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Proceedings the Seventh IEEE European Test Workshop (2002)
Corfu, Greece
May 26, 2002 to May 29, 2002
ISBN: 0-7695-1715-3
TABLE OF CONTENTS
Introduction
Foreword (PDF)
pp. viii
Committees (PDF)
pp. ix
pp. 128
Keynote Address
SoC Test
Defect Based Testing
M. Renovell , Universit? de Montpellier II
J. M. Gallière , Universit? de Montpellier II
F. Azaïs , Universit? de Montpellier II
Y. Bertrand , Universit? de Montpellier II
pp. 15
Verification
Srikanth Arekapudi , University of Massachusetts at Amherst
Fei Xin , University of Massachusetts at Amherst
Jinzheng Peng , University of Massachusetts at Amherst
Ian G. Harris , University of Massachusetts at Amherst
pp. 23
BIST and TRP
Andrzej Hlawiczka , Silesian University of Technology
Michal Kopec , Silesian University of Technology
pp. 31
Lars Schäfer , University of Stuttgart
Rainer Dorsch , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
pp. 37
Delay Testing
Xiao Liu , Virginia Tech
Michael S. Hsiao , Virginia Tech
Sreejit Chakravarty , Intel Corporation
Paul J Thadikaran , Intel Corporation
pp. 47
Yun Shao , University of Iowa
Sudhakar M. Reddy , University of Iowa
Irith Pomeranz , Purdue University
Seiji Kajihara , Kyushu Institute of Technology
pp. 53
System Test and Debug
Sandeep Kumar Goel , Philips Research Laboratories
Bart Vermeulen , Philips Research Laboratories
pp. 61
Tiziana Margaria , METAFrame Technologies GmbH
Oliver Niese , University of Dortmund
Bernhard Steffen , University of Dortmund
Andrei Erochok , Siemens AG
pp. 67
Industrial Experiences: Bridging Faults and Current Test
Jonathan Bradford , Micronas GmbH
Hartmut Delong , Micronas GmbH
Ilia Polian , Albert-Ludwigs-University
Bernd Becker , Albert-Ludwigs-University
pp. 75
Testing Data Converters and PLLs
S. Bernard , University of Montpellier
F. Azaïs , University of Montpellier
Y. Bertrand , University of Montpellier
M. Renovell , University of Montpellier
pp. 89
Martin John Burbidge , Lancaster University
Frederic Poullet , Dolphin Integration
Jim Tijou , Philips Semiconductors
Andrew Richardson , Lancaster University
pp. 95
Industrial Experiences: DFT and BIST
Harald Vranken , Philips Research Laboratories
Florian Meister , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
pp. 105
Power Conscious Testing
Ozgur Sinanoglu , University of California at San Diego
Ismet Bayraktaroglu , University of California at San Diego
Alex Orailoglu , University of California at San Diego
pp. 113
Erik Larsson , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 119
Author Index
Author Index (PDF)
pp. 127
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