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European Test Workshop, IEEE (2003)
Maastricht, The Netherlands
May 25, 2003 to May 28, 2003
ISBN: 0-7695-1908-3
TABLE OF CONTENTS
Introduction
Foreword (PDF)
pp. ix
Committees (PDF)
pp. x
DFT & BIST
M. J. Geuzebroek , Delft University of Technology
A. J. van de Goor , Delft University of Technology
pp. 3
S. Manich , Universitat Polit?cnica de Catalunya
L. Garcia , Universitat Polit?cnica de Catalunya
L. Balado , Universitat Polit?cnica de Catalunya
E. Lupon , Universitat Polit?cnica de Catalunya
J. Rius , Universitat Polit?cnica de Catalunya
R. Rodriguez , Universitat Polit?cnica de Catalunya
J. Figueras , Universitat Polit?cnica de Catalunya
pp. 9
Ozgur Sinanoglu , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 15
Memory Test
Simone Borri , Infineon Technologies France
Magali Hage-Hassan , Infineon Technologies France and Institut des Sciences de l?Ing?nieur de Montpellier
Patrick Girard , Laboratoire d?Informatique, Robotique et Micro?lectronique
Serge Pravossoudovitch , Laboratoire d?Informatique, Robotique et Micro?lectronique
Arnaud Virazel , Laboratoire d?Informatique, Robotique et Micro?lectronique
pp. 23
Said Hamdioui , Delft University of Technology and Intel Corporation
Rob Wadsworth , STMicroelectronics
John Delos Reyes , Intel Corporation
Ad J. van de Goor , Delft University of Technology
pp. 29
Anuja Sehgal , Duke University
Aishwarya Dubey , Indian Institute of Technology
Erik Jan Marinissen , Philips Research
Clemens Wouters , Philips Semiconductors
Harald Vranken , Philips Research
Krishnendu Chakrabarty , Duke University
pp. 35
Asynchronous Test
Octavian Petre , MESA+ Research Institute
Hans G. Kerkhoff , MESA+ Research Institute
pp. 43
SoC Testing
Julien Pouget , Link?ping University
Erik Larsson , Link?ping University
Zebo Peng , Link?ping University
Marie-Lise Flottes , Montpellier 2 University
Bruno Rouzeyre , Montpellier 2 University
pp. 51
Sandeep Kumar Goel , Philips Research Laboratories
Erik Jan Marinissen , Philips Research Laboratories
pp. 57
Issues in Test Application
Marco Rona , Infineon Technologies AG
Gunter Krampl , Infineon Technologies AG
Fritz Raczkowski , FH Joanneum Kapfenberg
pp. 71
Defect-Oriented Test
Joan Figueras , Universitat Politècnica de Catalunya
pp. 79
Daniel Arum?-Delgado , Polytechnical University of Catalunya
Rosa Rodr?guez-Monta? , Polytechnical University of Catalunya
Jos? Pineda de Gyvez , Philips Research Laboratories
Guido Gronthoud , Philips Research Laboratories
pp. 85
Ilia Polian , Albert-Ludwigs-University
Piet Engelke , Albert-Ludwigs-University
Michel Renovell , LIRMM - UMII
Bernd Becker , Albert-Ludwigs-University
pp. 91
ATPG
Functional Validation
F. Corno , Politecnico di Torino
G. Squillero , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
pp. 113
Scan and Core Testing
H. J. Vermaak , University of Twente and Technikon Free State
H. G. Kerkhoff , University of Twente
pp. 121
RF, EME, and Probing
Marten Seth , Credence Systems Corporation
pp. 129
Delay Testing
B. Seshadri , Purdue University
I. Pomeranz , Purdue University
S.M. Reddy , University of Iowa
S. Kundu , Intel Corporation
pp. 141
P. Girard , Universit? Montpellier II
O. H?ron , Universit? Montpellier II
S. Pravossoudovitch , Universit? Montpellier II
M. Renovell , Universit? Montpellier II
pp. 147
Exploiting 1149.1 for Debug and Core Test
Author Index
Author Index (PDF)
pp. 161
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