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1996 High-Assurance Systems Engineering Workshop (HASE '96)
Niagara, CANADA
October 22-October 22
ISBN: 0-8186-7629-9
Table of Contents
Keynote Speech
Session I: Specification and Testing of High-Assurance Systems
J.-M. Bruel, Lab. IRIT/SIERA, Univ. Paul Sabatier, Toulouse, France
R.B. France, Lab. IRIT/SIERA, Univ. Paul Sabatier, Toulouse, France
A. Benzekri, Lab. IRIT/SIERA, Univ. Paul Sabatier, Toulouse, France
Y. Raynaud, Lab. IRIT/SIERA, Univ. Paul Sabatier, Toulouse, France
pp. 16
T.S. Perraju, Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
S.P. Rana, Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
S.P. Sarkar, Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
pp. 24
Jyhjong Lin, Dept. of Inf. Manage., ChaoYan Inst. of Technol., Taichung County, Taiwan
D.C. Kung, Dept. of Inf. Manage., ChaoYan Inst. of Technol., Taichung County, Taiwan
Pei Hsia, Dept. of Inf. Manage., ChaoYan Inst. of Technol., Taichung County, Taiwan
pp. 271
R.V. Vishnuvajjala, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
Wei-Tek Tsai, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
R. Mojdehbakhsh, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
L. Elliott, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
pp. 32
R.V. Pichai, Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
J.E. Urban, Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
pp. 40
Panel I
Panel I
I-Ling Yen, Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
pp. 50
V.T. Thomas, Technol. Center, Honeywell Inc., Minneapolis, MN, USA
pp. 55
V.L. Winter, Sandia Nat. Labs., USA
pp. 57
Session II: Quality and High-Assurance
R. Paul, Testing & Evaluation, Washington, DC, USA
M.F. Khan, Testing & Evaluation, Washington, DC, USA
S. Baqai, Testing & Evaluation, Washington, DC, USA
A. Ghafoor, Testing & Evaluation, Washington, DC, USA
pp. 60
J. Voas, Reliable Software Technol., Sterling, VA, USA
F. Charron, Reliable Software Technol., Sterling, VA, USA
K. Miller, Reliable Software Technol., Sterling, VA, USA
pp. 78
Session III: Concurrency and High-Assurance
E.Y.T. Juan, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
J.J.P. Tsai, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
T. Murata, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
pp. 104
Jian Chen, Dept. of Comput. Sci., George Mason Univ., Fairfax, VA, USA
R. Carver, Dept. of Comput. Sci., George Mason Univ., Fairfax, VA, USA
pp. 112
K.H. Kim, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
C. Subbaraman, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
pp. 120
The Department of Defense Science and Technology (S&T) Program
Session IV: High-Assurance Execution Environments
N. Neves, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
W.K. Fuchs, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 134
S. Dawson, Real-Time Comput. Lab., Michigan Univ., Ann Arbor, MI, USA
F. Jahanian, Real-Time Comput. Lab., Michigan Univ., Ann Arbor, MI, USA
T. Mitton, Real-Time Comput. Lab., Michigan Univ., Ann Arbor, MI, USA
pp. 142
D.B. Stewart, Dept. of Electr. Eng. & Inst. for Adv. Comput. Studies, Maryland Univ., College Park, MD, USA
P.K. Khosla, Dept. of Electr. Eng. & Inst. for Adv. Comput. Studies, Maryland Univ., College Park, MD, USA
pp. 150
J.J.P. Tsai, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Bing Li, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
E.Y.T. Juan, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
pp. 158
P. Cornwell, Distributed Objects Res. Group, Bournemouth Univ., UK
A. Wellings, Distributed Objects Res. Group, Bournemouth Univ., UK
pp. 166
R. Vishnuvajjala, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
S. Subramanian, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
Wei-Tek Tsai, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
R. Mojdehbakhsh, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
L. Elliot, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
pp. 176
Speech
Panel II
Panel II
Session V: Security, Reliability and High-Assurance
M.H. Kang, Center for High Assurance Comput. Syst., Naval Res. Lab., Washington, DC, USA
J.N. Froscher, Center for High Assurance Comput. Syst., Naval Res. Lab., Washington, DC, USA
I.S. Moskowtiz, Center for High Assurance Comput. Syst., Naval Res. Lab., Washington, DC, USA
pp. 198
T.F. Keefe, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
W.T. Tsai, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
pp. 206
F.B. Bastani, Dept. of Comput. Sci., Houston Univ., TX, USA
B. Cukic, Dept. of Comput. Sci., Houston Univ., TX, USA
pp. 214
T. Nara, Quality Assurance & Inspection Dept., Hitachi Ltd., Kawasaki, Japan
M. Nakata, Quality Assurance & Inspection Dept., Hitachi Ltd., Kawasaki, Japan
A. Ooishi, Quality Assurance & Inspection Dept., Hitachi Ltd., Kawasaki, Japan
pp. 222
J.C. Becker, Air Traffic Manage., Lockheed Martin Federal Syst. Inc., Atlantic City Int. Airport, NJ, USA
G. Flick, Air Traffic Manage., Lockheed Martin Federal Syst. Inc., Atlantic City Int. Airport, NJ, USA
pp. 228
Session VI: High-Assurance Potpourri
T.M. Khoshgoftaar, Florida Atlantic Univ., Boca Raton, FL, USA
E.B. Allen, Florida Atlantic Univ., Boca Raton, FL, USA
L.A. Bullard, Florida Atlantic Univ., Boca Raton, FL, USA
R. Halstead, Florida Atlantic Univ., Boca Raton, FL, USA
G.P. Trio, Florida Atlantic Univ., Boca Raton, FL, USA
pp. 244
M.P.E. Heimdahl, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
B.J. Czerny, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
pp. 252
Q. Shi, Sch. of Comput. & Math., Liverpool John Moores Univ., UK
N. Zhang, Sch. of Comput. & Math., Liverpool John Moores Univ., UK
pp. 263
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