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International Conference on Field Programmable Logic and Applications, 2005.
August 24-August 26
ISBN: 0-7803-9362-7
Table of Contents
Papers
R. Dimond, Dept. of Comput., Imperial Coll., London, UK
O. Mencer, Dept. of Comput., Imperial Coll., London, UK
W. Luk, Dept. of Comput., Imperial Coll., London, UK
pp. 1-6
M. Lanuzza, Dept. of Electron., Comput. Sci.&Syst., Calabria Univ., Italy
S. Perri, Dept. of Electron., Comput. Sci.&Syst., Calabria Univ., Italy
pp. 13-18
V. Manohararajah, Altera Toronto Technol. Center, Canada
D.P. Singh, Altera Toronto Technol. Center, Canada
S.D. Brown, Altera Toronto Technol. Center, Canada
pp. 31-38
Y. Sugawara, Dept. of Comput. Sci., Tokyo Univ., Japan
M. Inaba, Dept. of Comput. Sci., Tokyo Univ., Japan
K. Hiraki, Dept. of Comput. Sci., Tokyo Univ., Japan
pp. 45-50
null Chi-Wei Wang, Dept. of Electr.&Comput. Eng., Illinois Univ., Urbana, IL, USA
N.R. Carter, Dept. of Electr.&Comput. Eng., Illinois Univ., Urbana, IL, USA
R.B. Kujoth, Dept. of Electr.&Comput. Eng., Illinois Univ., Urbana, IL, USA
J.J. Cook, Dept. of Electr.&Comput. Eng., Illinois Univ., Urbana, IL, USA
D.B. Gottlieb, Dept. of Electr.&Comput. Eng., Illinois Univ., Urbana, IL, USA
pp. 57-64
H. Tsukiashi, Fac. of Eng., Kumamoto Univ., Japan
M. Iida, Fac. of Eng., Kumamoto Univ., Japan
T. Sueyoshi, Fac. of Eng., Kumamoto Univ., Japan
pp. 65-70
M. Healy, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., USA
null Mongkol Ekpanyapong, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., USA
null Sung Kyu Lim, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., USA
pp. 71-76
G.W. Morris, Dept. of Electron. & Electr. Eng., Imperial Coll., London, UK
G.A. Constantimdes, Dept. of Electron.&Electr. Eng., Imperial Coll., London, UK
P.Y.K. Cheung, Dept. of Electron.&Electr. Eng., Imperial Coll., London, UK
pp. 77-82
K. Kanazawa, Syst.&Inf. Eng., Tsukuba Univ., Ibaraki, Japan
T. Maruyama, Syst. & Inf. Eng., Tsukuba Univ., Ibaraki, Japan
pp. 83-88
P.O. Domingos, Dept. of Electr.&Comput. Eng., IST/INESC-ID, Portugal
F.M. Silva, Dept. of Electr.&Comput. Eng., IST/INESC-ID, Portugal
H.C. Neto, Dept. of Electr.&Comput. Eng., IST/INESC-ID, Portugal
pp. 89-94
M. Holland, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
S. Hauck, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
pp. 95-100
C. You, ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA
null Jong-Ru Guo, ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA
M. Chu, ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA
null Kuan Zhou, ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA
R.P. Kraft, ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA
J.F. McDonald, ECSE Dept., Rensselaer Polytech. Inst., Troy, NY, USA
pp. 101-105
null Francisco-Javier Veredas, Adv. Syst.&Circuits, Infineon Technol. AG, Munich, Germany
M. Scheppler, Adv. Syst.&Circuits, Infineon Technol. AG, Munich, Germany
pp. 106-111
null Nalin Sidahao, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
G.A. Constantinides, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
P.Y.K. Cheung, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
pp. 112-117
C.T. Ewe, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
P.V.K. Cheung, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
G.A. Constantinides, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
pp. 124-129
M. Gorgon, Dept. of Automatics, AGH Univ. of Sci.&Technol., Krakow, Poland
S. Cichon, Dept. of Automatics, AGH Univ. of Sci.&Technol., Krakow, Poland
M. Pac, Dept. of Automatics, AGH Univ. of Sci.&Technol., Krakow, Poland
pp. 130-135
N. Lawal, Dept. of Inf. Technol.&Media, Mid Sweden Univ., Sundsvall, Sweden
B. Thornberg, Dept. of Inf. Technol.&Media, Mid Sweden Univ., Sundsvall, Sweden
M. O'Nils, Dept. of Inf. Technol.&Media, Mid Sweden Univ., Sundsvall, Sweden
pp. 136-141
S.A. Fahmy, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
P.Y.K. Cheung, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
W. Luk, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
pp. 142-147
J. Esquiagola, Microelectron. Lab., Polythecnic Sch. of Sao Paulo Univ., Brazil
G. Ozari, Microelectron. Lab., Polythecnic Sch. of Sao Paulo Univ., Brazil
M. Teruya, Microelectron. Lab., Polythecnic Sch. of Sao Paulo Univ., Brazil
M. Strum, Microelectron. Lab., Polythecnic Sch. of Sao Paulo Univ., Brazil
W. Chau, Microelectron. Lab., Polythecnic Sch. of Sao Paulo Univ., Brazil
pp. 148-152
C. Bobda, Dept. of Comput. Sci., Univ. of Erlangen-Nuremberg, Germany
A. Ahmadinia, Dept. of Comput. Sci., Univ. of Erlangen-Nuremberg, Germany
M. Majer, Dept. of Comput. Sci., Univ. of Erlangen-Nuremberg, Germany
J. Teich, Dept. of Comput. Sci., Univ. of Erlangen-Nuremberg, Germany
pp. 153-158
A. Ye, Dept. of Electr.&Comput. Eng., Toronto Univ., Ont., Canada
J. Rose, Dept. of Electr.&Comput. Eng., Toronto Univ., Ont., Canada
pp. 159-166
S. Balachandran, Dept. of Electr. Eng., Texas Univ., Dallas, TX, USA
D. Bhatia, Dept. of Electr. Eng., Texas Univ., Dallas, TX, USA
pp. 167-172
S. Masuno, Syst.&Inf. Eng., Tsukuba Univ., Ibaraki, Japan
T. Maruyama, Syst.&Inf. Eng., Tsukuba Univ., Ibaraki, Japan
Y. Yamaguchi, Syst.&Inf. Eng., Tsukuba Univ., Ibaraki, Japan
pp. 173-178
H. Niitsuma, Syst.&Inf. Eng., Tsukuba Univ., Ibaraki, Japan
T. Maruyama, Syst.&Inf. Eng., Tsukuba Univ., Ibaraki, Japan
pp. 179-184
T. Oppold, WSL/TI, Univ. Tubingen, Germany
T. Schweizer, WSL/TI, Univ. Tubingen, Germany
T. Kuhn, WSL/TI, Univ. Tubingen, Germany
W. Rosenstiel, WSL/TI, Univ. Tubingen, Germany
pp. 185-190
C. Hilton, Electron. Technol. Div., Rincon Res. Corp., Tucson, AZ, USA
pp. 191-196
P. Wolkotte, Dept. of EEMCS, Twente Univ., Enschede, Netherlands
G. Smit, Dept. of EEMCS, Twente Univ., Enschede, Netherlands
pp. 197-202
K. Kariniemi, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
J. Nurmi, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
pp. 203-210
N. Kasprzyk, Dept. for Integrated Circuit Design, Tech. Univ. Braunschweig, Germany
pp. 217-222
H. Kalte, Sch. of Comput. Sci.&Software Eng., Univ. of Western Australia, Crawley, WA, Australia
pp. 223-228
D. Suvakovic, Bell Labs, Lucent Technol., Murray Hill, NJ, USA
I. Hadzie, Bell Labs, Lucent Technol., Murray Hill, NJ, USA
pp. 229-234
V. Skylarov, Electron.&Telecommun. Dept., Aveiro Univ., Portugal
I. Skilarova, Electron.&Telecommun. Dept., Aveiro Univ., Portugal
B. Pimentel, Electron.&Telecommun. Dept., Aveiro Univ., Portugal
pp. 235-240
M. Bautista-Palacios, R&D Technol. Lab, Digital ASICs Hewlett Packard Co., Barcelona, Spain
L. Baldez, R&D Technol. Lab, Digital ASICs Hewlett Packard Co., Barcelona, Spain
J. Sempere-Agullo, R&D Technol. Lab, Digital ASICs Hewlett Packard Co., Barcelona, Spain
F. Cardells-Tormo, R&D Technol. Lab, Digital ASICs Hewlett Packard Co., Barcelona, Spain
P.L. Molinet, R&D Technol. Lab, Digital ASICs Hewlett Packard Co., Barcelona, Spain
pp. 241-246
Z. Hyder, Dept. of Electr. Eng.&Comput. Sci., California Univ., Berkeley, CA, USA
J. Wawrzynek, Dept. of Electr. Eng.&Comput. Sci., California Univ., Berkeley, CA, USA
pp. 247-254
A.J. Yu, Dept. of Electr.&Comput. Eng., British Columbia Univ., Canada
G.G.F. Lemieux, Dept. of Electr.&Comput. Eng., British Columbia Univ., Canada
pp. 255-262
C.-S. Bouganis, Dept. of Electr.&Electron. Eng., London Imperial Coll., UK
P.Y.K. Cheung, Dept. of Electr.&Electron. Eng., London Imperial Coll., UK
G.A. Constantinides, Dept. of Electr.&Electron. Eng., London Imperial Coll., UK
pp. 263-268
null Guanglie Zhang, Dept. of Comput. Sci.&Eng., Hong Kong Chinese Univ., Shatin, China
P.H.W. Leong, Dept. of Comput. Sci.&Eng., Hong Kong Chinese Univ., Shatin, China
pp. 275-280
null Wen Hai Fang, Dept. of Inf. Technol., Lund Univ., Switzerland
T. Johansson, Dept. of Inf. Technol., Lund Univ., Switzerland
L. Spaanenburg, Dept. of Inf. Technol., Lund Univ., Switzerland
pp. 281-286
J. Quartana, TIMA Lab., Grenoble, France
S. Renane, TIMA Lab., Grenoble, France
A. Baixas, TIMA Lab., Grenoble, France
L. Fesquet, TIMA Lab., Grenoble, France
M. Renaudin, TIMA Lab., Grenoble, France
pp. 299-304
P. Jamieson, Edward S. Rogers Sr. Dept. of Electr.&Comput. Eng., Toronto Univ., Ont., Canada
J. Rose, Edward S. Rogers Sr. Dept. of Electr.&Comput. Eng., Toronto Univ., Ont., Canada
pp. 305-310
H. Styles, Dept. of Comput., Imperial Coll., London, UK
W. Luk, Dept. of Comput., Imperial Coll., London, UK
pp. 311-316
J.L. Tripp, Los Alamos Nat. Lab., NM, USA
K.D. Peterson, Los Alamos Nat. Lab., NM, USA
C. Ahrens, Los Alamos Nat. Lab., NM, USA
J.D. Poznanovic, Los Alamos Nat. Lab., NM, USA
M.B. Gokhale, Los Alamos Nat. Lab., NM, USA
pp. 317-322
P. Zipf, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
O. Soffke, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
A. Schumacher, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
pp. 329-334
P. Zipf, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
O. Soffke, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
A. Schumacher, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
C. Schlachta, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
pp. 335-340
A.M. Smith, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
G.A. Constantinides, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
P.K.K. Cheung, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
pp. 341-346
H. Amano, Dept. of Inf.&Comput. Scinece, Keio Univ., Tokyo, Japan
S. Abe, Dept. of Inf.&Comput. Scinece, Keio Univ., Tokyo, Japan
K. Deguchi, Dept. of Inf.&Comput. Scinece, Keio Univ., Tokyo, Japan
Y. Hasegawa, Dept. of Inf.&Comput. Scinece, Keio Univ., Tokyo, Japan
pp. 347-352
M. Saito, Adv. Mobile Phones Div., Fujitsu Ltd., Kawasaki, Japan
H. Fujisawa, Adv. Mobile Phones Div., Fujitsu Ltd., Kawasaki, Japan
pp. 353-359
C. Zissulescu, Leiden Univ., Netherlands
B. Kienhuis, Leiden Univ., Netherlands
E. Deprettere, Leiden Univ., Netherlands
pp. 360-365
T. Hamada, Computational Astrophys. Lab., Inst. of Phys.&Chem. Res., Saitama, Japan
N. Nakasato, Computational Astrophys. Lab., Inst. of Phys.&Chem. Res., Saitama, Japan
pp. 366-373
null Sujan Pandey, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
M. Glesner, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany
pp. 374-379
O. Lehtoranta, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
E. Salminen, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
A. Kulmala, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
M. Hannikainen, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
T.D. Hamalainen, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
pp. 380-385
M. Janiaut, Lab. d'Instrum. Electronique de Nancy, Vandoeuvre-les-Nancy, France
C. Tanougast, Lab. d'Instrum. Electronique de Nancy, Vandoeuvre-les-Nancy, France
null Hassan Rabah, Lab. d'Instrum. Electronique de Nancy, Vandoeuvre-les-Nancy, France
Y. Berviller, Lab. d'Instrum. Electronique de Nancy, Vandoeuvre-les-Nancy, France
C. Mannino, Lab. d'Instrum. Electronique de Nancy, Vandoeuvre-les-Nancy, France
S. Weber, Lab. d'Instrum. Electronique de Nancy, Vandoeuvre-les-Nancy, France
pp. 386-390
C. Lopez-Ongil, Departamento de Tecnologia Electronica, Univ. Carlos III de Madrid, Spain
M. Garcia-Valderas, Departamento de Tecnologia Electronica, Univ. Carlos III de Madrid, Spain
M. Portela-Garcia, Departamento de Tecnologia Electronica, Univ. Carlos III de Madrid, Spain
L. Entrena-Arrontes, Departamento de Tecnologia Electronica, Univ. Carlos III de Madrid, Spain
pp. 397-402
O. Heron, Inst. fur Technische Informatik, Univ. Stuttgart, Germany
T. Arnaout, Inst. fur Technische Informatik, Univ. Stuttgart, Germany
H.-J. Wunderlich, Inst. fur Technische Informatik, Univ. Stuttgart, Germany
pp. 403-408
N. Campregher, Dept. of EEE, Imperial Coll. London, UK
P.Y.K. Cheung, Dept. of EEE, Imperial Coll. London, UK
G.A. Constantinides, Dept. of EEE, Imperial Coll. London, UK
pp. 409-414
P. Banerjee, Adv. Comput.&Microelectron. Unit, Indian Stat. Inst., Kolkata, India
S. Bhattacharjee, Adv. Comput.&Microelectron. Unit, Indian Stat. Inst., Kolkata, India
S. Sur-Kolay, Adv. Comput.&Microelectron. Unit, Indian Stat. Inst., Kolkata, India
S. Das, Adv. Comput.&Microelectron. Unit, Indian Stat. Inst., Kolkata, India
S.C. Nandy, Adv. Comput.&Microelectron. Unit, Indian Stat. Inst., Kolkata, India
pp. 415-420
I.F. Baskaya, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
S. Reddy, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
null Sung Kyu Lim, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
D. Anderson, Sch. of Electr.&Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 421-426
A. Sharma, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
S. Hauck, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
pp. 427-432
V. Carlier, Defense Securite, SAGEM, Paris, France
H. Chabanne, Defense Securite, SAGEM, Paris, France
E. Dottax, Defense Securite, SAGEM, Paris, France
H. Pelletier, Defense Securite, SAGEM, Paris, France
pp. 433-437
D. Nguyen, Dept. of Electr.&Comput. Eng., Northwestern Univ., Evanston, IL, USA
G. Memik, Dept. of Electr.&Comput. Eng., Northwestern Univ., Evanston, IL, USA
S.O. Memik, Dept. of Electr.&Comput. Eng., Northwestern Univ., Evanston, IL, USA
A. Choudhary, Dept. of Electr.&Comput. Eng., Northwestern Univ., Evanston, IL, USA
pp. 438-443
S. Yusuf, Dept. of Comput., Imperial Coll. London, UK
W. Luk, Dept. of Comput., Imperial Coll. London, UK
pp. 444-449
S. Chandrasekaran, Sch. of Comput. Sci., Queen's Univ., Belfast, UK
A. Amira, Sch. of Comput. Sci., Queen's Univ., Belfast, UK
pp. 450-455
S.G. Wong, Div. of Electron. Warfare&Radar, Defence Sci.&Technol. Organ., Edinburgh, SA, Australia
pp. 456-462
J. Diaz, Dept. of Comput. Archit.&Technol., Granada Univ., Spain
E. Ros, Dept. of Comput. Archit.&Technol., Granada Univ., Spain
S. Mota, Dept. of Comput. Archit.&Technol., Granada Univ., Spain
E.M. Ortigosa, Dept. of Comput. Archit.&Technol., Granada Univ., Spain
B. del Pino, Dept. of Comput. Archit.&Technol., Granada Univ., Spain
pp. 463-468
null Qiang Qiang, Dept. of Elec. Engr.&Comp. Sci., Case Western Reserve Univ., Cleveland, OH, USA
D.G. Saab, Dept. of Elec. Engr.&Comp. Sci., Case Western Reserve Univ., Cleveland, OH, USA
pp. 469-474
null Yongfeng Gu, Dept. of Electr.&Comput. Eng., Boston Univ., MA, USA
T. VanCourt, Dept. of Electr.&Comput. Eng., Boston Univ., MA, USA
M.C. Herbordt, Dept. of Electr.&Comput. Eng., Boston Univ., MA, USA
pp. 475-480
V. Goncalves, INESC-ID, Tech. Univ. of Lisbon, Lisboa, Portugal
J.T. de Sousa, INESC-ID, Tech. Univ. of Lisbon, Lisboa, Portugal
F. Goncalves, INESC-ID, Tech. Univ. of Lisbon, Lisboa, Portugal
pp. 481-486
K. Ravindran, California Univ., Berkeley, CA, USA
N. Satish, California Univ., Berkeley, CA, USA
null Yujia Jin, California Univ., Berkeley, CA, USA
K. Keutzer, California Univ., Berkeley, CA, USA
pp. 487-492
null Haoyu Song, Dept. of Comput. Sci.&Eng., Washington Univ. in St. Louis, MO, USA
T. Sproull, Dept. of Comput. Sci.&Eng., Washington Univ. in St. Louis, MO, USA
M. Attig, Dept. of Comput. Sci.&Eng., Washington Univ. in St. Louis, MO, USA
J. Lockwood, Dept. of Comput. Sci.&Eng., Washington Univ. in St. Louis, MO, USA
pp. 493-498
C.M. Kastner, Appl. Res. Lab., Washington Univ. in St. Louis, MO, USA
G.A. Covington, Appl. Res. Lab., Washington Univ. in St. Louis, MO, USA
A.A. Levine, Appl. Res. Lab., Washington Univ. in St. Louis, MO, USA
J.W. Lockwood, Appl. Res. Lab., Washington Univ. in St. Louis, MO, USA
pp. 499-504
R. Siripokarpirom, Dept. of Distributed Syst., Tech. Univ. Hamburg-Harburg, Hamburg, Germany
pp. 505-508
S. Yalcin, Fac. of Eng.&Natural Sci., Sabanci Univ., Istanbul, Turkey
H.F. Ates, Fac. of Eng.&Natural Sci., Sabanci Univ., Istanbul, Turkey
I. Hamzaoglu, Fac. of Eng.&Natural Sci., Sabanci Univ., Istanbul, Turkey
pp. 509-514
E. Todorovich, Sch. of Eng., Univ. Autonoma de Madrid, Spain
E. Boemo, Sch. of Eng., Univ. Autonoma de Madrid, Spain
pp. 515-518
G. Achery, Lehrstuhl fur Rechnertechnik und Rechnerorganisation Technische Univ. Munchen, Germany
C. Trinitis, Lehrstuhl fur Rechnertechnik und Rechnerorganisation Technische Univ. Munchen, Germany
pp. 519-522
C. Leong, ProsysLab/INESC-ID, Lisbon, Portugal
P. Bento, ProsysLab/INESC-ID, Lisbon, Portugal
J.P. Teixeira, ProsysLab/INESC-ID, Lisbon, Portugal
I.C. Teixeira, ProsysLab/INESC-ID, Lisbon, Portugal
pp. 523-526
R. Hecht, Inst. of Appl. Microelectron.&Comput. Eng., Rostock Univ., Rostock-Warnemuende, Germany
S. Kubisch, Inst. of Appl. Microelectron.&Comput. Eng., Rostock Univ., Rostock-Warnemuende, Germany
A. Herrholtz, Inst. of Appl. Microelectron.&Comput. Eng., Rostock Univ., Rostock-Warnemuende, Germany
D. Timmermann, Inst. of Appl. Microelectron.&Comput. Eng., Rostock Univ., Rostock-Warnemuende, Germany
pp. 527-530
A. Garcia, Dept. Electron.&Comput. Technol., Granada Univ., Spain
E. Castillo, Dept. Electron.&Comput. Technol., Granada Univ., Spain
A. Lloris, Dept. Electron.&Comput. Technol., Granada Univ., Spain
pp. 531-534
F. Angarita, Dept. de Ingenieria Electronica, Univ. Politecnica de Valencia, Spain
A. Perez-Pascual, Dept. de Ingenieria Electronica, Univ. Politecnica de Valencia, Spain
T. Sansaloni, Dept. de Ingenieria Electronica, Univ. Politecnica de Valencia, Spain
J. Vails, Dept. de Ingenieria Electronica, Univ. Politecnica de Valencia, Spain
pp. 535-538
D. Narh Amanor, Horst Gortz Inst. for IT Security, Ruhr Univ. Bochum, Germany
C. Paar, Horst Gortz Inst. for IT Security, Ruhr Univ. Bochum, Germany
J. Pelzl, Horst Gortz Inst. for IT Security, Ruhr Univ. Bochum, Germany
pp. 539-542
J. Khan, Dept. of ECECS, Cincinnati Univ., OH, USA
R. Vemuri, Dept. of ECECS, Cincinnati Univ., OH, USA
pp. 543-546
J. Javier Martinez, Dpto. Electron., Tecnologfa de Comput. y Proyectos, Univ. Politecnica de Cartagena, Spain
E. Javier Toledo, Dpto. Electron., Tecnologfa de Comput. y Proyectos, Univ. Politecnica de Cartagena, Spain
E. Javier Garrigos, Dpto. Electron., Tecnologfa de Comput. y Proyectos, Univ. Politecnica de Cartagena, Spain
J. Manuel Ferrdndez, Dpto. Electron., Tecnologfa de Comput. y Proyectos, Univ. Politecnica de Cartagena, Spain
pp. 547-550
A. Schiefer, Dept. of Comput. Sci., Leipzig Univ., Germany
U. Kebschull, Dept. of Comput. Sci., Leipzig Univ., Germany
pp. 551-554
null Yonghong Xu, Dept. of Electr.&Comput. Eng., Windsor Univ., Ont., Canada
M.A.S. Khalid, Dept. of Electr.&Comput. Eng., Windsor Univ., Ont., Canada
pp. 555-558
J. Alvarez, Dpto. Tecnologia Electronica, Vigo Univ., Spain
J. Marcos, Dpto. Tecnologia Electronica, Vigo Univ., Spain
pp. 559-562
K. Danne, Dept. of Comput. Sci., Paderborn Univ., Germany
M. Platzner, Dept. of Comput. Sci., Paderborn Univ., Germany
pp. 568-573
Y. Osana, Keio Univ., Yokohama, Japan
T. Fukushima, Keio Univ., Yokohama, Japan
M. Yoshimi, Keio Univ., Yokohama, Japan
Y. Iwaoka, Keio Univ., Yokohama, Japan
H. Amano, Keio Univ., Yokohama, Japan
pp. 574-577
F. Cardells-Tormo, InkJet Commercial Div., Hewlett-Packard, Barcelona, Spain
P.-L. Molinet, InkJet Commercial Div., Hewlett-Packard, Barcelona, Spain
J. Sempere-Agullo, InkJet Commercial Div., Hewlett-Packard, Barcelona, Spain
L. Baldez, InkJet Commercial Div., Hewlett-Packard, Barcelona, Spain
M. Bautista-Palacios, InkJet Commercial Div., Hewlett-Packard, Barcelona, Spain
pp. 578-581
M.J. Pearson, IAS Lab., Univ. of the West of England, Bristol, UK
C. Melhuish, IAS Lab., Univ. of the West of England, Bristol, UK
A.G. Pipe, IAS Lab., Univ. of the West of England, Bristol, UK
M. Nibouche, IAS Lab., Univ. of the West of England, Bristol, UK
L. Gilhesphy, IAS Lab., Univ. of the West of England, Bristol, UK
K. Gurney, IAS Lab., Univ. of the West of England, Bristol, UK
B. Mitchinson, IAS Lab., Univ. of the West of England, Bristol, UK
pp. 582-585
M. Keller, Dept. of Electr.&Electron. Eng., Univ. Coll. Cork, Ireland
T. Kerins, Dept. of Electr.&Electron. Eng., Univ. Coll. Cork, Ireland
W. Marnane, Dept. of Electr.&Electron. Eng., Univ. Coll. Cork, Ireland
pp. 594-597
X. Reves, Dept. of Signal Theor.&Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
V. Marojevic, Dept. of Signal Theor.&Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
R. Ferrus, Dept. of Signal Theor.&Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
A. Gelonch, Dept. of Signal Theor.&Commun., Univ. Politecnica de Catalunya, Barcelona, Spain
pp. 598-601
T. Ahonen, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
J. Nurmi, Inst. of Digital&Comput. Syst., Tampere Univ. of Technol., Finland
pp. 606-611
T. Van Court, Dept. of Electr.&Comput. Eng., Boston Univ., MA, USA
M.C. Herbordt, Dept. of Electr.&Comput. Eng., Boston Univ., MA, USA
pp. 612-617
S. Baloch, Inst. for Syst. Level Integration, Alba Centre, Livingston, UK
I. Ahmed, Inst. for Syst. Level Integration, Alba Centre, Livingston, UK
T. Arslan, Inst. for Syst. Level Integration, Alba Centre, Livingston, UK
pp. 618-621
J.A. Clarke, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
A.A. Gaffar, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
G.A. Constantinides, Dept. of Electr.&Electron. Eng., Imperial Coll. London, UK
pp. 626-629
U. Malik, Sch. of Comput. Sci.&Eng., New South Wales Univ., Sydney, NSW, Australia
O. Diessef, Sch. of Comput. Sci.&Eng., New South Wales Univ., Sydney, NSW, Australia
pp. 636-639
A. Danilin, Philips Res. Labs., Eindhoven, Netherlands
M. Bennebroek, Philips Res. Labs., Eindhoven, Netherlands
S. Sawitzki, Philips Res. Labs., Eindhoven, Netherlands
pp. 640-643
null Chin Mun Wee, Sch. of Inf. Technol.&Electr. Eng., Queensland Univ., Brisbane, Qld., Australia
P.R. Sutton, Sch. of Inf. Technol.&Electr. Eng., Queensland Univ., Brisbane, Qld., Australia
N.W. Bergmann, Sch. of Inf. Technol.&Electr. Eng., Queensland Univ., Brisbane, Qld., Australia
pp. 654-657
K. Siozios, Dep. of Electr.&Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
K. Tatas, Dep. of Electr.&Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
G. Koutroumpezis, Dep. of Electr.&Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
D. Soudris, Dep. of Electr.&Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
A. Thanailakis, Dep. of Electr.&Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
pp. 658-661
B. Ratchev, Altera Corp., San Jose, CA, USA
M. Mutton, Altera Corp., San Jose, CA, USA
D. Mendel, Altera Corp., San Jose, CA, USA
pp. 662-665
J.-P. Deschamps, Univ. Rovira i Virgili, Tarragona, Spain
G. Sutler, Univ. Rovira i Virgili, Tarragona, Spain
pp. 670-674
P. Faes, Dept. of Electron.&Inf. Syst., Ghent Univ., Belgium
M. Christiaens, Dept. of Electron.&Inf. Syst., Ghent Univ., Belgium
D. Buytaert, Dept. of Electron.&Inf. Syst., Ghent Univ., Belgium
D. Strooband, Dept. of Electron.&Inf. Syst., Ghent Univ., Belgium
pp. 675-680
A. Michalski, Dept. of Comput. Sci.&Eng., South Carolina Univ., Columbia, SC, USA
D. Buell, Dept. of Comput. Sci.&Eng., South Carolina Univ., Columbia, SC, USA
pp. 681-686
N. Bruchon, LIRMM, Montpeilier Univ., France
G. Cambon, LIRMM, Montpeilier Univ., France
L. Torres, LIRMM, Montpeilier Univ., France
G. Sassatelli, LIRMM, Montpeilier Univ., France
pp. 687-690
K.H. Tsoi, Dept. of Comput. Sci.&Eng., Hong Kong Chinese Univ., China
P.H.W. Leong, Dept. of Comput. Sci.&Eng., Hong Kong Chinese Univ., China
pp. 691-694
M. Zadnik, Fac. of Inf. Technol., Brno Univ. of Technol., Czech Republic
pp. 695-698
Z. Pohl, Inst. of Inf. Theor.&Autom., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
J. Kadlec, Inst. of Inf. Theor.&Autom., Acad. of Sci. of the Czech Republic, Prague, Czech Republic
pp. 699-702
K. Siozios, Dep. of Electr.&Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
D. Soudris, Dep. of Electr.&Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
A. Thanailakis, Dep. of Electr.&Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
pp. 707-708
F. Honore, Microsystems Technol. Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
A. Chandrakasan, Microsystems Technol. Lab., Massachusetts Inst. of Technol., Cambridge, MA, USA
pp. 709-710
L.E. Cordova, Dept. of Comput. Sci.&Eng., South Carolina Univ., Columbia, SC, USA
D.A. Buell, Dept. of Comput. Sci.&Eng., South Carolina Univ., Columbia, SC, USA
pp. 711-712
K.H. Tsoi, Dept. of Comput. Sci.&Eng., Chinese Univ. of Hong Kong, China
pp. 713-714
A.M. Smith, Dept. of Electr.&Electron. Eng., London Imperial Coll., UK
pp. 719-720
E. Pardo, Dept. de Electronica y Computacion, Univ. de Santiago de Compostela, Spain
R. Lopez, Dept. de Electronica y Computacion, Univ. de Santiago de Compostela, Spain
D. Cabello, Dept. de Electronica y Computacion, Univ. de Santiago de Compostela, Spain
pp. 721-722
E.J. Toledo, Dpto. Electronica, Tecnologia de Computadoras y Proyectos, Univ. Politecnica de Cartagena, Spain
J.J. Martinez, Dpto. Electronica, Tecnologia de Computadoras y Proyectos, Univ. Politecnica de Cartagena, Spain
E.J. Garrigos, Dpto. Electronica, Tecnologia de Computadoras y Proyectos, Univ. Politecnica de Cartagena, Spain
J.M. Ferrandez, Dpto. Electronica, Tecnologia de Computadoras y Proyectos, Univ. Politecnica de Cartagena, Spain
pp. 723-724
N. Campregher, Dept. of Electr.&Electron. Eng., Imperial Coll., London, UK
pp. 725-726
J. Lazanyi, Dept. of Meas.&Inf. Syst., Budapest Univ. of Technol.&Econ., Hungary
pp. 729-730
L. Shannon, Dept. of Electr.&Comput. Eng., Toronto Univ., Ont., Canada
pp. 731-732
R.P. Bharadwaj, Center for Integrated Circuits&Syst., Texas Univ., Dallas, TX, USA
pp. 735-738
R. Huang, Dept. of Electr. Comput. Eng.&Comput. Sci., Cincinnati Univ., OH, USA
R. Vemuri, Dept. of Electr. Comput. Eng.&Comput. Sci., Cincinnati Univ., OH, USA
pp. 739-740
D. Nguyen, Dept. of Electr.&Comput. Eng., Northwestern Univ., Evanston, IL, USA
pp. 741-742
H. Joshi, Dept. of Inf. Technol., MLV Textile Inst., Bhilwara, India
S.S. Verma, Dept. of Inf. Technol., MLV Textile Inst., Bhilwara, India
pp. 743-744
V. Singh, Nara Inst. of Sci.&Technol., Japan
M. Inoue, Nara Inst. of Sci.&Technol., Japan
pp. 747-748
Author index (PDF)
pp. 751-762
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