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2013 18th IEEE European Test Symposium (ETS) (2007)
Freiburg, Germany
May 20, 2007 to May 24, 2007
ISBN: 0-7695-2827-9
TABLE OF CONTENTS
Introduction
Foreword (PDF)
pp. ix
pp. xii
Plenary Presentations
Fault and Defect Diagnosis
Stefan Holst , Universitat Stuttgart, Germany
pp. 7-12
A. Bosio , Universite Montpellier II/CNRS, France
P. Girard , Universite Montpellier II/CNRS, France
C. Landrault , Universite Montpellier II/CNRS, France
S. Pravossoudovitch , Universite Montpellier II/CNRS, France
A. Rousset , Universite Montpellier II/CNRS, France
pp. 13-20
Mixed Signal DFT and Test
Marcelo Negreiros , Universidade Federal do Rio Grande do Sul, Brazil
Pascal Nouet , Laboratoire d'Informatique, de Robotique et de Microelectronique de Montpellier, France
Erik Schuler , Universidade Federal do Rio Grande do Sul, Brazil
pp. 21-28
NoC Testing
Jaan Raik , Tallinn University of Technology, Estonia
Raimund Ubar , Tallinn University of Technology, Estonia
Vineeth Govind , Tallinn University of Technology, Estonia
pp. 29-34
Tomokazu Yoneda , Nara Institute of Science and Technology, Japan
Hideo Fujiwara , Nara Institute of Science and Technology, Japan
pp. 35-42
Advances in RF Test
Frank Demmerle , Infineon Technologies AG, Germany
Roland May , Infineon Technologies AG, Germany
Martin Kaibel , Infineon Technologies AG, Germany
Sebastian Sattler , Infineon Technologies AG, Germany
pp. 43-48
Marcelo Negreiros , Universidade Federal do Rio Grande do Sul, Brazil
Altamiro A. Susin , Universidade Federal do Rio Grande do Sul, Brazil
pp. 49-54
Rene Jonker , NXP Semiconductors, The Netherlands
Shaji Krishnan , NXP Semiconductors, The Netherlands
pp. 55-62
Diagnosis and Debug
Bart Vermeulen , NXP Semiconductors Research, The Netherlands
Remco van Steeden , Technical University of Twente, The Netherlands
Martijn Bennebroek , Philips Research, The Netherlands
pp. 69-76
Simulation and Verification
J.-M. Daga , ATMEL Rousset, France
P. Girard , Universite de Montpellier II/CNRS, France
O. Ginez , Universite de Montpellier II/CNRS, France; ATMEL Rousset, France
S. Pravossoudovitch , Universite de Montpellier II/CNRS, France
A. Virazel , Universite de Montpellier II/CNRS, France
pp. 77-84
Memory Test
Zaid Al-Ars , Delft University of Technology, The Netherlands
Said Hamdioui , Delft University of Technology, The Netherlands
Jose Calero , Design of Systems on Silicon (DS2), Spain
pp. 85-90
Sybille Hellebrand , University of Paderborn, Germany
Philipp Ohler , University of Paderborn, Germany
pp. 91-96
P. Girard , Universite de Montpellier II/CNRS, France
C. Landrault , Universite de Montpellier II/CNRS, France
S. Pravossoudovitch , Universite de Montpellier II/CNRS, France
A. Virazel , Universite de Montpellier II/CNRS, France
M. Bastian , Infineon Technologies, France
pp. 97-104
On-Line Testing and Self-Test
Z. Xu , Lancaster University, UK
K. Georgopoulos , Lancaster University, UK
R.J.T. Bunyan , QinetiQ, UK
N. Dumas , Lancaster University, UK
pp. 105-110
N. Kranitis , University of Athens, Greece
A. Paschalis , University of Athens, Greece
A. Merentitis , University of Athens, Greece
pp. 111-116
Tomoo Inoue , Hiroshima City University, Japan
Takashi Fujii , Hiroshima City University, Japan
Hideyuki Ichihara , Hiroshima City University, Japan
pp. 117-124
Fault Grading and Test Quality
Zhanglei Wang , Duke University, USA
Michael Bienek , Advanced Micro Devices, USA
pp. 125-130
Sergei Devadze , Tallinn University of Technology, Estonia
Raimund Ubar , Tallinn University of Technology, Estonia
Artur Jutman , Tallinn University of Technology, Estonia
pp. 131-136
Rene Krenz-Baath , NXP Semiconductors, Germany
Andreas Glowatz , NXP Semiconductors, Germany
Juergen Schloeffel , NXP Semiconductors, Germany
pp. 137-144
Diagnosis and Yield Improvement
Sharma Manish , Mentor Graphics Corporation, USA
Huaxing Tang , Mentor Graphics Corporation, USA
Martin Keim , Mentor Graphics Corporation, USA
Brady Benware , Mentor Graphics Corporation, USA
pp. 145-150
Irith Pomeranz , Purdue University, USA
pp. 151-158
Single Event Upsets
L. Sterpone , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
pp. 159-164
C.A. Lisboa , Universidade Federal do Rio Grande do Sul, Brazil
L. Carro , Universidade Federal do Rio Grande do Sul, Brazil
pp. 165-172
Delay and Performance Test
Ramtilak Vemu , The University of Texas at Austin, USA
Sankar Gurumurthy , The University of Texas at Austin, USA
Daniel G. Saab , Case Western Reserve University
pp. 173-178
P. Bernardi , Politecnico di Torino, Italy
E. Sanchez , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
pp. 179-184
Stephen Sunter , LogicVision, Inc.
pp. 185-192
Embedded Tutorials
S. Bernard , LIRMM, University of Montpellier/CNRS, France
M. Renovell , LIRMM, University of Montpellier/CNRS, France
pp. 193-199
Klaus Luther , Infineon Technologies AG, Germany
pp. 200
Peter Maxwell , Micron Technology
pp. 201
Nicola Nicolici , McMaster University, Canada
pp. 202-210
ETS06 Best Paper
P. Cauvet , Philips France Semiconducteurs
S. Bernard , LIRMM, University of Montpellier/CNRS, France
F. Azais , LIRMM, University of Montpellier/CNRS, France
M. Comte , LIRMM, University of Montpellier/CNRS, France
V. Kerzerho , LIRMM, University of Montpellier/CNRS, France; Philips France Semiconducteurs
pp. 211-216
Author Index
Author Index (PDF)
pp. 217
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