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23rd EUROMICRO Conference '97 New Frontiers of Information Technology
On the use of term trees for effective and efficient test pattern generation
Budapest, HUNGARY
September 01-September 04
ISBN: 0-8186-8129-2
| ASCII Text | x | ||
| L. Jozwiak, "On the use of term trees for effective and efficient test pattern generation," EUROMICRO Conference, pp. 87, 23rd EUROMICRO Conference '97 New Frontiers of Information Technology, 1997. | |||
| BibTex | x | ||
| @article{ 10.1109/EURMIC.1997.617224, author = {L. Jozwiak}, title = {On the use of term trees for effective and efficient test pattern generation}, journal ={EUROMICRO Conference}, volume = {0}, year = {1997}, issn = {1089-6503}, pages = {87}, doi = {http://doi.ieeecomputersociety.org/10.1109/EURMIC.1997.617224}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - EUROMICRO Conference TI - On the use of term trees for effective and efficient test pattern generation SN - 1089-6503 SP EP A1 - L. Jozwiak, PY - 1997 KW - automatic test software; term trees; structural automatic test pattern generation; fault discovery; structural fault model; data representation; term tree based ATPG algorithm; nonredundant faults; fault model; minimal test set; circuit redundancy; logic design VL - 0 JA - EUROMICRO Conference ER - | |||
The aim of the structural automatic test pattern generation (ATPG) is to efficiently construct a compact set of test patterns that are able do discover faults from a given structural fault model. The paper focuses on the usage for ATPG of a new data representation, called term trees. We designed and implemented a new term tree based ATPG algorithm with the following features: (1) 100% coverage of all nonredundant faults of the fault model; (2) a (near) minimal test set; (3) detection of circuit redundancy that disables testing for some faults; (4) a practical ATPG time and memory usage. We introduce the term trees and their structural fault model, show how to use them for effective and efficient test pattern generation and discuss some ATPG results. We also propose an effective, efficient and flexible term tree minimization algorithm and discuss some benchmark results. The term trees can be applied for many other purposes in logic design and other areas.
Index Terms:
automatic test software; term trees; structural automatic test pattern generation; fault discovery; structural fault model; data representation; term tree based ATPG algorithm; nonredundant faults; fault model; minimal test set; circuit redundancy; logic design
Citation:
L. Jozwiak, "On the use of term trees for effective and efficient test pattern generation," euromicro, pp.87, 23rd EUROMICRO Conference '97 New Frontiers of Information Technology, 1997
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