- F
- FTCS
- 1996
- The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
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The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96) Sendai, Japan June 25-June 27 ISBN: 0-8186-7261-7 Table of Contents
 | Panel 1 |
 | Session Al - Distributed Systems, Chair: Hermann Kopetz, Austria |
J. Rushby, Comput. Sci. Lab., SRI Int., Menlo Park, CA, USA pp. 6
D.K. Pradhan, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
P. Krishna, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
N.H. Vaidya, Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA pp. 16
Y. Amir, Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA
A. Wool, Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA pp. 26
 | Session B1 - Testing, Chair: Hirokazu Ihara, Japan |
N. Itazaki, Dept. of Appl. Phys., Osaka Univ., Japan
Y. Idomoto, Dept. of Appl. Phys., Osaka Univ., Japan pp. 38
L. Nachman, Dept. of Electr. & Comput. Eng., Wisconsin Univ., WI, USA
K.K. Saluja, Dept. of Electr. & Comput. Eng., Wisconsin Univ., WI, USA
S. Upadyaya, Dept. of Electr. & Comput. Eng., Wisconsin Univ., WI, USA
R. Reuse, Dept. of Electr. & Comput. Eng., Wisconsin Univ., WI, USA pp. 44
I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA pp. 53
 | Session A2 - File Systems, Chair: Ambuj Goyal, USA |
 | Session B2 - Diagnosis, Chair: Arun Somani, USA |
N. Yanagida, Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan
H. Takahashi, Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan
Y. Takamatsu, Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan pp. 86
V. Boppana, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
I. Hartanto, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
W.K. Fuchs, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA pp. 96
 | Session A3 - Evaluation, Chair: Shunji Osaki, Japan |
M.A. Qureshi, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
W.H. Sanders, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA pp. 116
 | Session B3 - On-Line Checking, Chair: Yoshihiro Tohma, Japan |
G. Noubir, Dept. of Comput. Sci., Swiss Federal Inst. of Technol., Lausanne, Switzerland
B.Y. Choueiry, Dept. of Comput. Sci., Swiss Federal Inst. of Technol., Lausanne, Switzerland pp. 128
C. Rabejac, Lab. for Dependability Eng., CNRS, Toulouse, France
J.-P. Queille, Lab. for Dependability Eng., CNRS, Toulouse, France pp. 138
 | Panel 2 |
 | Session A4 - Group Communication, Chair: Rick Schlichting, USA |
R. Guerraoui, Dept. d'Inf., Ecole Polytech. Federale de Lausanne, Switzerland
A. Schiper, Dept. d'Inf., Ecole Polytech. Federale de Lausanne, Switzerland pp. 168
F. Cristian, Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA pp. 178
 | Session 64 - Coding, Chair: Jacob A. Abraham |
T. Ritthongpitak, Graduate Sch. of Inf. Sci. & Eng., Tokyo Inst. of Technol., Japan
M. Kitakami, Graduate Sch. of Inf. Sci. & Eng., Tokyo Inst. of Technol., Japan
E. Fujiwara, Graduate Sch. of Inf. Sci. & Eng., Tokyo Inst. of Technol., Japan pp. 190
C.L. Chen, Data Syst. Div., IBM Corp., Poughkeepsie, NY, USA pp. 200
V. Akella, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
N.H. Vaidya, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
G.R. Redinbo, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA pp. 208
 | Session A5 - Verification and Testing, Chair: Tohru Kikuno, Japan |
Zhiming Liu, Dept. of Math. & Comput. Sci., Leicester Univ., UK
M. Joseph, Dept. of Math. & Comput. Sci., Leicester Univ., UK pp. 220
Q.M. Tan, Dept. d'Inf. et de Recherche Oper., Montreal Univ., Que., Canada
A. Petrenko, Dept. d'Inf. et de Recherche Oper., Montreal Univ., Que., Canada
G. von Bochmann, Dept. d'Inf. et de Recherche Oper., Montreal Univ., Que., Canada pp. 230
 | Session B5 - Design, Chair: Algirdas Avizienis, USA |
R.A. Maxion, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
P.A. Syme, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA pp. 240
J.H. Slye, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
E.N. Elnozahy, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA pp. 250
 | Session A6 - Networks, Chair: Douglas M. Blough, USA |
Feng Bao, Dept. of Comput. Sci., Gunma Univ., Japan pp. 262
N.R. Mahapatra, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
S. Dutt, Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA pp. 272
M.M. Bae, Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
B. Bose, Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA pp. 282
 | Session B6 - Experiment and Analysis, Chair: John F. Meyer, USA |
M.F. Buckley, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
D.P. Siewiorek, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA pp. 294
J. Christmansson, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden
R. Chillarege, Dept. of Comput. Eng., Chalmers Univ. of Technol., Goteborg, Sweden pp. 304
T.K. Tsai, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
R.K. Iyer, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
D. Jewitt, Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA pp. 314
 | Session A7 - Self-Checking, Chair: Takashi Nanya, Japan |
N.k. Jha, Dept. of Electr. Eng., Princeton Univ., NJ, USA pp. 336
 | Session 67 - Practical Experience Reports I, Chair: Jean-Claude Laprie, France |
I. Lee, Syst. Dev. Group, Tandem Comput. Inc., Cupertino, CA, USA
G. Pitt, Syst. Dev. Group, Tandem Comput. Inc., Cupertino, CA, USA
R.K. Iyer, Syst. Dev. Group, Tandem Comput. Inc., Cupertino, CA, USA pp. 348
S. Ayache, Matra Marconi Space, Toulouse, France pp. 353
 | Session A8 - Parallelization, Chair: Fumiyasu Hirose, Japan |
P. Banerjee, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA pp. 360
Tzi-Cker Chiueh, Dept. of Comput. Sci., State Univ. of New York, Stony Brook, NY, USA
Peitao Deng, Dept. of Comput. Sci., State Univ. of New York, Stony Brook, NY, USA pp. 370
 | Session B8 - Practical Experience Reports II, Chair: Basil Smith, USA |
 | Session A9 - Fault Injection, Chair: Jan Toxin, Sweden |
M.Z. Rela, Dept. of Eng. Inf., Coimbra Univ., Portugal
H. Madeira, Dept. of Eng. Inf., Coimbra Univ., Portugal
J.G. Silva, Dept. of Eng. Inf., Coimbra Univ., Portugal pp. 394
S. Dawson, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
F. Jahanian, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
T. Mitton, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Teck-Lee Tung, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA pp. 404
J.G. Silva, Dept. of Eng. Inf., Coimbra Univ., Portugal
J. Carreira, Dept. of Eng. Inf., Coimbra Univ., Portugal
H. Madeira, Dept. of Eng. Inf., Coimbra Univ., Portugal
D. Costa, Dept. of Eng. Inf., Coimbra Univ., Portugal
P. Moreira, Dept. of Eng. Inf., Coimbra Univ., Portugal pp. 415
 | Session B9 - Practical Experience Reports III, Chair: Alain Costes, France |
M. Nohmi, Res. Lab., Hitachi Ltd., Japan
Y. Satoh, Res. Lab., Hitachi Ltd., Japan
H. Satoh, Res. Lab., Hitachi Ltd., Japan pp. 426
K. Kawamura, Dept. of Comput. Sci., Nat. Defense Acad., Yokosuka, Japan
T. Matsubara, Dept. of Comput. Sci., Nat. Defense Acad., Yokosuka, Japan
Y. Koga, Dept. of Comput. Sci., Nat. Defense Acad., Yokosuka, Japan pp. 431 Usage of this product signifies your acceptance of the Terms of Use.
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