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27th International Symposium on Fault-Tolerant Computing (FTCS '97)
Seattle, WA
June 25-June 27
ISBN: 0-8186-7831-3
Table of Contents
Session 1A: Distributed Systems, Chair: D. Taylor, University of Waterloo
Edgar Nett, GMD - German National Research Center for Information Technology
Michael Mock, GMD - German National Research Center for Information Technology
Peter Theisohn, GMD - German National Research Center for Information Technology
pp. 2
Tsu-Wei Chen, Bell Laboratories, Lucent Technologies
Paul Krzyzanowski, Bell Laboratories, Lucent Technologies
Michael R. Lyu, Bell Laboratories, Lucent Technologies
Cormac Sreenan, Bell Laboratories, Lucent Technologies
John A. Trotter, Bell Laboratories, Lucent Technologies
pp. 21
Session 1B: Dependability Evaluation, Chair: C.S. Raghavendra, Washington State University
Volkmar Sieh, University of Erlangen-N?rnberg
Oliver Tschäche, University of Erlangen-N?rnberg
Frank Balbach, University of Erlangen-N?rnberg
pp. 32
Session 2A: Checkpointing and Recovery, Chair: N. Vaidya, Texas A&M University
Hyo-chang Nam, Pohang University of Science and Technology
Jong Kim, Pohang University of Science and Technology
SungJe Hong, Pohang University of Science and Technology
Sunggu Lee, Pohang University of Science and Technology
pp. 48
Session 2B: User Interfaces and Object-Oriented Testing, Chair: C. Walter, WW Technology Group
Session 3A: Work In Progress and Outrageous Opinions, Organizer: R.D. Schlichting, University of Arizona
Session 3B: Real-Time Systems, Chair: N. Suri, New Jersey Institute of Technology
P. Veríssimo, F.C.U.L. - University of Lisboa
J. Rufino, F.C.U.L. - University of Lisboa
L. Ming, F.C.U.L. - University of Lisboa
pp. 112
Seungjae Han, Real-Time Computing Laboratory The University of Michigan
Kang G. Shin, Real-Time Computing Laboratory The University of Michigan
pp. 122
Session 4A: Test Generation, Chair: N. Saxena, Silicon Graphics
Weiping Shi, University of North Texas
Douglas B. West, University of Illinois at Urbana-Champaign
pp. 162
Session 4B: Scheduling and Recovery, Chair: S.-Y. Kuo, National Taiwan University
Yoshio Masubuchi, Information and Communication Systems Laboratory, Toshiba Corporation
Satoshi Hoshina, Information and Communication Systems Laboratory, Toshiba Corporation
Tomofumi Shimada, Information and Communication Systems Laboratory, Toshiba Corporation
Hideaki Hirayama, Information and Communication Systems Laboratory, Toshiba Corporation
Nobuhiro Kato, Information and Communication Systems Laboratory, Toshiba Corporation
pp. 184
Session 5A: Exploiting Redundancy, Chair: E. Fujiwara, Tokyo Institute of Technology
Fred J. Meyer, Texas A&M University and Fudan University
Xiao-Tao Chen, Texas A&M University and Fudan University
Wei Kang Huang, Texas A&M University and Fudan University
Fabrizio Lombardi, Texas A&M University and Fudan University
pp. 216
Session 5B: Fault Injection, Chair: L. Simoncini, CNR
A. Steininger, Dept. of Meas. Technol., Wien Univ. of Technol., Austria
C. Scherrer, Dept. of Meas. Technol., Wien Univ. of Technol., Austria
pp. 238
D.T. Stott, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
M.-C. Hsueh, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
G.L. Ries, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
R.K. Iyer, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
pp. 248
Session 6: Tool Demonstrations
Session 7A: Robust Algorithms, Chair: F. Jahanian, University of Michigan
Session 7B: Experience with Distributed Systems, Chair: N. Kanekawa, Hitachi
Yi-Min Wang, (AT&T Labs)
P. Y. Chung, (Bell Labs, Lucent Technologies)
Y. Huang, (Bell Labs, Lucent Technologies)
E. N. Elnozahy, (Carnegie Mellon University)
pp. 304
Session 8A: Design for Testing and Reliability, Chair: G. Choi, Texas A&M University
Gurjeet S. Saund, Center for Reliable and High-Performance Computing
Michael S. Hsiao, Center for Reliable and High-Performance Computing
Janak H. Patel, Center for Reliable and High-Performance Computing
pp. 320
S.N. Hamilton, Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
A. Orailoglu, Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
pp. 329
Bharat P. Dave, Department of Electrical Engineering Princeton University, Princeton, NJ 08544
Niraj K. Jha, Department of Electrical Engineering Princeton University, Princeton, NJ 08544
pp. 339
Session 8B: Panel
Year 2000 Challenge
Session 9: Tool Demonstrations
Model- and Experiment- Based Evaluation, Part 2
Session 10A: Modeling and Prediction, Chair: J.-C. Laprie, LAAS-CNRS
Session 10B: Experience with Large-Scale Systems, Chair: N. Bowen, IBM
A.M. Amendola, Ansald-Cris, Napoli, Italy
L. Impagliazzo, Ansald-Cris, Napoli, Italy
P. Marmo, Ansald-Cris, Napoli, Italy
F. Poli, Ansald-Cris, Napoli, Italy
pp. 380
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