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European Test Workshop, IEEE (2001)
Stockholm, Sweden
May 29, 2001 to June 1, 2001
ISBN: 0-7695-1016-7
TABLE OF CONTENTS
Foreword (PDF)
pp. viii
Committees (PDF)
pp. ix
Defect-Oriented Testing
J.M. Portal , ICF/L2MP-UMR CNRS 6137
A. Pérez , ICF/L2MP-UMR CNRS 6137
pp. 3
Yukiya Miura , Tokyo Metropolitan University
Shuichi Seno , Tokyo Metropolitan University
pp. 9
System-Level DFT
D.C.L. (Erik) van Geest , Philips Research
Frans G.M. de Jong , Philips Research
pp. 19
Delay Testing
Joonhwan Yi , The University of Michigan, Ann Arbor
John P. Hayes , The University of Michigan, Ann Arbor
pp. 27
Wilfried Daehn , Hochschule Magdeburg-Stendahl
pp. 42
Case Studies
Oliver Niese , METAFrame Technologies GmbH
Tiziana Margaria , METAFrame Technologies GmbH
Andreas Hagerer , METAFrame Technologies GmbH
Bernhard Steffen , Univ. of Dortmund
Georg Brune , Siemens AG
Werner Goerigk , Siemens AG
Hans-Dieter Ide , Siemens AG
pp. 51
Analog & Mixed-Signal Testing
D. de Venuto , Politecnico di Bari
M.J. Ohletz , Alcatel Microelectronics
B. Ricco , Universit? di Bologna
pp. 68
Matthew Worsman , The Hong Kong Polytechnic University
Mike W.T. Wong , The Hong Kong Polytechnic University
Y.S. Lee , The Hong Kong Polytechnic University
pp. 73
Transportation of Test Data
Mohsen Nahvi , University of British Columbia
André Ivanov , University of British Columbia
pp. 81
System-Level Testing
Maisaa Khalil , LCIS-INPG
Chantal Robach , LCIS-INPG
Franc Novak , Jozef Stefan Institute
Alenka Zuzek , Jozef Stefan Institute
pp. 89
RTL Validation, DFT, & TPG
M.B. Santos , IST /INESC-id
F.M. Gonçalves , IST /INESC-id
I.C. Teixeira , IST /INESC-id
J.P. Teixeira , IST /INESC-id
pp. 99
V.A. Zivkovic , University of Twente
R.J.W.T. Tangelder , University of Twente
H.G. Kerkhoff , University of Twente
pp. 106
BIST & Test Resource Partitioning
R. David , Laboratoire d'Automatique de Grenoble
P. Girard , LIRMM -CNRS/Universit? Montpellier II
C. Landrault , LIRMM -CNRS/Universit? Montpellier II
S. Pravossoudovitch , LIRMM -CNRS/Universit? Montpellier II
A. Virazel , LIRMM -CNRS/Universit? Montpellier II
pp. 117
Rainer Dorsch , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
pp. 124
Mixed-Signal Testing
Marco Rona , Infineon Technologies
Gunter Krampl , Infineon Technologies
pp. 135
Magnus Eckersand , National Semiconductor/Sweden
Ken Filliter , National Semiconductor/Sweden
Fredrik Franzon , Ericsson Radio Systems/Sweden
pp. 140
Author Index (PDF)
pp. 147
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