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Eighth IEEE European Test Workshop (ETW'03)
Maastricht, The Netherlands
May 25-May 28
ISBN: 0-7695-1908-3
Table of Contents
Introduction
DFT & BIST
S. Manich, Universitat Polit?cnica de Catalunya
L. Garcia, Universitat Polit?cnica de Catalunya
L. Balado, Universitat Polit?cnica de Catalunya
E. Lupon, Universitat Polit?cnica de Catalunya
J. Rius, Universitat Polit?cnica de Catalunya
R. Rodriguez, Universitat Polit?cnica de Catalunya
J. Figueras, Universitat Polit?cnica de Catalunya
pp. 9
Ozgur Sinanoglu, University of California at San Diego
Alex Orailoglu, University of California at San Diego
pp. 15
Memory Test
Simone Borri, Infineon Technologies France
Magali Hage-Hassan, Infineon Technologies France and Institut des Sciences de l?Ing?nieur de Montpellier
Patrick Girard, Laboratoire d?Informatique, Robotique et Micro?lectronique
Serge Pravossoudovitch, Laboratoire d?Informatique, Robotique et Micro?lectronique
Arnaud Virazel, Laboratoire d?Informatique, Robotique et Micro?lectronique
pp. 23
Said Hamdioui, Delft University of Technology and Intel Corporation
Rob Wadsworth, STMicroelectronics
John Delos Reyes, Intel Corporation
Ad J. van de Goor, Delft University of Technology
pp. 29
Anuja Sehgal, Duke University
Aishwarya Dubey, Indian Institute of Technology
Erik Jan Marinissen, Philips Research
Clemens Wouters, Philips Semiconductors
Harald Vranken, Philips Research
Krishnendu Chakrabarty, Duke University
pp. 35
Asynchronous Test
SoC Testing
Julien Pouget, Link?ping University
Erik Larsson, Link?ping University
Zebo Peng, Link?ping University
Marie-Lise Flottes, Montpellier 2 University
Bruno Rouzeyre, Montpellier 2 University
pp. 51
Issues in Test Application
Defect-Oriented Test
Daniel Arum?-Delgado, Polytechnical University of Catalunya
Rosa Rodr?guez-Monta?, Polytechnical University of Catalunya
Jos? Pineda de Gyvez, Philips Research Laboratories
Guido Gronthoud, Philips Research Laboratories
pp. 85
Ilia Polian, Albert-Ludwigs-University
Piet Engelke, Albert-Ludwigs-University
Michel Renovell, LIRMM - UMII
Bernd Becker, Albert-Ludwigs-University
pp. 91
ATPG
Functional Validation
Scan and Core Testing
RF, EME, and Probing
Delay Testing
P. Girard, Universit? Montpellier II
O. H?ron, Universit? Montpellier II
S. Pravossoudovitch, Universit? Montpellier II
M. Renovell, Universit? Montpellier II
pp. 147
Exploiting 1149.1 for Debug and Core Test
Author Index
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