• H
  • HLDVT
  • 2005
  • High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
Advanced Search 
High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
Napa Valley, CA, USA
November 30-December 02
ISBN: 0-7803-9571-9
Table of Contents
C.H.-P. Wen, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
L.C. Wang, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Kwang-Ting Cheng, Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
pp. 3-10
Chen He, Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
M.F. Jacome, Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
G. de Veciana, Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
pp. 11-18
J.C. Baraza, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
J. Gracia, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
D. Gil, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
P.J. Gil, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
pp. 19-26
J. Campos, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
H. Al-Asaad, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
pp. 27-34
H. Anand, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
J. Bhadra, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
A. Sen, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
M.S. Abadir, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
pp. 37-44
Feng Lu, Dept. of ECE, Univ. of California at Santa Barbara, CA, USA
K.-T. Cheng, Dept. of ECE, Univ. of California at Santa Barbara, CA, USA
pp. 45-51
M. Syal, Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
M.S. Hsiao, Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
pp. 52-59
J.-P. Talpin, INRIA-IRISA, Rennes, France
S.K. Shukla, Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
pp. 63-70
S. Chikada, Graduate Sch. of Inf. Sci., Nagoya Univ., Japan
S. Honda, Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
H. Tomiyama, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
H. Takada, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
pp. 71-76
A. Cheng, Sch. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
Cheng-Chew Lim, Sch. of Electr. & Electron. Eng., Adelaide Univ., SA, Australia
A. Parashkevov, Dept. of Comput. Eng., Valencia Tech. Univ., Spain
pp. 79-86
Che-Hua Shih, Dept. of Electron. Eng., National Chiao Tung Univ., Hsinchu, Taiwan
Juinn-Dar Huang, Dept. of Electron. Eng., National Chiao Tung Univ., Hsinchu, Taiwan
Jing-Yang Jou, Dept. of Electron. Eng., National Chiao Tung Univ., Hsinchu, Taiwan
pp. 87-93
K.D. Rich, Transmeta Corp., Santa Clara, CA, USA
S.G. Govindaraju, Transmeta Corp., Santa Clara, CA, USA
R. Shaw, Transmeta Corp., Santa Clara, CA, USA
D. Dobrikin, Transmeta Corp., Santa Clara, CA, USA
pp. 94-101
Y. Katz, IBM Res. Lab, Haifa, Israel
I. Jaeger, IBM Res. Lab, Haifa, Israel
R. Emek, IBM Res. Lab, Haifa, Israel
Y. Lichtenstein, IBM Res. Lab, Haifa, Israel
pp. 105-111
S. Fine, IBM Res. Lab., Haifa, Israel
A. Freund, IBM Res. Lab., Haifa, Israel
I. Jaeger, IBM Res. Lab., Haifa, Israel
Y. Naveh, IBM Res. Lab., Haifa, Israel
A. Ziv, IBM Res. Lab., Haifa, Israel
pp. 112-118
Qingwei Wu, Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
M.S. Hsiao, Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
pp. 121-126
S. Suhaib, FERMAT Lab, Virginia Tech, Blacksburg, VA, USA
D. Mathaikutty, FERMAT Lab, Virginia Tech, Blacksburg, VA, USA
S. Shukla, FERMAT Lab, Virginia Tech, Blacksburg, VA, USA
D. Berner, IBM Res. Lab., Haifa, Israel
pp. 127-134
D.K. Pradhan, Dept. of Comput. Sci., Bristol Univ., UK
A.K. Singh, FERMAT Lab, Virginia Tech, Blacksburg, VA, USA
T.L. Rajaprabhu, FERMAT Lab, Virginia Tech, Blacksburg, VA, USA
A.M. Jabir, IBM Res. Lab., Haifa, Israel
pp. 135-142
P.M. Peranandam, Dept. of Comput. Eng., Tubingen Univ., Germany
P.K. Nalla, Dept. of Comput. Eng., Tubingen Univ., Germany
R.J. Weiss, Dept. of Comput. Eng., Tubingen Univ., Germany
J. Ruf, Dept. of Comput. Eng., Tubingen Univ., Germany
T. Kropf, Dept. of Comput. Eng., Tubingen Univ., Germany
W. Rosenstiel, Dept. of Comput. Eng., Tubingen Univ., Germany
pp. 145-152
R. Kaivola, Intel Corp., Hillsboro, OR, USA
A. Naik, Intel Corp., Hillsboro, OR, USA
pp. 153-159
Zhenyu Chen, Dept. of Math., Nanjing Univ., China
Conghua Zhou, Dept. of Math., Nanjing Univ., China
Decheng Ding, Dept. of Math., Nanjing Univ., China
pp. 168-174
Chia-Chih Yen, Dept. of Electron. Eng., National Chiao-Tung Univ., Hsinchu, Taiwan
Jing-Yang Jou, Dept. of Electron. Eng., National Chiao-Tung Univ., Hsinchu, Taiwan
pp. 177-183
V.C. Vimjam, Dept. of Electr. & Comput. Eng.,, Virginia Tech, Blacksburg, VA, USA
M.S. Hsiao, Dept. of Electr. & Comput. Eng.,, Virginia Tech, Blacksburg, VA, USA
pp. 184-191
D. Babic, Dept. of Comput. Sci., British Columbia Univ., Vancouver, BC, Canada
J. Bingham, Dept. of Comput. Sci., British Columbia Univ., Vancouver, BC, Canada
A.J. Hu, Dept. of Comput. Sci., British Columbia Univ., Vancouver, BC, Canada
pp. 192-199
D.D. Hwang, Dept. of Elec. Eng., UCLA, Los Angeles, CA, USA
Shenglin Yang, Dept. of Elec. Eng., UCLA, Los Angeles, CA, USA
I. Verbauwhede, Dept. of Elec. Eng., UCLA, Los Angeles, CA, USA
P. Schaumont, Dept. of Comput. Eng., Tubingen Univ., Germany
pp. 203-210
Huiyun Li, Comput. Lab., Cambridge Univ., UK
A.T. Markettos, Comput. Lab., Cambridge Univ., UK
S. Moore, Comput. Lab., Cambridge Univ., UK
pp. 211-218
I. Ugarte, Dept. of TEISA, Cantabria Univ., Santander, Spain
P. Sanchez, Dept. of TEISA, Cantabria Univ., Santander, Spain
pp. 221-228
H. Azatchi, IBM Res. Lab. in Haifa, Israel
L. Fournier, IBM Res. Lab. in Haifa, Israel
A. Ziv, IBM Res. Lab. in Haifa, Israel
K. Zohar, IBM Res. Lab. in Haifa, Israel
pp. 229-236
A. Piziali, Tima Lab., Grenoble, France
A. Ziv, Tima Lab., Grenoble, France
pp. 247-247
Author index (Abstract)
pp. 249-250
Usage of this product signifies your acceptance of the Terms of Use.