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2013 18th IEEE European Test Symposium (ETS) (2005)
Tallinn, Estonia
May 22, 2005 to May 25, 2005
ISBN: 0-7695-2341-2
TABLE OF CONTENTS
Introduction
Foreword (PDF)
pp. viii
SoC Testing
Raimund Ubar , Tallinn University of Technology
Tatjana Shchenova , Tallinn University of Technology
Gert Jervan , Link?ping University
Zebo Peng , Link?ping University
pp. 2-7
Urban Ingelsson , Linköpings Universitet
Sandeep Kumar Goel , Philips Research Labs
Erik Larsson , Linköpings Universitet
Erik Jan Marinissen , Philips Research Labs
pp. 8-13
Dan Zhao , University of Louisiana at Lafayette
Shambhu Upadhyaya , State University of New York at Buffalo
Martin Margala , University of Rochester
pp. 14-19
Advances in Fault and Defect Models
Gang Chen , University of Iowa
Sudhakar Reddy , University of Iowa
Irith Pomeranz , Purdue University
Janusz Rajski , Mentor Graphics Corporation
Piet Engelke , Albert-Ludwigs-University
Bernd Becker , Albert-Ludwigs-University
pp. 22-27
Daniel Arum? , Universitat Polit?cnica de Catalunya
Rosa Rodr?guez-Monta? , Universitat Polit?cnica de Catalunya
Joan Figueras , Universitat Polit?cnica de Catalunya
pp. 28-33
Victor H. Champac , National Institute for Astrophysics, Optics and Electronics
Antonio Zenteno , National Institute for Astrophysics, Optics and Electronics
José L. García , National Institute for Astrophysics, Optics and Electronics
pp. 34-40
Advanced Test Generation Issues
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 42-47
Tsuyoshi Iwagaki , Nara Institute of Science and Technology
Satoshi Ohtake , Nara Institute of Science and Technology
Hideo Fujiwara , Nara Institute of Science and Technology
pp. 48-53
B. Seshadri , Purdue University
I. Pomeranz , Purdue University
S. M. Reddy , University of Iowa
S. Kundu , Intel Corporation
pp. 54-59
Low Cost Testing for Advanced Analog Circuits
Amir Zjajo , Philips Research Laboratories
Jose Pineda de Gyvez , Philips Research Laboratories
pp. 62-67
G. Srinivasan , Georgia Institute of Technology
S. Cherubal , Texas Instruments
P. Variyam , Texas Instruments
M. Teklu , Texas Instruments
C. P. Wang , Texas Instruments
D. Guidry , Texas Instruments
A. Chatterjee , Georgia Institute of Technology
pp. 68-73
On-Line and BIST Techniques for MEMS
F. Mailly , Université Montpellier II
F. Aza? , Université Montpellier II
N. Dumas , Université Montpellier II
L. Latorre , Université Montpellier II
P. Nouet , Université Montpellier II
pp. 76-81
Carl Jeffrey , Lancaster University
Zhou Xu , Lancaster University
Andrew Richardson , Lancaster University
pp. 88-93
Defect and Dynamic Fault Testing
Jaan Raik , Tallinn University of Technology
Raimund Ubar , Tallinn University of Technology
Joachim Sudbrock , Tallinn University of Technology
Wieslaw Kuzmicz , Warsaw University of Technology
Witold Pleskacz , Warsaw University of Technology
pp. 96-101
Smita Krishnaswamy , University of Michigan
Igor L. Markov , University of Michigan
John P. Hayes , University of Michigan
pp. 102-107
A. Raychowdhury , Purdue University
S. Ghosh , Purdue University
S. Bhunia , Purdue University
D. Ghosh , Purdue University
K. Roy , Purdue University
pp. 108-113
SRAM Memory Testing
Luigi Dilillo , Universté de Montpellier II
Patrick Girard , Universté de Montpellier II
Serge Pravossoudovitch , Universté de Montpellier II
Arnaud Virazel , Universté de Montpellier II
pp. 116-121
A. Benso , Politecnico di Torino
A. Bosio , Politecnico di Torino
S. Di Carlo , Politecnico di Torino
G. Di Natale , Politecnico di Torino
P. Prinetto , Politecnico di Torino
pp. 122-127
Matthew Collins , University of Southampton
Bashir M. Al-Hashimi , University of Southampton
Neil Ross , University of Southampton
pp. 128-133
Testing Regular Structures
Matteo Sonza Reorda , Politecnico di Torino
Luca Sterpone , Politecnico di Torino
Massimo Violante , Politecnico di Torino
pp. 136-141
Mohammad Gh. Mohammad , Kuwait University
Laila Terkawi , Kuwait University
pp. 142-147
Philipp Öhler , University of Paderborn
Sybille Hellebrand , University of Paderborn
pp. 148-153
Validation and Molecular Electronics
Fei Xin , University of Massachusetts at Amherst
Maciej Ciesielski , University of Massachusetts at Amherst
Ian G. Harris , University of California at Irvine
pp. 156-161
Franco Fummi , Università di Verona
Graziano Pravadelli , Università di Verona
Franco Toto , STMicroelectronics
pp. 162-167
Fault Diagnosis
Grzegorz Mrugalski , Mentor Graphics Corporation
Artur Pogiel , Poznań University of Technology
Janusz Rajski , Mentor Graphics Corporation
Jerzy Tyszer , Poznań University of Technology
Chen Wang , Mentor Graphics Corporation
pp. 176-181
Xinyue Fan , Oxford University
Will Moore , Oxford University
Camelia Hora , Philips Research Labs
Guido Gronthoud , Philips Research Labs
pp. 182-187
SoC Testing and Secure ICs
David H?ly , ST Microelectronics and Universit? Montpellier II
Fr?d?ric Bancel , ST Microelectronics
Marie-Lise Flottes , Universit? Montpellier II
Bruno Rouzeyre , Universit? Montpellier II
pp. 190-195
P. Bernardi , Politecnico di Torino
M. Grosso , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
pp. 202-207
Embedded Tutorials
Chuck Hawkins , University of New Mexico
Jaume Segura , University of the Balearic Islands
pp. 210-215
Hans-Joachim Wunderlich , Universit?t Stuttgart
pp. 216-221
Peter Maxwell , Agilent Technologies
pp. 222
Hans G. Kerkhoff , MESA+ Institute for Nanotechnology
pp. 223-228
Author Index
Author Index (PDF)
pp. 229-230
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