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Fifth IEEE International Conference on Advanced Learning Technologies (ICALT'05)
?First Aid for You?: Getting to Know Your Learning Style Using Machine Learning
Kaohsiung, Taiwan
July 05-July 08
ISBN: 0-7695-2338-2
| ASCII Text | x | ||
| Declan Kelly, Brendan Tangney, "?First Aid for You?: Getting to Know Your Learning Style Using Machine Learning," Advanced Learning Technologies, IEEE International Conference on, pp. 1-3, Fifth IEEE International Conference on Advanced Learning Technologies (ICALT'05), 2005. | |||
| BibTex | x | ||
| @article{ 10.1109/ICALT.2005.1, author = {Declan Kelly and Brendan Tangney}, title = {?First Aid for You?: Getting to Know Your Learning Style Using Machine Learning}, journal ={Advanced Learning Technologies, IEEE International Conference on}, volume = {0}, year = {2005}, isbn = {0-7695-2338-2}, pages = {1-3}, doi = {http://doi.ieeecomputersociety.org/10.1109/ICALT.2005.1}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Advanced Learning Technologies, IEEE International Conference on TI - ?First Aid for You?: Getting to Know Your Learning Style Using Machine Learning SN - 0-7695-2338-2 SP1 EP3 A1 - Declan Kelly, A1 - Brendan Tangney, PY - 2005 KW - null VL - 0 JA - Advanced Learning Technologies, IEEE International Conference on ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ICALT.2005.1
Research on learning has shown that students learn differently and that they prefer to use different type of resources. Adaptive Educational Systems can support different learning characteristics by building a model of the student?s learning behaviour and subsequently adapting the learning environment to match different needs. However major challenges exist, as it is not clear how a student model of learning style can be accurately built. One solution may be in the use of machine learning techniques. This paper presents ?First Aid For you?, a novel adaptive educational system that dynamically determines learning style using machine learning techniques. The paper describes how it uses the Felder & Solomon Index of Learning Style to design an environment for different learning styles. It also describes how, as the student interacts with the learning environment, it uses the Na?ve Bayes algorithm to predict the student?s preferred learning style and adaptively customize the learning environment
Citation:
Declan Kelly, Brendan Tangney, "?First Aid for You?: Getting to Know Your Learning Style Using Machine Learning," icalt, pp.1-3, Fifth IEEE International Conference on Advanced Learning Technologies (ICALT'05), 2005
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