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2013 18th IEEE European Test Symposium (ETS) (2004)
Corsica, France
May 23, 2004 to May 26, 2004
ISBN: 0-7695-2119-3
TABLE OF CONTENTS
Foreword (PDF)
pp. viii
Debug and Diagnosis
Artur Jutman , Tallinn University of Technology
pp. 2-7
Analog Measurement Techniques
O. Petre , MESA+ Research Institute, The Netherlands
H. G. Kerkhoff , MESA+ Research Institute, The Netherlands
pp. 10-15
Tian Xia , Univ. of Vermont, Burlington, VT
Peilin Song , IBM T.J. Watson Research Center, Yorktown Heights, NY
Keith A. Jenkins , IBM T.J. Watson Research Center, Yorktown Heights, NY
Jien-Chung Lo , Univ. of Rhode Island, Kingston
pp. 16-21
Design for Dependability
Xiangdong Xuan , Georgia Institute of Technology, Atlanta
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta
Adit D. Singh , Auburn University, AL
pp. 24-29
D. Marienfeld , University of Potsdam, Germany
E. S. Sogomonyan , University of Potsdam, Germany
V. Ocheretnij , University of Potsdam, Germany
M. G?ssel , University of Potsdam, Germany
pp. 30-35
ATE Hardware and Software
Bruce R. Parnas , Advantest R&D Center Inc.
Ankan Pramanick , Advantest R&D Center Inc.
Mark Elston , Advantest R&D Center Inc.
Toshiaki Adachi , Advantest R&D Center Inc.
pp. 38-43
Timing and Delay Testing
Ramyanshu Datta , The University of Texas at Austin
Antony Sebastine , The University of Texas at Austin
Jacob A. Abraham , The University of Texas at Austin
pp. 46-51
Patrick Girard , Universit? Montpellier II / CNRS, France
Olivier H?ron , Universit? Montpellier II / CNRS, France
Serge Pravossoudovitch , Universit? Montpellier II / CNRS, France
Michel Renovell , Universit? Montpellier II / CNRS, France
pp. 52-57
MEMS Testing
N. Dumas , Universit? de Montpellier II / CNRS, France
F. Aza? , Universit? de Montpellier II / CNRS, France
L. Latorre , Universit? de Montpellier II / CNRS, France
P. Nouet , Universit? de Montpellier II / CNRS, France
pp. 60-65
A. Dhayni , TIMA Laboratory, France
S. Mir , TIMA Laboratory, France
L. Rufer , TIMA Laboratory, France
pp. 66-71
Fei Su , Duke University, Durham, NC
Sule Ozev , Duke University, Durham, NC
Krishnendu Chakrabarty , Duke University, Durham, NC
pp. 72-77
Embedded Core Testing
Ludovic Krundel , Universit? Montpellier II, France
Sandeep Kumar Goel , Philips Research Laboratories, The Netherlands
Erik Jan Marinissen , Philips Research Laboratories, The Netherlands
Marie-Lise Flottes , LIRMM, France
Bruno Rouzeyre , LIRMM, France
pp. 80-85
Ozgur Sinanoglu , University of California, San Diego
Alex Orailoglu , University of California, San Diego
pp. 86-91
Test Resource Partitioning
Kedarnath J. Balakrishnan , University of Texas, Austin
Nur A. Touba , University of Texas, Austin
pp. 94-99
Paul Theo Gonciari , University of Southampton, UK
Bashir M. Al-Hashimi , University of Southampton, UK
pp. 100-105
Fault Simulation and Verification
Seiji Kajihara , Kyushu Institute of Technology, Japan
Kewal K. Saluja , University of Wisconsin-Madison
Sudhakar M. Reddy , University of Iowa, Iowa City
pp. 108-113
Victor Avenda? , Optics and Electronics-INAOE, Puebla, Mexico
Victor Champac , Optics and Electronics-INAOE, Puebla, Mexico
Joan Figueras , Universitat Politecnica de Catalunya-UPC, Barcelona, Spain
pp. 114-119
Analog BIST
Marcelo Negreiros , Universidade Federal do Rio Grande do Sul, Brazil
Luigi Carro , Universidade Federal do Rio Grande do Sul, Brazil
Altamiro A. Susin , Universidade Federal do Rio Grande do Sul, Brazil
pp. 122-126
Jee-Youl Ryu , Arizona State University, Tempe, AZ
Bruce C. Kim , Arizona State University, Tempe, AZ
Iboun Sylla , Texas Instruments, Inc., Dallas, Texas
pp. 127-132
Uros Kac , Jozef Stefan Institute
Franc Novak , Jozef Stefan Institute
pp. 133-138
Memory Testing
Luigi Dilillo , Universit? de Montpellier II / CNRS, France
Patrick Girard , Universit? de Montpellier II / CNRS, France
Serge Pravossoudovitch , Universit? de Montpellier II / CNRS, France
Arnaud Virazel , Universit? de Montpellier II / CNRS, France
Simone Borri , Infineon Technologies France
Magali Hage-Hassan , Infineon Technologies France
pp. 140-145
Ad J. van de Goor , Delft University of Technology, The Netherlands
Said Hamdioui , Philips Semiconductor Crolles R&D, France; Delft University of Technology, The Netherlands
Zaid Al-Ars , CatRam Solutions, The Netherlands; Delft University of Technology, The Netherlands
pp. 146-151
ATPG and High-Level Test
Piet Engelke , Albert-Ludwigs-University, Germany
Ilia Polian , Albert-Ludwigs-University, Germany
Michel Renovell , LIRMM - UMII, France
Bernd Becker , Albert-Ludwigs-University, Germany
pp. 160-165
Advances in DfT
Tsuyoshi Iwagaki , Nara Institute of Science and Technology, Japan
Satoshi Ohtake , Nara Institute of Science and Technology, Japan
Hideo Fujiwara , Nara Institute of Science and Technology, Japan
pp. 168-173
Y. Bonhomme , Nara Institute of Science and Technology
T. Yoneda , Nara Institute of Science and Technology
H. Fujiwara , Nara Institute of Science and Technology
P. Girard , Universit? Montpellier II/CNRS, France
pp. 174-179
Author Index (PDF)
pp. 180-181
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