• H
  • HLDVT
  • 2003
  • Eighth IEEE International High-Level Design Validation and Test Workshop (HLDVT'03)
Advanced Search 
Eighth IEEE International High-Level Design Validation and Test Workshop (HLDVT'03)
San Francisco, CA, USA
November 12-November 14
ISBN: 0-7803-8236-6
Table of Contents
Hldvt
Xiaoliang Bai, Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
Li Chen, Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
S. Dey, Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
pp. 11-16
M. Aharoni, IBM Haifa Res. Labs., Israel
S. Asaf, IBM Haifa Res. Labs., Israel
L. Fournier, IBM Haifa Res. Labs., Israel
A. Koifman, IBM Haifa Res. Labs., Israel
R. Nagel, IBM Haifa Res. Labs., Israel
pp. 17-22
A. Adir, IBM Res. Lab., Haifa, Israel
E. Bin, IBM Res. Lab., Haifa, Israel
O. Peled, IBM Res. Lab., Haifa, Israel
A. Ziv, IBM Res. Lab., Haifa, Israel
pp. 23-28
K.C. Shashidhar, IMEC, Heverlee, Belgium
M. Bruynooghe, IBM Res. Lab., Haifa, Israel
F. Catthoor, IBM Res. Lab., Haifa, Israel
G. Janssens, IBM Res. Lab., Haifa, Israel
pp. 31-36
F.M. De Paula, Mindspeed Technol. Inc., USA
F.M. De Paula, IBM Res. Lab., Haifa, Israel
H. Foster, IBM Res. Lab., Haifa, Israel
J.A. Nacif, IBM Res. Lab., Haifa, Israel
J. Tompkins, IBM Haifa Res. Labs., Israel
pp. 37-42
J.P.L. Campbell, Sch. of Comp. Sci., Waterloo Univ., Ont., Canada
N.A. Day, IBM Res. Lab., Haifa, Israel
pp. 43-48
S. Gopalakrishnan, Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
V. Durairaj, Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
P. Kalla, Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
pp. 51-56
R. Arora, Virginia Tech, Blacksburg, VA, USA
M.S. Hsiao, Virginia Tech, Blacksburg, VA, USA
pp. 63-68
F. Corno, Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
P. Gabrielli, Virginia Tech, Blacksburg, VA, USA
S. Tosato, Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
pp. 71-76
P. Schaumont, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
K. Sakiyama, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Y. Fan, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
D. Hwang, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
S. Yang, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
A. Hodjat, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
B. Lai, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
I. Verbauwhede, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 77-82
Xi Chen, California Univ., Riverside, CA, USA
H. Hsieh, California Univ., Riverside, CA, USA
F. Balarin, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Y. Watanabe, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 83-88
M. Braun, STZ Softwaretechnik, Esslingen, Germany
W. Rosenstiel, California Univ., Riverside, CA, USA
K.-D. Schubert, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 91-95
S. Fine, IBM Res. Lab in Haifa, Haifa Univ. Campus, Israel
A. Ziv, IBM Res. Lab in Haifa, Haifa Univ. Campus, Israel
pp. 96-101
F. Fummi, Dipt. di Inf., Verona Univ., Italy
C. Marconcini, Dipt. di Inf., Verona Univ., Italy
G. Pravadelli, Dipt. di Inf., Verona Univ., Italy
pp. 108-113
K. Chandrasekar, Virginia Tech, Blacksburg, VA, USA
M.S. Hsiao, Virginia Tech, Blacksburg, VA, USA
pp. 117-122
D. Grosse, Inst. of Comput. Sci., Bremen Univ., Germany
R. Drechsler, Inst. of Comput. Sci., Bremen Univ., Germany
pp. 123-128
S. Rahim, LIRMM - Synplicity, Montpellier, France
B. Rouzeyre, Inst. of Comput. Sci., Bremen Univ., Germany
L. Torres, Dipt. di Inf., Verona Univ., Italy
J. Rampon, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 129-134
D.K. Pradhan, Dept. of Comput. Sci., Bristol Univ., UK
S. Askar, Inst. of Comput. Sci., Bremen Univ., Germany
M. Ciesielski, Dipt. di Inf., Verona Univ., Italy
pp. 135-139
O. Goloubeva, Politecnico di Torino, Italy
M. Sonza Reorda, Politecnico di Torino, Italy
M. Violante, Politecnico di Torino, Italy
pp. 143-148
G. Parthasarathy, California Univ., Santa Barbara, CA, USA
M.K. Iyer, California Univ., Santa Barbara, CA, USA
K.-T. Cheng, California Univ., Santa Barbara, CA, USA
pp. 157-162
E. Gaudette, Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
M. Moussa, Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
I.G. Harris, California Univ., Santa Barbara, CA, USA
pp. 169-172
A. Ziv, Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
B. Bailey, California Univ., Santa Barbara, CA, USA
J. Abraham, California Univ., Santa Barbara, CA, USA
B. Joyner, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Y. Kas, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
M. Levinger, Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 175-175
Author index (PDF)
pp. 177-178
Usage of this product signifies your acceptance of the Terms of Use.