ISBN: 0-7695-2078-2

Ron Goldman, Rice University, Houston, Texas

Hugues Hoppe, Microsoft Research

M. Rumpf, Universit?t Duisburg-Essen

Gregory M. Nielson, Arizona State University

Zhang Caiming, Shandong University, Jinan, China

Fuhua (Frank) Cheng, University of Kentucky, Lexington, KY

Joon-Kyung Seong, Seoul National University, Korea

Ku-Jin Kim, Ajou University, Korea

Myung-Soo Kim, Seoul National University, Korea

Gershon Elber, Technion, Israel Institute of Technology

Chenshi Dong, Zhejiang University, China

Guozhao Wang, Zhejiang University, China

Pifu Zhang, University of Kentucky, Lexington

Fuhua (Frank) Cheng, University of Kentucky, Lexington

Zhang Fan, Northwest University, Xi'an, P.R. China

Kang Baosheng, Northwest University, Xi'an, P.R. China

Ru Shaofeng, Northwest University, Xi'an, P.R. China

Zhou Mingquan, Northwest University, Xi'an, P.R. China

Renjiang Zhang, Zhejiang University, Hangzhou, P.R. China

Guojin Wang, Zhejiang University, Hangzhou, P.R. China

Weixiang Zhang, Fudan University

Zongmin Wu, Fudan University

Xiao-Shan Gao, AMSS, Academia Sinica, China

Ming Li, AMSS, Academia Sinica, China

Xunnian Yang, Zhejiang University, China

Chong-Jun Li, Dalian University of Technology, China

Ren-Hong Wang, Dalian University of Technology, China

Baojiang Zhong, Nanjing University of Aeronautics and Astronautics, Nanjing, China

Wenhe Liao, Nanjing University of Aeronautics and Astronautics, Nanjing, China

Martin Aigner, Johannes Kepler University Linz, Austria

Bert J?ttler, Johannes Kepler University Linz, Austria

Myung-Soo Kim, Seoul National University, Korea

Zhang Liyan, Nanjing University of Aeronautics and Astronautics, Nanjing, China

Liu Shenglan, Nanjing University of Aeronautics and Astronautics, Nanjing, China

Wu Xi, Nanjing University of Aeronautics and Astronautics, Nanjing, China

Zhou Laishui, Nanjing University of Aeronautics and Astronautics, Nanjing, China

Soji Yamakawa, Carnegie Mellon University, Pittsburgh, PA

Kenji Shimada, Carnegie Mellon University, Pittsburgh, PA

Karan Singh, University of Toronto

Hans K. Pedersen, Metris

Venkat Krishnamurthy, Metris

Hongbo Fu, Hong Kong University of Science and Technology, Hong Kong

Chiew-Lan Tai, Hong Kong University of Science and Technology, Hong Kong

Hongxin Zhang, Hong Kong University of Science and Technology, Hong Kong; Zhejiang University, Hangzhou, China

Guiqing Li, City University of Hong Kong, Kowloon, China; Zhejiang University, Hangzhou, China

Weiyin Ma, City University of Hong Kong, Kowloon, China

Hujun Bao, Zhejiang University, Hangzhou, China

Guoliang Xu, Chinese Academy of Sciences, Beijing, China

Qing Pan, Chinese Academy of Sciences, Beijing, China

Guoliang Xu, Chinese Academy of Sciences, Beijing, China

Octavian Soldea, Technion-Israel Institute of Technology

Gershon Elber, Technion-Israel Institute of Technology

Ehud Rivlin, Technion-Israel Institute of Technology

Shigeo Takahashi, The University of Tokyo, Japan

Gregory M. Nielson, Arizona State University, Tempe, USA

Yuriko Takeshima, Ochanimizu University, Tokyo, Japan

Issei Fujishiro, Ochanimizu University, Tokyo, Japan

Jiuxiang Hu, Arizona State University, Tempe

Anshuman Razdan, Arizona State University, Tempe

Gregory M. Nielson, Arizona State University, Tempe

Gerald E. Farin, Arizona State University, Tempe

P. A. C. Varley, The University of Tokyo, Japan

H. Suzuki, The University of Tokyo, Japan

R. R. Martin, Cardiff University, Wales, UK

In-Kwon Lee, Yonsei University, South Korea

Ku-Jin Kim, Ajou University, South Korea

Jitendra Dimri, Indian Institute of Science, Bangalore, India

B. Gurumoorthy, Indian Institute of Science, Bangalore, India

Ying He, State University of New York at Stony Brook

Hong Qin, State University of New York at Stony Brook

Yong-Jin Liu, Hong Kong University of Science and Technology

Kai Tang, Hong Kong University of Science and Technology

Matthew Ming-Fai Yuen, Hong Kong University of Science and Technology

Martin Peternell, Vienna University of Technology, Austria

Yongqing Li, GE Global Research Center, Shanghai, China

Xiaoping Huang, GE Global Research Center, Shanghai, China

Chunhe Gong, GE Global Research Center, Niskayuna, NY

Kelvin Wang, GE Global Research Center, Shanghai, China

Seung Ryol Maeng, Kongju Nat. Univ.

Nakhoon Baek, Kongju Nat. Univ.

Sung-Yong Shin, KAIST

Byoung Kyu Choi, KAIST

Li Cui, Jilin University, Changchun, China

Hua Li, Academia Sinica, Beijing, China

Yunshi Zhou, Jilin University, Changchun, China

Qingde Li, University of Hull, UK

John G. Griffiths, University of Hull, UK

Xue-Zhang Liang, Jilin University, Changchun

Xiang-Jiu Che, Jilin University, Changchun

Qiang Li, Jilin University, Changchun

Chenghua Xu, Chinese Academy of Sciences, Beijing, P. R. China

Long Quan, Hong Kong University of Science and Technology, Kowloon

Yunhong Wang, Chinese Academy of Sciences, Beijing, P. R. China

Tieniu Tan, Chinese Academy of Sciences, Beijing, P. R. China

Maxime Lhuillier, Hong Kong University of Science and Technology, Kowloon

Peng Wu, The University of Tokyo

Hiromasa Suzuki, The University of Tokyo

Joe Kuragano, The University of Tokyo

Kiwamu Kase, The Institute of Physical and Chemical Research

Yi-wu Zhao, Jilin University, Changchun

Li-wen Han, Hebei Normal University, China

Yun-shi Zhou, Jilin University, Changchun

Hayong Shin, KAIST

Joon C. Park, KAIST

Byoung K. Choi, KAIST

Yun C. Chung, KAIST

Siyoul Rhee, Samsung Heavy Industry Co. Ltd.

Qing Wang, Zhejiang University, Hangzhou, China

Wei Hua, Zhejiang University, Hangzhou, China

Guiqing Li, Zhejiang University, Hangzhou, China

Hujun Bao, Zhejiang University, Hangzhou, China

Franck Xia, University of Missouri-Rolla

Hao Zhang, Simon Fraser University, Canada

Hendrik C. Blok, Simon Fraser University, Canada

Aidi Li, Dalian Railway Institute, China