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Exploring Quantifiable IT Yields, IEEE International Conference on (2007)
Amsterdam, The Netherlands
Mar. 19, 2007 to Mar. 21, 2007
ISBN: 978-1-4244-2537-2
TABLE OF CONTENTS
Frontmatter
Report of Conference Sessions
Technical Papers
Author Index
Author Index (PDF)
pp. 113
498 ms
(Ver 2.0)

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