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2009 IEEE International Workshop on Hardware-Oriented Security and Trust
Circuit-level techniques for reliable Physically Uncloneable Functions
San Francisco, CA, USA
July 27-July 27
ISBN: 978-1-4244-4805-0
| ASCII Text | x | ||
| Vignesh Vivekraja, Leyla Nazhandali, "Circuit-level techniques for reliable Physically Uncloneable Functions," Hardware-Oriented Security and Trust, IEEE International Workshop on, pp. 30-35, 2009 IEEE International Workshop on Hardware-Oriented Security and Trust, 2009. | |||
| BibTex | x | ||
| @article{ 10.1109/HST.2009.5225054, author = {Vignesh Vivekraja and Leyla Nazhandali}, title = {Circuit-level techniques for reliable Physically Uncloneable Functions}, journal ={Hardware-Oriented Security and Trust, IEEE International Workshop on}, volume = {0}, year = {2009}, isbn = {978-1-4244-4805-0}, pages = {30-35}, doi = {http://doi.ieeecomputersociety.org/10.1109/HST.2009.5225054}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Hardware-Oriented Security and Trust, IEEE International Workshop on TI - Circuit-level techniques for reliable Physically Uncloneable Functions SN - 978-1-4244-4805-0 SP30 EP35 A1 - Vignesh Vivekraja, A1 - Leyla Nazhandali, PY - 2009 VL - 0 JA - Hardware-Oriented Security and Trust, IEEE International Workshop on ER - | |||
In this paper we study the effect of transistor supply voltage and body bias on the performance of ring oscillator Physically Uncloneable Functions (PUFs). The uniqueness (ability to identify a PUF) and reproducibility (ability to reproduce the same output) of PUFs increase drastically in the subthreshold region of operation. Also, the reproducibility of PUFs increase when the transistors are forward body biased. A ring oscillator PUF was tested and it achieved a uniqueness of 47.8% and reproducibility of 100% when operating at a supply voltage of 0.2 V. Compared to a base line configuration, our method improved the uniqueness by 18% and reproducibility by 7%. Therefore, apart from architectural optimizations, circuit level considerations like supply voltage and body bias can improve the reliability of PUFs.
Citation:
Vignesh Vivekraja, Leyla Nazhandali, "Circuit-level techniques for reliable Physically Uncloneable Functions," hst, pp.30-35, 2009 IEEE International Workshop on Hardware-Oriented Security and Trust, 2009
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