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Eighth IEEE International High-Level Design Validation and Test Workshop (2003)
San Francisco, CA, USA
Nov. 12, 2003 to Nov. 14, 2003
ISBN: 0-7803-8236-6
TABLE OF CONTENTS
Hldvt
Xiaoliang Bai , Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
Li Chen , Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
S. Dey , Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, CA, USA
pp. 11-16
M. Aharoni , IBM Haifa Res. Labs., Israel
S. Asaf , IBM Haifa Res. Labs., Israel
L. Fournier , IBM Haifa Res. Labs., Israel
A. Koifman , IBM Haifa Res. Labs., Israel
R. Nagel , IBM Haifa Res. Labs., Israel
pp. 17-22
A. Adir , IBM Res. Lab., Haifa, Israel
E. Bin , IBM Res. Lab., Haifa, Israel
O. Peled , IBM Res. Lab., Haifa, Israel
A. Ziv , IBM Res. Lab., Haifa, Israel
pp. 23-28
K.C. Shashidhar , IMEC, Heverlee, Belgium
M. Bruynooghe , IBM Res. Lab., Haifa, Israel
F. Catthoor , IBM Res. Lab., Haifa, Israel
G. Janssens , IBM Res. Lab., Haifa, Israel
pp. 31-36
F.M. De Paula , Mindspeed Technol. Inc., USA
F.M. De Paula , IBM Res. Lab., Haifa, Israel
H. Foster , IBM Res. Lab., Haifa, Israel
J.A. Nacif , IBM Res. Lab., Haifa, Israel
J. Tompkins , IBM Haifa Res. Labs., Israel
pp. 37-42
J.P.L. Campbell , Sch. of Comp. Sci., Waterloo Univ., Ont., Canada
N.A. Day , IBM Res. Lab., Haifa, Israel
pp. 43-48
S. Gopalakrishnan , Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
V. Durairaj , Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
P. Kalla , Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
pp. 51-56
D.K. Pradhan , Dept. of Comput. Sci., Bristol Univ., UK
pp. 57-62
R. Arora , Virginia Tech, Blacksburg, VA, USA
M.S. Hsiao , Virginia Tech, Blacksburg, VA, USA
pp. 63-68
F. Corno , Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
P. Gabrielli , Virginia Tech, Blacksburg, VA, USA
S. Tosato , Dept. of Electr. & Comput. Eng., Utah Univ., Salt Lake City, UT, USA
pp. 71-76
P. Schaumont , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
K. Sakiyama , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Y. Fan , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
D. Hwang , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
S. Yang , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
A. Hodjat , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
B. Lai , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
I. Verbauwhede , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 77-82
Xi Chen , California Univ., Riverside, CA, USA
H. Hsieh , California Univ., Riverside, CA, USA
F. Balarin , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Y. Watanabe , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 83-88
M. Braun , STZ Softwaretechnik, Esslingen, Germany
W. Rosenstiel , California Univ., Riverside, CA, USA
K.-D. Schubert , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 91-95
S. Fine , IBM Res. Lab in Haifa, Haifa Univ. Campus, Israel
A. Ziv , IBM Res. Lab in Haifa, Haifa Univ. Campus, Israel
pp. 96-101
I. Ugarte , Cantabria Univ., Santander, Spain
P. Sanchez , Cantabria Univ., Santander, Spain
pp. 102-107
F. Fummi , Dipt. di Inf., Verona Univ., Italy
C. Marconcini , Dipt. di Inf., Verona Univ., Italy
G. Pravadelli , Dipt. di Inf., Verona Univ., Italy
pp. 108-113
K. Chandrasekar , Virginia Tech, Blacksburg, VA, USA
M.S. Hsiao , Virginia Tech, Blacksburg, VA, USA
pp. 117-122
D. Grosse , Inst. of Comput. Sci., Bremen Univ., Germany
R. Drechsler , Inst. of Comput. Sci., Bremen Univ., Germany
pp. 123-128
S. Rahim , LIRMM - Synplicity, Montpellier, France
B. Rouzeyre , Inst. of Comput. Sci., Bremen Univ., Germany
L. Torres , Dipt. di Inf., Verona Univ., Italy
J. Rampon , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 129-134
D.K. Pradhan , Dept. of Comput. Sci., Bristol Univ., UK
S. Askar , Inst. of Comput. Sci., Bremen Univ., Germany
M. Ciesielski , Dipt. di Inf., Verona Univ., Italy
pp. 135-139
O. Goloubeva , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
pp. 143-148
R. Emek , IBM Haifa Res. Lab., Israel
Y. Naveh , IBM Haifa Res. Lab., Israel
pp. 149-154
G. Parthasarathy , California Univ., Santa Barbara, CA, USA
M.K. Iyer , California Univ., Santa Barbara, CA, USA
K.-T. Cheng , California Univ., Santa Barbara, CA, USA
pp. 157-162
A. Fin , Dipt. di Inf., Verona Univ., Italy
F. Fummi , Dipt. di Inf., Verona Univ., Italy
pp. 163-168
E. Gaudette , Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
M. Moussa , Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
I.G. Harris , California Univ., Santa Barbara, CA, USA
pp. 169-172
A. Ziv , Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
B. Bailey , California Univ., Santa Barbara, CA, USA
J. Abraham , California Univ., Santa Barbara, CA, USA
B. Joyner , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Y. Kas , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
M. Levinger , Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
pp. 175
Author index (PDF)
pp. 177-178
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