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Ninth IEEE International Symposium on High-Assurance Systems Engineering (HASE'05) (1999)
Washington, D.C.
Nov. 17, 1999 to Nov. 19, 1999
ISBN: 0-7695-0418-3
TABLE OF CONTENTS
Keynote I
Keynote II
Paper Session I: Evaluation and Testing
Ann Q. Gates , University of Texas at El Paso
Patricia J. Teller , University of Texas at El Paso
pp. 11
W. T. Tsai , University of Minnesota
Weiguang Shao , University of Minnesota
Sanjai Rayadurgam , University of Minnesota
Jinbao Li , University of Minnesota
Raymond Paul , OASD, Y2K Office
pp. 27
Paper Session II: Special Session on UML for High Assurance Systems
M. Dal Cin , IMMD 3 University of Erlangen-Nuremberg and Technical University of Budapest
G. Huszerl , IMMD 3 University of Erlangen-Nuremberg and Technical University of Budapest
K. Kosmidis , IMMD 3 University of Erlangen-Nuremberg and Technical University of Budapest
pp. 37
Stefania Gnesi , Consiglio Nazionale delle Ricerche
Diego Latella , Consiglio Nazionale delle Ricerche
Mieke Massink , Consiglio Nazionale delle Ricerche
pp. 46
William E. McUmber , Michigan State University
Betty H.C. Cheng , Michigan State University
pp. 56
Paper Session III: Experience Reports
James Kirby, Jr. , Naval Research Laboratory
Myla Archer , Naval Research Laboratory
Constance Heitmeyer , Naval Research Laboratory
pp. 81
Li Gong , Sun Microsystems, Inc.
Satya Dodda , Sun Microsystems, Inc.
pp. 89
Paper Session IV: Fault Analysis
Ann T. Tai , IA Tech, Inc.
Savio N. Chau , California Institute of Technology
Leon Alkalai , California Institute of Technology
pp. 97
Taghi M. Khoshgoftaar , Florida Atlantic University
Edward B. Allen , Florida Atlantic University
pp. 105
Panel Session I: Building High-Assurance Systems Using COTS Components: Whether, Why, When and How?
Savio Chau , California Institute of Technology
pp. 116
Isaac Levendel , Motorola Incorporated
pp. 117
Jeffrey M. Voas , Reliable Software Technologies
pp. 119
Paper Session V: Case Studies
Dolores R. Wallace , National Institute of Standards and Technology
D. Richard Kuhn , National Institute of Standards and Technology
pp. 123
Barbara J. Czerny , Delphi Delco Electronics Systems
Mats P.E. Heimdahl , University of Minnesota
pp. 132
Steve Goddard , University of Nebraska
Kevin Jeffay , University of North Carolina at Chapel Hill
pp. 141
Paper Session VI: Reliable Communications
I-Ling Yen , University of Texas at Dallas
Biao Chen , University of Texas at Dallas
Ing-Ray Chen , Virginia Polytechnic Institute
pp. 161
Isao Kaji , Miyagi University
Yongdong Tan , Tokyo Institute of Technology
Kinji Mori , Tokyo Institute of Technology
pp. 169
Haihong Zheng , Nokia Research Center
Sourav Bhattacharya , Arizona State University
pp. 179
Paper Session VII: Frameworks, Systems, Tools
Jennifer Ren , University of Illinois at Urbana-Champaign
Michel Cukier , University of Illinois at Urbana-Champaign
Paul Rubel , University of Illinois at Urbana-Champaign
William H. Sanders , University of Illinois at Urbana-Champaign
David E. Bakken , BBN Technologies
David A. Karr , BBN Technologies
pp. 189
Alec Yasinsac , National Academy of Engineering
William A. Wulf , Florida State University
pp. 197
Carol L. Hoover , Carnegie Mellon University
Jeffery Hansen , Carnegie Mellon University
Philip Koopman , Carnegie Mellon University
Sandeep Tamboli , Carnegie Mellon University
pp. 207
Michael W. Whalen , University of Minnesota
Mats. P.E. Heimdahl , University of Minnesota
pp. 217
Panel Session II: What are the Most Critical Challenges to Integrating High Assurance Systems?
Paper Session VIII: Metrics and Modeling
Diego Del Gobbo , West Virginia University
Bojan Cukic , West Virginia University
Marcello R. Napolitano , West Virginia University
S. Easterbrook , University of Toronto
pp. 231
Paul E. Ammann , George Mason University
Paul E. Black , National Institute of Standards and Technology
pp. 239
Tom Chen , Colorado State University
Anneliese von Mayrhauser , Colorado State University
Amjad Hajjar , Colorado State University
Charles Anderson , Colorado State University
Mehmet Sahinoglu , Case Western Reserve
pp. 249
Victor L. Winter , Sandia National Laboratories
pp. 257
Panel Session III: Should High Assurance Systems Use Software? Risk vs. Functionality
Victor L. Winter , Sandia National Laboratories
Ray Berg , Sandia National Laboratories
pp. 269
Larry J. Dalton , Sandia National Laborities
pp. 272
Ben L. Di Vito , NASA Langley Research Center
pp. 273
Jeffrey M. Voas , Reliable Software Technologies
pp. 274
Author Index (PDF)
pp. 275
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