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4th IEEE International Symposium on High-Assurance Systems Engineering
Washington, D.C.
November 17-November 19
ISBN: 0-7695-0418-3
Table of Contents
Keynote I
Convergence on High Assurability: Will We Converge or Diverge?
Keynote II
Countdown to Y2K: View from the DoD DCIO
Paper Session I: Evaluation and Testing
W. T. Tsai, University of Minnesota
Weiguang Shao, University of Minnesota
Sanjai Rayadurgam, University of Minnesota
Jinbao Li, University of Minnesota
Raymond Paul, OASD, Y2K Office
pp. 27
Paper Session II: Special Session on UML for High Assurance Systems
M. Dal Cin, IMMD 3 University of Erlangen-Nuremberg and Technical University of Budapest
G. Huszerl, IMMD 3 University of Erlangen-Nuremberg and Technical University of Budapest
K. Kosmidis, IMMD 3 University of Erlangen-Nuremberg and Technical University of Budapest
pp. 37
Stefania Gnesi, Consiglio Nazionale delle Ricerche
Diego Latella, Consiglio Nazionale delle Ricerche
Mieke Massink, Consiglio Nazionale delle Ricerche
pp. 46
Paper Session III: Experience Reports
Paper Session IV: Fault Analysis
Panel Session I: Building High-Assurance Systems Using COTS Components: Whether, Why, When and How?
Paper Session V: Case Studies
Dolores R. Wallace, National Institute of Standards and Technology
D. Richard Kuhn, National Institute of Standards and Technology
pp. 123
Paper Session VI: Reliable Communications
I-Ling Yen, University of Texas at Dallas
Biao Chen, University of Texas at Dallas
Ing-Ray Chen, Virginia Polytechnic Institute
pp. 161
Paper Session VII: Frameworks, Systems, Tools
Jennifer Ren, University of Illinois at Urbana-Champaign
Michel Cukier, University of Illinois at Urbana-Champaign
Paul Rubel, University of Illinois at Urbana-Champaign
William H. Sanders, University of Illinois at Urbana-Champaign
David E. Bakken, BBN Technologies
David A. Karr, BBN Technologies
pp. 189
Panel Session II: What are the Most Critical Challenges to Integrating High Assurance Systems?
Paper Session VIII: Metrics and Modeling
Paul E. Ammann, George Mason University
Paul E. Black, National Institute of Standards and Technology
pp. 239
Tom Chen, Colorado State University
Anneliese von Mayrhauser, Colorado State University
Amjad Hajjar, Colorado State University
Charles Anderson, Colorado State University
Mehmet Sahinoglu, Case Western Reserve
pp. 249
Panel Session III: Should High Assurance Systems Use Software? Risk vs. Functionality
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