P. Bollini, Dipartimento di Ingegneria Elettron., Firenze Univ., Italy
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E. Del Re, ORINCON Corp., San Diego, CA, USA
G. Mangani, Dept. of Radio Eng., Southeast Univ., Nanjing, China
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W.B. Ribbens, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Jaehong Park, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Daeeun Kim, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
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Jongwan Kim, Dept. of Comput. Eng., Seoul Nat. Univ., South Korea
Jesung Ahn, Dept. of Comput. Eng., Seoul Nat. Univ., South Korea
Jesung Ahn, Dept. of Comput. Eng., Seoul Nat. Univ., South Korea
Heeyeung Hwang, Dept. of Radio Eng., Southeast Univ., Nanjing, China
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E.J. Bellegarda, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
J.R. Bellegarda, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
J.H. Kim, Dept. of Comput. Eng., Seoul Nat. Univ., South Korea
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V. Chandrasekaran, Sch. of Electr. Eng. & Comput. Sci., Melbourne Univ., Parkville, Vic., Australia
M. Palaniswani, Sch. of Electr. Eng. & Comput. Sci., Melbourne Univ., Parkville, Vic., Australia
T.M. Caelli, Sch. of Electr. Eng. & Comput. Sci., Melbourne Univ., Parkville, Vic., Australia
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Fu-Hua Liu, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
R.M. Stern, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
A. Acero, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
P.J. Moreno, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
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A.M. Darwish, Dept. of Comput. Eng., Cairo Univ., Giza, Egypt
G.A. Auda, Dept. of Comput. Eng., Cairo Univ., Giza, Egypt
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V. DeBrunner, Dept. of Electr. Eng., Oklahoma Univ., Norman, OK, USA
T. Bussert, Dept. of Comput. Eng., Cairo Univ., Giza, Egypt
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Hong Yan, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
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S. Manke, Dept. of Comput. Sci., Karlsruhe Univ., Germany
U. Bodenhausen, Dept. of Comput. Sci., Karlsruhe Univ., Germany
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M. Schenkel, Swiss Federal Inst. of Technol., Zurich, Switzerland
I. Guyon, Dept. of Comput. Sci., Karlsruhe Univ., Germany
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D. Nandagopal, Guided Weapons Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
N.M. Martin, Guided Weapons Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
R.P. Johnson, Guided Weapons Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
P. Lozo, Guided Weapons Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
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S.V. Vaseghi, Sch. of Inf. Syst., East Anglia Univ., Norwich, UK
B.P. Milner, Sch. of Inf. Syst., East Anglia Univ., Norwich, UK
J.J. Humphries, Sch. of Inf. Syst., East Anglia Univ., Norwich, UK
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Sin-Horng Chen, Nat. Chiao Tung Univ., Hsinchu, Taiwan
Yuan-Fu Liao, Nat. Chiao Tung Univ., Hsinchu, Taiwan
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H.B.D. Sorensen, Dept. of Electron. & Electr. Eng., Eng. Acad. of Denmark, Lyngby, Denmark
U. Hartmann, Nat. Chiao Tung Univ., Hsinchu, Taiwan
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A. Bouzerdoum, Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
M.L. Southcott, Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
J. Zhu, Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
R.E. Bogner, Dept. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
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K. Hassanein, Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
L. Deng, Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
M.I. Elmasry, Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
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C. Bregler, Int. Comput. Sci. Inst., Berkeley, CA, USA
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V. Abrash, Speech Res. & Technol. Program, SRI Int., Menlo Park, CA, USA
M. Cohen, Speech Res. & Technol. Program, SRI Int., Menlo Park, CA, USA
H. Franco, Speech Res. & Technol. Program, SRI Int., Menlo Park, CA, USA
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W. Reichl, Lehrstuhl fur Datenverarbeitung, Munchen Univ., Germany
P. Caspary, Lehrstuhl fur Datenverarbeitung, Munchen Univ., Germany
G. Ruske, Lehrstuhl fur Datenverarbeitung, Munchen Univ., Germany
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Jun He, T.C.T.S., Fac. Polytech. de Mons, Belgium
H. Leich, T.C.T.S., Fac. Polytech. de Mons, Belgium
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R. Sankar, Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
S. Patravali, Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
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J. Hernando, Dept. of Signal Theor. & Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
C. Nadeu, Dept. of Signal Theor. & Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
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M.E. Knappe, Bell-Northern Res., Ottawa, Ont., Canada
R. Goubran, Dept. of Signal Theor. & Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
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M. Slaney, Apple Comput. Inc., Cupertino, CA, USA
D. Naar, Apple Comput. Inc., Cupertino, CA, USA
R.E. Lyon, Apple Comput. Inc., Cupertino, CA, USA
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T. Usagawa, Dept. of Electr. Eng. & Comput. Sci., Kumamoto Univ., Japan
M. Iwata, Dept. of Electr. Eng. & Comput. Sci., Kumamoto Univ., Japan
M. Ebata, Dept. of Electr. Eng. & Comput. Sci., Kumamoto Univ., Japan
pp. 81-84
F. Seide, Telecommun. Group, Tech. Univ. Hamburg-Harburg, Germany
A. Mertins, Telecommun. Group, Tech. Univ. Hamburg-Harburg, Germany
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Yuqing Gao, Apple-ISS Res. Center, Inst. of Syst. Sci., Singapore
J.-P. Haton, Apple-ISS Res. Center, Inst. of Syst. Sci., Singapore
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A.L.N. Fred, Centro de Analise e Processamento de Sinais, Inst. Superior Tecnico, Lisbon, Portugal
J.M.N. Leitao, Centro de Analise e Processamento de Sinais, Inst. Superior Tecnico, Lisbon, Portugal
pp. 9-II12
A. Kataoka, NTT Human Interface Labs., Tokyo, Japan
T. Moriya, NTT Human Interface Labs., Tokyo, Japan
S. Hayashi, NTT Human Interface Labs., Tokyo, Japan
pp. 93-96
R. Salami, Dept. of Electr. Eng., Sherbrooke Univ., Que., Canada
C. Laflamme, Dept. of Electr. Eng., Sherbrooke Univ., Que., Canada
J.-P. Adoul, Dept. of Electr. Eng., Sherbrooke Univ., Que., Canada
pp. 97-100
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