The Community for Technology Leaders
RSS Icon
Subscribe
2013 18th IEEE European Test Symposium (ETS) (2006)
Southampton, United Kingdom
May 21, 2006 to May 21, 2006
ISBN: 0-7695-2566-0
TABLE OF CONTENTS
Introduction
Foreward (PDF)
pp. ix
Plenary Presentations
Steve Furber , University of Manchester, UK
pp. 4-8
Delay Fault Testing
Gefu Xu , Auburn University, USA
Adit D. Singh , Auburn Univesity, USA
pp. 9-14
Noohul Basheer Zain Ali , University of Southampton, UK
Mark Zwolinski , University of Southampton, UK
Bashir M Al-Hashimi , University of Southampton, UK
Peter Harrod , ARM. Ltd.
pp. 15-20
Zhuo Zhang , University of Iowa, USA
Sudhakar M. Reddy , University of Iowa, USA
Irith Pomeranz2, Pomeranz , Purdue University, USA
Janusz Rajski , Mentor Graphics Corp., USA
Bashir M. Al-Hashimi , University of Southampton, UK
pp. 21-28
Single-Event Upsets
Mohammad Hosseinabady , University of Tehran, Iran
Pejman Lotfi-Kamran , University of Tehran, Iran
Giorgio Di Natale , Politecnico di Torino, Italy
Stefano Di Carlo , Politecnico di Torino, Italy
Alfredo Benso , Politecnico di Torino, Italy
Paolo Prinetto , Politecnico di Torino, Italy
pp. 29-34
Maryam Ashouei , Georgia Instititute of Technology, USA
Soumendu Bhattacharya , Georgia Institute of Technology, USA
Abhijit Chatterjee , Georgia Institute of Technology, USA
pp. 35-42
Memory Testing - 1
G. Harutunyan , Virage Logic, Armenia
V.A. Vardanian , Virage Logic, Armenia
Y. Zorian , Virage Logic, Armenia
pp. 43-48
A. Benso , Politecnico di Torino, Italy
A. Bosio , Politecnico di Torino, Italy
S. Di Carlo , Politecnico di Torino, Italy
G. Di Natale , Politecnico di Torino, Italy
P. Prinetto , Politecnico di Torino, Italy
pp. 49-54
Yu-Jen Huang , National Central University, Taiwan
Jin-Fu Li , National Central University, Taiwan
pp. 55-62
Test of Reconfiguration Systems
Wenjing Rao , UC San Diego, USA
Alex Orailoglu , UC San Diego, USA
Ramesh Karri , Polytechnic University
pp. 63-68
Kentaroh Katoh , Chiba University, Japan
Hideo Ito , Chiba University, Japan
pp. 69-74
M. Sonza Reorda , Politecnico di Torino, Italy
L. Sterpone , Politecnico di Torino, Italy
M. Violante , Politecnico di Torino, Italy
M. Portela-Garcia , Universidad Carlos III de Madrid, Spain
C. Lopez-Ongil , Universidad Carlos III de Madrid, Spain
L. Entrena , Universidad Carlos III de Madrid, Spain
pp. 75-82
Memory Testing - 2
Qiang Xu , The Chinese University of Hong Kong
Baosheng Wang , ATI Technologies Inc., Canada
F. Y. Young , The Chinese University of Hong Kong
pp. 83-88
Slimane Boutobza , Synopsys Inc, France
Michael Nicolaidis , Tima, France
Kheiredine M. Lamara , Synopsys Inc, France
Andrea Costa , Synopsys Inc, France
pp. 89-96
Test and Measurement
Bernd Laquai , Agilent Technologies, Germany
Martin Hua , Agilent Technologies, Germany
Guido Schulze , Agilent Technologies, Germany
Michael Braun , Agilent Technologies, Germany
pp. 97-102
Matthew Collins , University of Southampton, UK
Bashir M. Al-Hashimi , University of Southampton, UK
pp. 103-110
BIST and Test Data Compression for Logic
Ramashis Das , University of Michigan, USA
Igor L. Markov , University of Michigan, USA
John P. Hayes , University of Michigan, USA
pp. 111-116
Artur Pogiel , Poznan University of Technology, Poland
Janusz Rajski , Mentor Graphics Corporation, USA
Jerzy Tyszer , Poznan University of Technology, Poland
pp. 117-122
Valentin Gherman , Universitaet Stuttgart, Germany
Hans-Joachim Wunderlich , Universitaet Stuttgart, Germany
Juergen Schloeffel , Philips Semiconductors GmbH, Germany
Michael Garbers , Philips Semiconductors GmbH, Germany
pp. 123-130
Test of Sigma-Delta Modulators
Gildas Leger , Instituto de Microelectr?nica de Sevilla (IMSE-CNM), Spain
Adoraci? Rueda , Universidad de Sevilla, Spain
pp. 131-136
Erik Sch? , Universidade Federal do Rio Grande do Sul, Brazil
Daniel Scain Farenzena , Universidade Federal do Rio Grande do Sul, Brazil
Luigi Carro , Universidade Federal do Rio Grande do Sul, Brazil
pp. 137-144
Current-Based and Power Switch Testing
Sandeep Kumar Goel , Philips Research Laboratories, The Netherlands
Maurice Meijer , Philips Research Laboratories, The Netherlands
Jose Pineda de Gyvez , Philips Research Laboratories, The Netherlands
pp. 145-150
M. Cimino , IXL laboratory, France
H. Lapuyade , IXL laboratory, France
M. De Matos , IXL laboratory, France
T. Taris , IXL laboratory, France
Y. Deval , IXL laboratory, France
JB. B?gueret , IXL laboratory, France
pp. 151-158
Test of AD and DA Circuits
V. Kerz?rho , University of Montpellier, France
P. Cauvet , Philips France Semiconducteurs, France
S. Bernard , University of Montpellier, France
F. Aza? , University of Montpellier, France
M. Comte , University of Montpellier, France
M. Renovell , University of Montpellier, France
pp. 159-164
Shalabh Goyal, , Georgia Institute of Technology, USA
Abhijit Chatterjee , Georgia Insitute of Technology, USA
Mike Atia , National Semiconductor Corporation, USA
pp. 165-172
Automatic Test Pattern Generation
Irith Pomeranz , Purdue University, USA
Sudhakar M. Reddy , University of Iowa, USA
pp. 173-178
Giuseppe Di Guglielmo , Universita di Verona, Italy
Franco Fummi , Universita di Verona, Italy
Cristina Marconcini , Universita di Verona, Italy
Graziano Pravadelli , Universita di Verona, Italy
pp. 179-184
N. Devtaprasanna , University of Iowa, USA
A. Gunda , LSI Logic Inc., USA
P. Krishnamurthy , LSI Logic Inc., USA
S. M. Reddy , University of Iowa, USA
I. Pomeranz , Purdue University, USA
pp. 185-192
Advanced Analog Testing
V. Fresnaud , Philips France Semiconducteurs, France
L. Bossuet , Laboratoire IXL, France
D. Dallet , Laboratoire IXL, France
S. Bernard , University of Montpellier, France
J.M. Janik , University of Caen, France
B. Agnus , Philips France Semiconducteurs, France
Ph. Cauvet , Philips France Semiconducteurs, France
Ph. Gandy , Philips France Semiconducteurs, France
pp. 193-198
Byoungho Kim , The University of Texas at Austin, USA
Hongjoong Shin , The University of Texas at Austin, USA
Ji Hwan (Paul) Chun , Intel Corporation, AZ, USA
Jacob A. Abraham , The University of Texas at Austin, USA
pp. 199-204
Donghoon Han , Georgia Institute of Technology, USA
Shalabh Goyal, , Georgia Institute of Technology, USA
Soumendu Bhattacharya , Georgia Institute of Technology, USA
Abhijit Chatterjee , Georgia Institute of Technology, USA
pp. 205-212
Test of Asynchronous and NOC Circuitry
Alexandre M. Amory , Federal University of RGS - UFRG, Brazil
Kees Goossens , Philips Research Laboratories, The Netherlands
Erik Jan Marinissen , Philips Research Laboratories, The Netherlands
Marcelo Lubaszewski , Federal University of RGS - UFRGS, Brazil
Fernando Moraes , Catholic University - PUCRS, Brazil
pp. 213-218
Xuan-Tu Tran , LETI - CEA, France
Jean Durupt , LETI - CEA, France
Francois BERTRAND Bertrand , LETI - CEA, France
Vincent Beroulle , LCIS -INPG, France
Chantal Robach , LCIS - INPG, France
pp. 219-224
D. Shang , University of Newcastle upon Tyne, UK
A. Yakovlev , University of Newcastle upon Tyne, UK
F. Burns , University of Newcastle upon Tyne, UK
F. Xia , University of Newcastle upon Tyne, UK
A. Bystrov , University of Newcastle upon Tyne, UK
pp. 225-232
Diagnosis
Michal Kopec , Silesian University of Technology, Poland
Tomasz Garbolino , Silesian University of Technology, Poland
Krzysztof Gucwa , Silesian University of Technology, Poland
Andrzej Hlawiczka , Silesian University of Technology, Poland
pp. 233-238
Frank Poehl , Infineon Technologies AG, Germany
Jan Rzeha , University of Potsdam, Germany
Matthias Beck , Infineon Technologies AG, Germany
Michael Goessel , University of Potsdam, Germany
Ralf Arnold , Infineon Technologies AG, Germany
Peter Ossimitz , Infineon Technologies AG, Germany
pp. 239-246
Embedded Tutorials
Tino Heijmen , Philips Research Laboratories, The Netherlands
Andr? Nieuwland , Philips Research Laboratories, The Netherlands
pp. 247-252
Bill Eklow , Cisco Systems, USA
Ben Bennetts , Bennetts Associates, UK
pp. 253-254
Author Index
Author Index (PDF)
pp. 255
6 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool