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2010 East-West Design & Test Symposium
On selection of state variables for delay test of identical functional units
St. Petersburg, Russia
September 17-September 20
ISBN: 978-1-4244-9555-9
ASCII Text
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Aditi Kajala, Gayaprasad Sinsinwar, Rahul Raj Choudhary, Jaynarayan Tudu, Virendra Singh, "On selection of state variables for delay test of identical functional units," East-West Design & Test Symposium, pp. 200-203, 2010 East-West Design & Test Symposium, 2010.
 
 
BibTex
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@article{ 10.1109/EWDTS.2010.5742119,
author = {Aditi Kajala and Gayaprasad Sinsinwar and Rahul Raj Choudhary and Jaynarayan Tudu and Virendra Singh},
title = {On selection of state variables for delay test of identical functional units},
journal ={East-West Design & Test Symposium},
volume = {0},
year = {2010},
isbn = {978-1-4244-9555-9},
pages = {200-203},
doi = {http://doi.ieeecomputersociety.org/10.1109/EWDTS.2010.5742119},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - East-West Design & Test Symposium
TI - On selection of state variables for delay test of identical functional units
SN - 978-1-4244-9555-9
SP200
EP203
A1 - Aditi Kajala,
A1 - Gayaprasad Sinsinwar,
A1 - Rahul Raj Choudhary,
A1 - Jaynarayan Tudu,
A1 - Virendra Singh,
PY - 2010
VL - 0
JA - East-West Design & Test Symposium
ER -
 
Aditi Kajala, Govt. Engineering College, Bikaner (Rajasthan) India
Gayaprasad Sinsinwar, Mody Institute of Technology and Science, Laxmangarh (Rajasthan), India
Rahul Raj Choudhary, Mody Institute of Technology and Science, Laxmangarh (Rajasthan), India
Jaynarayan Tudu, Indian Institute of Science, Bangalore, India
Virendra Singh, Indian Institute of Science, Bangalore, India
Multiple copies of the same functional units are common in today's design. It allows us to reduce golden reference storage by performing comparison of output response of the identical circuits when identical input sequence is applied to them. We present output response comparison scheme for identical sequential circuits for delay test using static transition probability. This allows us to make selection independent of the input sequence.
Citation:
Aditi Kajala, Gayaprasad Sinsinwar, Rahul Raj Choudhary, Jaynarayan Tudu, Virendra Singh, "On selection of state variables for delay test of identical functional units," ewdts, pp.200-203, 2010 East-West Design & Test Symposium, 2010
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