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- HASE
- 1996
- 1996 High-Assurance Systems Engineering Workshop (HASE '96)
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1996 High-Assurance Systems Engineering Workshop (HASE '96) Niagara, CANADA October 22-October 22 ISBN: 0-8186-7629-9 Table of Contents
 | Keynote Speech |
 | Session I: Specification and Testing of High-Assurance Systems |
J.-M. Bruel, Lab. IRIT/SIERA, Univ. Paul Sabatier, Toulouse, France
R.B. France, Lab. IRIT/SIERA, Univ. Paul Sabatier, Toulouse, France
A. Benzekri, Lab. IRIT/SIERA, Univ. Paul Sabatier, Toulouse, France
Y. Raynaud, Lab. IRIT/SIERA, Univ. Paul Sabatier, Toulouse, France pp. 16
T.S. Perraju, Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
S.P. Rana, Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA
S.P. Sarkar, Dept. of Comput. Sci., Wayne State Univ., Detroit, MI, USA pp. 24
Jyhjong Lin, Dept. of Inf. Manage., ChaoYan Inst. of Technol., Taichung County, Taiwan
D.C. Kung, Dept. of Inf. Manage., ChaoYan Inst. of Technol., Taichung County, Taiwan
Pei Hsia, Dept. of Inf. Manage., ChaoYan Inst. of Technol., Taichung County, Taiwan pp. 271
Wei-Tek Tsai, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
R. Mojdehbakhsh, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
L. Elliott, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA pp. 32
R.V. Pichai, Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
J.E. Urban, Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA pp. 40
 | Panel I |
I-Ling Yen, Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA pp. 50
V.T. Thomas, Technol. Center, Honeywell Inc., Minneapolis, MN, USA pp. 55
 | Session II: Quality and High-Assurance |
R. Paul, Testing & Evaluation, Washington, DC, USA
M.F. Khan, Testing & Evaluation, Washington, DC, USA
S. Baqai, Testing & Evaluation, Washington, DC, USA
A. Ghafoor, Testing & Evaluation, Washington, DC, USA pp. 60
J. Voas, Reliable Software Technol., Sterling, VA, USA
F. Charron, Reliable Software Technol., Sterling, VA, USA
K. Miller, Reliable Software Technol., Sterling, VA, USA pp. 78
 | Session III: Concurrency and High-Assurance |
E.Y.T. Juan, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
J.J.P. Tsai, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
T. Murata, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA pp. 104
Jian Chen, Dept. of Comput. Sci., George Mason Univ., Fairfax, VA, USA
R. Carver, Dept. of Comput. Sci., George Mason Univ., Fairfax, VA, USA pp. 112
K.H. Kim, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
C. Subbaraman, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA pp. 120
The Department of Defense Science and Technology (S&T) Program
 | Session IV: High-Assurance Execution Environments |
N. Neves, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
W.K. Fuchs, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA pp. 134
S. Dawson, Real-Time Comput. Lab., Michigan Univ., Ann Arbor, MI, USA
F. Jahanian, Real-Time Comput. Lab., Michigan Univ., Ann Arbor, MI, USA
T. Mitton, Real-Time Comput. Lab., Michigan Univ., Ann Arbor, MI, USA pp. 142
D.B. Stewart, Dept. of Electr. Eng. & Inst. for Adv. Comput. Studies, Maryland Univ., College Park, MD, USA
P.K. Khosla, Dept. of Electr. Eng. & Inst. for Adv. Comput. Studies, Maryland Univ., College Park, MD, USA pp. 150
J.J.P. Tsai, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Bing Li, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
E.Y.T. Juan, Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA pp. 158
P. Cornwell, Distributed Objects Res. Group, Bournemouth Univ., UK
A. Wellings, Distributed Objects Res. Group, Bournemouth Univ., UK pp. 166
S. Subramanian, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
Wei-Tek Tsai, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
R. Mojdehbakhsh, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
L. Elliot, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA pp. 176
Sanghyun Ahn, Comput. Sci. Dept., Sejong Univ., Seoul, South Korea pp. 184
 | Speech |
 | Panel II |
 | Session V: Security, Reliability and High-Assurance |
M.H. Kang, Center for High Assurance Comput. Syst., Naval Res. Lab., Washington, DC, USA
J.N. Froscher, Center for High Assurance Comput. Syst., Naval Res. Lab., Washington, DC, USA
I.S. Moskowtiz, Center for High Assurance Comput. Syst., Naval Res. Lab., Washington, DC, USA pp. 198
T.F. Keefe, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
W.T. Tsai, Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA pp. 206
B. Cukic, Dept. of Comput. Sci., Houston Univ., TX, USA pp. 214
T. Nara, Quality Assurance & Inspection Dept., Hitachi Ltd., Kawasaki, Japan
M. Nakata, Quality Assurance & Inspection Dept., Hitachi Ltd., Kawasaki, Japan
A. Ooishi, Quality Assurance & Inspection Dept., Hitachi Ltd., Kawasaki, Japan pp. 222
J.C. Becker, Air Traffic Manage., Lockheed Martin Federal Syst. Inc., Atlantic City Int. Airport, NJ, USA
G. Flick, Air Traffic Manage., Lockheed Martin Federal Syst. Inc., Atlantic City Int. Airport, NJ, USA pp. 228
R. Yu, Dept. of Defense, USA pp. 237
 | Session VI: High-Assurance Potpourri |
E.B. Allen, Florida Atlantic Univ., Boca Raton, FL, USA
R. Halstead, Florida Atlantic Univ., Boca Raton, FL, USA
G.P. Trio, Florida Atlantic Univ., Boca Raton, FL, USA pp. 244
H. Engel, Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany pp. 279
M.P.E. Heimdahl, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA
B.J. Czerny, Dept. of Comput. Sci., Minnesota Univ., Minneapolis, MN, USA pp. 252
Q. Shi, Sch. of Comput. & Math., Liverpool John Moores Univ., UK
N. Zhang, Sch. of Comput. & Math., Liverpool John Moores Univ., UK pp. 263 Usage of this product signifies your acceptance of the Terms of Use.
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