• E
  • ETS
  • 2006
  • Eleventh IEEE European Test Symposium (ETS'06)
Advanced Search 
Eleventh IEEE European Test Symposium (ETS'06)
Southampton, United Kingdom
May 21-May 21
ISBN: 0-7695-2566-0
Table of Contents
Introduction
Plenary Presentations
Delay Fault Testing
Noohul Basheer Zain Ali, University of Southampton, UK
Mark Zwolinski, University of Southampton, UK
Bashir M Al-Hashimi, University of Southampton, UK
Peter Harrod, ARM. Ltd.
pp. 15-20
Zhuo Zhang, University of Iowa, USA
Sudhakar M. Reddy, University of Iowa, USA
Irith Pomeranz2, Pomeranz, Purdue University, USA
Janusz Rajski, Mentor Graphics Corp., USA
Bashir M. Al-Hashimi, University of Southampton, UK
pp. 21-28
Single-Event Upsets
Mohammad Hosseinabady, University of Tehran, Iran
Pejman Lotfi-Kamran, University of Tehran, Iran
Giorgio Di Natale, Politecnico di Torino, Italy
Stefano Di Carlo, Politecnico di Torino, Italy
Alfredo Benso, Politecnico di Torino, Italy
Paolo Prinetto, Politecnico di Torino, Italy
pp. 29-34
Memory Testing - 1
A. Benso, Politecnico di Torino, Italy
A. Bosio, Politecnico di Torino, Italy
S. Di Carlo, Politecnico di Torino, Italy
G. Di Natale, Politecnico di Torino, Italy
P. Prinetto, Politecnico di Torino, Italy
pp. 49-54
Test of Reconfiguration Systems
M. Sonza Reorda, Politecnico di Torino, Italy
L. Sterpone, Politecnico di Torino, Italy
M. Violante, Politecnico di Torino, Italy
M. Portela-Garcia, Universidad Carlos III de Madrid, Spain
C. Lopez-Ongil, Universidad Carlos III de Madrid, Spain
L. Entrena, Universidad Carlos III de Madrid, Spain
pp. 75-82
Memory Testing - 2
Qiang Xu, The Chinese University of Hong Kong
Baosheng Wang, ATI Technologies Inc., Canada
F. Y. Young, The Chinese University of Hong Kong
pp. 83-88
Test and Measurement
BIST and Test Data Compression for Logic
Ramashis Das, University of Michigan, USA
Igor L. Markov, University of Michigan, USA
John P. Hayes, University of Michigan, USA
pp. 111-116
Artur Pogiel, Poznan University of Technology, Poland
Janusz Rajski, Mentor Graphics Corporation, USA
Jerzy Tyszer, Poznan University of Technology, Poland
pp. 117-122
Valentin Gherman, Universitaet Stuttgart, Germany
Hans-Joachim Wunderlich, Universitaet Stuttgart, Germany
Juergen Schloeffel, Philips Semiconductors GmbH, Germany
Michael Garbers, Philips Semiconductors GmbH, Germany
pp. 123-130
Test of Sigma-Delta Modulators
Gildas Leger, Instituto de Microelectr?nica de Sevilla (IMSE-CNM), Spain
Adoraci? Rueda, Universidad de Sevilla, Spain
pp. 131-136
Erik Sch?, Universidade Federal do Rio Grande do Sul, Brazil
Daniel Scain Farenzena, Universidade Federal do Rio Grande do Sul, Brazil
Luigi Carro, Universidade Federal do Rio Grande do Sul, Brazil
pp. 137-144
Current-Based and Power Switch Testing
Sandeep Kumar Goel, Philips Research Laboratories, The Netherlands
Maurice Meijer, Philips Research Laboratories, The Netherlands
Jose Pineda de Gyvez, Philips Research Laboratories, The Netherlands
pp. 145-150
M. Cimino, IXL laboratory, France
H. Lapuyade, IXL laboratory, France
M. De Matos, IXL laboratory, France
T. Taris, IXL laboratory, France
Y. Deval, IXL laboratory, France
JB. B?gueret, IXL laboratory, France
pp. 151-158
Test of AD and DA Circuits
V. Kerz?rho, University of Montpellier, France
P. Cauvet, Philips France Semiconducteurs, France
S. Bernard, University of Montpellier, France
F. Aza?, University of Montpellier, France
M. Comte, University of Montpellier, France
M. Renovell, University of Montpellier, France
pp. 159-164
Shalabh Goyal,, Georgia Institute of Technology, USA
Abhijit Chatterjee, Georgia Insitute of Technology, USA
Mike Atia, National Semiconductor Corporation, USA
pp. 165-172
Automatic Test Pattern Generation
Giuseppe Di Guglielmo, Universita di Verona, Italy
Franco Fummi, Universita di Verona, Italy
Cristina Marconcini, Universita di Verona, Italy
Graziano Pravadelli, Universita di Verona, Italy
pp. 179-184
N. Devtaprasanna, University of Iowa, USA
A. Gunda, LSI Logic Inc., USA
P. Krishnamurthy, LSI Logic Inc., USA
S. M. Reddy, University of Iowa, USA
I. Pomeranz, Purdue University, USA
pp. 185-192
Advanced Analog Testing
V. Fresnaud, Philips France Semiconducteurs, France
L. Bossuet, Laboratoire IXL, France
D. Dallet, Laboratoire IXL, France
S. Bernard, University of Montpellier, France
J.M. Janik, University of Caen, France
B. Agnus, Philips France Semiconducteurs, France
Ph. Cauvet, Philips France Semiconducteurs, France
Ph. Gandy, Philips France Semiconducteurs, France
pp. 193-198
Byoungho Kim, The University of Texas at Austin, USA
Hongjoong Shin, The University of Texas at Austin, USA
Ji Hwan (Paul) Chun, Intel Corporation, AZ, USA
Jacob A. Abraham, The University of Texas at Austin, USA
pp. 199-204
Donghoon Han, Georgia Institute of Technology, USA
Shalabh Goyal,, Georgia Institute of Technology, USA
Soumendu Bhattacharya, Georgia Institute of Technology, USA
Abhijit Chatterjee, Georgia Institute of Technology, USA
pp. 205-212
Test of Asynchronous and NOC Circuitry
Alexandre M. Amory, Federal University of RGS - UFRG, Brazil
Kees Goossens, Philips Research Laboratories, The Netherlands
Erik Jan Marinissen, Philips Research Laboratories, The Netherlands
Marcelo Lubaszewski, Federal University of RGS - UFRGS, Brazil
Fernando Moraes, Catholic University - PUCRS, Brazil
pp. 213-218
Xuan-Tu Tran, LETI - CEA, France
Jean Durupt, LETI - CEA, France
Francois BERTRAND Bertrand, LETI - CEA, France
Vincent Beroulle, LCIS -INPG, France
Chantal Robach, LCIS - INPG, France
pp. 219-224
D. Shang, University of Newcastle upon Tyne, UK
A. Yakovlev, University of Newcastle upon Tyne, UK
F. Burns, University of Newcastle upon Tyne, UK
F. Xia, University of Newcastle upon Tyne, UK
A. Bystrov, University of Newcastle upon Tyne, UK
pp. 225-232
Diagnosis
Michal Kopec, Silesian University of Technology, Poland
Tomasz Garbolino, Silesian University of Technology, Poland
Krzysztof Gucwa, Silesian University of Technology, Poland
Andrzej Hlawiczka, Silesian University of Technology, Poland
pp. 233-238
Frank Poehl, Infineon Technologies AG, Germany
Jan Rzeha, University of Potsdam, Germany
Matthias Beck, Infineon Technologies AG, Germany
Michael Goessel, University of Potsdam, Germany
Ralf Arnold, Infineon Technologies AG, Germany
Peter Ossimitz, Infineon Technologies AG, Germany
pp. 239-246
Embedded Tutorials
Tino Heijmen, Philips Research Laboratories, The Netherlands
Andr? Nieuwland, Philips Research Laboratories, The Netherlands
pp. 247-252
Author Index
Usage of this product signifies your acceptance of the Terms of Use.