ISBN: 0-7695-2122-3

Demetri Terzopoulos, New York University, New York, NY; University of Toronto, ON, Canada

Yuencheng Lee, New York University, New York, NY; University of Toronto, ON, Canada

M. Alex O. Vasilescu, New York University, New York, NY; University of Toronto, ON, Canada

David K. Wagg, University of Southampton, UK

Mark S. Nixon, University of Southampton, UK

Raquel Urtasun, EPFL, Lausanne, Switzerland

Pascal Fua, EPFL, Lausanne, Switzerland

Guoying Zhao, Chinese Academy of Sciences, Beijing

Rui Chen, Chinese Academy of Sciences, Beijing

Guoyi Liu, Chinese Academy of Sciences, Beijing

Hua Li, Chinese Academy of Sciences, Beijing

Jinho Lee, Mitsubishi Electric Research Laboratories; Cambridge, MA; The Ohio State University, Columbus, OH

Baback Moghaddam, Mitsubishi Electric Research Laboratories; Cambridge, MA

Hanspeter Pfister, Mitsubishi Electric Research Laboratories; Cambridge, MA

Raghu Machiraju, The Ohio State University, Columbus, OH

Qiang Zhu, University of California, Santa Barbara

Kwang-Ting Cheng, University of California, Santa Barbara

Ching-Tung Wu, University of California, Santa Barbara

Yi-Leh Wu, VIMA Technologies Inc. Santa Barbara, CA

Kyong I. Chang, University of Notre Dame, IN

Kevin W. Bowyer, University of Notre Dame, IN

Patrick J. Flynn, University of Notre Dame, IN

Xin Chen, University of Notre Dame, IN

In Kyu Park, INHA University, Incheon, Korea

Hui Zhang, Samsung Advanced Institute of Technology, Yongin, Korea

Vladimir Vezhnevets, Moscow State University, Moscow, Russia

Heui-Keun Choh, Samsung Advanced Institute of Technology, Yongin, Korea

Tony Ezzat, Massachusetts Institute of Technology, Cambridge

Gadi Geiger, Massachusetts Institute of Technology, Cambridge

Tomaso Poggio, Massachusetts Institute of Technology, Cambridge

M. Hamouz, University of Surrey, UK

J. Kittler, University of Surrey, UK

J.-K. Kamarainen, Lappeenranta Univ. of Technology, Finland

P. Paalanen, Lappeenranta Univ. of Technology, Finland

H. K?lvi?inen, Lappeenranta Univ. of Technology, Finland

Jie Chen, Harbin Institute of Technology, China

Xilin Chen, Harbin Institute of Technology, China

Wen Gao, Harbin Institute of Technology, China; Chinese Academy of Sciences, Beijing, China

Bo Wu, Tsinghua University, Beijing, China

Haizhou AI, Tsinghua University, Beijing, China

Chang Huang, Tsinghua University, Beijing, China

Shihong Lao, Omron Corporation

Yuchi Huang, Microsoft Research Asia; The Chinese Academy of Sciences

Stephen Lin, Microsoft Research Asia

Stan Z. Li, Microsoft Research Asia

Hanqing Lu, The Chinese Academy of Sciences

Heung-Yeung Shum, Microsoft Research Asia

Bernhard Fr?, Fraunhofer Institute for Integrated Circuits, Erlangen, Germany

Andreas Ernst, Fraunhofer Institute for Integrated Circuits, Erlangen, Germany

I. Patras, Delft University of Technology, The Netherlands

M. Pantic, Delft University of Technology, The Netherlands

Naiwala P. Chandrasiri, The University of Tokyo, Japan

Takeshi Naemura, The University of Tokyo, Japan

Hiroshi Harashima, The University of Tokyo, Japan

Haisong Gu, University of Nevada Reno

Qiang Ji, Rensselaer Polytechnic Institute

Ioannis A. Ypsilos, University of Surrey, Guildford, UK

Adrian Hilton, University of Surrey, Guildford, UK

Simon Rowe, Canon Research Centre Europe, Bracknell, Beskshire

F. Bettinger, University of Manchester, UK

T. F. Cootes, University of Manchester, UK

Jeffrey F. Cohn, University of Pittsburgh

Lawrence Ian Reed, University of Pittsburgh

Tsuyoshi Moriyama, Carnegie Mellon University

Jing Xiao, Carnegie Mellon University

Karen Schmidt, University of Pittsburgh

Zara Ambadar, University of Pittsburgh

Mark S. Nixon, University of Southampton, UK

John N. Carter, University of Southampton, UK

Chan-Su Lee, Rutgers University, New Brunswick, NJ

Ahmed Elgammal, Rutgers University, New Brunswick, NJ

Bernd Heisele, Honda Research Institute USA, Inc., Boston, USA

Takamasa Koshizen, Honda Research Institute Japan, Co. Ltd., Wako-shi, Japan

Amit Jain, Indiana University-Purdue University-Indianapolis, IN

Jeffrey Huang, Indiana University-Purdue University-Indianapolis, IN

K. H. Pun, The Chinese University of Hong Kong, Shatin, Hong Kong

Y. S. Moon, The Chinese University of Hong Kong, Shatin, Hong Kong

LinLin Shen, University of Nottingham

Li Bai, University of Nottingham

Pong C. Yuen, Hong Kong Baptist University

C. H. Man, Hong Kong Baptist University

Takatsugu Hirayama, Osaka University, Japan

Yoshio Iwai, Osaka University, Japan

Masahiko Yachida, Osaka University, Japan

Jamie Sherrah, Safehouse Technology Pty Ltd, Australia

Satoshi Hosoi, OMRON Corporation, Japan

Erina Takikawa, OMRON Corporation, Japan

Masato Kawade, OMRON Corporation, Japan

N. P. Costen, Manchester Metropolitan University, UK

M. Brown, Manchester Metropolitan University, UK

S. Akamatsu, Hosei University, Japan

S?bastien Marcel, Dalle Molle Institute for Perceptual Artificial Intelligence (IDIAP), Switzerland

Xiangsheng Huang, Chinese Academy of Sciences, Beijing, China

Stan Z. Li, Microsoft Research Asia, Beijing, China

Yangsheng Wang, Chinese Academy of Sciences, Beijing, China

Rauf Kh. Sadykhov, BSUIR, Minsk, Belarus

Vladimir A. Samokhval, UIIP of NAS of Belarus, Minsk, Belarus

Leonid P. Podenok, UIIP of NAS of Belarus, Minsk, Belarus

Junping Zhang, Fudan University, Shanghai, China

Stan Z. Li, Microsoft Research Asia, Beijing, China

Jue Wang, Chinese Academy of Sciences, Beijing, China

Shaohua Kevin Zhou, University of Maryland, College Park

Rama Chellappa, University of Maryland, College Park

Shaohua Kevin Zhou, University of Maryland, College Park

Rama Chellappa, University of Maryland, College Park

Baback Moghaddam, Mitsubishi Electric Research Laboratories, Cambridge, MA

Takeshi Shakunaga, Okayama University, Japan

Fumihiko Sakaue, Okayama University, Japan

Kazuma Shigenari, Okayama University, Japan

Mohammad T. Sadeghi, University of Surrey, Guildford, UK

Josef Kittler, University of Surrey, Guildford, UK

James Short, University of Surrey, Guildford, UK

Josef Kittler, University of Surrey, Guildford, UK

Kieron Messer, University of Surrey, Guildford, UK

Haiyuan Wu, Wakayama University, Japan

Qian Chen, Wakayama University, Japan

Toshikazu Wada, Wakayama University, Japan

Filareti Tsalakanidou, Aristotle University of Thessaloniki, Greece; Informatics and Telematics Institute, Thessaloniki, Greece

Sotiris Malassiotis, Informatics and Telematics Institute, Thessaloniki, Greece

Michael G. Strintzis, Aristotle University of Thessaloniki, Greece; Informatics and Telematics Institute, Thessaloniki, Greece

Ho-Choul Jung, Korea University, Seoul

Bon-Woo Hwang, VirtualMedia, Inc., Seoul, Korea

Seong-Whan Lee, Korea University, Seoul

Bon-Woo Hwang, Korea University, Seoul

Myung-Cheol Roh, Korea University, Seoul

Seong-Whan Lee, Korea University, Seoul

Xiaogang Wang, The Chinese University of Hong Kong

Xiaoou Tang, The Chinese University of Hong Kong

Ming Zhao, Zhejiang University, Hangzhou, P.R. China

Chun Chen, Zhejiang University, Hangzhou, P.R. China

Stan Z. Li, Microsoft Research Asia, Beijing, P.R. China

Jiajun Bu, Zhejiang University, Hangzhou, P.R. China

Laiyun Qing, ICT-ISVISION Joint R&D Laboratory for Face Recognition, CAS, Beijing, China

Shiguang Shan, ICT-ISVISION Joint R&D Laboratory for Face Recognition, CAS, Beijing, China

Wen Gao, ICT-ISVISION Joint R&D Laboratory for Face Recognition, CAS, Beijing, China

Longbin Chen, University of Miami, FL

Lei Zhang, Microsoft Research Asia, Beijing, China

Hongjiang Zhang, Microsoft Research Asia, Beijing, China

Mohamed Abdel-Mottaleb, University of Miami, FL

Chenghua Xu, Chinese Academy of Sciences, Beijing, P. R. China

Yunhong Wang, Chinese Academy of Sciences, Beijing, P. R. China

Tieniu Tan, Chinese Academy of Sciences, Beijing, P. R. China

Long Quan, Hong Kong University of Science and Technology

Shiguang Shan, Chinese Academy of Sciences

Yizheng Chang, Harbin Institute of Technology

Wen Gao, Chinese Academy of Sciences; Harbin Institute of Technology

Bo Cao, Chinese Academy of Sciences

Peng Yang, Chinese Academy of Sciences

Theodoros Papatheodorou, Imperial College London

Daniel Rueckert, Imperial College London

Jian Huang, Hong Kong Baptist University

Pong C Yuen, Hong Kong Baptist University

Wen-Sheng Chen, Hong Kong Baptist University; Shenzhen University, P.R. China

J H Lai, ZhongShan University, P.R. China

Jaepil Ko, Yonsei Univ., Seoul, Korea

Hyeran Byun, Yonsei Univ., Seoul, Korea

Yong Ma, Tsinghua University, Beijing, P.R.China

Xiaoqing Ding, Tsinghua University, Beijing, P.R.China

Zhenger Wang, Tsinghua University, Beijing, P.R.China

Ning Wang, Tsinghua University, Beijing, P.R.China

Xiaoou Tang, The Chinese University of Hong Kong

Zhifeng Li, The Chinese University of Hong Kong

Won-Sook Lee, University of Ottawa, Canada

Kyung-Ah Sohn, Samsung AIT, Korea

Peng Yang, Institute of Computing Technology of Chinese Academy Science

Shiguang Shan, Institute of Computing Technology of Chinese Academy Science

Wen Gao, Institute of Computing Technology of Chinese Academy Science

Stan Z. Li, Microsoft Research Asia

Dong Zhang, Microsoft Research Asia

Lijun Yin, State University of New York at Binghamton

Jingrong Jia, State University of New York at Binghamton

Joseph Morrissey, State University of New York at Binghamton

Wei Liu, Chinese Academy of Sciences, Beijing, P. R. China

Yunhong Wang, Chinese Academy of Sciences, Beijing, P. R. China

Stan Z. Li, Microsoft Research Asia, Beijing, P. R. China

Tieniu Tan, Chinese Academy of Sciences, Beijing, P. R. China

D. Cristinacce, University of Manchester, U.K

T. F. Cootes, University of Manchester, U.K

Yuanjian Feng, Shanghai Jiaotong University, China

Pengfei Shi, Shanghai Jiaotong University, China

Fuzhen Huang, Shanghai Jiaotong University, China

Jianbo Su, Shanghai Jiaotong University, China

Takahiro Tsuda, Gifu University, Japan

Kazuhiko Yamamoto, Gifu University, Japan

Kunihito Kato, Gifu University, Japan

Lin-Lin Huang, Tokyo University of Agriculture and Technology, Japan

Akinobu Shimizu, Tokyo University of Agriculture and Technology, Japan

Hidefumi Kobatake, Tokyo University of Agriculture and Technology, Japan

Yohei Ishii, HOIP Softopia Japan/JST

Hitoshi Hongo, HOIP Softopia Japan/JST

Kazuhiko Yamamoto, Gifu University, Japan

Yoshinori Niwa, HOIP Softopia Japan/JST

Jung-Bae Kim, Samsung Advanced Institute of Technology, Korea

Young Hoon Sung, Samsung Advanced Institute of Technology, Korea

Seok-Cheol Kee, Samsung Advanced Institute of Technology, Korea

Tomokazu Wakasugi, Toshiba Corporation, Japan

Masahide Nishiura, Toshiba Corporation, Japan

Kazuhiro Fukui, Toshiba Corporation, Japan

Yuri Ivanov, Honda Research Institute, US, Boston, MA

Bernd Heisele, Honda Research Institute, US, Boston, MA

Thomas Serre, Honda Research Institute, US, Boston, MA

Takuma Funahasahi, SCCS, Chukyo University

Masafumi Tominaga, HOIP Softopia Japan, JST

Takayuki Fujiwara, SCCS, Chukyo University

Hiroyasu Koshimizu, SCCS, Chukyo University

Congyong Su, Zhejiang University, Hangzhou, China

Yueting Zhuang, Zhejiang University, Hangzhou, China

Li Huang, Zhejiang University, Hangzhou, China

Fei Wu, Zhejiang University, Hangzhou, China

Kyung-A Kim, Pohang University of Science and Technology, South Korea

Se-Young Oh, Pohang University of Science and Technology, South Korea

Hyun-Chul Choi, Pohang University of Science and Technology, South Korea

Jan Sochman, Czech Technical University in Prague

Jir? Matas, Czech Technical University in Prague

Jinfeng Yang, Chinese Academy of Sciences, Beijing, China

Tieniu Tan, Chinese Academy of Sciences, Beijing, China

Weiming Hu, Chinese Academy of Sciences, Beijing, China

Hongliang Jin, Chinese Academy of Sciences, Beijing, China

Qingshan Liu, Chinese Academy of Sciences, Beijing, China

Hanqing Lu, Chinese Academy of Sciences, Beijing, China

Javier Ruiz-del-Solar, Universidad de Chile, Santiago, Chile

Rodrigo Verschae, Universidad de Chile, Santiago, Chile

Harsh Nanda, University of Maryland, College Park

Kikuo Fujimura, Honda Research Institute USA, Mountain View, CA

Yoshio Matsumoto, Nara Institute of Science and Technology, Japan

Jun'iti Ido, Nara Institute of Science and Technology, Japan

Kentaro Takemura, Nara Institute of Science and Technology, Japan

Masanao Koeda, Nara Institute of Science and Technology, Japan

Tsukasa Ogasawara, Nara Institute of Science and Technology, Japan

Tomoki Kobayashi, Gifu University, Japan

Yukihiro Ogawa, Gifu Prefectual Research Institute of Manufacturaling Information Technology, Japan

Kunihito Kato, Gifu University, Japan

Kazuhiko Yamamoto, Gifu University, Japan

Qiang Wang, Tsinghua University, Beijing, P.R. China.

Haizhou Ai, Tsinghua University, Beijing, P.R. China.

Guangyou Xu, Tsinghua University, Beijing, P.R. China.

Lukasz Zalewski, University of London, UK

Shaogang Gong, University of London, UK

Yusuke Shinohara, University of Tokyo, Japan

Nobuyuki Otsu, National Institute of Advanced Industrial Science and Technology (AIST), Japan

Juliano J. Bazzo, Federal University of Paran?, Brazil

Marcus V. Lamar, Federal University of Paran?, Brazil

Yanghua Liu, Tsinghua Univ. Beijing China

Guangyou Xu, Tsinghua Univ. Beijing China

Qiang Wang, Tsinghua Univ. Beijing China

Nicu Sebe, University of Amsterdam, The Netherlands

Michael S. Lew, Leiden University, The Netherlands

Ira Cohen, HP Labs, USA

Yafei Sun, Sichuan University, China

Theo Gevers, University of Amsterdam, The Netherlands

Thomas S. Huang, University of Illinois at Urbana-Champaign, IL, USA

Haibing Ren, Samsung Advanced Institute of Technology, Beijing, China

Guangyou Xu, Computing, Tsinghua University, Beijing, China

SeokCheol Kee, Samsung Advanced Institute of Technology, Yonging-Si, Korea

Xia Liu, Ohio State University, Columbus OH

Kikuo Fujimura, Honda Research Institute USA, Mountain View CA

W. W. Kong, National University of Singapore

Surendra Ranganath, National University of Singapore

St?phane Perrin, University of Tokyo, Japan

Alvaro Cassinelli, University of Tokyo, Japan

Masatoshi Ishikawa, University of Tokyo, Japan

Jose L. Hernandez-Rebollar, The George Washington University

Nicholas Kyriakopoulos, The George Washington University

Robert W. Lindeman, The George Washington University

Wen Gao, Harbin Institute of Technology, China; Chinese Academy of Sciences, Beijing, China

Gaolin Fang, Harbin Institute of Technology, China

Debin Zhao, Harbin Institute of Technology, China

Yiqiang Chen, Chinese Academy of Sciences, Beijing, China

Sylvie C. W. Ong, National University of Singapore

Surendra Ranganath, National University of Singapore

Kai Nickel, Universitt Karlsruhe (TH), Germany

Edgar Seemann, Universitt Karlsruhe (TH), Germany

Rainer Stiefelhagen, Universitt Karlsruhe (TH), Germany

Agn? Just, Institut Dalle Molle d?Intelligence Artificielle Perceptive (IDIAP), Martigny, Switzerland

Olivier Bernier, France Telecom Research & Development, Lannion, France

S?bastien Marcel, IDIAP, Martigny, Switzerland

Roland Kehl, Swiss Federal Institute of Technology Z?rich (ETH), Switzerland

Luc Van Gool, Swiss Federal Institute of Technology Z?rich (ETH), Switzerland

Tatsuya Ishihara, University of Tokyo, Japan

Nobuyuki Otsu, National Institute of Advanced Industrial Science and Technology (AIST), Japan

Yasushi Hamada, Osaka University, Japan

Nobutaka Shimada, Osaka University, Japan

Yoshiaki Shirai, Osaka University, Japan

Ma Gengyu, Tsinghua University, Beijing, China

Lin Xueyin, Tsinghua University, Beijing, China

Atid Shamaie, Dublin City University, Ireland

Alistair Sutherland, Dublin City University, Ireland

David C. Minnen, Georgia Institute of Technology, Atlanta

Christopher R. Wren, Mitsubishi Electric Research Laboratories, Cambridge, MA

Mathias K?lsch, University of California, Santa Barbara

Matthew Turk, University of California, Santa Barbara

R. Martin McGuire, Georgia Tech, Atlanta

Jose Hernandez-Rebollar, George Washington University, Washington, DC

Thad Starner, Georgia Tech, Atlanta

Valerie Henderson, Georgia Tech, Atlanta

Helene Brashear, Georgia Tech, Atlanta

Danielle S. Ross, University of Rochester, NY

Edgar Seemann, Universit?t Karlsruhe (TH), Germany

Kai Nickel, Universit?t Karlsruhe (TH), Germany

Rainer Stiefelhagen, Universit?t Karlsruhe (TH), Germany

Guoyuan Liang, Peking University, P.R. China

Hongbin Zha, Peking University, P.R. China

Hong Liu, Peking University, P.R. China

Jian-Gang Wang, Institute for Infocomm Research, Singapore

Eric Sung, Nanyang Technological University, Singapore

Ronda Venkateswarlu, Institute for Infocomm Research, Singapore

Fernando De la Torre, Carnegie Mellon University, Pittsburgh, Pennsylvania

Jordi Casoliva, Carnegie Mellon University, Pittsburgh, Pennsylvania

Jeffrey F. Cohn, University of Pittsburgh, Pennsylvania

Yuxiao Hu, Microsoft Research, Asia, Beijing, China

Longbin Chen, University of Miami, Coral Gables, FL

Yi Zhou, Microsoft Research, Asia, Beijing, China

Hongjiang Zhang, Microsoft Research, Asia, Beijing, China

Akira Utsumi, ATR Media Information Science Laboratories, Japan

Nobuji Tetsutani, ATR Media Information Science Laboratories, Japan

Chunhong Pan, Chinese Academy of Sciences, P. R. China

Songde Ma, Chinese Academy of Sciences, P. R. China

Caifeng Shan, Chinese Academy of Sciences, Beijing, P.R. China

Yucheng Wei, Chinese Academy of Sciences, Beijing, P.R. China

Tieniu Tan, Chinese Academy of Sciences, Beijing, P.R. China

Fr?d?ric Ojardias, Institut National des Sciences Appliqu?es de Lyon (INSA de Lyon)

Matthieu Bray, Swiss Federal Institute of Technology (ETH), Switzerland

Esther Koller-Meier, Swiss Federal Institute of Technology (ETH), Switzerland

Luc Van Gool, Swiss Federal Institute of Technology (ETH), Switzerland

K. Hayashi, Mitsubishi Electric co., Hyogo, Japan

M. Hashimoto, Mitsubishi Electric co., Hyogo, Japan

K. Sumi, Kyoto University, Japan

K. Sasakawa, Mitsubishi Electric co., Hyogo, Japan

Dong-Wan Kang, Waseda University, Japan

Yuichi Onuma, Waseda University, Japan

Jun Ohya, Waseda University, Japan

John Y. Lin, University of Illinois at Urbana-Champaign, Urbana, IL

Ying Wu, Northwestern University, Evanston, IL

Thomas S. Huang, University of Illinois at Urbana-Champaign, Urbana, IL

Jiang Gao, Carnegie Mellon University, Pittsburgh, PA

Alexander G. Hauptmann, Carnegie Mellon University, Pittsburgh, PA

Howard D. Wactlar, Carnegie Mellon University, Pittsburgh, PA

Pong C. Yuen, Hong Kong Baptist University, Hong Kong

J. H. Lai, Zhongshan University, China

Q. Y. Huang, Hong Kong Baptist University, Hong Kong; Zhongshan University, China

Toshikazu Kobayashi, Hosei University, Japan

Masataka Ozu, Hosei University, Japan

Syunsuke Otake, Hosei University, Japan

Shigeru Akamatsu, Hosei University, Japan

Tracy Westeyn, Georgia Institute of Technology, Atlanta

Thad Starner, Georgia Institute of Technology, Atlanta

Yang Li, Tsinghua University, Beijing, P. R. China

Xueyin Lin, Tsinghua University, Beijing, P. R. China

Jinshi Cui, Tsinghua University, China

Zengqi Sun, Tsinghua University, China

Hajime Sato, Waseda University, Japan

Jun Ohya, Waseda University, Japan

Nobuyoshi Terashima, Waseda University, Japan

Ping-Hsien Lee, Academia Sinica, Taipei, Taiwan; National Taiwan University, Taiwan

Chu-Song Chen, Academia Sinica, Taipei, Taiwan

Shigeru Mukaida, ATR Human Information Science Laboratories, Japan

Hiroshi Ando, ATR Human Information Science Laboratories, Japan

Jerry Jun Yokono, Center for Biological and Computational Learning, M.I.T., Cambridge, MA

Tomaso Poggio, Center for Biological and Computational Learning, M.I.T., Cambridge, MA

Qingshan Liu, Chinese Academy of Sciences, Beijing, China

Jian Cheng, Chinese Academy of Sciences, Beijing, China

Hanqing Lu, Chinese Academy of Sciences, Beijing, China

Songde Ma, Chinese Academy of Sciences, Beijing, China

Jeroen Lichtenauer, Delft University of Technology, The Netherlands

Marcel Reinders, Delft University of Technology, The Netherlands

Emile Hendriks, Delft University of Technology, The Netherlands

Chris McDonald, Carleton University, Ottawa, ON, Canada

Gerhard Roth, National Research Council, Ottawa, ON, Canada

Steve Marsh, National Research Council, Ottawa, ON, Canada

Taketoshi Mori, The University of Tokyo, Japan

Yushi Segawa, The University of Tokyo, Japan

Masamichi Shimosaka, The University of Tokyo, Japan

Tomomasa Sato, The University of Tokyo, Japan

Dong Hyun Yoo, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Korea

Myung Jin Chung, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Korea

Shi Han, Zhejiang University, Hangzhou, P.R. China

Gang Pan, Zhejiang University, Hangzhou, P.R. China

Zhaohui Wu, Zhejiang University, Hangzhou, P.R. China

Young-Ho Son, Intelligent Robotics Research Center, KIST, Seoul, Korea; Korea University, Seoul, Korea

Bum-Jae You, Intelligent Robotics Research Center, KIST, Seoul, Korea

Sang-Rok Oh, Intelligent Robotics Research Center, KIST, Seoul, Korea

Gwi-Tae Park, Korea University, Seoul, Korea

Yoichi Sato, The University of Tokyo, Japan

Kenji Oka, The University of Tokyo, Japan

Hideki Koike, University of Electro-Communications, Japan

Yasuto Nakanishi, Tokyo University of Agriculture and Technology, Japan

A. Hadid, University of Oulu, Finland

M. Pietik?inen, University of Oulu, Finland

Haitao Wang, Chinese Academy of Sciences, Beijing, China

Stan Z Li, Microsoft Research Asia Beijing, China

Yangsheng Wang, Chinese Academy of Sciences, Beijing, China

Fabien Cardinaux, IDIAP, Martigny, Switzerland

Conrad Sanderson, IDIAP, Martigny, Switzerland

Samy Bengio, IDIAP, Martigny, Switzerland

Jeong-Seon Park, Korea University, Seoul

Seong-Whan Lee, Korea University, Seoul

Xun Xu, University of Illinois at Urbana-Champaign

Changshui Zhang, Tsinghua University, Beijing, P.R.China

Thomas S. Huang, University of Illinois at Urbana-Champaign

Yuxiao Hu, Microsoft Research, Asia, Beijing, China

Dalong Jiang, Chinese Academy of Sci., Beijing, China

Shuicheng Yan, Peking University, Beijing, China

Lei Zhang, Microsoft Research, Asia, Beijing, China

Hongjiang Zhang, Microsoft Research, Asia, Beijing, China

Woong Choi, Tokyo Institute of Technology, Japan

Seung Zoo Jeong, Tokyo Institute of Technology, Japan

Naoki Hashimoto, Tokyo Institute of Technology, Japan

Syouichi Hasegawa, Tokyo Institute of Technology, Japan

Yasuharu Koike, Tokyo Institute of Technology, Japan

Makoto Sato, Tokyo Institute of Technology, Japan

Takaaki Shiratori, The University of Tokyo, Japan

Atsushi Nakazawa, Osaka University, Japan

Katsushi Ikeuchi, The University of Tokyo, Japan

Martin Eriksson, Royal Institute of Technology, Stockholm, Sweden

Stefan Carlsson, Royal Institute of Technology, Stockholm, Sweden

Jongwoo Lim, University of Illinois at Urbana, Champaign

David Kriegman, University of California at San Diego

Jiang Gao, Carnegie Mellon University, Pittsburgh, PA

Jianbo Shi, University of Pennsylvania, Philadelphia,PA

Kanav Kahol, Arizona State University, Tempe

Priyamvada Tripathi, Arizona State University, Tempe

Sethuraman Panchanathan, Arizona State University, Tempe

Eng-Jon Ong, University of Surrey, Guildford

Richard Bowden, University of Surrey, Guildford

Akihiro Imai, Osaka University, Japan

Nobutaka Shimada, Osaka University, Japan

Yoshiaki Shirai, Osaka University, Japan