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2012 17th IEEE European Test Symposium (2012)
Annecy
May 28, 2012 to May 31, 2012
ISBN: 978-1-4673-0696-6
TABLE OF CONTENTS
Jae Wook Lee , Intel Corp., Austin, TX, USA
Ji Hwan Chun , Intel Corp., Santa Clara, CA, USA
J. A. Abraham , Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
pp. 1-6
500 ms
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