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Acoustics, Speech, and Signal Processing, IEEE International Conference on (1994)
Adelaide, SA, Australia
Apr. 19, 1994 to Apr. 22, 1994
ISBN: 0-7803-1775-0
TABLE OF CONTENTS
J.-M. Boucher , Groupe Traitement d'Images, Ecole Nat. Superieure des Telecommun. de Bretagne, Brest, France
S. Pleihers , Groupe Traitement d'Images, Ecole Nat. Superieure des Telecommun. de Bretagne, Brest, France
pp. 1-4
P. Jackway , Signal Process. Res. Centre, Queensland Univ., Brisbane, Qld., Australia
W.W. Boles , Signal Process. Res. Centre, Queensland Univ., Brisbane, Qld., Australia
M. Deriche , Signal Process. Res. Centre, Queensland Univ., Brisbane, Qld., Australia
pp. 5-8
Ying Wang , Center for Autom. Res., Maryland Univ., College Park, MD, USA
R. Chellappa , Center for Autom. Res., Maryland Univ., College Park, MD, USA
Qinfen Zheng , Center for Autom. Res., Maryland Univ., College Park, MD, USA
pp. 9-V12
G. Marcu , Graphica Comput. Corp., Tokyo, Japan
K. Iwata , Graphica Comput. Corp., Tokyo, Japan
pp. 101-104
N. Kobayashi , Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
H. Saito , Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
pp. 105-108
G.S.D. Farrow , Dept. of Electr. Eng., Manchester Univ., UK
C.S. Xydeas , Dept. of Electr. Eng., Manchester Univ., UK
J.P. Oakley , Dept. of Electr. Eng., Manchester Univ., UK
pp. 109-112
J.P. Oakley , Hewlett-Packard Lab., Palo Alto, CA, USA
pp. 113-116
S.A. Karunasekera , Dept. of Eng., Cambridge Univ., UK
N.G. Kingsbury , Dept. of Eng., Cambridge Univ., UK
pp. 117-120
N. Nikolaidis , Dept. of Electr. Eng., Thessaloniki Univ., Greece
I. Pitas , Dept. of Electr. Eng., Thessaloniki Univ., Greece
pp. 121-124
T. Starner , BBN Syst. & Technol. Corp., Cambridge, MA, USA
J. Makhoul , BBN Syst. & Technol. Corp., Cambridge, MA, USA
R. Schwartz , BBN Syst. & Technol. Corp., Cambridge, MA, USA
G. Chou , BBN Syst. & Technol. Corp., Cambridge, MA, USA
pp. 125-128
R.W. Picard , Media Lab., MIT, Cambridge, MA, USA
Fang Liu , Media Lab., MIT, Cambridge, MA, USA
pp. 129-132
S. Krishnamachari , Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
R. Chellappa , Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
pp. 13-16
H. Cherifi , TSI, CNRS, Saint Etienne, France
R. Grisel , Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
pp. 133-136
R. Grisel , Signal Process. Res. Centre, Queensland Univ. of Technol., Brisbane, Qld., Australia
W.W. Boles , Signal Process. Res. Centre, Queensland Univ. of Technol., Brisbane, Qld., Australia
pp. 137-140
S. Lee , Dept. of Electr. & Comput. Eng., Queensland Univ., Qld., Australia
B. Lovell , Dept. of Electr. & Comput. Eng., Queensland Univ., Qld., Australia
pp. 141-144
A.C. Kam , Caliper Corp., USA
G.E. Kopec , Dept. of Electr. & Comput. Eng., Queensland Univ., Qld., Australia
pp. 145-148
J.R. Bellegarda , IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
D. Nahamoo , IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
K.S. Nathan , IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
E.J. Bellegarda , IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 149-152
H. Singh , Aware Inc., Cambridge, MA, USA
A. Mahalanobis , IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 153-156
C. Boni , Alenia S.p.A, Rome, Italy
M. Richard , Alenia S.p.A, Rome, Italy
S. Barbarossa , IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
pp. 157-160
H. Choi , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
H. Choi , Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 161-164
Z. Belhadj , Lab. S2HF IRESTE, Systemes et Signaux Hautes Frequences, Nantes, France
A. Saad , Lab. S2HF IRESTE, Systemes et Signaux Hautes Frequences, Nantes, France
S. El Assad , Lab. S2HF IRESTE, Systemes et Signaux Hautes Frequences, Nantes, France
J. Saillard , Lab. S2HF IRESTE, Systemes et Signaux Hautes Frequences, Nantes, France
pp. 165-168
M. Soumekh , Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
M. Pollock , Lab. S2HF IRESTE, Systemes et Signaux Hautes Frequences, Nantes, France
R. Dinger , Lab. S2HF IRESTE, Systemes et Signaux Hautes Frequences, Nantes, France
pp. 169-172
T. Aydin , Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
Y. Yemez , Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
B. Sankur , Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
E. Anarim , Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
O. Alkin , Dept. of Electr. & Electron. Eng., Bogazici Univ., Istanbul, Turkey
pp. 17-20
A. Wang , Inst. of Electron., Acad. Sinica, Beijing, China
Y. Mao , Inst. of Electron., Acad. Sinica, Beijing, China
Z. Chen , Inst. of Electron., Acad. Sinica, Beijing, China
pp. 173-176
B. Haywood , Microwave Radar Div., Defence Sci. & Technol. Organ., Melbourne, Vic., Australia
R. Kyprianou , Microwave Radar Div., Defence Sci. & Technol. Organ., Melbourne, Vic., Australia
A. Zyweck , Microwave Radar Div., Defence Sci. & Technol. Organ., Melbourne, Vic., Australia
pp. 177-180
N. Lannes , CERFACS, Toulouse, France
E. Anterrieu , CERFACS, Toulouse, France
S. Roques , CERFACS, Toulouse, France
G. Fitoussi , CERFACS, Toulouse, France
pp. 181-184
Jiang Hui , Inst. of Acoust., Acad. Sinica, Beijing, China
Hou Chao-Huan , Inst. of Acoust., Acad. Sinica, Beijing, China
pp. 185-188
J.M. Moureaux , UNSA, CNRS, Valbonne, France
P. Gauthier , UNSA, CNRS, Valbonne, France
M. Barlaud , UNSA, CNRS, Valbonne, France
P. Bellemain , CERFACS, Toulouse, France
pp. 189-192
N.J.S. Stacy , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
D. Burgess , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
J.J. Douglass , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
M.R. Muller , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
M. Robinson , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
pp. 193-196
Y. Aoki , Dept. of Inf. Eng., Hokkaido Univ., Sapporo, Japan
S. Tanahashi , Dept. of Inf. Eng., Hokkaido Univ., Sapporo, Japan
J. Xu , Dept. of Inf. Eng., Hokkaido Univ., Sapporo, Japan
pp. 197-200
S. Simmons , Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
R. Evans , Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
pp. 201-204
J. Nieweglowski , Signal Process. Lab., Tampere Univ. of Technol., Finland
T. Moisala , Signal Process. Lab., Tampere Univ. of Technol., Finland
P. Haavisto , Dept. of Inf. Eng., Hokkaido Univ., Sapporo, Japan
pp. 205-208
K. Aizawa , Dept. of Electr. Eng., Tokyo Univ., Japan
K. Iwata , Dept. of Electr. Eng., Tokyo Univ., Japan
T. Saito , Dept. of Inf. Eng., Hokkaido Univ., Sapporo, Japan
M. Hatori , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
pp. 209-212
A. Laine , Florida Univ., Gainesville, FL, USA
M. Lewis , Dept. of Electr. Eng., Tokyo Univ., Japan
F. Taylor , Dept. of Inf. Eng., Hokkaido Univ., Sapporo, Japan
pp. 21-24
M. Covell , Interval Res. Corp., Palo Alto, CA, USA
M. Withgott , Interval Res. Corp., Palo Alto, CA, USA
pp. 213-216
S. Kozu , Semiconductor Appl. Eng. Div., NEC Corp., Kawasaki, Japan
S. Kulkarni , Interval Res. Corp., Palo Alto, CA, USA
pp. 217-220
M.M. Chang , Dept. of Electr. Eng., Rochester Univ., NY, USA
M.I. Sezan , Interval Res. Corp., Palo Alto, CA, USA
A.M. Tekalp , Dept. of Inf. Eng., Hokkaido Univ., Sapporo, Japan
pp. 221-224
A.J. Patti , Dept. of Electr. Eng., Rochester Univ., NY, USA
M.I. Sezan , Dept. of Electr. Eng., Rochester Univ., NY, USA
A.M. Tekalp , Dept. of Inf. Eng., Hokkaido Univ., Sapporo, Japan
pp. 225-228
N.M. Namazi , Dept. of Electr. Eng., Catholic Univ. of America, Washington, DC, USA
P. Penafiel , Dept. of Electr. Eng., Catholic Univ. of America, Washington, DC, USA
C.M. Fan , Dept. of Electr. Eng., Catholic Univ. of America, Washington, DC, USA
pp. 229-232
C. Bussiere , Dept. of Electr. Eng., Toronto Univ., Ont., Canada
D. Hatzinakos , Dept. of Electr. Eng., Toronto Univ., Ont., Canada
pp. 233-236
J.C. Brailean , Digital Technol. Res. Lab., Motorola Inc., Schaumburg, IL, USA
T. Ozcelik , Dept. of Electr. Eng., Toronto Univ., Ont., Canada
A.K. Katsaggelos , Dept. of Electr. Eng., Catholic Univ. of America, Washington, DC, USA
pp. 237-240
R.J. Crinon , Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
W.J. Kolodziej , Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
pp. 241-244
R.D. Morris , Dept. of Eng., Cambridge Univ., UK
W.J. Fitzgerald , Dept. of Eng., Cambridge Univ., UK
pp. 245-248
J. Princen , AT&T Bell Labs., Murray Hill, NJ, USA
M.H. Chan , Dept. of Eng., Cambridge Univ., UK
pp. 249-252
Jianxin Hou , Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
R.H. Bamberger , Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
pp. 25-28
G.P. Abousleman , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
M.W. Marcellin , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
B.R. Hunt , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
pp. 253-256
E.A. Gifford , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
B.R. Hunt , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
M.W. Marcellin , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
pp. 257-260
D. Miller , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
K. Rose , Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
P.A. Chou , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
pp. 261-264
A. Woolf , Div. of Radiophysics, CSIRO, Sydney, NSW, Australia
G. Rogers , Div. of Radiophysics, CSIRO, Sydney, NSW, Australia
pp. 269-272
C. Stiller , Inst. fur Elektrische Nachrichentech., Tech. Hochschule Aachen, Germany
pp. 273-276
C. Gu , Signal Process. Lab., Swiss Federal Inst. of Technol., Lausanne, Switzerland
pp. 277-280
J.M. Lervik , Dept. of Telecomm., Norwegian Inst. of Technol., Trondheim, Norway
T.A. Ramstad , Dept. of Telecomm., Norwegian Inst. of Technol., Trondheim, Norway
pp. 281-284
M. Cermelli , Dept. of Comput. Sci., Genoa Univ., Italy
F. Lavagetto , Dept. of Comput. Sci., Genoa Univ., Italy
M. Pampolini , Dept. of Comput. Sci., Genoa Univ., Italy
pp. 285-288
Lai-Man Po , Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
Wen-Tao Tan , Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
Chi-Ho Chan , Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
pp. 289-292
J.S. Marques , INESC, Tech. Univ. Lisbon, Portugal
pp. 29-32
P.S. Lewis , Eng. Sci. and Appl. Div., Los Alamos Nat. Lab., NM, USA
J.C. Mosher , Eng. Sci. and Appl. Div., Los Alamos Nat. Lab., NM, USA
pp. 293-296
K. Faez , Amirkabir Univ. of Technol., Tehran, Iran
M. Kamel , Eng. Sci. and Appl. Div., Los Alamos Nat. Lab., NM, USA
pp. 297-300
K.-K.R. Yu , Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
Sze-Fong Yau , Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
pp. 301-304
L. Blanc-Feraud , CNRS, Nice, France
P. Charbonnier , Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
P. Lobel , Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
M. Barlaud , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
pp. 305-308
M. Barlaud , Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
M. Barlaud , Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
pp. 309-312
A. Malinverno , Schlumberger-Doll Res., Ridgefield, CT, USA
D.J. Rossi , Schlumberger-Doll Res., Ridgefield, CT, USA
M. Daniel , Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
pp. 313-316
Yong Zhang , Bio-Eng. Program, Michigan Univ., Ann Arbor, MI, USA
Yong Zhang , Schlumberger-Doll Res., Ridgefield, CT, USA
W.L. Rogers , Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong
pp. 317-320
T.M. Habashy , Schlumberger-Doll Res., Ridgefield, CT, USA
E.J. Bellegarda , Schlumberger-Doll Res., Ridgefield, CT, USA
pp. 321-324
I. Pitas , Dept. of Electr. Eng., Thessaloniki Univ., Greece
A. Karasaridis , Dept. of Electr. Eng., Thessaloniki Univ., Greece
pp. 325-328
J.D. McDonnell , Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
R.N. Shorten , Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
A.D. Fagan , Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
pp. 329-332
P.R. Hsu , Dept. of Electron. Eng., Tokyo Univ., Japan
H. Harashima , Dept. of Electron. Eng., Tokyo Univ., Japan
pp. 33-36
Jianzhong Huang , Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
S. Liu , Dept. of Electron. Eng., Tokyo Univ., Japan
pp. 333-336
A. Palau , Dept. of Comput. Sci. & Electr. Eng., Vermont Univ., Burlington, VT, USA
G. Mirchandani , Dept. of Comput. Sci. & Electr. Eng., Vermont Univ., Burlington, VT, USA
pp. 337-340
Jiebo Luo , Dept. of Electr. Eng., Rochester Univ., NY, USA
Jiebo Luo , Dept. of Electr. Eng., Rochester Univ., NY, USA
K.J. Parker , Dept. of Electr. Eng., Rochester Univ., NY, USA
T.S. Huang , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
pp. 341-344
W. Philips , ELIS, Ghent Univ., Belgium
C. Christopoulos , Dept. of Electr. Eng., Rochester Univ., NY, USA
pp. 345-348
M. Iwahashi , Dept. of Electr. Eng., Nagaoka Univ. of Technol., Niigata, Japan
K. Ohyama , Dept. of Electr. Eng., Rochester Univ., NY, USA
N. Kambayashi , Dept. of Electr. Eng., Rochester Univ., NY, USA
pp. 349-352
P. Waldemar , Dept. of Telecommun., Inst. of Technol., Trondheim, Norway
T.A. Ramstad , Dept. of Telecommun., Inst. of Technol., Trondheim, Norway
pp. 353-356
M. Nikolova , Lab. des Signaux et Syst., Ecole Superieure d'Electr., Gif-sur-Yvette, France
A. Mohammad-Djafari , Lab. des Signaux et Syst., Ecole Superieure d'Electr., Gif-sur-Yvette, France
J. Idier , Lab. des Signaux et Syst., Ecole Superieure d'Electr., Gif-sur-Yvette, France
pp. 357-360
D.D. Giusto , Istituto di Elettrotecnica, Cagliari Univ., Italy
S. Fioravanti , Lab. des Signaux et Syst., Ecole Superieure d'Electr., Gif-sur-Yvette, France
pp. 361-364
T. Eude , Inst. Nat. des Sci. Appliquees, Mont Saint Aignan, France
R. Grisel , Lab. des Signaux et Syst., Ecole Superieure d'Electr., Gif-sur-Yvette, France
H. Cherifi , Lab. des Signaux et Syst., Ecole Superieure d'Electr., Gif-sur-Yvette, France
R. Debrie , Microwave Radar Div., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
pp. 365-368
T. Naemura , Dept. of Electr. Eng., Tokyo Univ., Japan
H. Harashima , Dept. of Electr. Eng., Tokyo Univ., Japan
pp. 369-372
M.Y. Jaisimha , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
J.R. Goldschneider , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
A.E. Mohr , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
E.A. Riskin , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
R.M. Haralick , Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
pp. 37-40
R.R. Schultz , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
R.L. Stevenson , Dept. of Electr. Eng., Notre Dame Univ., IN, USA
pp. 373-376
R.M. Elfadel , Res. Lab. of Electron., MIT, Cambridge, MA, USA
pp. 377-380
K. Popat , Media Lab., MIT, Cambridge, MA, USA
R.W. Picard , Media Lab., MIT, Cambridge, MA, USA
pp. 381-384
P.J. Whitbread , Div. of Inf. Technol., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
pp. 385-388
Hsi-Jung Wu , Apple Comput. Inc., Cupertino, CA, USA
D. Ponceleon , Apple Comput. Inc., Cupertino, CA, USA
K. Wang , Apple Comput. Inc., Cupertino, CA, USA
J. Normile , Apple Comput. Inc., Cupertino, CA, USA
pp. 389-392
J. You , Sch. of Comput. & Inf. Sci., Univ. South Australia, The Levels, SA, Australia
H.A. Cohen , Apple Comput. Inc., Cupertino, CA, USA
pp. 393-396
D. Tretter , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
K. Khawaja , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
C.A. Bouman , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
A.A. Maciejewski , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 397-400
Tsann-Shyong Liu , Inst. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
N. Jayant , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 401-404
W.L. Chooi , Dept. of Electr. & Comput. Syst. Eng., Monash Univ., Clayton, Vic., Australia
K.N. Ngan , Dept. of Electr. & Comput. Syst. Eng., Monash Univ., Clayton, Vic., Australia
pp. 405-408
L. Contin , CSELT, Torino, Italy
S. Battista , CSELT, Torino, Italy
pp. 409-412
M. Bennamoun , Signal Process. Res. Centre, Queensland Univ. of Technol., Brisbane, Qld., Australia
pp. 41-44
G. Bozdagi , Dept. of Electr. & Electron. Eng., Bilkent Univ., Ankara, Turkey
A.M. Tekalp , CSELT, Torino, Italy
L. Onural , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 413-416
S. Liu , Hewlett-Packard Co., Palo Alto, CA, USA
pp. 417-420
L.C. de Silva , Dept. of Electr. Eng., Tokyo Univ., Japan
K. Aizawa , Dept. of Electr. Eng., Tokyo Univ., Japan
M. Hatori , Dept. of Electr. Eng., Tokyo Univ., Japan
pp. 421-424
M. Hatori , Video Lab., Samsung Electron. Co., Suwon, South Korea
M. Hatori , Video Lab., Samsung Electron. Co., Suwon, South Korea
pp. 425-428
Li Yan , AT&T Bell Labs., Holmdel, NJ, USA
pp. 429-432
B. DeCleene , Dept. of Electr. Eng., Pennsylvania Univ., Philadelphia, PA, USA
H. Sorensen , Dept. of Electr. Eng., Pennsylvania Univ., Philadelphia, PA, USA
pp. 433-436
G.W. Cook , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
E.J. Delp , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 437-440
B.K. Natarajan , Hewlett-Packard Co., Palo Alto, CA, USA
V. Bhaskaran , Hewlett-Packard Co., Palo Alto, CA, USA
pp. 441-443
R.P. Millane , Whistler Center for Carbohydrate Res., Purdue Univ., West Lafayette, IN, USA
P.J. Bones , Hewlett-Packard Co., Palo Alto, CA, USA
H. Jiang , Dept. of Electr. Eng., Tokyo Univ., Japan
pp. 445-448
H. Jiang , Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
B.D. Jeffs , Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
pp. 449-452
T. Saito , Dept. of Electr. Eng., Kanagawa Univ., Yokohama, Japan
T. Komatsu , Dept. of Electr. Eng., Kanagawa Univ., Yokohama, Japan
K. Aizawa , Dept. of Electr. Eng., Tokyo Univ., Japan
pp. 45-48
R. Whatmough , Div. of Inf. Technol., Defence Sci. & Technol. Organ., Salisbury, SA, Australia
pp. 453-456
C.-F. Westin , Dept. of Electr. Eng., Linkoping Univ., Sweden
K. Nordberg , Dept. of Electr. Eng., Linkoping Univ., Sweden
H. Knutsson , Dept. of Electr. Eng., Linkoping Univ., Sweden
pp. 457-460
A.L. Harvey , Dept. of Electr. Eng., R. Melbourne Inst. of Technol., Vic., Australia
H.A. Cohen , Dept. of Electr. Eng., Linkoping Univ., Sweden
pp. 461-464
C.R. Parker , Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
B.L. Satherley , Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
P.J. Bones , Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
pp. 465-468
M. Gunsay , Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
B.D. Jeffs , Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
pp. 469-472
P.L. Combettes , Dept. of Electr. Eng., City Univ. of New York, NY, USA
H. Puh , Dept. of Electr. Eng., City Univ. of New York, NY, USA
pp. 473-476
A.W. Johnson , Telecom Australia Res. Labs., Australia
J. Princen , Dept. of Electr. Eng., City Univ. of New York, NY, USA
M.H. Chan , Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
pp. 477-480
Feng-Ming Wang , C-Cube Microsyst., Milpitas, CA, USA
S. Liu , Dept. of Electr. Eng., City Univ. of New York, NY, USA
pp. 481-484
F.G.B. De Natale , Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy
G.S. Desoli , Dept. of Electr. Eng., City Univ. of New York, NY, USA
D.D. Guisto , Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
pp. 485-488
N. Vasconcelos , Media Lab., MIT, Cambridge, MA, USA
A. Lippman , Media Lab., MIT, Cambridge, MA, USA
pp. 489-492
Y. Iano , DECOM, Univ. Estadual de Campinas, Sao Paulo, Brazil
pp. 49-50
D. Taubman , California Univ., Berkeley, CA, USA
A. Zakhor , California Univ., Berkeley, CA, USA
pp. 493-496
Jungwoo Lee , Dept. of Electr. Eng., Princeton Univ., NJ, USA
B.W. Dickinson , Dept. of Electr. Eng., Princeton Univ., NJ, USA
pp. 497-500
A. Kaup , Inst. for Commun. Eng., Tech. Hochschule Aachen, Germany
T. Aach , Inst. for Commun. Eng., Tech. Hochschule Aachen, Germany
pp. 501-504
D.L. Wilson , Sch. of Electron. & Electr. Eng., Bath Univ., UK
J.A. Nicholls , Sch. of Electron. & Electr. Eng., Bath Univ., UK
D.M. Monro , Sch. of Electron. & Electr. Eng., Bath Univ., UK
pp. 505-508
P. Musumeci , Dept. of Electr. Eng., Australian Defence Force Acad., Canberra, ACT, Australia
pp. 509-512
Hyun-Soo Kang , Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon, South Korea
Jong-Hun Kim , Sch. of Electron. & Electr. Eng., Bath Univ., UK
Jung-Hee Lee , Sch. of Electron. & Electr. Eng., Bath Univ., UK
Seong-Dae Kim , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 513-516
Wentao Zheng , Dept. of Electr. Eng., Tokyo Univ., Japan
H. Harashima , Dept. of Electr. Eng., Tokyo Univ., Japan
pp. 517-520
P.K. Moller , Electron. Inst., Tech. Univ. Denmark, Lyngby, Denmark
pp. 521-524
O. Ikeda , Fac. of Eng., Takushoku Univ., Tokyo, Japan
pp. 525-528
H. Knutsson , Comput. Vision Lab., Linkoping Univ., Sweden
M. Andersson , Comput. Vision Lab., Linkoping Univ., Sweden
pp. 529-532
B. Macq , Lab. de Telecommun. et Teledetection, Univ. Catholique de Louvain, Belgium
M. Mattavelli , Lab. de Telecommun. et Teledetection, Univ. Catholique de Louvain, Belgium
O. Van Calster , Lab. de Telecommun. et Teledetection, Univ. Catholique de Louvain, Belgium
E. Van der Plancke , Lab. de Telecommun. et Teledetection, Univ. Catholique de Louvain, Belgium
S. Comes , Lab. de Telecommun. et Teledetection, Univ. Catholique de Louvain, Belgium
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J.-M. Laferte , IRISA/INRIA/CNR, Rennes, France
P. Perez , IRISA/INRIA/CNR, Rennes, France
F. Heitz , IRISA/INRIA/CNR, Rennes, France
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C.A. Bouman , Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
K. Sauer , IRISA/INRIA/CNR, Rennes, France
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J.A. O'Sullivan , Dept. of Electr. Eng., Washington Univ., St. Louis, MO, USA
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N. Merlet , Inst. of Comput. Sci., Hebrew Univ., Jerusalem, Israel
J. Zerubia , IRISA/INRIA/CNR, Rennes, France
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B.R. Hunt , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
D. DeKruger , Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
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J.R. Casas , Dept. of Signal Theory & Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
L. Torres , Dept. of Signal Theory & Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
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D.M. Monro , Sch. of Electron. & Electr. Eng., Bath Univ., UK
S.J. Woolley , Sch. of Electron. & Electr. Eng., Bath Univ., UK
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B. Hurtgen , Inst. for Commun. Eng., Aachen Univ. of Technol, Germany
T. Hain , Inst. for Commun. Eng., Aachen Univ. of Technol, Germany
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G.E. Oien , Rogaland Univ. Centre, Stavanger, Norway
Z. Baharav , Inst. for Commun. Eng., Aachen Univ. of Technol, Germany
S. Lepsoy , IRISA/INRIA/CNR, Rennes, France
E. Karnin , Lab. de Telecommun. et Teledetection, Univ. Catholique de Louvain, Belgium
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E. Reusens , Signal Process. Lab., Swiss Federal Inst. of Technol., Lausanne, Switzerland
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M. Muneyasu , Fac. of Eng., Hiroshima Univ., Japan
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T. Hinamoto , Fac. of Eng., Hiroshima Univ., Japan
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J. Apostolopoulos , Res. Lab. of Electron., MIT, Cambridge, MA, USA
A. Pfajfer , Res. Lab. of Electron., MIT, Cambridge, MA, USA
A. Pfajfer , Res. Lab. of Electron., MIT, Cambridge, MA, USA
J.S. Lim , Res. Lab. of Electron., MIT, Cambridge, MA, USA
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T. Fujii , Dept. of Electr. Eng., Tokyo Univ., Japan
H. Harashima , Dept. of Electr. Eng., Tokyo Univ., Japan
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K. Asai , Mitsubishi Electr. Corp., Japan
N.T. Thao , Dept. of Electr. Eng., Tokyo Univ., Japan
M. Vetterli , Res. Lab. of Electron., MIT, Cambridge, MA, USA
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A. Teuner , Dept. of Electr. Eng., Duisburg Univ., Germany
P.A. Nielsen , Dept. of Electr. Eng., Tokyo Univ., Japan
B.J. Hosticka , Res. Lab. of Electron., MIT, Cambridge, MA, USA
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J.P. Andrew , Dept. of Electr. & Comput. Eng., Wollongong Univ., NSW, Australia
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F.J. Paoloni , Dept. of Electr. & Comput. Eng., Wollongong Univ., NSW, Australia
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R. Lancini , CEFRIEL, Milan, Italy
E. Marconetti , Dept. of Electr. & Comput. Eng., Wollongong Univ., NSW, Australia
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L. Torres , Dept. de Teoria del Senyal i Comunicacions, Univ. Politecnica de Catalunya, Barcelona, Spain
J.R. Casas , Dept. de Teoria del Senyal i Comunicacions, Univ. Politecnica de Catalunya, Barcelona, Spain
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E.K. Tsern , Inf. Syst. Lab., Stanford Univ., CA, USA
T.H.Y. Meng , Inf. Syst. Lab., Stanford Univ., CA, USA
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M. Skoglund , Dept. of Inf. Theory, Chalmers Univ. of Technol., Goteborg, Sweden
P. Hedelin , Dept. of Inf. Theory, Chalmers Univ. of Technol., Goteborg, Sweden
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A. Taguchi , Musashi Inst. of Technol., Tokyo, Japan
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R. Fioravanti , Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy
S. Fioravanti , Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy
D.D. Giusto , Dept. de Teoria del Senyal i Comunicacions, Univ. Politecnica de Catalunya, Barcelona, Spain
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N.M. Nasrabadi , Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
S.A. Rizvi , Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
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F. Nesci , Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
F. Kossentini , Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
M.J.T. Smith , Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
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M. Effros , Inf. Syst. Lab., Stanford Univ., CA, USA
P.A. Chou , Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
R.M. Gray , Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
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S.S. Hemami , Inf. Syst. Lab., Stanford Univ., CA, USA
R.M. Gray , Inf. Syst. Lab., Stanford Univ., CA, USA
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Bing Zeng , Dept. of Electr. & Electon. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, Hong Kong
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J.S.J. Li , Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
A. Ramsingh , Dept. of Electr. & Electron. Eng., Canterbury Univ., Christchurch, New Zealand
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H.R. Rabiee , Dept. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
R.L. Kashyap , Dept. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
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C.S. Regazzoni , Dept. of Biophys. & Electron. Eng., Genoa Univ., Italy
A.S. Venetsanopoulos , Dept. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
G.L. Foresti , Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
G. Vernazza , Res. Lab. of Electron., MIT, Cambridge, MA, USA
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Hong Tang , Comput. Sci. Lab., Australian Nat. Univ., Canberra, ACT, Australia
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K. Nishi , Dept. of Commun. & Syst. Emg., Univ. of Electro-Commun., Tokyo, Japan
S. Ando , Dept. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
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N. Chaddha , Inf. Syst. Lab., Stanford Univ., CA, USA
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T.H.Y. Meng , Inf. Syst. Lab., Stanford Univ., CA, USA
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A. Tremeau , Lab. Traitement du Signal et Instrum., Saint-Etienne, France
M. Calonnier , Inf. Syst. Lab., Stanford Univ., CA, USA
B. Laget , Inf. Syst. Lab., Stanford Univ., CA, USA
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Tsann-Shyong Liu , Inst. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Long-Wen Chang , Inst. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
pp. 97-100
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