• H
  • HASE
  • 2000
  • Fifth IEEE International Symposim on High Assurance Systems Engineering (HASE'00)
Advanced Search 
Fifth IEEE International Symposim on High Assurance Systems Engineering (HASE'00)
Albuquerque, New Mexico
November 15-November 17
ISBN: 0-7695-0927-4
Table of Contents
Introduction
Banquet Address
Jim Skinner, Computer Sciences Corporation
pp. xi
Keynote Address
Session I: Test-Based Comprehension and Failure Prediction Models and Metrics
null
D.T. Smith, Virginia Military Institute
T. A. DeLong, Virginia Military Institute
B. W. Johnson, Virginia Military Institute
T. C. Giras, Virginia Military Institute
pp. 17
Panel Session: How can Symposia Be Structured to Benefit Both Industry and Academia?
null
R. R. Lutz, California Institute of Technology and Iowa State University
pp. 49
Session II: Using, Extending, and Analyzing UML
null
S. Gnesi, Istituto di Elaborazione dell'Inf., CNR
D. Latella, Istituto di Elaborazione dell'Inf., CNR
M. Massink, Istituto di Elaborazione dell'Inf., CNR
pp. 55
Yeong Choi Sang, Korea National Defense University
D. Wijesekera, Korea National Defense University
pp. 75
H. Gabor, Budapest University of Technology & Economics
M. Istvan, Budapest University of Technology & Economics
pp. 83
Session III: Special-Purpose High Consequence Processors
null
Panel Session: Do Formal Methods Really Belong in the Toolbox of the Practicing Engineer?
null
Session IV: Requirements Specification, Analysis, and Synthesis
null
S. Goddard, University of Nebraska-Lincoln
K. Jeffay, University of Nebraska-Lincoln
pp. 177
Session V: Works in Progress
null
S. Patton, Illinois State University
B. Smith, Illinois State University
D. Doss, Illinois State University
W. Yurcik, Illinois State University
pp. 199
B. K. Aichernig, Graz University of Technology
A. Gerstinger, Graz University of Technology
R. Aster, Graz University of Technology
pp. 203
K. S. Tso, IA Tech. Inc.
A. T. Tai, IA Tech. Inc.
L. Alkalai, IA Tech. Inc.
S.N. Chau, IA Tech. Inc.
W. H. Sanders, IA Tech. Inc.
pp. 212
Session VI: Specification, Rigorous Validation, and Analysis
null
Session VII: Development and Testing Tools and System Architectures
null
F. B. Bastani, University of Texas at Dallas
S. Ntafos, University of Texas at Dallas
I-Ling Yen, University of Texas at Dallas
D. E. Harris, University of Texas at Dallas
R. R. Morrow, University of Texas at Dallas
R. Paul, University of Texas at Dallas
pp. 265
Zhiwei Xu, Florida Atlantic University
T. M. Khoshgoftaar, Florida Atlantic University
E. B. Allen, Florida Atlantic University
pp. 281
Panel Session: Testing in High Assurance System Engineering
null
Session VIII: Reliability Models and Metrics
null
R. M. Kieckhafer, Michigan Technological Unversity
M. H. Azadmanesh, Michigan Technological Unversity
Y. Hui, Michigan Technological Unversity
pp. 293
A. F. Garcia, Pontificia Universidade Catolica do Rio de Janeiro
D. M. Beder, Pontificia Universidade Catolica do Rio de Janeiro
C. M. F. Rubira, Pontificia Universidade Catolica do Rio de Janeiro
pp. 311
Author Index
Usage of this product signifies your acceptance of the Terms of Use.