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Sixth IEEE European Test Workshop (ETW'01)
Stockholm, Sweden
May 29-June 01
ISBN: 0-7695-1016-7
Table of Contents
Defect-Oriented Testing
System-Level DFT
Delay Testing
Joonhwan Yi, The University of Michigan, Ann Arbor
John P. Hayes, The University of Michigan, Ann Arbor
pp. 27
Case Studies
Oliver Niese, METAFrame Technologies GmbH
Tiziana Margaria, METAFrame Technologies GmbH
Andreas Hagerer, METAFrame Technologies GmbH
Bernhard Steffen, Univ. of Dortmund
Georg Brune, Siemens AG
Werner Goerigk, Siemens AG
Hans-Dieter Ide, Siemens AG
pp. 51
Analog & Mixed-Signal Testing
Matthew Worsman, The Hong Kong Polytechnic University
Mike W.T. Wong, The Hong Kong Polytechnic University
Y.S. Lee, The Hong Kong Polytechnic University
pp. 73
Transportation of Test Data
System-Level Testing
RTL Validation, DFT, & TPG
BIST & Test Resource Partitioning
R. David, Laboratoire d'Automatique de Grenoble
P. Girard, LIRMM -CNRS/Universit? Montpellier II
C. Landrault, LIRMM -CNRS/Universit? Montpellier II
S. Pravossoudovitch, LIRMM -CNRS/Universit? Montpellier II
A. Virazel, LIRMM -CNRS/Universit? Montpellier II
pp. 117
Mixed-Signal Testing
Magnus Eckersand, National Semiconductor/Sweden
Ken Filliter, National Semiconductor/Sweden
Fredrik Franzon, Ericsson Radio Systems/Sweden
pp. 140
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