ISBN: 0-8186-7786-4

Ali Dasdan, Dept. of Comp. Sci., Univ. of Illinois, IL, USA

Anmol Mathur, Silicon Graphics Inc., Mountain View, CA, USA

Rajesh K. Gupta, Dept. of Info. & Comp. Sci., Univ. of California, Irvine, CA, USA

Preeti Ranjan Panda, Dept. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA

Nikil D. Dutt, Dept. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA

Alexandru Nicolau, Dept. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA

Pierre Girodias, Universit? de Montr?al

Eduard Cerny, Universit? de Montr?al

Michael S. Hsiao, University of Illinois, Illinois, USA

Elizabeth M. Rudnick, University of Illinois, Illinois, USA

Janak H. Patel, University of Illinois, Illinois, USA

A. Dargelas, Univ. Montpellier II / CNRS, Montpellier, FRANCE

C. Gauthron, COMPASS Design Automation, Sophia-Antipolis, FRANCE

Y. Bertrand, Univ. Montpellier II / CNRS, Montpellier, FRANCE

F. Corno, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

P. Prinetto, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

M. Rebaudengo, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

M. Sonza Reorda, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

Philippe Benabes, Ecole Superieure d'Electr., Gif-sur-Yvette, France

Mansour Keramat, Ecole Superieure d'Electr., Gif-sur-Yvette, France

Richard Kielbasa, Ecole Superieure d'Electr., Gif-sur-Yvette, France

Guo-Neng Lu, Universit? Pierre et Marie Curie ( PARIS VI )

Gerard Sou, Universit? Pierre et Marie Curie ( PARIS VI )

S. Donnay, Katholieke Universiteit Leuven, Heverlee, Belgium

G. Gielen, Katholieke Universiteit Leuven, Heverlee, Belgium

W. Sansen, Katholieke Universiteit Leuven, Heverlee, Belgium

W. Kruiskamp, Eindhoven University of Technology, Eindhoven, The Netherlands

D. Leenaerts, Eindhoven University of Technology, Eindhoven, The Netherlands

W. Van Bokhoven, Eindhoven University of Technology, Eindhoven, The Netherlands

M. Nourani, Dept. of Electr. & Comput. Eng., Tehran Univ., Iran

C. Papachristou, Dept. of Electr. & Comput. Eng., Tehran Univ., Iran

Christian Dufaza, LIRMM, Montpellier, FRANCE

Yervant Zorian, Logic Vision, Inc., CA, USA

Dimitrios Kagaris, Electrical Engineering Dept., Southern Illinois University, IL, USA

Spyros Tragoudas, Computer Science Dept., Southern Illinois University, IL, USA

Andre Hertwig, University of Stuttgart, Germany

Hans-Joachim Wunderlich, University of Stuttgart, Germany

Kazuo Iwama, Dept of Computer Science & Communication Engineering, Kyushu University, Japan

Sunao Sawada, Dept of Computer Science & Communication Engineering, Kyushu University, Japan

Kensuke Hino, Industria1 Instrumentation & Control Systems Department, TOSHIBA Corporation, Japan

Hiroyuki Kurokawa, Research & Development, JUSTSYSTEM Corporation, Japan

Jordi Cortadella, Universit Politecnica de Catalunya, Barcelona, Spain

Michael Kishinevsky, The University of Aizu, Aizu- Wakamatsu, Japan

Alex Kondratyev, The University of Aizu, Aizu- Wakamatsu, Japan

Luciano Lavagno, Politecnico di Torino, Torino, Italy

Alex Yakovlev, University of Newcastle upon Tyne, England

Klaus Hofmann, Darmstadt University of Technology, Institute of Microelectronic Systems, Darmstadt, Germany

Manfred Glesner, Darmstadt University of Technology, Institute of Microelectronic Systems, Darmstadt, Germany

Nicu Sebe, University Bucharest, Romania

A. Manolescu, University Bucharest, Romania

Santiago Marco, University of Barcelona, Spain

Josep Samitier, University of Barcelona, Spain

Jean-Michel Karam, INPG / TIMA, Grenoble, France

Bernard Courtois, INPG / TIMA, Grenoble, France

W. Wünsche, Fraunhofer-Inst. for Integrated Circuits, Dresden, Germany

C. Clauß, Fraunhofer-Inst. for Integrated Circuits, Dresden, Germany

P. Schwarz, Fraunhofer-Inst. for Integrated Circuits, Dresden, Germany

F. Winkler, Fraunhofer-Inst. for Integrated Circuits, Dresden, Germany

B. Romanowicz, Inst. of Microsyst., Swiss Federal Inst. of Technol., Lausanne, Switzerland

M. Laudon, Inst. of Microsyst., Swiss Federal Inst. of Technol., Lausanne, Switzerland

P. Lerch, Inst. of Microsyst., Swiss Federal Inst. of Technol., Lausanne, Switzerland

P. Renaud, Inst. of Microsyst., Swiss Federal Inst. of Technol., Lausanne, Switzerland

H.P. Amann, Inst. of Microsyst., Swiss Federal Inst. of Technol., Lausanne, Switzerland

A. Boegli, Inst. of Microsyst., Swiss Federal Inst. of Technol., Lausanne, Switzerland

V. Moser, Inst. of Microsyst., Swiss Federal Inst. of Technol., Lausanne, Switzerland

F. Pellandini, Inst. of Microsyst., Swiss Federal Inst. of Technol., Lausanne, Switzerland

M.L.G. Smeets, Philips Res., Eindhoven, Netherlands

E.H.L. Aarts, Philips Res., Eindhoven, Netherlands

G. Essink, Philips Res., Eindhoven, Netherlands

E.A. de Kock, Philips Res., Eindhoven, Netherlands

Yanbing Li, Dept. of Electr. Eng., Princeton University, NJ, USA

Wayne Wolf, Dept. of Electr. Eng., Princeton University, NJ, USA

Rainer Leupers, University of Dortmund, Dortmund, Germany

Peter Marwedel, University of Dortmund, Dortmund, Germany

Subhrajit Bhattacharya, C&C Res. Labs., NEC USA, Princeton, NJ, USA

Sujit Dey, C&C Res. Labs., NEC USA, Princeton, NJ, USA

Bhaskar Sengupta, C&C Res. Labs., NEC USA, Princeton, NJ, USA

Xinli Gu, Synopsys, Inc., Mountain View, CA, USA

Erik Larsson, Dept. of Comp. and Info. Sci., Link?ping University, Link?ping, Sweden

Krzysztof Kuchinski, Dept. of Comp. and Info. Sci., Link?ping University, Link?ping, Sweden

Zebo Peng, Dept. of Comp. and Info. Sci., Link?ping University, Link?ping, Sweden

M.L. Flottes, Lab. d'Inf., de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, Franc

R. Pires, Lab. d'Inf., de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, Franc

B. Rouzeyre, Lab. d'Inf., de Robotique et de Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, Franc

A. Hett, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

R. Drechsler, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

B. Becker, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

G. Cabodi, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

P. Camurati, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

L. Lavagno, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

S. Quer, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

T. Kropf, Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany

J. Ruf, Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany

J.P. Fradin, Epsilon Ingenierie, Labege, France

L. Molla, Epsilon Ingenierie, Labege, France

B. Desaunettes, Epsilon Ingenierie, Labege, France

R.J.W.T. Tangelder, MESA Res. Inst., Twente Univ., Enschede, Netherlands

G. Diemel, MESA Res. Inst., Twente Univ., Enschede, Netherlands

H.G. Kerkhoff, MESA Res. Inst., Twente Univ., Enschede, Netherlands

M. Lang, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany

D. David, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany

M. Glesner, Inst. of Microelectron. Syst., Darmstadt Univ. of Technol., Germany

Radim Cmar, FEI STU

Serge Vernalde, IMEC-VSDM

Ander Royo, Universidad Polit?cnica de Madrid

Javier Moran, Universidad Polit?cnica de Madrid

Juan Carlos Lopez, Universidad Polit?cnica de Madrid

J. Riesco, Telefonica Investigacion y Desarrollo, Madrid, Spain

J.C. Díaz, Telefonica Investigacion y Desarrollo, Madrid, Spain

L.A. Merayo, Telefonica Investigacion y Desarrollo, Madrid, Spain

J.L. Conesa, Telefonica Investigacion y Desarrollo, Madrid, Spain

C. Santos, Telefonica Investigacion y Desarrollo, Madrid, Spain

E. Juárez, Telefonica Investigacion y Desarrollo, Madrid, Spain

O. Coudert, Synopsys Inc., Mountain View, CA, USA

C. Scholl, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

S. Melchior, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

G. Hotz, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

P. Molitor, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

Ayman Wahba, Joseph Fourier University

Dominique Borrione, Joseph Fourier University

J.P. Fishburn, Lucent Technol., AT&T Bell Labs., Murray Hill, NJ, USA

S. Kundu, Res. Lab., IBM Corp., Austin, TX, USA

U. Ghoshal, Res. Lab., IBM Corp., Austin, TX, USA

U. Geigenmüller, Delft Univ. of Technol., Netherlands

N.P. van der Meijs, Delft Univ. of Technol., Netherlands

V. Stopjaková, Dept. of Microelectron., Slovak Tech. Univ., Bratislava, Slovakia

H. Manhaeve, Dept. of Microelectron., Slovak Tech. Univ., Bratislava, Slovakia

M. Sachdev, Philips Res. Lab., Eindhoven, Netherlands

B. Laquai, IMS, Stuttgart, Germany

H. Richter, IMS, Stuttgart, Germany

H. Werkmann, IMS, Stuttgart, Germany

Pradip K. Jha, IBM East Fishkill Facility

Nikil D. Dutt, University of California at Irvine

M. Miranda, IMEC, Leuven, Belgium

M. Kaspar, IMEC, Leuven, Belgium

F. Catthoor, IMEC, Leuven, Belgium

H. de Man, IMEC, Leuven, Belgium

Min Xu, University of California, Irvine

Fadi Kurdahi, University of California, Irvine

K.S. Seong, Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea

C.M. Kyung, Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea

Le-Chin Eugene Liu, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

C. Sechen, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

Hsiao-Ping Tseng, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

C. Sechen, Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

Kanad Chakraborty, The University of Michigan

Pinaki Mazumder, The University of Michigan

R.O. Duarte, TIMA, Grenoble, France

M. Nicolaidis, TIMA, Grenoble, France

H. Bederr, TIMA, Grenoble, France

Y. Zorian, TIMA, Grenoble, France

C-T. Huang

C-W. Wu

K. Arabi, Dept. of Electr. & Comput. Eng., Ecole Polytech., Montreal, Que., Canada

B. Kaminska, Dept. of Electr. & Comput. Eng., Ecole Polytech., Montreal, Que., Canada

R. de Vries, Philips Res. Lab., Eindhoven, Netherlands

T. Zwemstra, Philips Res. Lab., Eindhoven, Netherlands

E.M.J.G. Bruls, Philips Res. Lab., Eindhoven, Netherlands

P.P.L. Regtien, Philips Res. Lab., Eindhoven, Netherlands

E.K.F. Lee, Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA

P. Walker, Div. of Eng., Brown Univ., Providence, RI, USA

S. Ghosh, Div. of Eng., Brown Univ., Providence, RI, USA

Minoru Shoji, Fuhitsu Limited

Fumiyasu Hirose, Fuhitsu Limited

Shintaro Shimogori, Fuhitsu Limited

Satoshi Kowatari, Fuhitsu Limited

Hiroshi Nagai, Fuhitsu Limited

P. Walker, Div. of Eng., Brown Univ., Providence, RI, USA

S. Ghosh, Div. of Eng., Brown Univ., Providence, RI, USA

L.T. Walczowski, Electron. Eng. Labs., Kent Univ., Canterbury, UK

D. Nalbantis, Electron. Eng. Labs., Kent Univ., Canterbury, UK

W.A.J. Waller, Electron. Eng. Labs., Kent Univ., Canterbury, UK

K. Shi, Electron. Eng. Labs., Kent Univ., Canterbury, UK

Juan A. Prieto, Centro Nacional de Microelectronica.

Adoracion Rueda, Centro Nacional de Microelectronica.

Jose M. Quintana, Centro Nacional de Microelectronica.

Jose L. Huertas, Centro Nacional de Microelectronica.

Ignacio Garcia-Vargas, Centro Nacional de Microelectronica

Mariano Galan, Centro Nacional de Microelectronica

Francisco V. Fernandez, Centro Nacional de Microelectronica

Angel Rodriguez-Vazque., Centro Nacional de Microelectronica

A. Bogliolo, DEIS, Bologna Univ., Italy

L. Benini, DEIS, Bologna Univ., Italy

G. De Micheli, DEIS, Bologna Univ., Italy

S. Gavrilov, Acad. of Sci., Moscow, Russia

A. Glebov, Acad. of Sci., Moscow, Russia

S. Rusakov, Acad. of Sci., Moscow, Russia

D. Blaauw, Acad. of Sci., Moscow, Russia

L. Jones, Acad. of Sci., Moscow, Russia

G. Vijayan, Acad. of Sci., Moscow, Russia

Vikram Saxena, Synopsys Inc.

Farid N. Najm, University of Illinois at Urbana-Champaign

Ibrahim Hajj, University of Illinois at Urbana-Champaign

S. Chiusano, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

F. Corno, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

P. Prinetto, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

M. Sonza Reorda, Dipartimento di Autom. e Inf., Politecnico di Torino, Italy

D. Eisenbiegler, Inst. for Circuit Design & Fault Tolerance, Karlsruhe Univ., Germany

R. Kumar, Inst. for Circuit Design & Fault Tolerance, Karlsruhe Univ., Germany

C. Blumenrohr, Inst. for Circuit Design & Fault Tolerance, Karlsruhe Univ., Germany

S. Hendriex, Katholieke Univ., Leuven, Heverlee, Belgium

L. Claesen, Katholieke Univ., Leuven, Heverlee, Belgium

Cristiana Bolchini, Politecnico di Milano

Fabio Salice, Politecnico di Milano

Donatella Sciuto, Politecnico di Milano

M. Favalli, DEIS, Bologna Univ., Italy

C. Metra, DEIS, Bologna Univ., Italy

Antonis Paschalis

Nikos Gaitanis

Dimitris Gizopoulos

Panagiotis Kostarakis

Sriram Govindarajan, University of Cincinnati

Ranga Vemuri, University of Cincinnati

Dirk Herrmann, Technical University of Braunschweig

Rolf Ernst, Technical University of Braunschweig

W.F.J. Verhaegh, Philips Res. Lab., Eindhoven, Netherlands

P.E.R. Lippens, Philips Res. Lab., Eindhoven, Netherlands

E.H.L. Aarts, Philips Res. Lab., Eindhoven, Netherlands

J.L. van Meerbergen, Philips Res. Lab., Eindhoven, Netherlands

F. Thoen

J. Van Der Steen

G. de Jong

G. Goossens

H De Man

T. Grotker, Aachen Univ. of Technol., Germany

R. Schoenen, Aachen Univ. of Technol., Germany

H. Meyr, Aachen Univ. of Technol., Germany

F. Vahid, Dept. of Comput. Sci., California Univ., Riverside, CA, USA

S. Narayanan, Sun Microsyst. Inc., Mountain View, CA, USA

R. Srinivasan, Sun Microsyst. Inc., Mountain View, CA, USA

R.P. Kunda, Sun Microsyst. Inc., Mountain View, CA, USA

M.E. Levitt, Sun Microsyst. Inc., Mountain View, CA, USA

S. Bozorgui-Nesbat, Sun Microsyst. Inc., Mountain View, CA, USA

J.T. de Sousa, Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK

P.Y.K. Cheung, Dept. of Electr. & Electron. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK

I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, US

S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, US

L. Benini, Comput. Syst. Lab., Stanford Univ., CA, USA

G. De Micheli, Comput. Syst. Lab., Stanford Univ., CA, USA

E. Macii, Comput. Syst. Lab., Stanford Univ., CA, USA

M. Poncino, Comput. Syst. Lab., Stanford Univ., CA, USA

R. Scarsi, Comput. Syst. Lab., Stanford Univ., CA, USA

P. Surti, Intel Corp., Folsom, CA, USA

L.F. Chao, Intel Corp., Folsom, CA, USA

A. Tyagi, Intel Corp., Folsom, CA, USA

Hoon Choi, KAIST

Seung Ho Hwang, KAIST

I. Gibson, Canon Inf. Syst. Res., North Ryde, NSW, Australia

C. Amies, Canon Inf. Syst. Res., North Ryde, NSW, Australia

Claus Schneider, Siemens AG

P. Schaumont

S. Vernalde

L. Rijnders

M. Engels

I. Bolsens

R. Drechsler, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

H. Hengster, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

H. Schafer, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

J. Hartmann, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

B. Becker, Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany

I. Pomeranz, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

S.M. Reddy, Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA

A. Benso, Politecnico di Torino, Italy

P. Prinetto, Politecnico di Torino, Italy

M. Rebaudengo, Politecnico di Torino, Italy

M. Sonza Reorda, Politecnico di Torino, Italy

R. Ubar, Politecnico di Torino, Italy

M. Renovell, Lab. d'Inf., LIRMM, Montpellier, France

F. Azais, Lab. d'Inf., LIRMM, Montpellier, France

Y. Bertrand, Lab. d'Inf., LIRMM, Montpellier, France

T. Olbrich

I.A. Grout

Y.E. Aimine

A.M. Richardson

J Contensou

V. Kaal, MESA Res. Inst., Twente Univ., Enschede, Netherlands

H. Kerkhoff, MESA Res. Inst., Twente Univ., Enschede, Netherlands

J.E. Crenshaw, Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA

M. Sarrafzadeh, Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA

S. Manich, Univ. Politecnica de Catalunya, Barcelona, Spain

J. Figueras, Univ. Politecnica de Catalunya, Barcelona, Spain

S. Turgis, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

J.M. Daga, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

J.M. Portal, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

D. Auvergne, Univ. des Sci. et Tech. du Languedoc, Montpellier, France

J. Faura, SIDSA, Parque Technol., Madrid, Spain

C. Horton, SIDSA, Parque Technol., Madrid, Spain

B. Krah, SIDSA, Parque Technol., Madrid, Spain

J. Cabestany, SIDSA, Parque Technol., Madrid, Spain

M.A. Aguirre, SIDSA, Parque Technol., Madrid, Spain

J.M. Insenser, SIDSA, Parque Technol., Madrid, Spain

J.A.J. Leijten, Philips Res. Lab., Eindhoven, Netherlands

J.L. van Meerbergen, Philips Res. Lab., Eindhoven, Netherlands

A.H. Timmer, Philips Res. Lab., Eindhoven, Netherlands

J.A.G. Jess, Philips Res. Lab., Eindhoven, Netherlands

C. Liem, Lab. TIMA, INPG, Grenoble, France

P. Paulin, Lab. TIMA, INPG, Grenoble, France

A. Jerraya, Lab. TIMA, INPG, Grenoble, France

T. Rowekamp, German Nat. Res. Center for Comput. Sci., St. Augustin, Germany

L. Peters, German Nat. Res. Center for Comput. Sci., St. Augustin, Germany

J. Gonzalez-Torres

P.A. Mateos

J.M. Hernandez

M.R. Karthikeyan

S.K Nandy

H. Ihs, Lab. d'Inf., Robotique et de Micro-electronique, Montpellier, France

C. Dufaza, Lab. d'Inf., Robotique et de Micro-electronique, Montpellier, France

V. Szekely, Dept. of Electron Devices, Tech. Univ. Budapest, Hungary

A. Pahi, Dept. of Electron Devices, Tech. Univ. Budapest, Hungary

A. Poppe, Dept. of Electron Devices, Tech. Univ. Budapest, Hungary

M. Rencz, Dept. of Electron Devices, Tech. Univ. Budapest, Hungary

A. Csendes, Dept. of Electron Devices, Tech. Univ. Budapest, Hungary

Marina Santo Zarnik, Hipot Hybrid

Franc Novak, Jozef Stefan Institute

Srecko Macek, Jozef Stefan Institute

Renate Beckmann, University of Dortmund

Jnrgen Herrmann, University of Dortmund

I. Ozimek, Institute Jozef Stefan

R. Verlic, Institute Jozef Stefan

J. Tasic, University of Ljubljana

A. Mignotte, Ecole Normale Superieure de Lyon, France

O. Peyran, Ecole Normale Superieure de Lyon, France

J. Walrath, Dept. of Electron. Comput., Cincinnati Univ., OH, USA

R. Vemuri, Dept. of Electron. Comput., Cincinnati Univ., OH, USA

W. Bradley, Dept. of Electron. Comput., Cincinnati Univ., OH, USA

A. Ursu, Technical University of Moldova

G. Gruita, Technical University of Moldova

S. Zaporojan, Technical University of Moldova

M. Wolf, Otto-von-Guericke-Univ., Magdeburg, Germany

U. Kleine, Otto-von-Guericke-Univ., Magdeburg, Germany

M.F. Abdulla, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., New Delhi, India

C.P. Ravikumar, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., New Delhi, India

A. Kumar, Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., New Delhi, India

Yoshinobu Higami, Osaka University

Kozo Kinoshita, Osaka University

A.J. van de Goor, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

G.N. Gaydadjiev, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

V.N. Yarmolik, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

V.G. Mikitjuk, Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands

R.D. Blanton, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

J.P. Hayes, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

M. Svajda, Tech. Univ. of Brno, Czech Republic

B. Straka, Tech. Univ. of Brno, Czech Republic

H. Manhaeve, Tech. Univ. of Brno, Czech Republic

Adam Kristof, Silesian Technical University