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10th IEEE High Assurance Systems Engineering Symposium (HASE'07)
Dallas, Texas, USA
November 14-November 16
ISBN: 0-7695-3043-5
| ASCII Text | x | ||
| Ronald J. Leach, "Preliminary Models of the Cost of Fault Tolerance," Ninth IEEE International Symposium on High-Assurance Systems Engineering (HASE'05), pp. 371-372, 10th IEEE High Assurance Systems Engineering Symposium (HASE'07), 2007. | |||
| BibTex | x | ||
| @article{ 10.1109/HASE.2007.11, author = {Ronald J. Leach}, title = {Preliminary Models of the Cost of Fault Tolerance}, journal ={Ninth IEEE International Symposium on High-Assurance Systems Engineering (HASE'05)}, volume = {0}, year = {2007}, issn = {1530-2059}, pages = {371-372}, doi = {http://doi.ieeecomputersociety.org/10.1109/HASE.2007.11}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - Ninth IEEE International Symposium on High-Assurance Systems Engineering (HASE'05) TI - Preliminary Models of the Cost of Fault Tolerance SN - 1530-2059 SP371 EP372 A1 - Ronald J. Leach, PY - 2007 KW - null VL - 0 JA - Ninth IEEE International Symposium on High-Assurance Systems Engineering (HASE'05) ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/HASE.2007.11
Software cost estimation and overruns continue to plague the software engineering community, especially in the area of safety-critical systems. We provide some preliminary models to predict the cost of adding fault detection, fault-tolerance, or fault isolation techniques to a software system or subsystem if the cost of originally developing the system or subsystem is known. Since cost is a major driver in the decision to develop new safety-critical systems, such models will be useful to requirements engineers, systems engineers, decision makers, and those intending to reuse systems and components in safety-critical environments where fault tolerance is critical.
Citation:
Ronald J. Leach, "Preliminary Models of the Cost of Fault Tolerance," hase, pp.371-372, 10th IEEE High Assurance Systems Engineering Symposium (HASE'07), 2007
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